ES2555683T3 - Infraestructura de sensor con electrónica integrada - Google Patents

Infraestructura de sensor con electrónica integrada Download PDF

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Publication number
ES2555683T3
ES2555683T3 ES05724643.1T ES05724643T ES2555683T3 ES 2555683 T3 ES2555683 T3 ES 2555683T3 ES 05724643 T ES05724643 T ES 05724643T ES 2555683 T3 ES2555683 T3 ES 2555683T3
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Prior art keywords
sensor
actuator
excitation
package
damage
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ES05724643.1T
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Seth S. Kessler
Kristin A. Jugenheimer
Aaron B. Size
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Metis Design Corp
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Metis Design Corp
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/30Measuring arrangements characterised by the use of mechanical techniques for measuring the deformation in a solid, e.g. mechanical strain gauge
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/16Measuring force or stress, in general using properties of piezoelectric devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0033Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by determining damage, crack or wear
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0075Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by means of external apparatus, e.g. test benches or portable test systems
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/045Analysing solids by imparting shocks to the workpiece and detecting the vibrations or the acoustic waves caused by the shocks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04Analysing solids
    • G01N29/12Analysing solids by measuring frequency or resonance of acoustic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/24Probes
    • G01N29/2475Embedded probes, i.e. probes incorporated in objects to be inspected
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/24Probes
    • G01N29/2481Wireless probes, e.g. with transponders or radio links
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/025Change of phase or condition
    • G01N2291/0258Structural degradation, e.g. fatigue of composites, ageing of oils
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/028Material parameters
    • G01N2291/02827Elastic parameters, strength or force
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/028Material parameters
    • G01N2291/02845Humidity, wetness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/042Wave modes
    • G01N2291/0422Shear waves, transverse waves, horizontally polarised waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/042Wave modes
    • G01N2291/0427Flexural waves, plate waves, e.g. Lamb waves, tuning fork, cantilever
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/10Number of transducers
    • G01N2291/106Number of transducers one or more transducer arrays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/26Scanned objects
    • G01N2291/269Various geometry objects
    • G01N2291/2694Wings or other aircraft parts

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Abstract

Un dispositivo (5) para su utilización en la detección de un evento en una estructura, comprendiendo el dispositivo: un encapsulado de sensor (10), comprendiendo el encapsulado: un sensor (50); un accionador (51) situado sustancialmente en el mismo plano que el sensor (50) en el interior del encapsulado de sensor (10), estando configurado el accionador (51) para excitar formas de onda en la estructura sensibles a una excitación, y estando configurado el sensor (50) para recibir ondas reflejadas propagadas por la estructura en respuesta a las formas de onda; y una placa de circuito impreso (22) en comunicación, por lo menos, con uno del sensor (50) y el accionador (51), comprendiendo la placa de circuito impreso (22): un microprocesador construido y dispuesto para recoger datos, por lo menos, desde uno del sensor (50) y el accionador (51); un generador de señal construido y dispuesto para proporcionar la excitación, por lo menos, a uno de sensor (50) y el accionador (51); y un amplificador para modificar la excitación.

Description

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accionador de cada nodo 5 excita las estructuras que están siendo monitorizadas o probadas, y los sensores de uno
o varios nodos del dispositivo 5 diferentes miden la respuesta transmitida para determinar la situación de la estructura. El dispositivo 5 en el que se produce el accionamiento se denomina el nodo maestro. Cuando se utiliza el método de emisión-recepción, la designación de nodo maestro rota de manera iterativa a través de cada uno de los diversos nodos 5, de tal modo que se pueden recoger combinaciones de funciones de transferencia. El método preferido es utilizar simultáneamente los métodos tanto de impulso-eco como de emisión-recepción. Este caso es similar al método de solamente emisión-recepción descrito anteriormente, si bien en este caso los datos reflejados desde el sensor del nodo maestro son recogidos asimismo para ser fusionados con la totalidad de los otros datos.
Las pruebas de monitorización estructural se facilitan con la electrónica de la PCB 22. El microprocesador inicia la prueba activando el generador de funciones arbitrarias para excitar el accionador en el nodo 5 e iniciando la recogida de datos mediante el registrador de datos en la PCB 22. Las pruebas pueden ser iniciadas remotamente por un usuario, estar preprogramadas para ser ejecutadas a ciertos intervalos, o ser desencadenadas por métodos pasivos. Los datos digitales de la memoria tampón son recogidos por un procesador central mediante un enlace de datos cableado o inalámbrico. Los datos son procesados por el procesador central. El microprocesador en la PCB 22 puede proporcionar procesamiento para evaluar daños localmente.
Una vez que se han recogido datos de tensión mediante uno de los métodos descritos anteriormente, existen varias maneras de descomponer estos datos con el fin de determinar el estado de la estructura. En primer lugar, los datos se pueden filtrar y se puede eliminar el ruido utilizando filtros de paso banda para eliminar ruido eléctrico de alta frecuencia y vibraciones de deriva y mecánicas de baja frecuencia. Se pueden utilizar algoritmos que comparan los niveles de energía integrados, recibidos en los sensores, para determinar si hay daños presentes; la energía reflejada aumentada y la energía transmitida reducida son ambas métricas de daños. Esto sigue con una evaluación del tiempo de vuelo de la reflexión, para determinar la posición del daño multiplicando estos resultados por la velocidad de la onda. Se puede realizar una transformada de Fourier rápida para inspeccionar el ancho de banda de la frecuencia resultante, lo que se utiliza para determinar el tipo de daño presente en la estructura. Utilizando la física de tres sensores independientes para evaluar el daño, por ejemplo, se puede minimizar la incidencia de falsos positivos.
En un sistema de dispositivos de detección de daños incorporado en una estructura, la activación del dispositivo de detección 5 se produce en un nodo maestro. La detección se produce en todos los demás nodos. Con la utilización de un único nodo maestro se puede estimar la distancia al daño, y se puede estimar asimismo el ángulo desde el nodo maestro en el que se ha detectado el daño. El procedimiento de detección de daños se puede ejecutar iterativamente haciendo que cada nodo sea el nodo maestro. Con la utilización de múltiples nodos, se puede triangular el daño.
La invención proporciona una infraestructura para un sensor o accionador que funciona utilizando una fuente de alimentación compatible, tal como un piezoeléctrico, una lámina resistiva, MEMS o corrientes parasitarias, por ejemplo. La infraestructura descrita en esta memoria proporciona una infraestructura de "caja negra" que permite que los datos y la alimentación fluyan entrando y saliendo de una red distribuida de sensores dispuestos en cadena margarita, reduciendo el cableado, el tiempo de instalación y el coste. La infraestructura se puede fabricar en masa a bajo coste, y personalizar para aplicaciones en software. El dispositivo puede ser utilizado para llevar a cabo métodos de detección de daños tales como ondas de Lamb, respuesta de frecuencia, emisión acústica y monitorización de la deformación/tensión para cualquier material o estructura conocidos.
Los expertos en la materia reconocerán, o serán capaces de determinar utilizando tan sólo la experimentación rutinaria, numerosos equivalentes a los procedimientos específicos descritos en la presente memoria. Se considera que dichos equivalentes están dentro del alcance de la invención. Se pueden realizar diversas sustituciones, alteraciones y modificaciones a la invención sin apartarse del espíritu y el alcance de la invención. Otros aspectos, ventajas y modificaciones están dentro del alcance de la invención. Los contenidos de todas las referencias, patentes concedidas y solicitudes de patentes publicadas, citadas a lo largo de esta descripción se incorporan a la misma como referencia. Los componentes, procesos y métodos apropiados de estas patentes, solicitudes y otros documentos pueden ser seleccionados para la invención y sus realizaciones.
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Claims (1)

  1. imagen1
ES05724643.1T 2004-10-07 2005-03-03 Infraestructura de sensor con electrónica integrada Active ES2555683T3 (es)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US61670504P 2004-10-07 2004-10-07
US61674804P 2004-10-07 2004-10-07
US616705P 2004-10-07
US616748P 2004-10-07
PCT/US2005/007137 WO2006041513A1 (en) 2004-10-07 2005-03-03 Sensor infrastructure

Publications (1)

Publication Number Publication Date
ES2555683T3 true ES2555683T3 (es) 2016-01-07

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US (3) US7373260B2 (es)
EP (1) EP1802938B1 (es)
ES (1) ES2555683T3 (es)
WO (1) WO2006041513A1 (es)

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US20080312846A1 (en) 2008-12-18
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EP1802938B1 (en) 2015-09-09
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US20060080048A1 (en) 2006-04-13
US7627439B1 (en) 2009-12-01
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