Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
  • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
  • G01N27/622—Ion mobility spectrometry
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
  • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
  • G01N27/68—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using electric discharge to ionise a gas
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J49/00—Particle spectrometers or separator tubes
  • H01J49/0027—Methods for using particle spectrometers
  • H01J49/0031—Step by step routines describing the use of the apparatus
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J49/00—Particle spectrometers or separator tubes
  • H01J49/0027—Methods for using particle spectrometers
  • H01J49/0036—Step by step routines describing the handling of the data generated during a measurement
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J49/00—Particle spectrometers or separator tubes
  • H01J49/02—Details
  • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
  • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J49/00—Particle spectrometers or separator tubes
  • H01J49/02—Details
  • H01J49/06—Electron- or ion-optical arrangements
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J49/00—Particle spectrometers or separator tubes
  • H01J49/02—Details
  • H01J49/06—Electron- or ion-optical arrangements
  • H01J49/061—Ion deflecting means, e.g. ion gates
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J49/00—Particle spectrometers or separator tubes
  • H01J49/02—Details
  • H01J49/06—Electron- or ion-optical arrangements
  • H01J49/067—Ion lenses, apertures, skimmers
• • H—ELECTRICITY
  • H01—ELECTRIC ELEMENTS
  • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
  • H01J49/00—Particle spectrometers or separator tubes
  • H01J49/02—Details
  • H01J49/10—Ion sources; Ion guns
  • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
  • H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge

Definitions

• the present invention relates to methods and apparatus, and in particular methods and apparatus for analysing substances by detecting ions, and still more particularly to ion shutters for such apparatus and methods of controlling such ion shutters
• IMS Ion mobility spectrometers
• IMS can identify material from a sample of interest by ionising the material (e.g., molecules, atoms, and so forth) and measuring the time it takes the resulting ions to travel a known distance under a known electric field. Typically this time is measured from the time an ion gate (which may also be referred to as an ion shutter) is opened, to the time that ion arrives at a detector such as a Faraday cup.
• a detector such as a Faraday cup.
• Each ion's time of flight is associated with the ion's mobility.
• An ion's mobility relates to its mass and geometry. Therefore, by measuring the time of flight of an ion it is possible to infer its identity. These times of flight may be displayed graphically or numerically as a spectrum.
• IMS cells include detectors which collect ions to measure their time of flight so they can be identified, this may be done in the presence of a drift gas so that mobility effects can separate the ions.
• Some IMS cells may separate ions according to their time of flight so that ions having selected times of flight (implying a selected range of ion mobilities) can be provided to other detector instruments, such as mass spectrometers, for further analysis.
• IMS-MS In which an IMS cell is used as an ion filter to select ions from a sample. The selected ions are then provided to a mass spectrometer.
• groups of ions can be released from a reaction region by opening an ion shutter and/or passed into an inlet of a mass spectrometer.
• the reaction region of an IMS cell has a finite length, and in the time interval for which the shutter is held open, ions which may be distributed around the reaction region must travel (at least partially) across that reaction region to reach the shutter.
• the opening of the shutter of a pulsed ionisation source IMS spectrometer is normally synchronized to the ion pulse generation.
• This synchronization includes the so called "gate delay" which occurs a fixed time after the ion pulse has been generated. This delay is required so that the ion pulse will be present at the shutter when it is opened.
• the gate delay selects which ions are admitted into the detector from any given pulse of an ionisation source. Due to mobility effects in the reaction region a shorter delay tends to allow more of the smaller, more mobile, ions into the drift region. On the other hand, a longer gate delay may promote admittance of ions of lower mobility into the drift region. The more mobile ions may comprise so called reactant ions, whereas the less mobile ions may comprise product ions.
• the gate delay may be set so that both the reactant ion peak (RIP) and product ions will be visible in a typical sample spectrum.
• Such "middle ground” setting of the gate delay may exclude some of the product ions from entering the drift tube. Thus the apparent sensitivity of the detector to this type of ion will be reduced.
• Embodiments of the present disclosure may aim to improve the apparent sensitivity of an IMS detector and to reduce the above- described problem of "mobility selection".
• a method of operating an ion mobility spectrometer comprising: drawing a sample of gaseous fluid into a reaction region of the ion mobility spectrometer; providing a first pulse of a pulsed ionisation source to ionise the sample of gaseous fluid, thereby to obtain first sample ions; after a first gate delay following the first trigger opening an ion shutter to permit a portion of the first sample ions to leave the reaction region; providing a second pulse of the pulsed ionisation source to further ionise the sample of gaseous fluid, thereby to obtain second sample ions; after a second gate delay following the first trigger opening the ion shutter to permit a portion of the second sample ions to leave the reaction region, wherein the second gate delay is different from the first gate delay.
• the second gate delay may be selected so that the portion of second sample ions comprises reactant ions in preference to product ions.
• the first gate delay may be longer than the second gate delay.
• the first gate delay may be selected so that the portion of first sample ions comprises product ions in preference to reactant ions.
• These and other methods described herein may comprise obtaining ion spectrum data based on analysing at least one of (a) the portion of first sample ions and (b) the portion of second sample ions, thereby to control subsequent operation of an ion shutter of the ion mobility spectrometer based on said analysing of the at least one of (a) and (b).
• Controlling subsequent operation of the ion shutter may comprise selecting a subsequent gate delay based on a product ion peak in the obtained ion spectrum data.
• selecting the subsequent gate delay may comprise selecting a gate delay to increase the amplitude of the product ion peak, e.g. by choosing a gate delay which permits a greater number of ions having that range of mobilities to pass through the gate. It will be appreciated by the skilled addressee in the context of the present disclosure that whilst the precise time for an ion species to travel from the ion source to the gate cannot be analytically defined for all systems in general, for any given system it is possible empirically to determine a range of gate delays appropriate for increasing sensitivity to ions of a particular mobility.
• Controlling subsequent operation of the ion shutter may comprise reducing a gate width during a gate delay interval associated with the product ion peak.
• gate delay for sensitivity to particular ion species which may be expected in a sample one or more of the gate delays used in a sequence of such delays may be chosen based on the mobility of a calibrant, e.g. to enhance a calibrant peak.
• Drawing the sample of gaseous fluid may comprise operating a pressure pulser to draw the sample into the reaction region, wherein the first pulse of the ionisation source and the second pulse of the ionisation source are both performed prior to the next operation of the pressure pulser.
• the methods described herein may comprise determining first ion spectrum data based on analysing the first sample ions; determining second ion spectrum based on analysing the second sample ions; and combining the first ion spectrum data and the second ion spectrum data to provide a combined spectrum for identifying a substance of interest in the sample of gaseous fluid.
• An aspect provides a detector comprising: a pulsed ionisation source for ionising gaseous fluid in a reaction region of the detector instrument; an ion shutter; and a controller operable to: operate the pulsed ionisation source to provide a first pulse to ionise a sample of gaseous fluid in the reaction region, thereby to obtain first sample ions; control the ion shutter to provide a first gate delay between the operating of the ioniser and opening the ion shutter to permit a portion of the first sample ions to leave the reaction region; operate the pulsed ionisation source to provide a second pulse to further ionise the sample of gaseous fluid in the reaction region, thereby to obtain second sample ions, and to control the ion shutter to provide a second gate delay between the operating of the ioniser and opening the ion shutter to permit a portion of the second sample ions to leave the reaction region; wherein the second gate delay is different from the first gate delay.
• the second gate delay may be selected so that the portion of second sample ions comprises reactant ions in preference to product ions.
• the first gate delay may be longer than the second gate delay.
• the first gate delay may be selected so that the portion of first sample ions comprises product ions in preference to reactant ions.
• the controller may be configured to obtain ion spectrum data based on analysing at least one of (a) the portion of first sample ions and (b) the portion of second sample ions.
• the controller may be configured to control subsequent operation of the ion shutter based on said analysing, for example it may be configured to select a subsequent gate delay based on the timing of a product ion peak in the obtained ion spectrum data.
• Selecting the subsequent gate delay comprises selecting a gate delay to increase sensitivity to the product ion peak (e.g. to increase the amplitude achievable at a given gate width).
• Controlling subsequent operation of the ion shutter may comprise reducing a gate width during a gate delay interval associated with the product ion peak.
• At least one gate delay may be selected based on the mobility of a calibrant.
• the detectors described herein may comprise a pressure pulser (e.g. an electromechanical actuator which drives a diaphragm in the manner of a loudspeaker).
• a pressure pulser may be arranged to provide samples of gaseous fluid from an inlet of the instrument into the reaction region. Drawing the sample of gaseous fluid comprises operating the pressure pulser to draw the sample into the reaction region - e.g. by providing temporary reductions of pressure in the reaction region.
• the controller may be configured so that after operating the pressure pulser to draw the sample into the reaction region the first pulse of the ionisation source and the second pulse of the ionisation source are both performed prior to the next operation of the pressure pulser.
• An aspect provides a method of configuring an ion mobility spectrometry apparatus, the method comprising: programming a controller of the apparatus to perform the method of any of the methods described or claimed herein.
• such a controller may be connected for controlling a pulsed ionisation source and an ion shutter of the apparatus, and/or coupled to a detector of the apparatus for obtaining ion spectrum data and/or connected for controlling a pressure pulser of the apparatus for providing samples of gaseous fluid into the reaction region.
• An aspect of the disclosure provides a computer program product, such as a computer readable signal or tangible non-transitory computer readable storage medium comprising program instructions for programming a controller of an ion mobility spectrometry apparatus to perform any of the methods described or claimed herein.
• a computer program product such as a computer readable signal or tangible non-transitory computer readable storage medium comprising program instructions for programming a controller of an ion mobility spectrometry apparatus to perform any of the methods described or claimed herein.
• Figure 1 shows a cut away view of an ion mobility spectrometer
• Figure 2 is a flow chart illustrating a method of operation of such an ion mobility spectrometer
• Figure 3 shows a schematic diagram of an example of an ion mobility spectrometer of the type illustrated in Figure 1;
• Figure 4 is a timing diagram illustrating operation of such an ion mobility spectrometer to implement a method of the type indicated by Figure 2;
• Figure 5 is a flow chart illustrating a method of operation such as that explained with reference to Figure 2 and/or Figure 4;
• Figure 6 is a flow chart illustrating a further such method of operation of an ion mobility spectrometer.
• Figure 1 shows a cut away view of an ion mobility spectrometer
• the ion mobility spectrometer of Figure 1 comprises a reaction region 102, a pulsed ionisation source 104 for ionising gaseous fluid in the reaction region 102, an ion shutter 105 and a controller 120.
• the controller 120 is connected to the ionisation source 104 and to the shutter 105.
• the controller 120 provides a series of pulses of the ionisation source 104.
• the controller 120 opens the ion shutter 105 after a "gate delay", ions generated by that pulse then travel out of the reaction region along the drift region of the spectrometer to a detector such as a Faraday cup.
• Each pulse of operation of the ionisation source 104 can thus be used to provide an ion mobility spectrum.
• the series of spectra arising from the series of pulses applied to each sample are then combined to provide a spectrum for that sample.
• the controller 120 illustrated in Figure 1 is configured to change the gate delay so that a different gate delay is used for at least one pulse of the series of pulses.
• An ion mobility spectrum produced by combining spectra produced using different gate delays reduces the problems which might otherwise be caused by "mobility selection".
• IMS ion mobility spectrometry
• the IMS cell comprises a housing, such as a tube 101.
• the reaction region 102 is at one end inside this housing 101, and separated from a detector 118 by a drift region 103.
• the reaction region 102 is separated from the drift region 103 by the ion shutter 105.
• the housing 101 comprises an inlet 108 for enabling a sample of gaseous fluid (such as vapour, and/or gas, and/or an aerosol) to be introduced into the reaction region 102.
• gaseous fluid such as vapour, and/or gas, and/or an aerosol
• the pulsed ionisation source 104 is arranged for ionising the sample in the reaction region.
• the pulsed ionisation source 104 comprises a corona point.
• the pulsed ionisation source 104 is connected so that the controller 120 can control the delivery of electrical energy to the controller 120, such as by switching on the supply of a pulse of electrical power.
• each pulse of operation of the ionisation source 104 may comprise a period during which a series of voltage spikes are applied across the electrodes of the ionisation source 104.
• the ionisation source 104 may have some capacitance, so the delivery of a short DC pulse may give rise to some "ringing".
• the application of a pulse by the ionisation source 104 may comprise switching the ionisation source 104 from an 'off' state into an active state in which ions are generated, sometimes by a series of voltage spikes (e.g. generated by an AC voltage, which may be associated by such ringing) before the source is returned to an 'off' state.
• a series of voltage spikes e.g. generated by an AC voltage, which may be associated by such ringing
• the ion shutter 105 comprises two electrodes 106, 107, which are coupled to the controller 120 to enable a barrier voltage to be provided between the two electrodes 106, 107.
• this barrier voltage acts to prevent ions from travelling from the reaction region into a drift region of the IMS, and an open state in which ions can travel into the drift region towards the detector.
• the ion shutter 105 may comprise a Tyndall-Powell, Bradbury-Nielsen shutter, or other type of shutter.
• the shutter electrodes 106, 107 may each comprise elongate conductors, and the elongate conductors of the first shutter electrode 106 may be aligned in the drift direction with the elongate conductors of the second shutter electrode 107.
• each shutter electrode 106, 107 may be arranged as a grid, such as a mesh, for example a triangular, rectangular, hexagonal, or other regular or irregular mesh.
• the shutter electrodes 106, 107 need not be separated in the drift direction.
• they may be coplanar, in which case the elongate conductors may be interdigitated, for example they may be interleaved or interwoven.
• the drift region 103 lies between the reaction region 102 and a detector 118 such as a collector, for example a Faraday cup for detecting the arrival of ions, or another type of a detector 118 such as a mass spectrometer. Where such another type of detector is used, an inlet of that detector may be used in place of the Faraday cup, and an additional ion shutter may be interposed between the drift region and the inlet of that detector. This can be used to select (e.g. filter) ions which are provided to that other detector according to their time of flight.
• a detector 118 such as a collector, for example a Faraday cup for detecting the arrival of ions, or another type of a detector 118 such as a mass spectrometer.
• an inlet of that detector may be used in place of the Faraday cup, and an additional ion shutter may be interposed between the drift region and the inlet of that detector. This can be used to select (e.g. filter) ions which are provided to that other detector according
• a voltage profile may be provided in the drift region 103 using a series of drift electrodes 103a, 103b spaced apart along the drift region.
• a repeller plate or other electrode may be arranged for extending this voltage profile into the reaction region 102.
• the profile voltage varies spatially (e.g. as a function of displacement along the cell in the drift direction) to provide an electric field that moves ions along the cell 100 towards the detector 118.
• the electric field may be uniform and/or known along the drift region 103 and/or the reaction region 102.
• the controller 120 comprises a programmable processor, an output interface such as a DAC (not shown in the drawings) which is able to control the provision of appropriate electrical control signals and/or power supply to the ion shutter and to the ionisation source 104.
• the controller 120 is thus operable to operate the pulsed ionisation source 104, and to control the ion shutter.
• the controller 120 may also store timing data indicating the gate delay associated with certain types of ion. For example, it may comprise data indicating the gate delay associated with preferentially selecting reactant ions and/or other types of ions such as a calibrant.
• the IMS cell 100 illustrated in Figure 1 may also comprise a drift gas inlet 122 into the drift region near the detector, and a drift gas outlet near the shutter so that a flow of (cleaned, dried) drift gas can be provided against the direction of travel of the ions towards the detector.
• a sample of gaseous fluid such as vapour is provided 300 into the reaction region 102.
• the controller 120 then triggers the provision of electrical power to the pulsed ionisation source 104, which provides a pulse of ionising energy.
• Reactant ions, generated by this pulse of ionising energy are mixed 302 with the sample in the reaction region to create a cloud of product ions (e.g. ionised sample) and reactant ions.
• the controller 120 waits for a selected time period (the first gate delay) before opening 304 the ion shutter.
• the gate delay may comprise the time between rising edge of the corona trigger and a predetermined point in the operation of the ion gate.
• the gate is held open for a period, generally referred to as the "gate width", before being closed again.
• the gate width is at least a microsecond, and may be less than 10ms.
• the gate widths which are used in practice may be selected based on the length of the drift chamber, and the degree of sensitivity required, and the desired timing resolution. For example for a drift tube 4cm in length a gate width of between 80 to 180 mb may be used.
• first sample ions Of the cloud of product ions and reactant ions generated by the first ionisation of the sample (which may be referred to herein as first sample ions), only that portion of ions which arrive at the gate during the gate width are allowed 306 to travel through the gate towards the detector. The more mobile ions, which arrive prior to opening of the shutter, and the less mobile ions which arrive after it has closed, are prevented from passing the gate (for example they may be neutralised at the shutter).
• the controller 120 then triggers the provision of electrical power to the pulsed ionisation source 104 for a second time which provides a pulse of ionising energy to further ionise 308 the sample which remains in the reaction region 102, left over from the previous operation of the ionisation source 104.
• This generates a further cloud of product ions and reactant ions (which may be referred to herein as second sample ions).
• the controller 120 After the ionisation source 104 has been operated this second time, to further ionise the sample from which the first sample ions were derived, the controller 120 then waits for a selected time period to provide a second gate delay, different from the first gate delay, before opening 310 the ion shutter.
• a portion of the second sample ions are selected to leave the reaction region during this second gate width, but because of the different gate delay the distribution of ion mobilities in that portion of ions will differ from that of the portion of the first sample ions, even though the first sample ions and the second sample ions were derived from the same sample. Accordingly, by using a series of different gate widths a better representation of the components of the sample can be obtained.
• the controller 120 may be configured to implement a number of refinements of the approach described above.
• the controller 120 may be configured so that, of the two gate delay times, the longer delay is used for the first sample ions and the shorter delay is used for the second sample ions. This may help to address the problem that sample concentration in the reaction region tends to reduce over time as sample is carried away by the drift gas, or otherwise diffuses out of the reaction region.
• the portion of the first sample ions which is selected using the first (longer) gate delay may be obtained whilst the sample concentration in the reaction region is higher. This may improve sensitivity.
• the second sample ions, selected using the second (shorter) gate delay may comprise relatively more reactant ions than the first sample ions. Thus the reactant ion peak can be obtained when sample has been depleted without loss of sensitivity to the sample ions. Different sequences of gate delays may be used.
• a selectable sequence of gate delays may be used.
• a sequence of ionisation events may take place and for each ionisation event the gate may be opened and closed, thus providing a sequence of ionisation & gating events.
• the gate delay of each such event may be selected by the controller 120 e.g. according to pre-stored data.
• the pre-stored data may comprise a set of sequences; each sequence adapted for detection of particular substances or for use in particular circumstances. Different types of sequences may be used, for example:
• sequences of the same type may also be stored, for example sequences of any of the above types and having one or more different absolute values of gate delay for use in detecting particular substances or in particular circumstances.
• the controller 120 may be configured to respond to user input and/or based on some sensed condition (such as temperature or humidity) to select one or more of the stored sequences from the pre-stored data.
• the pre-stored data may comprise a sequence for use in calibration, and a sequence for use in sampling.
• FIG 3 is a schematic diagram of an example of an ion mobility spectrometer of the type illustrated in Figure 1.
• the ion mobility spectrometer shown in Figure 3 is identical to that described with Figure 1 in that it comprises an ionisation source 104, a reaction region 102 separated from a drift region 103 by an ion shutter 105, and a controller 120 for controlling the ion shutter and the ionisation source 104.
• the spectrometer illustrated in Figure 3 also comprises drift electrodes 103a, 103b for providing the electric field in the drift region 103.
• a drift gas inlet 122 is provided into the drift region 103 near the detector 118, and a drift gas outlet 124 near the shutter so that a flow of drift gas can be provided against the direction of travel of the ions towards the detector.
• the spectrometer illustrated in Figure 3 may also comprise a pressure pulser 126.
• a pressure pulser 126 may comprise a transducer, such as an electromechanical transducer, arranged in the manner of a miniature loudspeaker.
• a transducer may be operable to drive a diaphragm or other means for providing pulsed changes of pressure in the reaction region 102.
• Figure 4 is a timing diagram comprising 4 pairs of axes.
• the first 400 illustrates the timing of operation of the pressure pulser
• the second 402 illustrates the concentration of the sample in the reaction region
• the third 404 illustrates the switching on and off of the pulsed ionisation source 104
• the fourth 406 illustrates operation of the gate.
• the timing diagram shown in Figure 4 illustrates operation of an ion mobility spectrometer such as that illustrated in Figure 3.
• the pressure pulser 126 is operated 408 to draw a sample of gaseous fluid into the reaction region 102. This provides an initial sample concentration 410.
• the controller 120 then triggers 412 operation of the pulsed ionisation source 104. This generates reactant ions, which are then combined with the sample to ionise the sample generating the first sample ions. As shown, this reduces the sample concentration 414.
• the ion shutter 105 is held closed after the ionisation source 104 has been operated for a first gate delay 416.
• the ioniser is then operated again 420 to further ionise the sample remaining in the reaction region from the preceding operation of the ioniser. As shown this further reduces the sample concentration 422, and also generates the second sample ions.
• the shutter is held closed after the second operation 420 of the ionisation source 104 for the second gate delay 424, before it is opened to let a portion of the second sample ions travel towards the detector 118.
• the ion shutter is then closed again, and the cycle may be repeated - for example by operating the ioniser for a third time to still further ionise the remnants of the original sample, and generate third sample ions which may be analysed using a third gate delay 426.
• This cycle (operate ioniser, apply gate delay, open gate) may be repeated any number of times for each operation of the pressure pulser, so that each operation of the pressure pulser may be associated with a series of sets of ion mobility data, each obtained using a different gate delay.
• sample concentration is shown as being constant between the pulses 424, 426, 428 of ionisation source 104, it will be appreciated that the sample concentrations 410, 414, 422, generally also decrease over time as sample diffuses out of the reaction region and is carried away by bulk flow (e.g. in the drift gas).
• the methods of operation illustrated in Figure 2 and Figure 4 may each be further developed in a variety of ways.
• controller 120 may be configured to control the gate delay and/or the gate width of the ion shutter 105 based on ion spectrum data.
• Figure 5 shows a flow chart illustrating one such example.
• the detector 118 of the IMS cell illustrated in Figure 1 may also be connected to the controller 120.
• the controller 120 may thus obtain 502 ion spectrum data e.g. from the first and/or second sample ions. It may then determine whether peaks are present in the ion spectrum data, for example peaks associated with particular product ions and/or particular times of flight. As will be appreciated by the skilled practitioner having read the present disclosure, such peaks may be identified in the ion spectrum data by thresholding or other methods such as curve fitting (e.g. fitting a Gaussian).
• the controller 120 can thus obtain data indicating the time of flight of ions from the ion shutter to the detector, but other methods may be used.
• the controller 120 may be configured to use such data to select a gate delay (or sequence of gate delays as defined above) e.g. based on the timing of one or more peaks and/or based on the detection of a particular substance or species of ion.
• the time of arrival thus determined can then be used to determine at least one gate delay for subsequent analysis of the sample, or a subsequent sample e.g. according to a method such as that illustrated in Figure 2 or Figure 4.
• Selecting the gate delay in this way e.g. to match the expected time of arrival of particular product ions at the ion shutter, may increase the sensitivity of the IMS apparatus to those particular product ions - e.g. by increasing the amplitude of the product ion peak for a given sample concentration in the reaction region.
• Figure 6 shows a further example of a way in which the methods of the present disclosure may be developed.
• the flow chart shown in Figure 6 illustrates a method of controlling operation of the ion shutter by reducing gate width during a gate delay interval which is associated with product ion peak.
• the controller 120 determines 502 an ion spectrum, and identifies 504 product ion peaks in that spectrum as explained above with reference to Figure 5.
• the controller 120 can use this data to determine 506 gate delays based on the expected times of arrival at the ion shutter of particular product ions associated with those peaks.
• the controller 120 may then use a reduced gate width at the determined gate delay. It may also use a reduced gate width to scan through a series of such gate delays. For example, the controller 120 may identify a gate delay interval based on the expected times of arrival. This may be done using ion spectrum data determined using a first gate width (e.g. the default gate width for the instrument, which may be in a range such as one defined above e.g. between ⁇ mq and 10ms. The controller 120 may then select a second shorter gate width and perform a series of cycles in which the selected gate delay (s) are used and the reduced gate width is used to scan across the identified gate delay interval.
• a first gate width e.g. the default gate width for the instrument, which may be in a range such as one defined above e.g. between ⁇ mq and 10ms.
• the controller 120 may then select a second shorter gate width and perform a series of cycles in which the selected gate delay (s) are used and the reduced gate width is used to scan across the identified gate
• providing a pulse of a pulsed ionisation source may comprise delivering electrical energy to the ionisation source 120 to initiate operation of the ionisation source 104. It may also comprise switching the ionisation source off, and/or allowing it to return to a state in which ions are not generated until the next active delivery of energy to the ionisation source.
• providing a pulse of a pulsed ionisation source may comprise both initiating and ending the supply of power to the ionisation source from a power source such as a battery and/or using a switch such as a relay.
• the ionisation source described herein may comprise a corona source, such as a corona point, in some examples the operation of the corona point source may comprise an electrical pulse of 12kV, having a rise time of about 150 ns and a pulse width of between 200 and 900 ns.
• a dielectric barrier discharge source may also be used, in which case operation of the ionisation source may comprise a pulse of approximately 10ms duration (e.g. based on the full width at half maximum of the pulse), and may comprise voltages of up to approximately 5 kV, for example peak voltages in the range lkV to 4.5kV.
• the pulse may comprise an oscillatory component having a frequency which is characteristic of the DBD source and/or the electrical power supply to the DBD source.
• pulses produced by DBD and corona sources may vary, but it will be appreciated in the context of the present disclosure that such pulses may comprise an oscillatory signal modulated by a pulse envelope.
• the IMS cell typically employs a single high voltage power supply.
• the maximum voltage e.g. at the top of the reaction region (the end furthest from the detector) may be resistively divided to provide the required voltage for each element of the IMS cell including the electrodes which define the electric field of the ionisation and drift regions and the electrodes of the ion gate/shutter.
• a corona source is used to generate ions this may have its own dedicated power supply which provides a fixed DC voltage and pulsed voltage which generates the ions.
• separate power supply units could be used for one or more elements of the IMS.
• the present disclosure aims to reduce the effect of the above "mobility selection" by changing the gate delay so that product ion amplitudes are increased, but at the same time maintaining a consistent and useable RIP. To achieve this it is proposed to scan the gate delay through increasing values during the sampling period and then perform an average of the resulting peak amplitudes.
• Embodiments of the disclosure aim to improve the IMS response to a product ion by active manipulation of the opening and closing of the ion gate.
• Embodiments can be implemented in any IMS system which uses a pulsed ion source, e.g. a corona discharge source, by a software modification. In some embodiments no hardware changes would be required. These and other embodiments could be included into portable IMS equipment which are being used in search scenarios.
• Embodiments may help to enable the detector to "focus" in on a compound of interest and help to reject false alarms.
• the functionality of the controller 120 may be provided by a general purpose processor, which may be configured to perform a method according to any one of those described herein.
• the controller 120 may comprise digital logic, such as field programmable gate arrays, FPGA, application specific integrated circuits, ASIC, a digital signal processor, DSP, or by any other appropriate hardware.
• one or more memory elements can store data and/or program instructions used to implement the operations described herein.
• Embodiments of the disclosure provide tangible, non-transitory storage media comprising program instructions operable to program a processor to perform any one or more of the methods described and/or claimed herein and/or to provide data processing apparatus as described and/or claimed herein.
• the controller 120 may comprise an analogue control circuit which provides at least a part of this control functionality. An embodiment provides an analogue control circuit configured to perform any one or more of the methods described herein.

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