FI20021973A0 - Synkroninen optinen mittaus- ja tarkistusmenetelmä ja laite - Google Patents

Synkroninen optinen mittaus- ja tarkistusmenetelmä ja laite

Info

Publication number
FI20021973A0
FI20021973A0 FI20021973A FI20021973A FI20021973A0 FI 20021973 A0 FI20021973 A0 FI 20021973A0 FI 20021973 A FI20021973 A FI 20021973A FI 20021973 A FI20021973 A FI 20021973A FI 20021973 A0 FI20021973 A0 FI 20021973A0
Authority
FI
Finland
Prior art keywords
control method
optical measurement
synchronous optical
synchronous
measurement
Prior art date
Application number
FI20021973A
Other languages
English (en)
Swedish (sv)
Other versions
FI20021973A (fi
Inventor
Iiro Hietanen
Heimo Keraenen
Seppo Pyoerret
Original Assignee
Sr Instr Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sr Instr Oy filed Critical Sr Instr Oy
Priority to FI20021973A priority Critical patent/FI20021973A/fi
Publication of FI20021973A0 publication Critical patent/FI20021973A0/fi
Priority to US10/533,645 priority patent/US7605921B2/en
Priority to CNA2007101010212A priority patent/CN101050952A/zh
Priority to PCT/FI2003/000814 priority patent/WO2004042321A1/en
Priority to EP03810467A priority patent/EP1558894A1/en
Priority to AU2003276285A priority patent/AU2003276285A1/en
Priority to CNB200380102905XA priority patent/CN1318840C/zh
Priority to CA2505017A priority patent/CA2505017C/en
Publication of FI20021973A publication Critical patent/FI20021973A/fi
Priority to US12/549,181 priority patent/US20100045988A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/894—Pinholes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
FI20021973A 2002-11-05 2002-11-05 Synkroninen optinen mittaus- ja tarkistusmenetelmä ja laite FI20021973A (fi)

Priority Applications (9)

Application Number Priority Date Filing Date Title
FI20021973A FI20021973A (fi) 2002-11-05 2002-11-05 Synkroninen optinen mittaus- ja tarkistusmenetelmä ja laite
US10/533,645 US7605921B2 (en) 2002-11-05 2003-11-04 Synchronous optical measurement and inspection method and means
CNA2007101010212A CN101050952A (zh) 2002-11-05 2003-11-04 同步光学测量和探伤方法及装置
PCT/FI2003/000814 WO2004042321A1 (en) 2002-11-05 2003-11-04 Synchronous optical measurement and ispection method and means
EP03810467A EP1558894A1 (en) 2002-11-05 2003-11-04 Synchronous optical measurement and inspection method and means
AU2003276285A AU2003276285A1 (en) 2002-11-05 2003-11-04 Synchronous optical measurement and ispection method and means
CNB200380102905XA CN1318840C (zh) 2002-11-05 2003-11-04 同步光学测量和探伤方法及装置
CA2505017A CA2505017C (en) 2002-11-05 2003-11-04 Synchronous optical measurement and inspection method and means
US12/549,181 US20100045988A1 (en) 2002-11-05 2009-08-27 Synchronous optical measurement and inspection method and means

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20021973A FI20021973A (fi) 2002-11-05 2002-11-05 Synkroninen optinen mittaus- ja tarkistusmenetelmä ja laite

Publications (2)

Publication Number Publication Date
FI20021973A0 true FI20021973A0 (fi) 2002-11-05
FI20021973A FI20021973A (fi) 2004-05-06

Family

ID=8564882

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20021973A FI20021973A (fi) 2002-11-05 2002-11-05 Synkroninen optinen mittaus- ja tarkistusmenetelmä ja laite

Country Status (7)

Country Link
US (2) US7605921B2 (fi)
EP (1) EP1558894A1 (fi)
CN (2) CN101050952A (fi)
AU (1) AU2003276285A1 (fi)
CA (1) CA2505017C (fi)
FI (1) FI20021973A (fi)
WO (1) WO2004042321A1 (fi)

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WO2005072265A2 (en) * 2004-01-22 2005-08-11 Wintriss Engineering Corporation Illumination system for material inspection
US7623699B2 (en) * 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
US20060090319A1 (en) * 2004-11-01 2006-05-04 Howe Major K Defect locating system for moving web
US7615938B2 (en) * 2005-04-06 2009-11-10 Apple Inc. Method and system for variable LED output in an electronic device
US8175739B2 (en) * 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
US7542821B2 (en) * 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US20090028417A1 (en) * 2007-07-26 2009-01-29 3M Innovative Properties Company Fiducial marking for multi-unit process spatial synchronization
FI20075975L (fi) * 2007-12-31 2009-07-01 Metso Automation Oy Rainan mittaus
DE102008027393A1 (de) * 2008-06-06 2009-12-10 Isra Vision Ag Optische Überwachungseinrichtung
US7797133B2 (en) * 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
EP2186624B1 (en) * 2008-11-18 2015-08-26 Tetra Laval Holdings & Finance S.A. Apparatus and method for detecting the position of application of a sealing strip onto a web of packaging material for food products
US8798479B2 (en) * 2009-12-03 2014-08-05 Samsung Electronics Co., Ltd. Controlling brightness of light sources used for data transmission
CN102650588A (zh) * 2012-03-16 2012-08-29 京东方科技集团股份有限公司 监测溶液加工能力的方法及装置、刻蚀系统
US10670515B2 (en) 2013-05-20 2020-06-02 Magna International Inc. Detecting edge cracks
CN104458749A (zh) * 2013-09-25 2015-03-25 中国科学院沈阳自动化研究所 基于机器视觉的铝型材表面缺陷实时检测系统
CN103759675B (zh) * 2013-12-23 2016-07-06 中国兵器科学研究院宁波分院 一种用于光学元件非球面微结构的同步检测方法
JP6406543B2 (ja) * 2014-10-16 2018-10-17 株式会社リコー 画像形成装置及び物体処理装置。
CN105987922B (zh) * 2015-12-31 2018-11-06 北京强度环境研究所 一种基于原位分析技术研究材料损伤微观机理的实验方法
WO2017171046A1 (ja) * 2016-03-31 2017-10-05 株式会社未来機械 作業ロボットおよびエッジ検出器
IT201600072709A1 (it) * 2016-07-12 2018-01-12 Perini Fabio Spa Linea di trasformazione per carta tissue e metodo
JP6597691B2 (ja) * 2017-03-27 2019-10-30 Ｊｆｅスチール株式会社 表面欠陥検査方法及び表面欠陥検査システム
TWI694686B (zh) * 2018-11-15 2020-05-21 財團法人工業技術研究院 水下無線通訊裝置及方法
CN110346381B (zh) * 2019-08-12 2022-03-08 衡阳师范学院 一种光学元件损伤测试方法及装置
CN111879789A (zh) * 2020-07-15 2020-11-03 深圳科瑞技术股份有限公司 金属表面缺陷检测方法及系统
US12072506B2 (en) * 2021-11-04 2024-08-27 L3Harris Technologies, Inc. Apparatus and method for simplifying a control interface of a night vision system using bi-directional detector/display overlay
CN114858755B (zh) * 2022-07-05 2022-10-21 中国航发四川燃气涡轮研究院 一种航空发动机涂层变频原位激光检测系统

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US5625196A (en) * 1995-05-30 1997-04-29 Abb Industrial Systems, Inc. Method and apparatus for monitoring/calibrating a process measuring system
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Also Published As

Publication number Publication date
CN1711458A (zh) 2005-12-21
CA2505017A1 (en) 2004-05-21
CN101050952A (zh) 2007-10-10
US20060164645A1 (en) 2006-07-27
CA2505017C (en) 2010-09-28
WO2004042321A1 (en) 2004-05-21
US7605921B2 (en) 2009-10-20
FI20021973A (fi) 2004-05-06
US20100045988A1 (en) 2010-02-25
CN1318840C (zh) 2007-05-30
EP1558894A1 (en) 2005-08-03
AU2003276285A1 (en) 2004-06-07

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