ES2168327T3 - Procedimiento para el calibrado de un analizador de red segun el principio de 15 pasos. - Google Patents

Procedimiento para el calibrado de un analizador de red segun el principio de 15 pasos.

Info

Publication number
ES2168327T3
ES2168327T3 ES95115296T ES95115296T ES2168327T3 ES 2168327 T3 ES2168327 T3 ES 2168327T3 ES 95115296 T ES95115296 T ES 95115296T ES 95115296 T ES95115296 T ES 95115296T ES 2168327 T3 ES2168327 T3 ES 2168327T3
Authority
ES
Spain
Prior art keywords
calibration
doors
measurement
another
procedure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES95115296T
Other languages
English (en)
Inventor
Holger Dipl-Ing Heuermann
Burkhard Prof Dr Ing Schiek
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohde and Schwarz GmbH and Co KG
Rosenberger Hochfrequenztechnik GmbH and Co KG
Original Assignee
Rohde and Schwarz GmbH and Co KG
Rosenberger Hochfrequenztechnik GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohde and Schwarz GmbH and Co KG, Rosenberger Hochfrequenztechnik GmbH and Co KG filed Critical Rohde and Schwarz GmbH and Co KG
Application granted granted Critical
Publication of ES2168327T3 publication Critical patent/ES2168327T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

EN UN PROCEDIMIENTO PARA LA CALIBRACION DE UN ANALIZADOR DE RED QUE MUESTRA DOS PUERTAS DE MEDICION Y AL MENOS CUATRO LUGARES DE MEDIDA SEGUN EL PRINCIPIO DE 15 TERMINOS SE CALCULAN LOS VALORES DE CORRECCION DE ACUERDO CON LOS ESTANDARES DE CALIBRACION CONECTADOS ENTRE AMBAS PUERTAS DE MEDICION A TRAVES DE LA MEDICION EN SUCESION DE UNO SOBRE OTRO DE LOS PARAMETROS DE REFLEXION Y DE TRANSMISION EN CINCO SUCESIONES DE SERIE CUALESQUIERA UNA DESPUES DE OTRA, TENIENDOSE EN CUANTA EN LAS MEDICIONES DE OBJETOS QUE SIGUEN A CONTINUACION; PARA ELLO SE UTILIZA LA PRIMERA MEDICION DE CALIBRACION COMO STANDARD DE CALIBRADO EN UNA PUERTA CON RESISTENCIA CONOCIDA O CON DESARROLLO EN VACIO, DE TAL MODO QUE DESPUES DE CONECTADO UNA CON OTRA EN AMBAS PUERTAS DE MEDICION SE DETERMINAN LAS CUATRO MEDICIONES DE CALIBRACION RESTANTES (CALIBRACION MM O OO DE DOBLE PUERTA), UTILIZANDOSE LOS STANDARDS DE CALIBRADO, DONDE DE LOS DIECISEIS PARAMETROS DE CONTROL COMPLETOS SON SOLAMENTE CONOCIDOS ONCE, MIENTRAS QUELOS RESTANTES CINCO PARAMETROS DE CONTROL NO CONOCIDOS SE CALCULAN A PARTIR DE LOS VALORES DE MEDICION MEDIDOS DE FORMA COMPLETA A CONTINUACION.
ES95115296T 1994-10-05 1995-09-28 Procedimiento para el calibrado de un analizador de red segun el principio de 15 pasos. Expired - Lifetime ES2168327T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE4435559A DE4435559A1 (de) 1994-10-05 1994-10-05 Verfahren zur Durchführung elektrischer Präzisionsmessungen mit Selbstkontrolle

Publications (1)

Publication Number Publication Date
ES2168327T3 true ES2168327T3 (es) 2002-06-16

Family

ID=6529997

Family Applications (2)

Application Number Title Priority Date Filing Date
ES95115296T Expired - Lifetime ES2168327T3 (es) 1994-10-05 1995-09-28 Procedimiento para el calibrado de un analizador de red segun el principio de 15 pasos.
ES95115297T Expired - Lifetime ES2164128T3 (es) 1994-10-05 1995-09-28 Procedimiento de calibrado de un analizador de red de acuerdo con el principio de 7 pasos.

Family Applications After (1)

Application Number Title Priority Date Filing Date
ES95115297T Expired - Lifetime ES2164128T3 (es) 1994-10-05 1995-09-28 Procedimiento de calibrado de un analizador de red de acuerdo con el principio de 7 pasos.

Country Status (4)

Country Link
US (2) US5608330A (es)
EP (2) EP0706055B1 (es)
DE (3) DE4435559A1 (es)
ES (2) ES2168327T3 (es)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5561378A (en) * 1994-07-05 1996-10-01 Motorola, Inc. Circuit probe for measuring a differential circuit
US5748506A (en) * 1996-05-28 1998-05-05 Motorola, Inc. Calibration technique for a network analyzer
DE19639515B4 (de) * 1996-09-26 2006-10-12 Rosenberger Hochfrequenztechnik Gmbh & Co. Anordnung zum Kalibrieren eines Netzwerkanalysators für die On-Wafer-Messung an integrierten Mikrowellenschaltungen
TW346541B (en) * 1997-10-15 1998-12-01 Ind Tech Res Inst Method for calibrating stepper attenuator a method for calibrating a stepper attenuator, comprises testing the S parameters with no attenuator; separately testing the S parameters for each attenuator; etc.
DE19743712C2 (de) * 1997-10-02 2003-10-02 Rohde & Schwarz Verfahren zum Kalibrieren eines zwei Meßtore und vier Meßstellen aufweisenden vektoriellen Netzwerkanalysators nach dem 15-Term-Fehlermodell
US6060888A (en) * 1998-04-24 2000-05-09 Hewlett-Packard Company Error correction method for reflection measurements of reciprocal devices in vector network analyzers
US6188968B1 (en) * 1998-05-18 2001-02-13 Agilent Technologies Inc. Removing effects of adapters present during vector network analyzer calibration
US6300775B1 (en) 1999-02-02 2001-10-09 Com Dev Limited Scattering parameter calibration system and method
US6421624B1 (en) * 1999-02-05 2002-07-16 Advantest Corp. Multi-port device analysis apparatus and method and calibration method thereof
GB2347754A (en) * 1999-03-11 2000-09-13 Alenia Marconi Syst Ltd Measuring electromagnetic energy device parameters
US6230106B1 (en) * 1999-10-13 2001-05-08 Modulation Instruments Method of characterizing a device under test
US6571187B1 (en) * 2000-02-09 2003-05-27 Avaya Technology Corp. Method for calibrating two port high frequency measurements
US6342947B1 (en) * 2000-04-10 2002-01-29 The United States Of America As Represented By The Secretary Of The Army Optical power high accuracy standard enhancement (OPHASE) system
US6590644B1 (en) * 2001-01-12 2003-07-08 Ciena Corporation Optical module calibration system
US6643597B1 (en) * 2001-08-24 2003-11-04 Agilent Technologies, Inc. Calibrating a test system using unknown standards
JP3558074B2 (ja) * 2001-12-10 2004-08-25 株式会社村田製作所 測定誤差の補正方法、電子部品の良否判定方法および電子部品特性測定装置
US7107170B2 (en) * 2003-02-18 2006-09-12 Agilent Technologies, Inc. Multiport network analyzer calibration employing reciprocity of a device
US7064555B2 (en) * 2003-02-18 2006-06-20 Agilent Technologies, Inc. Network analyzer calibration employing reciprocity of a device
GB2409049B (en) * 2003-12-11 2007-02-21 Agilent Technologies Inc Power measurement apparatus and method therefor
DE102005005056B4 (de) 2004-09-01 2014-03-20 Rohde & Schwarz Gmbh & Co. Kg Verfahren zum Kalibrieren eines Netzwerkanalysators
EP2030028A2 (de) * 2006-06-21 2009-03-04 Rohde & Schwarz GmbH & Co. KG Verfahren und vorrichtung zur kalibrierung eines netzwerkanalysators für messungen an differentiellen anschlüssen
DE102006030630B3 (de) * 2006-07-03 2007-10-25 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg HF-Messvorrichtung, Verfahren zu deren Kalibrierung sowie Verfahren zum Bestimmen von Streuparametern mit dieser HF-Messvorrichtung
US7532014B2 (en) * 2006-08-08 2009-05-12 Credence Systems Corporation LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers
US7777497B2 (en) * 2008-01-17 2010-08-17 Com Dev International Ltd. Method and system for tracking scattering parameter test system calibration
US8436626B2 (en) * 2009-12-17 2013-05-07 Taiwan Semiconductor Manfacturing Company, Ltd. Cascaded-based de-embedding methodology
CN101782637B (zh) * 2010-03-16 2013-04-03 南京航空航天大学 基于电磁兼容分析与应用的射频电流探头特性校准方法
US8798953B2 (en) * 2011-09-01 2014-08-05 Yuan Ze University Calibration method for radio frequency scattering parameter measurement applying three calibrators and measurement structure thereof
DE102012006314A1 (de) * 2012-03-28 2013-10-02 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Zeitbereichsmessverfahren mit Kalibrierung im Frequenzbereich
CN103543425B (zh) * 2013-10-28 2016-06-29 中国电子科技集团公司第四十一研究所 一种自动补偿网络分析仪测量面变化误差的方法
US20160146920A1 (en) * 2014-11-20 2016-05-26 Sigurd Microelectronics Corp. Rf parameter calibration method
DE102014019008B4 (de) 2014-12-18 2022-05-05 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Verfahren zum Kalibrieren einer Messadaptierung mit zwei differentiellen Schnittstellen
US10890642B1 (en) 2019-07-31 2021-01-12 Keysight Technologies, Inc. Calibrating impedance measurement device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3912795A1 (de) * 1988-04-22 1989-11-02 Rohde & Schwarz Verfahren zum kalibrieren eines netzwerkanalysators
US4982164A (en) * 1988-04-22 1991-01-01 Rhode & Schwarz Gmbh & Co. K.G. Method of calibrating a network analyzer
DE3911254A1 (de) * 1989-04-07 1990-10-11 Eul Hermann Josef Dipl Ing Verfahren zur etablierung der komplexen messfaehigkeit homodyner netzwerkanalysevorrichtungen
US5313166A (en) * 1990-11-11 1994-05-17 Rohde & Schwarz Gmbh & Co. Kg Method of calibrating a network analyzer
AU3711793A (en) * 1992-05-02 1993-11-04 Laboratorium Prof. Dr. Rudolf Berthold Gmbh & Co. Kg A method of calibrating a network analyzer
DE4332273C2 (de) 1992-12-12 1997-09-25 Rohde & Schwarz Verfahren zum Kalibrieren eines Netzwerkanalysators

Also Published As

Publication number Publication date
DE59509963D1 (de) 2002-01-31
EP0706055A2 (de) 1996-04-10
EP0706055A3 (es) 1996-05-22
DE4435559A1 (de) 1996-04-11
ES2164128T3 (es) 2002-02-16
EP0706059B1 (de) 2001-12-19
US5666059A (en) 1997-09-09
DE59509906D1 (de) 2002-01-17
EP0706055B1 (de) 2001-12-05
US5608330A (en) 1997-03-04
EP0706059A1 (de) 1996-04-10

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