ES2728377T3 - Procedimiento integrado para analizar cristales en depósitos - Google Patents

Procedimiento integrado para analizar cristales en depósitos Download PDF

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Publication number
ES2728377T3
ES2728377T3 ES07809184T ES07809184T ES2728377T3 ES 2728377 T3 ES2728377 T3 ES 2728377T3 ES 07809184 T ES07809184 T ES 07809184T ES 07809184 T ES07809184 T ES 07809184T ES 2728377 T3 ES2728377 T3 ES 2728377T3
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ES
Spain
Prior art keywords
sample
electron microscopy
scanning electron
energy dispersion
ray spectrometry
Prior art date
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Active
Application number
ES07809184T
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English (en)
Spanish (es)
Inventor
Mihai G M Pop
Brian Glenn Lockamon
Vladimir Oleshko
James Howe
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Framatome Inc
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Framatome Inc
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Publication of ES2728377T3 publication Critical patent/ES2728377T3/es
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Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21C—NUCLEAR REACTORS
    • G21C17/00—Monitoring; Testing ; Maintaining
    • G21C17/02—Devices or arrangements for monitoring coolant or moderator
    • G21C17/022—Devices or arrangements for monitoring coolant or moderator for monitoring liquid coolants or moderators
    • G21C17/0225—Chemical surface treatment, e.g. corrosion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
    • G01N23/2252—Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21C—NUCLEAR REACTORS
    • G21C17/00—Monitoring; Testing ; Maintaining
    • G21C17/017—Inspection or maintenance of pipe-lines or tubes in nuclear installations
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
    • G21F9/00—Treating radioactively contaminated material; Decontamination arrangements therefor
    • G21F9/001—Decontamination of contaminated objects, apparatus, clothes, food; Preventing contamination thereof
    • G21F9/002—Decontamination of the surface of objects with chemical or electrochemical processes
    • G21F9/004—Decontamination of the surface of objects with chemical or electrochemical processes of metallic surfaces
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
    • G21F9/00—Treating radioactively contaminated material; Decontamination arrangements therefor
    • G21F9/28—Treating solids
    • G21F9/30—Processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/079—Investigating materials by wave or particle radiation secondary emission incident electron beam and measuring excited X-rays
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00—Energy generation of nuclear origin
    • Y02E30/30—Nuclear fission reactors

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Food Science & Technology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
ES07809184T 2006-07-21 2007-05-24 Procedimiento integrado para analizar cristales en depósitos Active ES2728377T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/490,952 US8804897B2 (en) 2006-07-21 2006-07-21 Integrated method to analyze crystals in deposits
PCT/US2007/012471 WO2008013597A2 (fr) 2006-07-21 2007-05-24 Procédé intégré pour analyser des cristaux dans des dépôts

Publications (1)

Publication Number Publication Date
ES2728377T3 true ES2728377T3 (es) 2019-10-24

Family

ID=38981936

Family Applications (1)

Application Number Title Priority Date Filing Date
ES07809184T Active ES2728377T3 (es) 2006-07-21 2007-05-24 Procedimiento integrado para analizar cristales en depósitos

Country Status (6)

Country Link
US (1) US8804897B2 (fr)
EP (1) EP2044596B1 (fr)
JP (2) JP5550098B2 (fr)
ES (1) ES2728377T3 (fr)
TW (1) TWI471872B (fr)
WO (1) WO2008013597A2 (fr)

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WO2011011622A1 (fr) * 2009-07-23 2011-01-27 Areva Np Inc. Procédé perfectionné d’utilisation d’un outil de prélèvement d’échantillons d'impuretés (crud) sur des barres de combustible
US8664595B2 (en) 2012-06-28 2014-03-04 Fei Company Cluster analysis of unknowns in SEM-EDS dataset
US9188555B2 (en) 2012-07-30 2015-11-17 Fei Company Automated EDS standards calibration
EP2698805A1 (fr) * 2012-08-16 2014-02-19 FEI Company Procédé de réalisation EDX dans un microscope à particules chargées
US8937282B2 (en) 2012-10-26 2015-01-20 Fei Company Mineral identification using mineral definitions including variability
US9778215B2 (en) 2012-10-26 2017-10-03 Fei Company Automated mineral classification
US9048067B2 (en) 2012-10-26 2015-06-02 Fei Company Mineral identification using sequential decomposition into elements from mineral definitions
US9091635B2 (en) 2012-10-26 2015-07-28 Fei Company Mineral identification using mineral definitions having compositional ranges
US9897582B2 (en) 2012-10-26 2018-02-20 Pratt & Whitney Canada Corp. Method and system for failure prediction using lubricating fluid analysis
US9194829B2 (en) 2012-12-28 2015-11-24 Fei Company Process for performing automated mineralogy
JP6328456B2 (ja) * 2014-03-20 2018-05-23 株式会社日立ハイテクサイエンス エネルギー分散型ｘ線分析装置及びエネルギー分散型ｘ線分析方法
US9869648B2 (en) * 2014-06-26 2018-01-16 The Board Of Trustees Of The Leland Stanford Junior University High density grids
US10330664B2 (en) 2015-06-18 2019-06-25 Pratt & Whitney Canada Corp. Evaluation of component condition through analysis of material interaction
US10519800B2 (en) 2015-12-08 2019-12-31 Pratt & Whitney Canada Corp. Method and system for diagnosing a condition of an engine using lubricating fluid analysis
US10151739B2 (en) 2016-04-25 2018-12-11 Pratt & Whitney Canada Corp. Method and system for evaluation of engine condition
CN110208298B (zh) * 2019-06-03 2022-02-01 中国农业科学院农业环境与可持续发展研究所 原位分离土壤微团聚体中活性组分表征其微观结构的方法
CN113533405B (zh) * 2021-07-27 2022-08-09 唐山钢铁集团有限责任公司 一种铝硅涂层原板合金层中Al5FeSi相的观察方法
CN114216917B (zh) * 2021-11-23 2024-04-12 长江存储科技有限责任公司 测试样品的表征方法
CN114418990B (zh) * 2022-01-18 2024-05-24 北京石油化工学院 一种基于深度学习的连续工业结晶图像处理系统

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FR2504307A1 (fr) 1981-04-17 1982-10-22 Framatome Sa Procede et appareillage de prelevement de depots sur des elements combustibles irradies
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Also Published As

Publication number Publication date
TWI471872B (zh) 2015-02-01
TW200816229A (en) 2008-04-01
EP2044596B1 (fr) 2019-02-13
JP2014029347A (ja) 2014-02-13
US20140183356A1 (en) 2014-07-03
WO2008013597A2 (fr) 2008-01-31
EP2044596A4 (fr) 2016-01-27
US8804897B2 (en) 2014-08-12
JP5550098B2 (ja) 2014-07-16
JP2010504503A (ja) 2010-02-12
EP2044596A2 (fr) 2009-04-08
WO2008013597A3 (fr) 2008-11-20

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