ES2035793A1 - Sistema optico de alta definicion. - Google Patents

Sistema optico de alta definicion.

Info

Publication number
ES2035793A1
ES2035793A1 ES919102026A ES9102026A ES2035793A1 ES 2035793 A1 ES2035793 A1 ES 2035793A1 ES 919102026 A ES919102026 A ES 919102026A ES 9102026 A ES9102026 A ES 9102026A ES 2035793 A1 ES2035793 A1 ES 2035793A1
Authority
ES
Spain
Prior art keywords
vision system
resolution
part inspection
resolution vision
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES919102026A
Other languages
English (en)
Other versions
ES2035793B1 (es
Inventor
Jr Stanley P Turcheck
Randy K Baird
James P Martin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FMC Corp
Original Assignee
FMC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FMC Corp filed Critical FMC Corp
Publication of ES2035793A1 publication Critical patent/ES2035793A1/es
Application granted granted Critical
Publication of ES2035793B1 publication Critical patent/ES2035793B1/es
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Closed-Circuit Television Systems (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)

Abstract

SISTEMA OPTICO DE ALTA DEFINICION PARA INSPECCION DE PIEZAS PARA REALIZAR UNA INSPECCION DETALLADA DE PIEZAS. UN DISPOSITIVO ACOPLADO EN CARGA PROPORCIONA ALTA DEFINICION EN AMBOS EJES X E Y. LOS DATOS PROCEDENTES DEL DISPOSITIVO DE ACOPLAMIENTO EN CARGA, RESULTANTES DE UNA PIEZA NORMALIZADA, SE ALMACENAN EN FORMA COMPRIMIDA. LOS DATOS COMPRIMIDOS DE UNA PIEZA EN INSPECCION SE COMPARAN CON LOS DATOS COMPRIMIDOS DE LA PIEZA NORMALIZADA PARA DETERMINAR SI LA PIEZA COMPROBADA ES BUENA O NO.
ES9102026A 1990-09-17 1991-09-11 Sistema optico de alta definicion. Expired - Fee Related ES2035793B1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/583,256 US5103304A (en) 1990-09-17 1990-09-17 High-resolution vision system for part inspection

Publications (2)

Publication Number Publication Date
ES2035793A1 true ES2035793A1 (es) 1993-04-16
ES2035793B1 ES2035793B1 (es) 1994-04-16

Family

ID=24332341

Family Applications (1)

Application Number Title Priority Date Filing Date
ES9102026A Expired - Fee Related ES2035793B1 (es) 1990-09-17 1991-09-11 Sistema optico de alta definicion.

Country Status (9)

Country Link
US (1) US5103304A (es)
JP (1) JPH04305774A (es)
AU (1) AU644466B2 (es)
CA (1) CA2050568A1 (es)
CH (1) CH682984A5 (es)
DE (1) DE4128753A1 (es)
ES (1) ES2035793B1 (es)
FR (1) FR2666883B1 (es)
IT (1) IT1251478B (es)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU645123B2 (en) * 1990-09-24 1994-01-06 Fmc Corporation Automatic windowing for article recognition
IL99823A0 (en) * 1990-11-16 1992-08-18 Orbot Instr Ltd Optical inspection method and apparatus
US5287293A (en) * 1990-12-31 1994-02-15 Industrial Technology Research Institute Method and apparatus for inspecting the contours of a gear
US5954583A (en) * 1992-11-05 1999-09-21 Com21 Limited Secure access control system
US5732147A (en) * 1995-06-07 1998-03-24 Agri-Tech, Inc. Defective object inspection and separation system using image analysis and curvature transformation
DE19713521B4 (de) * 1997-04-02 2004-09-23 Festo Ag & Co Vorrichtung zur Erkennung falsch orientierter und/oder von einem vorgegebenen Muster abweichender Teile
US6330354B1 (en) 1997-05-01 2001-12-11 International Business Machines Corporation Method of analyzing visual inspection image data to find defects on a device
KR100533758B1 (ko) * 2003-02-25 2005-12-06 엘에스전선 주식회사 광소자 영상획득 유닛 배열을 이용한 영상정보 획득 장치
CN110940270B (zh) * 2019-10-30 2022-04-12 深圳市凯中精密技术股份有限公司 一种连接器pin针位置度的检测方法及检测装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4457434A (en) * 1982-02-01 1984-07-03 Fmc Corporation Apparatus for orienting, singulating and sizing mushrooms and like objects
ES2007051A6 (es) * 1986-06-11 1989-06-01 Fmc Corp Procedimiento y aparato para orientar e inspeccionar piezas de trabajo

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4608709A (en) * 1983-03-08 1986-08-26 Owens-Illinois, Inc. Method and apparatus for gauging containers
JPS60263807A (ja) * 1984-06-12 1985-12-27 Dainippon Screen Mfg Co Ltd プリント配線板のパタ−ン欠陥検査装置
US4619356A (en) * 1984-08-15 1986-10-28 Fmc Corporation Programmable parts feeder
GB2175396B (en) * 1985-05-22 1989-06-28 Filler Protection Developments Apparatus for examining objects
US4678920A (en) * 1985-06-17 1987-07-07 General Motors Corporation Machine vision method and apparatus
US4707734A (en) * 1985-06-17 1987-11-17 The Perkin-Elmer Corporation Coarse flaw detector for printed circuit board inspection
JPS62173731A (ja) * 1986-01-28 1987-07-30 Toshiba Corp 被検査物の表面検査装置
US4711579A (en) * 1986-08-12 1987-12-08 H. Fred Johnston System for automatically inspecting a flat workpiece for holes
JPH0671038B2 (ja) * 1987-03-31 1994-09-07 株式会社東芝 結晶欠陥認識処理方法
JP2512871B2 (ja) * 1987-04-23 1996-07-03 株式会社ニコン パタ−ン測定装置
US4845558A (en) * 1987-12-03 1989-07-04 Kla Instruments Corporation Method and apparatus for detecting defects in repeated microminiature patterns
GB8809455D0 (en) * 1988-04-21 1988-05-25 Bp Chem Int Ltd Ruminant animal feedstuffs
JPH0276081A (ja) * 1988-09-13 1990-03-15 Yokogawa Electric Corp パターン検査装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4457434A (en) * 1982-02-01 1984-07-03 Fmc Corporation Apparatus for orienting, singulating and sizing mushrooms and like objects
ES2007051A6 (es) * 1986-06-11 1989-06-01 Fmc Corp Procedimiento y aparato para orientar e inspeccionar piezas de trabajo

Also Published As

Publication number Publication date
FR2666883A1 (fr) 1992-03-20
CH682984A5 (de) 1993-12-31
ITMI912445A1 (it) 1993-03-17
AU644466B2 (en) 1993-12-09
IT1251478B (it) 1995-05-15
AU8244091A (en) 1992-03-19
DE4128753A1 (de) 1992-03-19
FR2666883B1 (fr) 1995-11-17
JPH04305774A (ja) 1992-10-28
ES2035793B1 (es) 1994-04-16
US5103304A (en) 1992-04-07
CA2050568A1 (en) 1992-03-18
ITMI912445A0 (it) 1991-09-17

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Legal Events

Date Code Title Description
FD1A Patent lapsed

Effective date: 20010201