EP4248485A2 - Abnehmbare ionenquelle für axiale oder kreuzstrahlionisation - Google Patents
Abnehmbare ionenquelle für axiale oder kreuzstrahlionisationInfo
- Publication number
- EP4248485A2 EP4248485A2 EP21827311.8A EP21827311A EP4248485A2 EP 4248485 A2 EP4248485 A2 EP 4248485A2 EP 21827311 A EP21827311 A EP 21827311A EP 4248485 A2 EP4248485 A2 EP 4248485A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- ionization
- assembly
- magnet
- source
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010894 electron beam technology Methods 0.000 claims abstract description 17
- 238000010884 ion-beam technique Methods 0.000 claims abstract description 7
- 239000000523 sample Substances 0.000 claims description 37
- 238000000034 method Methods 0.000 claims description 27
- 238000000451 chemical ionisation Methods 0.000 claims description 16
- 238000003780 insertion Methods 0.000 claims description 6
- 230000037431 insertion Effects 0.000 claims description 6
- 229910000938 samarium–cobalt magnet Inorganic materials 0.000 claims description 3
- 150000002500 ions Chemical class 0.000 description 88
- 238000004949 mass spectrometry Methods 0.000 description 12
- 150000001875 compounds Chemical class 0.000 description 9
- 239000003153 chemical reaction reagent Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 4
- 238000013022 venting Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000010494 dissociation reaction Methods 0.000 description 3
- 230000005593 dissociations Effects 0.000 description 3
- 238000004252 FT/ICR mass spectrometry Methods 0.000 description 2
- 239000012491 analyte Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 238000001360 collision-induced dissociation Methods 0.000 description 2
- 238000001211 electron capture detection Methods 0.000 description 2
- 238000001077 electron transfer detection Methods 0.000 description 2
- 239000012634 fragment Substances 0.000 description 2
- 238000005040 ion trap Methods 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 238000013467 fragmentation Methods 0.000 description 1
- 238000006062 fragmentation reaction Methods 0.000 description 1
- 230000003116 impacting effect Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000037427 ion transport Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000000447 pesticide residue Substances 0.000 description 1
- 230000001846 repelling effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
Definitions
- the mass analyzer 106 can also be configured to fragment the ions using collision induced dissociation (CID) electron transfer dissociation (ETD), electron capture dissociation (ECD), photo induced dissociation (PID), surface induced dissociation (SID), and the like, and further separate the fragmented ions based on the mass-to-charge ratio.
- the mass analyzer 106 can be a hybrid system incorporating one or more mass analyzers and mass separators coupled by various combinations of ion optics and storage devices.
- a hybrid system can a linear ion trap (LIT), a high energy collision dissociation device (HCD), an ion transport system, and a TOF.
- Ionization chamber 206 can include gas inlet 222 for directing a gas sample into an ionization volume 224 defined by the ionization chamber 208.
- gas molecules within the ionization volume 224 can be ionized by the electrons from the thermionic filament 218.
- Lenses 208 and 210 can define a post ionization volume 226.
- Post ionization volume 226 can be a region where ions can be formed which has a lower pressure for the sample.
- Post ionization volume 226 can include regions of the lenses where electrons are present. In various embodiments, it may also include areas outside of the ionization volume and the lenses.
- a single rotatable magnet assembly can house differing magnets optimized for El or CI operation.
- the position of the magnet can be altered mechanically or a magnet external to the vacuum chamber can cause the magnet to rotate in the opposite position if the assembly is well balanced. This allows crossbeam ionization for PCI and NCI, while also allowing axial mode operation for high sensitivity El.
- the ability to change the electron beam orientation without the need to vent can significantly reduce down time.
- the first magnet 304 is adjacent to electron source 202 and the ion source can be operated in axial mode, such as for El.
- the electrons travel from thermionic filament 218 of source 202 along the axis 230 into ionization volume 224 of ion source 200.
- Magnetic fields from magnet 304 can provide magnetic containment reducing the spread of the electrons as they travel along the axis 230 into ionization volume 224.
- Figure 6 illustrates a method of removing of an ion source.
- the first electron source can be energized with a magnet assembly in a first position.
- the first position of the magnet assembly can align a magnet with the first electron source.
- the first electron source can produce electrons that cause the ionization a sample, as indicated at 604.
- Ionizing the sample can include direct ionization by the electrons, such as El, or indirect ionization where a reagent is ionized and reacts with the sample, such as CI.
- the ionized sample can be analyzed by mass spectrometry to identify and quantify compounds in the sample.
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US202063116075P | 2020-11-19 | 2020-11-19 | |
| PCT/US2021/060064 WO2022109252A2 (en) | 2020-11-19 | 2021-11-19 | Removable ion source capable of axial or cross beam ionization |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP4248485A2 true EP4248485A2 (de) | 2023-09-27 |
Family
ID=78918782
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP21827311.8A Pending EP4248485A2 (de) | 2020-11-19 | 2021-11-19 | Abnehmbare ionenquelle für axiale oder kreuzstrahlionisation |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP4248485A2 (de) |
| CN (1) | CN116529848A (de) |
| WO (1) | WO2022109252A2 (de) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3992632A (en) * | 1973-08-27 | 1976-11-16 | Hewlett-Packard Company | Multiconfiguration ionization source |
| US4960991A (en) * | 1989-10-17 | 1990-10-02 | Hewlett-Packard Company | Multimode ionization source |
| DE112019002405B4 (de) * | 2018-05-11 | 2023-02-23 | Leco Corporation | Zweistufige Ionenquelle, geschlossene und offene Ionenvolumen aufweisend |
-
2021
- 2021-11-19 EP EP21827311.8A patent/EP4248485A2/de active Pending
- 2021-11-19 WO PCT/US2021/060064 patent/WO2022109252A2/en not_active Ceased
- 2021-11-19 CN CN202180077115.9A patent/CN116529848A/zh active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| WO2022109252A2 (en) | 2022-05-27 |
| WO2022109252A3 (en) | 2022-07-07 |
| CN116529848A (zh) | 2023-08-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: UNKNOWN |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE |
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| 17P | Request for examination filed |
Effective date: 20230424 |
|
| AK | Designated contracting states |
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| DAV | Request for validation of the european patent (deleted) | ||
| DAX | Request for extension of the european patent (deleted) |