ES2021655B3 - Procedimiento para medir el eje optico de un proyector de una rayo conducido y el dispositivo para realizar este procedimiento. - Google Patents
Procedimiento para medir el eje optico de un proyector de una rayo conducido y el dispositivo para realizar este procedimiento.Info
- Publication number
- ES2021655B3 ES2021655B3 ES87112608T ES87112608T ES2021655B3 ES 2021655 B3 ES2021655 B3 ES 2021655B3 ES 87112608 T ES87112608 T ES 87112608T ES 87112608 T ES87112608 T ES 87112608T ES 2021655 B3 ES2021655 B3 ES 2021655B3
- Authority
- ES
- Spain
- Prior art keywords
- procedure
- projector
- measuring
- perform
- optical axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
- G02B23/12—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices with means for image conversion or intensification
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F41—WEAPONS
- F41G—WEAPON SIGHTS; AIMING
- F41G3/00—Aiming or laying means
- F41G3/32—Devices for testing or checking
- F41G3/326—Devices for testing or checking for checking the angle between the axis of the gun sighting device and an auxiliary measuring device
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
- G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Astronomy & Astrophysics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Optical Radar Systems And Details Thereof (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Aiming, Guidance, Guns With A Light Source, Armor, Camouflage, And Targets (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19863635689 DE3635689A1 (de) | 1986-10-21 | 1986-10-21 | Verfahren zur vermessung der optischen achse eines leitstrahlprojektors und einrichtung zur durchfuehrung des verfahrens |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2021655B3 true ES2021655B3 (es) | 1991-11-16 |
Family
ID=6312095
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES87112608T Expired - Lifetime ES2021655B3 (es) | 1986-10-21 | 1987-08-29 | Procedimiento para medir el eje optico de un proyector de una rayo conducido y el dispositivo para realizar este procedimiento. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4848903A (es) |
EP (1) | EP0264591B1 (es) |
BR (1) | BR8704859A (es) |
DE (2) | DE3635689A1 (es) |
ES (1) | ES2021655B3 (es) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ATE276605T1 (de) * | 1998-11-12 | 2004-10-15 | Broadcom Corp | Integrierte tunerarchitektur |
JP4005881B2 (ja) * | 2002-08-30 | 2007-11-14 | 株式会社東芝 | 露光装置の検査方法 |
CN102057248B (zh) | 2008-06-19 | 2015-05-20 | 天宝导航有限公司 | 用于检测激光束的定位装置和方法 |
CN102494872B (zh) * | 2011-11-15 | 2014-08-06 | 中国科学院紫金山天文台 | 实时测定天文望远镜指向误差的方法 |
WO2016114694A1 (en) | 2015-01-15 | 2016-07-21 | Telefonaktiebolaget Lm Ericsson (Publ) | Method and system relating to handover |
DE202015002992U1 (de) * | 2015-04-22 | 2016-07-25 | MÖLLER-WEDEL OPTICAL GmbH | System zum Ausrichten einer Blende relativ zu einer optischen Achse |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3690594A (en) * | 1964-05-20 | 1972-09-12 | Eltro Gmbh | Method and apparatus for the determination of coordinates |
FR1516261A (fr) * | 1967-01-27 | 1968-03-08 | Nord Aviation | Procédé de meusre du dépointage d'un appareil optique et dispositif de mesure correspondant |
US3989385A (en) * | 1974-09-16 | 1976-11-02 | International Business Machines Corporation | Part locating, mask alignment and mask alignment verification system |
US4014482A (en) * | 1975-04-18 | 1977-03-29 | Mcdonnell Douglas Corporation | Missile director |
DE2536878C3 (de) * | 1975-08-19 | 1979-09-27 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Elektrooptisches Rückstrahl-Ortungsgerät, insbesondere Laserentfernungsmesser, mit Justierhilfe |
GB1569256A (en) * | 1975-11-14 | 1980-06-11 | Sira Institute | Optical apparatus and method |
JPS5382100A (en) * | 1976-12-02 | 1978-07-20 | Bofors Ab | Optical system |
DE2821170C2 (de) * | 1978-05-13 | 1986-06-26 | Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar | Einrichtung zum objektivierten Zieleinfang |
US4300736A (en) * | 1979-08-17 | 1981-11-17 | Raytheon Company | Fire control system |
JPS5729922A (en) * | 1980-07-31 | 1982-02-18 | Tokyo Optical Co Ltd | Measuring device for refractive characteristic of optical system |
DE3439273C1 (de) * | 1984-10-26 | 1985-11-14 | Eltro GmbH, Gesellschaft für Strahlungstechnik, 6900 Heidelberg | Vorrichtung zur Harmonisierung der Sichtlinien zweier Beobachtungsgeraete |
-
1986
- 1986-10-21 DE DE19863635689 patent/DE3635689A1/de active Granted
-
1987
- 1987-08-29 EP EP87112608A patent/EP0264591B1/de not_active Expired - Lifetime
- 1987-08-29 DE DE8787112608T patent/DE3769431D1/de not_active Expired - Fee Related
- 1987-08-29 ES ES87112608T patent/ES2021655B3/es not_active Expired - Lifetime
- 1987-09-22 BR BR8704859A patent/BR8704859A/pt not_active IP Right Cessation
- 1987-10-20 US US07/111,407 patent/US4848903A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE3635689A1 (de) | 1988-05-05 |
EP0264591A3 (en) | 1988-07-06 |
EP0264591A2 (de) | 1988-04-27 |
BR8704859A (pt) | 1988-05-24 |
EP0264591B1 (de) | 1991-04-17 |
DE3635689C2 (es) | 1991-01-24 |
US4848903A (en) | 1989-07-18 |
DE3769431D1 (de) | 1991-05-23 |
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