ES2188408B1 - Sistema de prediccion de las emisiones radiadas por un equipo electronico. - Google Patents

Sistema de prediccion de las emisiones radiadas por un equipo electronico.

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Publication number
ES2188408B1
ES2188408B1 ES200102399A ES200102399A ES2188408B1 ES 2188408 B1 ES2188408 B1 ES 2188408B1 ES 200102399 A ES200102399 A ES 200102399A ES 200102399 A ES200102399 A ES 200102399A ES 2188408 B1 ES2188408 B1 ES 2188408B1
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ES
Spain
Prior art keywords
sub
electronic equipment
value
electric field
max
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
ES200102399A
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English (en)
Other versions
ES2188408A1 (es
Inventor
Jose Emilio Rodriguez Seco
Eduardo Zabala Lekue
Eugenio Perea Olabarria
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fundacion Tecnalia Research and Innovation
Original Assignee
Fundacion Labein
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fundacion Labein filed Critical Fundacion Labein
Priority to ES200102399A priority Critical patent/ES2188408B1/es
Publication of ES2188408A1 publication Critical patent/ES2188408A1/es
Application granted granted Critical
Publication of ES2188408B1 publication Critical patent/ES2188408B1/es
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Measurement Of Radiation (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

Sistema de medición simulada de las emisiones radiadas de acuerdo a un ensayo normativo EMI por un equipo electrónico apantallado con aberturas y cables salientes, en el que se configura el equipo electrónico a medir, indicando sus parámetros físicos de volumen y los parámetros físicos de los cables conectados a él; se mide el valor de campo eléctrico X (en V/m) en dicha abertura y el valor de la intensidad Y (en A) en dicho cable, y se calcula en base a las ecuaciones **FIGURA** que en base a los datos conocidos de valor de campo (X) y de intensidad (Y) y los valores constantes (k{sub,1}), (k{sub,2}), (k{sub,3}) determina el máximo valor de campo eléctrico (E{sub,MAX}){sub,X} que produciría cada abertura y el máximo valor de campo eléctrico (E{sub,MAX}){sub,Y} que produciría cada cable para cada valor de frecuencia (). De aplicación en la industria electrónica.
ES200102399A 2001-10-30 2001-10-30 Sistema de prediccion de las emisiones radiadas por un equipo electronico. Expired - Fee Related ES2188408B1 (es)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ES200102399A ES2188408B1 (es) 2001-10-30 2001-10-30 Sistema de prediccion de las emisiones radiadas por un equipo electronico.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ES200102399A ES2188408B1 (es) 2001-10-30 2001-10-30 Sistema de prediccion de las emisiones radiadas por un equipo electronico.

Publications (2)

Publication Number Publication Date
ES2188408A1 ES2188408A1 (es) 2003-06-16
ES2188408B1 true ES2188408B1 (es) 2004-10-16

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ID=8499321

Family Applications (1)

Application Number Title Priority Date Filing Date
ES200102399A Expired - Fee Related ES2188408B1 (es) 2001-10-30 2001-10-30 Sistema de prediccion de las emisiones radiadas por un equipo electronico.

Country Status (1)

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ES (1) ES2188408B1 (es)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108490281B (zh) * 2018-01-31 2020-08-11 中国人民解放军陆军工程大学 用频装备随机噪声电磁辐射效应预测方法及终端设备

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0642028B1 (de) * 1993-09-08 1999-05-26 Gunter Langer Mess- und Experimentiersystem zur Erfassung und Bewertung des EMV-Verhaltens elektrischer Geräte, Baugruppen und Schaltungen
JP3489363B2 (ja) * 1996-12-25 2004-01-19 松下電工株式会社 回路基板の電磁障害測定方法および測定装置
EP0884690A3 (de) * 1997-06-11 2002-07-24 Infineon Technologies AG Rechnergestütztes Simulationsverfahren zur Bestimmung eines elektromagnetischen Feldes eines Körpers
JP2000261178A (ja) * 1999-03-05 2000-09-22 Sony Corp 電子機器用筐体及びその設計方法、並びに該電子機器用筐体を具備した電子機器
JP3821612B2 (ja) * 1999-07-09 2006-09-13 松下電器産業株式会社 不要輻射解析方法

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
BASE DE DATOS WPI en QUESTEL, semana 199838, Londres: Derwent Publications Ltd., AN 1998-442803, JP 10-185973 A (MATSUSHITA), resumen. *
BASE DE DATOS WPI en QUESTEL, semana 200120, Londres: Derwent Publications Ltd., AN 2001-198928, JP 2001022813 A (MATSUSHITA), resumen. *

Also Published As

Publication number Publication date
ES2188408A1 (es) 2003-06-16

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