FI20000282A0 - Menetelmä ja laite päällysteen mittaamiseksi - Google Patents

Menetelmä ja laite päällysteen mittaamiseksi

Info

Publication number
FI20000282A0
FI20000282A0 FI20000282A FI20000282A FI20000282A0 FI 20000282 A0 FI20000282 A0 FI 20000282A0 FI 20000282 A FI20000282 A FI 20000282A FI 20000282 A FI20000282 A FI 20000282A FI 20000282 A0 FI20000282 A0 FI 20000282A0
Authority
FI
Finland
Prior art keywords
measuring coating
coating
measuring
Prior art date
Application number
FI20000282A
Other languages
English (en)
Swedish (sv)
Other versions
FI115856B (fi
FI20000282A (fi
Inventor
Jussi Tenhunen
Markku Maentylae
Markku Kaensaekoski
Original Assignee
Neles Paper Automation Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Neles Paper Automation Oy filed Critical Neles Paper Automation Oy
Priority to FI20000282A priority Critical patent/FI115856B/fi
Publication of FI20000282A0 publication Critical patent/FI20000282A0/fi
Priority to PCT/FI2001/000113 priority patent/WO2001059435A1/en
Priority to EP01907591.0A priority patent/EP1274985B1/en
Priority to CA2399632A priority patent/CA2399632C/en
Priority to AU2001235516A priority patent/AU2001235516A1/en
Publication of FI20000282A publication Critical patent/FI20000282A/fi
Priority to US10/216,009 priority patent/US6717148B2/en
Application granted granted Critical
Publication of FI115856B publication Critical patent/FI115856B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI20000282A 2000-02-10 2000-02-10 Menetelmä ja laite päällysteen mittaamiseksi FI115856B (fi)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FI20000282A FI115856B (fi) 2000-02-10 2000-02-10 Menetelmä ja laite päällysteen mittaamiseksi
PCT/FI2001/000113 WO2001059435A1 (en) 2000-02-10 2001-02-08 Method and apparatus for measuring coating
EP01907591.0A EP1274985B1 (en) 2000-02-10 2001-02-08 Method and apparatus for measuring coating
CA2399632A CA2399632C (en) 2000-02-10 2001-02-08 Method and apparatus for measuring coating
AU2001235516A AU2001235516A1 (en) 2000-02-10 2001-02-08 Method and apparatus for measuring coating
US10/216,009 US6717148B2 (en) 2000-02-10 2002-08-09 Method and apparatus for measuring coating

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20000282 2000-02-10
FI20000282A FI115856B (fi) 2000-02-10 2000-02-10 Menetelmä ja laite päällysteen mittaamiseksi

Publications (3)

Publication Number Publication Date
FI20000282A0 true FI20000282A0 (fi) 2000-02-10
FI20000282A FI20000282A (fi) 2001-08-11
FI115856B FI115856B (fi) 2005-07-29

Family

ID=8557430

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20000282A FI115856B (fi) 2000-02-10 2000-02-10 Menetelmä ja laite päällysteen mittaamiseksi

Country Status (6)

Country Link
US (1) US6717148B2 (fi)
EP (1) EP1274985B1 (fi)
AU (1) AU2001235516A1 (fi)
CA (1) CA2399632C (fi)
FI (1) FI115856B (fi)
WO (1) WO2001059435A1 (fi)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030132387A1 (en) * 1998-02-12 2003-07-17 Metso Paper Automation Oy Method and device for measuring the amount of coating on a moving substrate
FI115412B (fi) * 2002-04-16 2005-04-29 Metso Automation Oy Menetelmä ja laitteisto paperirainalla olevan päällysteen määrän mittaamiseksi
US6960769B2 (en) * 2002-10-03 2005-11-01 Abb Inc. Infrared measuring apparatus and method for on-line application in manufacturing processes
CN1627317A (zh) * 2003-12-12 2005-06-15 北京阳光奥森科技有限公司 利用主动光源获取人脸图像的方法
DE102004023092B3 (de) * 2004-05-05 2006-01-05 System Kurandt Gmbh Vorrichtung zur Erkennung von Leim auf einer Oberfläche
FI118304B (fi) * 2006-03-24 2007-09-28 Metso Paper Inc Menetelmä ja sovitelma päällystemäärän hallitsemiseksi kuiturainan päällystyksessä
US7482590B2 (en) * 2006-12-20 2009-01-27 Voith Patent Gmbh Method for determining the coating quantity on a material web
ES2419165T3 (es) 2007-08-13 2013-08-19 Ndc Infrared Engineering Limited Método y aparato para la detección electromagnética para su uso en la fabricación de una lámina fibrosa
FI20075975L (fi) * 2007-12-31 2009-07-01 Metso Automation Oy Rainan mittaus
US9029776B2 (en) * 2008-09-05 2015-05-12 Metso Automation Oy Determining the amount of starch
US8101047B2 (en) * 2008-09-29 2012-01-24 Honeywell International Inc. Method of correcting gypsum crystal water effect on infrared moisture measurement
US8148690B2 (en) * 2009-09-24 2012-04-03 ABB, Ltd. Method and apparatus for on-line web property measurement
FI20105452A0 (fi) * 2010-04-26 2010-04-26 Metso Automation Oy Rainan mittaus
DE102012100794B3 (de) * 2012-01-31 2013-02-28 Airbus Operations Gmbh Vorrichtung und Verfahren zum Erfassen von Kontaminationen in einem Hydrauliksystem
FI125514B (fi) * 2012-05-25 2015-11-13 Valmet Automation Oy Laite ja menetelmä selluloosaa ja mahdollisesti ligniiniä sisältävän rainan mittaamiseksi
FI125721B (fi) 2012-05-25 2016-01-29 Valmet Automation Oy Laite ja menetelmä selluloosamateriaalia ja ainakin yhtä väriainetta, joka sisältää painomusteen, käsittävän kohteen mittaamiseksi
US9116041B1 (en) * 2012-06-11 2015-08-25 The United States Of America As Represented By The Secretary Of The Navy System and method for spectral infrared thermal imaging
FI128285B (fi) * 2014-06-27 2020-02-28 Metso Automation Oy Optinen monikanavamittausyksikkö, optinen monikanavadetektoriyksikkö ja näihin liittyvä mittausmenetelmä
DE102018103171A1 (de) * 2017-11-23 2019-05-23 Tdk Electronics Ag Verfahren zum Bestimmen von Eigenschaften einer Beschichtung auf einer transparenten Folie, Verfahren zur Herstellung einer Kondensatorfolie und Einrichtung zum Bestimmen von Eigenschaften einer Beschichtung auf einer transparenten Folie

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2910673C2 (de) * 1979-03-19 1985-08-08 Paul Lippke Gmbh & Co Kg, 5450 Neuwied Verfahren zum berührungslosen Messen des absoluten Gehaltes eines Stoffes(Beisubstanz) in einer die Form eines dünnen Filmes aufweisenden Mischung(Hauptsubstanz und Beisubstanz) mehrerer Stoffe, insbesondere zum Messen des absoluten Gehaltes von Wasser in Papier
US4345840A (en) * 1980-04-08 1982-08-24 California Institute Of Technology Method and apparatus for instantaneous band ratioing in a reflectance radiometer
US4631408A (en) * 1984-09-24 1986-12-23 Kollmorgen Technologies Corporation Method of simultaneously determining gauge and orientation of polymer films
US4965452A (en) * 1988-07-11 1990-10-23 Process Automation Business, Inc. Infrared analysis of paper printability
SE468334B (sv) * 1991-04-23 1992-12-14 Peter Perten Saett och anordning foer infraroedanalys, speciellt avseende livsmedel
US5338361A (en) * 1991-11-04 1994-08-16 Measurex Corporation Multiple coat measurement and control apparatus and method
US5276327A (en) 1991-12-09 1994-01-04 Measurex Corporation Sensor and method for mesaurement of select components of a material
US5250811A (en) 1991-12-20 1993-10-05 Eastman Kodak Company Method for determining compositional information of a multilayer web
US5659397A (en) * 1995-06-08 1997-08-19 Az Technology Method and apparatus for measuring total specular and diffuse optical properties from the surface of an object
US5818045A (en) * 1996-07-19 1998-10-06 Mark; Howard L. Spectroscopic system for quantifying constituents in natural products
US5745243A (en) * 1996-11-15 1998-04-28 Optical Solutions, Inc. Photometer apparatus
AU5990998A (en) * 1997-02-13 1998-09-08 Valmet Automation Inc. Method for measuring the components of a coating on a moving base material
FI970612A (fi) 1997-02-13 1998-08-14 Valmet Automation Inc Menetelmä paperin päällysteen komponenttien mittaamiseksi
US5795394A (en) * 1997-06-02 1998-08-18 Honeywell-Measurex Coating weight measuring and control apparatus
US6433338B1 (en) * 1998-02-09 2002-08-13 Tomra Systems Asa Method and device for identification of a type of material in an object and utilization therefor
FI108811B (fi) * 1998-02-12 2002-03-28 Metso Paper Automation Oy Menetelmä ja laite liikkuvalla alustalla olevan päällysteen määrän mittaamiseksi
DE19810163A1 (de) 1998-03-05 1999-09-30 Valco Cincinnati Gmbh Einrichtung zum Nachweis von Wasser und wasserhaltigen Substanzen, insbesondere von wasserhaltigen Klebstoffen, auf Oberflächen beliebiger Materialien

Also Published As

Publication number Publication date
EP1274985A1 (en) 2003-01-15
CA2399632A1 (en) 2001-08-16
US6717148B2 (en) 2004-04-06
AU2001235516A1 (en) 2001-08-20
CA2399632C (en) 2013-01-08
WO2001059435A1 (en) 2001-08-16
FI115856B (fi) 2005-07-29
US20030047135A1 (en) 2003-03-13
EP1274985B1 (en) 2017-10-11
FI20000282A (fi) 2001-08-11

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