FI129000B - Cryogenic microwave analyzer - Google Patents
Cryogenic microwave analyzer Download PDFInfo
- Publication number
- FI129000B FI129000B FI20176051A FI20176051A FI129000B FI 129000 B FI129000 B FI 129000B FI 20176051 A FI20176051 A FI 20176051A FI 20176051 A FI20176051 A FI 20176051A FI 129000 B FI129000 B FI 129000B
- Authority
- FI
- Finland
- Prior art keywords
- detector
- heating
- coupled
- superconductor
- input
- Prior art date
Links
- 238000010438 heat treatment Methods 0.000 claims abstract description 104
- 239000002887 superconductor Substances 0.000 claims abstract description 41
- 239000006096 absorbing agent Substances 0.000 claims abstract description 24
- 230000005855 radiation Effects 0.000 claims abstract description 23
- 230000008859 change Effects 0.000 claims abstract description 11
- 238000005259 measurement Methods 0.000 claims description 39
- 230000008878 coupling Effects 0.000 claims description 18
- 238000010168 coupling process Methods 0.000 claims description 18
- 238000005859 coupling reaction Methods 0.000 claims description 18
- 238000001514 detection method Methods 0.000 claims description 9
- 238000009792 diffusion process Methods 0.000 claims description 6
- 239000002784 hot electron Substances 0.000 claims description 6
- 230000000903 blocking effect Effects 0.000 claims description 3
- 238000006073 displacement reaction Methods 0.000 claims description 2
- 239000000463 material Substances 0.000 description 18
- 230000000694 effects Effects 0.000 description 8
- 239000004020 conductor Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 229910001252 Pd alloy Inorganic materials 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000012512 characterization method Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- BBKFSSMUWOMYPI-UHFFFAOYSA-N gold palladium Chemical compound [Pd].[Au] BBKFSSMUWOMYPI-UHFFFAOYSA-N 0.000 description 2
- CNQCVBJFEGMYDW-UHFFFAOYSA-N lawrencium atom Chemical compound [Lr] CNQCVBJFEGMYDW-UHFFFAOYSA-N 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 229910001020 Au alloy Inorganic materials 0.000 description 1
- 101100086716 Caenorhabditis elegans ran-3 gene Proteins 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000007707 calorimetry Methods 0.000 description 1
- 239000002041 carbon nanotube Substances 0.000 description 1
- 229910021393 carbon nanotube Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- -1 copper Chemical class 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 229910021389 graphene Inorganic materials 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 239000011135 tin Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/006—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of the effect of a material on microwaves or longer electromagnetic waves, e.g. measuring temperature via microwaves emitted by the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/002—Calibrated temperature sources, temperature standards therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K17/00—Measuring quantity of heat
- G01K17/003—Measuring quantity of heat for measuring the power of light beams, e.g. laser beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/006—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using superconductive elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/22—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of ac into dc
- G01R19/225—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using conversion of ac into dc by means of thermocouples or other heat sensitive elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/02—Arrangements for measuring electric power or power factor by thermal methods, e.g. calorimetric
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/14—Compensating for temperature change
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N60/00—Superconducting devices
- H10N60/10—Junction-based devices
- H10N60/12—Josephson-effect devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N60/00—Superconducting devices
- H10N60/10—Junction-based devices
- H10N60/128—Junction-based devices having three or more electrodes, e.g. transistor-like structures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
- G01J2005/208—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices superconductive
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Combustion & Propulsion (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Measurement Of Radiation (AREA)
Priority Applications (14)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20176051A FI129000B (en) | 2017-11-23 | 2017-11-23 | Cryogenic microwave analyzer |
| RU2020118472A RU2768987C1 (ru) | 2017-11-23 | 2018-11-22 | Криогенный анализатор СВЧ-диапазона |
| AU2018374039A AU2018374039B2 (en) | 2017-11-23 | 2018-11-22 | Cryogenic microwave analyzer |
| CN201880015944.2A CN110383020B (zh) | 2017-11-23 | 2018-11-22 | 低温微波分析仪 |
| CA3075673A CA3075673A1 (en) | 2017-11-23 | 2018-11-22 | Cryogenic microwave analyzer |
| SG11202002158RA SG11202002158RA (en) | 2017-11-23 | 2018-11-22 | Cryogenic microwave analyzer |
| EP18812221.2A EP3714245B1 (en) | 2017-11-23 | 2018-11-22 | Cryogenic microwave analyzer |
| BR112020010220-2A BR112020010220A2 (pt) | 2017-11-23 | 2018-11-22 | analisador de micro-ondas criogênico |
| US16/766,152 US11442086B2 (en) | 2017-11-23 | 2018-11-22 | Microwave radiation detector |
| KR1020207012677A KR102672186B1 (ko) | 2017-11-23 | 2018-11-22 | 극저온 마이크로파 분석기 |
| PCT/FI2018/050851 WO2019102071A1 (en) | 2017-11-23 | 2018-11-22 | Cryogenic microwave analyzer |
| JP2020524100A JP7253545B2 (ja) | 2017-11-23 | 2018-11-22 | 極低温マイクロ波分析装置 |
| IL274498A IL274498B2 (en) | 2017-11-23 | 2020-05-06 | Cryogenic microwave analyzer |
| AU2020101876A AU2020101876A4 (en) | 2017-11-23 | 2020-08-18 | Cryogenic microwave analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20176051A FI129000B (en) | 2017-11-23 | 2017-11-23 | Cryogenic microwave analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FI20176051A1 FI20176051A1 (en) | 2019-05-24 |
| FI129000B true FI129000B (en) | 2021-04-30 |
Family
ID=64572383
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FI20176051A FI129000B (en) | 2017-11-23 | 2017-11-23 | Cryogenic microwave analyzer |
Country Status (13)
| Country | Link |
|---|---|
| US (1) | US11442086B2 (zh) |
| EP (1) | EP3714245B1 (zh) |
| JP (1) | JP7253545B2 (zh) |
| KR (1) | KR102672186B1 (zh) |
| CN (1) | CN110383020B (zh) |
| AU (2) | AU2018374039B2 (zh) |
| BR (1) | BR112020010220A2 (zh) |
| CA (1) | CA3075673A1 (zh) |
| FI (1) | FI129000B (zh) |
| IL (1) | IL274498B2 (zh) |
| RU (1) | RU2768987C1 (zh) |
| SG (1) | SG11202002158RA (zh) |
| WO (1) | WO2019102071A1 (zh) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117008668B (zh) * | 2023-10-08 | 2024-02-13 | 国网江苏省电力有限公司营销服务中心 | 基于固态介质的量子电压标准系统温控装置、方法及系统 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3842349A (en) * | 1973-08-07 | 1974-10-15 | Canadian Patents Dev | Automatic ac/dc rms comparator |
| US3906231A (en) * | 1974-03-19 | 1975-09-16 | Nasa | Doped Josephson tunneling junction for use in a sensitive IR detector |
| US4901006A (en) * | 1984-02-15 | 1990-02-13 | Electro Scientific Industries, Inc. | Method and apparatus for AC signal comparison, calibration and measurement |
| US4869598A (en) * | 1988-03-11 | 1989-09-26 | Mcdonald Donald G | Temperature-sensitive multiple-layer thin film superconducting device |
| FR2642903B1 (fr) * | 1989-01-13 | 1995-05-05 | Thomson Csf | Detecteur de rayonnement |
| US5285067A (en) * | 1992-03-05 | 1994-02-08 | The United States Of America As Represented By The Secretary Of The Navy | Microwave detection of a superconducting infrared sensor |
| US5378873A (en) * | 1992-06-05 | 1995-01-03 | Katzmann; Fred L. | Electrothermal conversion elements, apparatus and methods for use in comparing, calibrating and measuring electrical signals |
| US5783805A (en) | 1992-06-05 | 1998-07-21 | Katzmann; Fred L. | Electrothermal conversion elements, apparatus and methods for use in comparing, calibrating and measuring electrical signals |
| RU2227346C1 (ru) | 2002-07-24 | 2004-04-20 | Рязанский государственный педагогический университет им. С.А. Есенина | Сверхпроводящая полупроводниковая наноструктура с квантовыми ямами |
| WO2009088062A1 (ja) * | 2008-01-10 | 2009-07-16 | Akita University | 感温磁性体を用いた温度計測方法及び温度制御方法 |
| FI20080124L (fi) | 2008-02-15 | 2009-08-16 | Teknillinen Korkeakoulu | Läheis-Josephson-ilmaisin |
| US8610069B2 (en) * | 2010-01-13 | 2013-12-17 | Tegam, Inc. | Coaxial to dual co-planar waveguide launcher for microwave bolometry |
| RU2437189C1 (ru) | 2010-09-08 | 2011-12-20 | Научно-исследовательский институт ядерной физики имени Д.В. Скобельцына Московского государственного университета имени М.В. Ломоносова | Детектор терагерцового излучения на джозефсоновской гетероструктуре |
| FI122887B (fi) * | 2010-09-20 | 2012-08-31 | Aalto Korkeakoulusaeaetioe | Menetelmä ja laite yksittäisten mikroaaltofotonien ilmaisemiseksi metallisessa aaltojohteessa |
| GB2520032A (en) * | 2013-11-06 | 2015-05-13 | Univ Warwick | Bolometer |
| FI20165492A (fi) * | 2015-12-29 | 2017-06-30 | Aalto-Korkeakoulusäätiö (Aalto Univ Foundation) | Piirikokoonpano, järjestelmä ja menetelmä sähköisten kvanttilaitteiden jäähdyttämiseksi |
| US9818064B1 (en) * | 2016-10-11 | 2017-11-14 | International Business Machines Corporation | High fidelity threshold detection of single microwave photons using a quantum non-demolition photon detector |
-
2017
- 2017-11-23 FI FI20176051A patent/FI129000B/en active IP Right Grant
-
2018
- 2018-11-22 BR BR112020010220-2A patent/BR112020010220A2/pt not_active Application Discontinuation
- 2018-11-22 CN CN201880015944.2A patent/CN110383020B/zh active Active
- 2018-11-22 CA CA3075673A patent/CA3075673A1/en active Pending
- 2018-11-22 SG SG11202002158RA patent/SG11202002158RA/en unknown
- 2018-11-22 WO PCT/FI2018/050851 patent/WO2019102071A1/en unknown
- 2018-11-22 AU AU2018374039A patent/AU2018374039B2/en not_active Ceased
- 2018-11-22 US US16/766,152 patent/US11442086B2/en active Active
- 2018-11-22 EP EP18812221.2A patent/EP3714245B1/en active Active
- 2018-11-22 JP JP2020524100A patent/JP7253545B2/ja active Active
- 2018-11-22 KR KR1020207012677A patent/KR102672186B1/ko active IP Right Grant
- 2018-11-22 RU RU2020118472A patent/RU2768987C1/ru active
-
2020
- 2020-05-06 IL IL274498A patent/IL274498B2/en unknown
- 2020-08-18 AU AU2020101876A patent/AU2020101876A4/en not_active Revoked
Also Published As
| Publication number | Publication date |
|---|---|
| AU2020101876A4 (en) | 2020-09-24 |
| BR112020010220A2 (pt) | 2020-11-10 |
| KR20200087756A (ko) | 2020-07-21 |
| JP2021504934A (ja) | 2021-02-15 |
| CA3075673A1 (en) | 2019-05-31 |
| IL274498B2 (en) | 2023-04-01 |
| JP7253545B2 (ja) | 2023-04-06 |
| FI20176051A1 (en) | 2019-05-24 |
| CN110383020A (zh) | 2019-10-25 |
| AU2018374039A1 (en) | 2020-04-23 |
| EP3714245B1 (en) | 2022-04-13 |
| US20200284825A1 (en) | 2020-09-10 |
| SG11202002158RA (en) | 2020-04-29 |
| EP3714245A1 (en) | 2020-09-30 |
| CN110383020B (zh) | 2022-01-07 |
| KR102672186B1 (ko) | 2024-06-05 |
| AU2018374039B2 (en) | 2021-10-07 |
| RU2768987C1 (ru) | 2022-03-28 |
| IL274498A (en) | 2020-06-30 |
| IL274498B (en) | 2022-12-01 |
| WO2019102071A1 (en) | 2019-05-31 |
| US11442086B2 (en) | 2022-09-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PC | Transfer of assignment of patent |
Owner name: AALTO UNIVERSITY FOUNDATION SR. |
|
| PC | Transfer of assignment of patent |
Owner name: IQM FINLAND OY |
|
| FG | Patent granted |
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