ES2034445T3 - Procedimiento para la evaluacion de la informacion grafica en un control superficial optico por medio de un sistema de exploracion electronico. - Google Patents
Procedimiento para la evaluacion de la informacion grafica en un control superficial optico por medio de un sistema de exploracion electronico.Info
- Publication number
- ES2034445T3 ES2034445T3 ES198989104403T ES89104403T ES2034445T3 ES 2034445 T3 ES2034445 T3 ES 2034445T3 ES 198989104403 T ES198989104403 T ES 198989104403T ES 89104403 T ES89104403 T ES 89104403T ES 2034445 T3 ES2034445 T3 ES 2034445T3
- Authority
- ES
- Spain
- Prior art keywords
- optical surface
- surface control
- image
- procedure
- exploration system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/70—Denoising; Smoothing
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/20—Image enhancement or restoration using local operators
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20212—Image combination
- G06T2207/20224—Image subtraction
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Analysis (AREA)
- Image Processing (AREA)
Abstract
EL INVENTO CONSISTE EN UN PROCEDIMIENTO PARA VALORACION DE LA INFORMACION DE IMAGEN EN UN CONTROL DE SUPERFICIE OPTICO MEDIANTE UNA SISTEMA DE EXPLORACION ELECTRONICO QUE POSIBILITA UNA ELIMINACION DE LAS INFORMACIONES SUBTERRANEAS PERJUDICIALES DE LA SUPERFICIE A OBSERVAR EN EL LUGAR DEFECTUOSO. PARA GARANTIZAR UNA MEJOR CAPACIDAD DE RECONOCIMIENTO DEL LUGAR DEFECTUOSO SE IMPELEN LAS INFORMACIONES DE PUNTO DE IMAGEN DE LA IMENGEN DE LA FUENTE (QB) A MODO DE LINEAS Y/O RANURAS POR UN FILTRO (F) UNIDIMENSIONAL EN UNA CADENCIA DADA, PARA FORMACION DE UNA IMAGEN DE LINEAS RESULTANTE (ZB) Y UN PRIMER VALOR DE FILTRO (EFWALT) DEL FILTRO UNIDIMENSIONAL (F) SE CORRIGE CON DEPENDENCIA DE OTRO VALOR DE FILTRO (LFW) EN CADA CADENCIA PARA UN NUEVO PRIMER VALOR DE FILTRO (EFWNEU). EL INVENTO ES UTILIZABLE EN PROCEDIMIENTOS OPTICOS PARA CONTROL DE SUPERFICIES, POR EJEMPLO DE PIEZAS DE CHAPA EN LA CONSTRUCCION DE AUTOMOVILES.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE3809448A DE3809448A1 (de) | 1988-03-21 | 1988-03-21 | Verfahren zur auswertung der bildinformation bei einer optischen oberflaechenkontrolle mittels eines elektronischen abtastsystems |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ES2034445T3 true ES2034445T3 (es) | 1993-04-01 |
Family
ID=6350284
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ES198989104403T Expired - Lifetime ES2034445T3 (es) | 1988-03-21 | 1989-03-13 | Procedimiento para la evaluacion de la informacion grafica en un control superficial optico por medio de un sistema de exploracion electronico. |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP0334152B1 (es) |
| DE (2) | DE3809448A1 (es) |
| ES (1) | ES2034445T3 (es) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4401263C1 (de) * | 1994-01-18 | 1995-03-09 | Helge Dipl Ing Bohlmann | Oberflächenprofilmessgerät |
| CN1172960A (zh) * | 1996-08-05 | 1998-02-11 | 顾康庭 | 显微镜用的256级灰度照明方法 |
| DE10038494A1 (de) * | 2000-08-08 | 2002-02-21 | Abb Patent Gmbh | Verfahren zur Ermittlung von verrauschten oder formveränderten Bereichen in einer Zeitreihe |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL7602468A (nl) * | 1976-03-09 | 1977-09-13 | Skf Ind Trading & Dev | Inrichting voor het controleren van de fabricage- kwaliteit van voorwerpen. |
| CH615031A5 (es) * | 1976-04-30 | 1979-12-28 | Gretag Ag | |
| DD156635A1 (de) * | 1981-03-02 | 1982-09-08 | Rainer Gutsch | Verfahren zur trennung von gestaltabweichungen technischer oberflaechen |
| DD253295A1 (de) * | 1986-10-10 | 1988-01-13 | Technisches Glas Veb K | Verfahren und anordnung zur automatischen erkennung von unregelmaessigkeiten in transparenten pruefobjekten |
-
1988
- 1988-03-21 DE DE3809448A patent/DE3809448A1/de not_active Withdrawn
-
1989
- 1989-03-13 ES ES198989104403T patent/ES2034445T3/es not_active Expired - Lifetime
- 1989-03-13 EP EP89104403A patent/EP0334152B1/de not_active Expired - Lifetime
- 1989-03-13 DE DE8989104403T patent/DE58902018D1/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| EP0334152B1 (de) | 1992-08-12 |
| DE58902018D1 (de) | 1992-09-17 |
| EP0334152A1 (de) | 1989-09-27 |
| DE3809448A1 (de) | 1989-10-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FG2A | Definitive protection |
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