WO2022109252A2 - Removable ion source capable of axial or cross beam ionization - Google Patents
Removable ion source capable of axial or cross beam ionization Download PDFInfo
- Publication number
- WO2022109252A2 WO2022109252A2 PCT/US2021/060064 US2021060064W WO2022109252A2 WO 2022109252 A2 WO2022109252 A2 WO 2022109252A2 US 2021060064 W US2021060064 W US 2021060064W WO 2022109252 A2 WO2022109252 A2 WO 2022109252A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- ionization
- assembly
- magnet
- source
- electron
- Prior art date
Links
- 238000010894 electron beam technology Methods 0.000 claims abstract description 17
- 238000010884 ion-beam technique Methods 0.000 claims abstract description 7
- 239000000523 sample Substances 0.000 claims description 37
- 238000000034 method Methods 0.000 claims description 27
- 238000000451 chemical ionisation Methods 0.000 claims description 16
- 238000003780 insertion Methods 0.000 claims description 6
- 230000037431 insertion Effects 0.000 claims description 6
- 229910000938 samarium–cobalt magnet Inorganic materials 0.000 claims description 3
- 150000002500 ions Chemical class 0.000 description 88
- 238000004949 mass spectrometry Methods 0.000 description 12
- 150000001875 compounds Chemical class 0.000 description 9
- 239000003153 chemical reaction reagent Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 4
- 238000013022 venting Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000010494 dissociation reaction Methods 0.000 description 3
- 230000005593 dissociations Effects 0.000 description 3
- 238000004252 FT/ICR mass spectrometry Methods 0.000 description 2
- 239000012491 analyte Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 238000001360 collision-induced dissociation Methods 0.000 description 2
- 238000001211 electron capture detection Methods 0.000 description 2
- 238000001077 electron transfer detection Methods 0.000 description 2
- 239000012634 fragment Substances 0.000 description 2
- 238000005040 ion trap Methods 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 238000013467 fragmentation Methods 0.000 description 1
- 238000006062 fragmentation reaction Methods 0.000 description 1
- 230000003116 impacting effect Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000037427 ion transport Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000000447 pesticide residue Substances 0.000 description 1
- 230000001846 repelling effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
Definitions
- the present disclosure generally relates to the field of mass spectrometry including a removable ion source capable of axial or cross beam ionization.
- Mass spectrometry can be used to perform detailed analyses on samples. Furthermore, mass spectrometry can provide both qualitative (is compound X present in the sample) and quantitative (how much of compound X is present in the sample) data for a large number of compounds in a sample. These capabilities have been used for a wide variety of analyses, such as to test for drug use, determine pesticide residues in food, monitor water quality, and the like.
- Electrode impact ionization involves impacting the sample with electrons to produce ions.
- chemical ionization involves the ionization of a reagent gas by electron impact, and the ionized reagent gas reacts with the sample to ionize the sample.
- CI can be useful for identification of molecular weight when El results in excessive fragmentation.
- Mass spectrometers with the ability to perform multiple ionization techniques can be used to analyze a wider variety of compounds. From the foregoing it will be appreciated that a need exists for improved ion sources.
- An ion source can include an ionization assembly, first and second electron sources, and a magnet assembly.
- the ionization assembly can include an ionization chamber and at least one ion lens.
- the ionization assembly can have a primary axis defined by the direction of an ion beam exiting the ionization assembly and the ionization chamber and the at least one ion lens can be arranged along the primary axis.
- the first electron source can be aligned along the primary axis of the ionization assembly and can be configured to provide an electron beam parallel to the primary axis.
- the second electron source can be adjacent to the ionization assembly and can be configured to provide an electron beam orthogonal to the primary axis.
- the magnet assembly can include a first magnet and a second magnet. The magnet assembly can be movable between a first position in which the first magnet is aligned with the first electron source and a second position in which the second magnet is aligned with the second electron source.
- Figure 1 is a block diagram of an exemplary mass spectrometry system, in accordance with various embodiments.
- Figure 2 is a diagram of an ion source, in accordance with various embodiments.
- Figures 3A and 3B illustrate the operation of an exemplary magnet assembly in conjunction with the ion source, in accordance with various embodiments.
- Figures 4A and 4B illustrate the operation of another exemplary magnet assembly in conjunction with the ion source, in accordance with various embodiments.
- Figures 5 illustrates an exemplary method of switching between modes of an ion source, in accordance with various embodiments.
- Figures 6 illustrates an exemplary method of removing the ion source, in accordance with various embodiments.
- a “system” sets forth a set of components, real or abstract, comprising a whole where each component interacts with or is related to at least one other component within the whole.
- mass spectrometry platform 100 can include components as displayed in the block diagram of Figure 1. In various embodiments, elements of Figure 1 can be incorporated into mass spectrometry platform 100. According to various embodiments, mass spectrometer 100 can include an ion source 102, , a mass analyzer 106, an ion detector 108, and a controller 110.
- the ion source 102 generates a plurality of ions from a sample.
- the ion source can include, but is not limited to, an electron ionization (El) source, a chemical ionization (CI) source, and the like.
- the mass analyzer 106 can separate ions based on a mass-to-charge ratio of the ions.
- the mass analyzer 106 can include a quadrupole mass filter analyzer, a quadrupole ion trap analyzer, a time-of- flight (TOF) analyzer, an electrostatic trap (e.g., Orbitrap) mass analyzer, Fourier transform ion cyclotron resonance (FT-ICR) mass analyzer, and the like.
- TOF time-of- flight
- electrostatic trap e.g., Orbitrap
- FT-ICR Fourier transform ion cyclotron resonance
- the mass analyzer 106 can also be configured to fragment the ions using collision induced dissociation (CID) electron transfer dissociation (ETD), electron capture dissociation (ECD), photo induced dissociation (PID), surface induced dissociation (SID), and the like, and further separate the fragmented ions based on the mass-to-charge ratio.
- the mass analyzer 106 can be a hybrid system incorporating one or more mass analyzers and mass separators coupled by various combinations of ion optics and storage devices.
- a hybrid system can a linear ion trap (LIT), a high energy collision dissociation device (HCD), an ion transport system, and a TOF.
- the ion detector 108 can detect ions.
- the ion detector 108 can include an electron multiplier, a Faraday cup, and the like. Ions leaving the mass analyzer can be detected by the ion detector.
- the ion detector can be quantitative, such that an accurate count of the ions can be determined.
- the mass analyzer detects the ions, combining the properties of both the mass analyzer 106 and the ion detector 108 into one device.
- the controller 110 can communicate with the ion source 102, the mass analyzer 106, and the ion detector 108.
- the controller 110 can configure the ion source 102 or enable/disable the ion source 102.
- the controller 110 can configure the mass analyzer 106 to select a particular mass range to detect.
- the controller 110 can adjust the sensitivity of the ion detector 108, such as by adjusting the gain.
- the controller 110 can adjust the polarity of the ion detector 108 based on the polarity of the ions being detected.
- the ion detector 108 can be configured to detect positive ions or be configured to detected negative ions.
- Ion sources which utilize an on-axis electron beam can present problems when utilized for Chemical Ionization.
- NCI Negative Chemical Ionization
- problems with electron charging near the ion exit aperture can result in rapid loss of sensitivity due to repelling of analyte ions back into the ion volume.
- the exit aperture can be larger for NCI in order to mitigate charging, but then the electron beam passes far into the Q0 ion guide resulting in extended down time for cleaning the Q0 ion guide.
- PCI Positive Chemical Ionization
- El Electron Ionization
- FIG. 2 is a diagram illustrating an ion source 200 capable of both axial mode operation and cross-beam (Nier) type operation, which can be used as ion source 102 of mass spectrometry platform 100.
- Ion source 200 can include a first electron source 202, a second electron source 204 an electron lens 206, an ionization chamber 208, lens elements 210, 212, and 214, and RF ion guide 216.
- Ion source 200 can include an axis 230 along which ions are directed out of the ionization chamber to other components of the mass spectrometer.
- Electron source 202 can include a thermionic filament 218 and electron source 204 can include a thermionic filament 220 for the generation of electrons.
- electron sources 202 and 204 can include additional thermionic filaments for redundancy or increased electron production.
- electron sources 202 and 204 can include a field emitter.
- the electrons from electron source 202 can travel along axis 230 into ionization chamber 208 of ion source 200 to ionize gas molecules.
- Electron lens 206 can serve to prevent the ions from traveling back towards the electron source.
- the electrons from electron source 204 can travel orthogonally to the axis of the ion source 200 into the ionization chamber 208 to ionize gas molecules.
- Ionization chamber 206 can include gas inlet 222 for directing a gas sample into an ionization volume 224 defined by the ionization chamber 208.
- gas molecules within the ionization volume 224 can be ionized by the electrons from the thermionic filament 218.
- Lenses 208 and 210 can define a post ionization volume 226.
- Post ionization volume 226 can be a region where ions can be formed which has a lower pressure for the sample.
- Post ionization volume 226 can include regions of the lenses where electrons are present. In various embodiments, it may also include areas outside of the ionization volume and the lenses.
- Wall 228 can restrict the flow of gas from ionization volume 224 to the post ionization volume 226, creating a substantial pressure difference between the ionization volume 224 and post ionization volume 226. While ionization can occur in post ionization volume 226, significantly more ions can be generated in ionization volume 224 due to the lower sample density in the post ionization volume 226.
- gas molecules within the ionization volume 224 can be ionized by the electrons from the thermionic filament 220. The electrons are directed along electron source axis 232 which is orthogonal to the ion source axis 230. As the electrons are directed orthogonally into the ionization volume 232, the electrons are substantially contained within the ionization volume 224 and do not ionize gas molecules in the post ionization volume 226.
- Lens 212 and 214 and RF ion guide 216 can assist in the movement of ions along axis 230 from the ionization volume 224 to additional ion optical elements which direct the ions to mass analyzer 106 of mass spectrometry platform 100.
- a single rotatable magnet assembly can house differing magnets optimized for El or CI operation.
- the position of the magnet can be altered mechanically or a magnet external to the vacuum chamber can cause the magnet to rotate in the opposite position if the assembly is well balanced. This allows crossbeam ionization for PCI and NCI, while also allowing axial mode operation for high sensitivity El.
- the ability to change the electron beam orientation without the need to vent can significantly reduce down time.
- Figures 3A and 3B illustrate a magnet assembly 302 for use with electron ionization ion source 200 capable of both axial mode operation and crossbeam (Nier) type operation.
- the magnet assembly includes a first magnet 304 and a second magnet 306. Additionally, magnet assembly is mounted on hinge pin 308 so the magnet assembly can rotate on hinge pin 308 between a first position illustrated in Figure 3 A and a second position illustrated in Figure 3B.
- the first magnet 304 is adjacent to electron source 202 and the ion source can be operated in axial mode, such as for El.
- the electrons travel from thermionic filament 218 of source 202 along the axis 230 into ionization volume 224 of ion source 200.
- Magnetic fields from magnet 304 can provide magnetic containment reducing the spread of the electrons as they travel along the axis 230 into ionization volume 224.
- the second magnet 306 is adjacent to the electron source 204 and the ion source can be operated cross-beam (Nier) mode, such as for PCI and NCI.
- the electrons travel from thermionic filament 220 of source 204 along the electron source axis 232 into ionization volume 224 of ion source 200.
- Magnetic fields from magnet 306 can provide magnetic containment reducing the spread of the electrons as they travel along the axis 230 into ionization volume 224.
- the rotation of magnet assembly 302 into the second position can allow passage of ion source assembly 200 via a vacuum insertion/removal tool (IR Tool) without venting.
- IR Tool vacuum insertion/removal tool
- Figures 4A and 4B illustrate a single magnet assembly 402 which can rotate about 270 degrees around pivot point 408.
- the position of the magnet can be altered mechanically. This allows cross-beam ionization for PCI and NCI, while also allowing axial mode operation for high sensitivity El.
- the ability to change the electron beam orientation without the need to vent can significantly reduce down time.
- Figures 4A and 4B illustrate a magnet assembly 402 for use with electron ionization ion source 200 capable of both axial mode operation and crossbeam (Nier) type operation.
- the magnet assembly includes a first magnet 404 and a second magnet 406. Additionally, magnet assembly is mounted on pivot point 408 so the magnet assembly can rotate 270 degrees between a first position illustrated in Figure 4 A and a second position illustrated in Figure 4B.
- magnets 404 and 406 are adjacent to one another, magnets 404 and 406 can be oriented to reinforce one another and create a stronger magnetic field. Thus, the use of smaller magnets or even a single magnet are possible.
- magnets 404 and 406 are aligned with electron source 202 and the ion source can be operated in axial mode, such as for El.
- the electrons travel from thermionic filament 218 of source 202 along the axis 230 into ionization volume 224 of ion source 200.
- Magnetic fields from magnets 404 and 406 can provide magnetic containment reducing the spread of the electrons as they travel along the axis 230 into ionization volume 224.
- magnets 404 and 406 are aligned with the electron source 204 and the ion source can be operated cross-beam (Nier) mode, such as for PCI and NCI.
- the electrons travel from thermionic filament 220 of source 204 along the electron source axis 232 into ionization volume 224 of ion source 200.
- Magnetic fields from magnets 404 and 406 can provide magnetic containment reducing the spread of the electrons as they travel along the axis 230 into ionization volume 224.
- the rotation of magnet assembly 402 into the second position can allow passage of ion source assembly 200 via a vacuum insertion/removal tool (IR Tool) without venting.
- IR Tool vacuum insertion/removal tool
- the magnet assembly 402 can be moved by a mechanical linkage or an electric motor.
- an external magnet can apply a force to magnets 404 and 406 to cause the rotation of the magnet assembly.
- a counterweight can be used to balance the weight of the magnet to reduce the force needed to rotate the magnet assembly 402 around pivot point 408.
- the magnets can avoid direct contact with high temperature source parts.
- the magnet assembly can be attached to a rotatable shaft made of heat conductive aluminum in contact with cooler portions of the vacuum chamber.
- the magnet may further comprise temperature compensated Samarium Cobalt magnets which have a low change in B as a function of temperature.
- the ion source can be used with direct insertion probes (DIP) and direct exposure probes (DEP) when the magnet assembly is in the second position and aligned for cross-beam (Nier) mode.
- DIP direct insertion probes
- DEP direct exposure probes
- Figure 5 illustrates a method of switching modes of an ion source.
- the first electron source can be energized with a magnet assembly in a first position.
- the first position of the magnet assembly can align a magnet with the first electron source.
- the first electron source can produce electrons that cause the ionization a sample, as indicated at 504.
- Ionizing the sample can include direct ionization by the electrons, such as El, or indirect ionization where a reagent is ionized and reacts with the sample, such as CI.
- the ionized sample can be analyzed by mass spectrometry to identify and quantify compounds in the sample.
- the first electron source can be turned off, and, at 508, the magnet assembly can be rotated to a second position.
- the second position of the magnet assembly can align a magnet with a second electron source.
- the second electron source can be energized, and, at 512, the electrons produced by the second electron source can cause the ionization of a sample.
- Ionizing the sample can include direct ionization by the electrons, such as El, or indirect ionization where a reagent is ionized and reacts with the sample, such as CI.
- the ionized sample can be analyzed by mass spectrometry to identify and quantify compounds in the sample.
- the second electron source can be turned off, and at 516, the magnet assembly can be rotated back to the first position. Once in the first position, the method can return to 502 to use the first electron source.
- Figure 6 illustrates a method of removing of an ion source.
- the first electron source can be energized with a magnet assembly in a first position.
- the first position of the magnet assembly can align a magnet with the first electron source.
- the first electron source can produce electrons that cause the ionization a sample, as indicated at 604.
- Ionizing the sample can include direct ionization by the electrons, such as El, or indirect ionization where a reagent is ionized and reacts with the sample, such as CI.
- the ionized sample can be analyzed by mass spectrometry to identify and quantify compounds in the sample.
- the first electron source can be turned off, and, at 608, the magnet assembly can be rotated to a second position. In the second position of the magnet assembly, the magnet assembly may not block removal of the ion source.
- the first electron source and/or the ion source can be removed and/or replaced.
- the ion source can be removed without venting the vacuum chamber, such as by isolating the ion source from the vacuum chamber.
- the ion source can be cleaned and reinstalled.
- the electron source can be replaced, such as when a thermionic filament fails.
- the magnet assembly can be rotated back to the first position. Once in the first position, the method can return to 602 to use the first electron source.
- the specification may have presented a method and/or process as a particular sequence of steps.
- the method or process should not be limited to the particular sequence of steps described.
- other sequences of steps may be possible. Therefore, the particular order of the steps set forth in the specification should not be construed as limitations on the claims.
- the claims directed to the method and/or process should not be limited to the performance of their steps in the order written, and one skilled in the art can readily appreciate that the sequences may be varied and still remain within the spirit and scope of the various embodiments.
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202180077115.9A CN116529848A (en) | 2020-11-19 | 2021-11-19 | Removable ion source capable of axial or transverse beam ionization |
US18/251,934 US20240021426A1 (en) | 2021-11-19 | 2021-11-19 | Removable Ion Source Capable Of Axial Or Cross Beam Ionization |
EP21827311.8A EP4248485A2 (en) | 2020-11-19 | 2021-11-19 | Removable ion source capable of axial or cross beam ionization |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US202063116075P | 2020-11-19 | 2020-11-19 | |
US63/116,075 | 2020-11-19 |
Publications (2)
Publication Number | Publication Date |
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WO2022109252A2 true WO2022109252A2 (en) | 2022-05-27 |
WO2022109252A3 WO2022109252A3 (en) | 2022-07-07 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2021/060064 WO2022109252A2 (en) | 2020-11-19 | 2021-11-19 | Removable ion source capable of axial or cross beam ionization |
Country Status (3)
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EP (1) | EP4248485A2 (en) |
CN (1) | CN116529848A (en) |
WO (1) | WO2022109252A2 (en) |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3992632A (en) * | 1973-08-27 | 1976-11-16 | Hewlett-Packard Company | Multiconfiguration ionization source |
US4960991A (en) * | 1989-10-17 | 1990-10-02 | Hewlett-Packard Company | Multimode ionization source |
JP7112517B2 (en) * | 2018-05-11 | 2022-08-03 | レコ コーポレイション | Ion source and mass spectrometer |
-
2021
- 2021-11-19 EP EP21827311.8A patent/EP4248485A2/en active Pending
- 2021-11-19 CN CN202180077115.9A patent/CN116529848A/en active Pending
- 2021-11-19 WO PCT/US2021/060064 patent/WO2022109252A2/en active Application Filing
Also Published As
Publication number | Publication date |
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EP4248485A2 (en) | 2023-09-27 |
CN116529848A (en) | 2023-08-01 |
WO2022109252A3 (en) | 2022-07-07 |
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