EP4100789A4 - Verminderung von defekten unter verwendung eines polygonablationsmusters - Google Patents

Verminderung von defekten unter verwendung eines polygonablationsmusters Download PDF

Info

Publication number
EP4100789A4
EP4100789A4 EP21751194.8A EP21751194A EP4100789A4 EP 4100789 A4 EP4100789 A4 EP 4100789A4 EP 21751194 A EP21751194 A EP 21751194A EP 4100789 A4 EP4100789 A4 EP 4100789A4
Authority
EP
European Patent Office
Prior art keywords
polygon
ablation pattern
mitigating defects
mitigating
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP21751194.8A
Other languages
English (en)
French (fr)
Other versions
EP4100789A1 (de
Inventor
Madhura R. GADRE
Todd William Martin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
View Inc
Original Assignee
View Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by View Inc filed Critical View Inc
Publication of EP4100789A1 publication Critical patent/EP4100789A1/de
Publication of EP4100789A4 publication Critical patent/EP4100789A4/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/15—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on an electrochromic effect
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10048—Infrared image

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Electrochromic Elements, Electrophoresis, Or Variable Reflection Or Absorption Elements (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
EP21751194.8A 2020-02-05 2021-02-05 Verminderung von defekten unter verwendung eines polygonablationsmusters Pending EP4100789A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US202062970581P 2020-02-05 2020-02-05
PCT/US2021/016937 WO2021159006A1 (en) 2020-02-05 2021-02-05 Mitigating defects using polygon ablation pattern

Publications (2)

Publication Number Publication Date
EP4100789A1 EP4100789A1 (de) 2022-12-14
EP4100789A4 true EP4100789A4 (de) 2024-02-21

Family

ID=77199444

Family Applications (1)

Application Number Title Priority Date Filing Date
EP21751194.8A Pending EP4100789A4 (de) 2020-02-05 2021-02-05 Verminderung von defekten unter verwendung eines polygonablationsmusters

Country Status (4)

Country Link
EP (1) EP4100789A4 (de)
CN (1) CN115244457A (de)
CA (1) CA3167003A1 (de)
WO (1) WO2021159006A1 (de)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9885934B2 (en) 2011-09-14 2018-02-06 View, Inc. Portable defect mitigators for electrochromic windows
EP4134733A1 (de) 2012-03-13 2023-02-15 View, Inc. Stiftlochabschwächung für optische vorrichtungen
CN113074627B (zh) * 2021-03-12 2022-06-10 中国科学院生物物理研究所 直接电子探测相机的成像方法、装置及计算机设备

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012154320A1 (en) * 2011-03-31 2012-11-15 Sage Electrochromics, Inc Method and system for detecting and repairing defects in an electrochromic device using thermal imaging
US20130225027A1 (en) * 2011-05-27 2013-08-29 Sage Electrochromics, Inc. Apparatus and method for repair of defects in an electronic energy control or display device
US20150077831A1 (en) * 2012-03-13 2015-03-19 View, Inc. Pinhole mitigation for optical devices
US20150108102A1 (en) * 2012-05-18 2015-04-23 View, Inc. Circumscribing defects in optical devices

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9885934B2 (en) * 2011-09-14 2018-02-06 View, Inc. Portable defect mitigators for electrochromic windows
CN103630542B (zh) * 2012-08-27 2018-03-20 Ntn株式会社 缺陷检测装置、缺陷修正装置及缺陷检测方法
JP6250169B2 (ja) * 2013-09-04 2017-12-20 サン−ゴバン グラス フランスＳａｉｎｔ−Ｇｏｂａｉｎ Ｇｌａｓｓ Ｆｒａｎｃｅ 電気的に絶縁された欠陥個所を含む導電性コーティングを備えた板ガラスの製造方法
CN104792794A (zh) * 2015-04-28 2015-07-22 武汉工程大学 基于机器视觉的光学薄膜表面缺陷检测方法
CN107389688B (zh) * 2017-07-21 2020-05-12 中国工程物理研究院激光聚变研究中心 大口径熔石英光学元件表面微缺陷多工位集成修复方法
KR20190023374A (ko) * 2017-08-29 2019-03-08 윈포시스(주) 디스플레이 패널 검사 방법

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012154320A1 (en) * 2011-03-31 2012-11-15 Sage Electrochromics, Inc Method and system for detecting and repairing defects in an electrochromic device using thermal imaging
US20130225027A1 (en) * 2011-05-27 2013-08-29 Sage Electrochromics, Inc. Apparatus and method for repair of defects in an electronic energy control or display device
US20150077831A1 (en) * 2012-03-13 2015-03-19 View, Inc. Pinhole mitigation for optical devices
US20150108102A1 (en) * 2012-05-18 2015-04-23 View, Inc. Circumscribing defects in optical devices

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2021159006A1 *

Also Published As

Publication number Publication date
CA3167003A1 (en) 2021-08-12
EP4100789A1 (de) 2022-12-14
CN115244457A (zh) 2022-10-25
WO2021159006A1 (en) 2021-08-12

Similar Documents

Publication Publication Date Title
EP4100789A4 (de) Verminderung von defekten unter verwendung eines polygonablationsmusters
EP3960362A4 (de) Laserbestrahlungskopf
CA3269509A1 (en) Mitigating beam squint in multi-beam forming networks
EP4337943A4 (de) Unterdrückung von laserglühmustern
CA3223670A1 (en) Trestle
EP4143677A4 (de) Abgestuftes anwendungsmuster
EP4074751A4 (de) Zusammensetzung zur musterbildung
AU2023901296A0 (en) Laser Ablation
CA3268167A1 (en) HIGH SURFACE BRAIDS
AU2023903867A0 (en) Soak Well
CA3262931A1 (en) CORRECTION OF REASONS
EM87819340008S (de) Zierelemente für Oberflächen
EM87819340007S (de) Zierelemente für Oberflächen
EM87713800003S (de) Zierelemente für Oberflächen
EM87713800001S (de) Zierelemente für Oberflächen
EM87713800002S (de) Zierelemente für Oberflächen
EM87713800004S (de) Zierelemente für Oberflächen
EM87713800005S (de) Zierelemente für Oberflächen
EM87713800006S (de) Zierelemente für Oberflächen
EM87496260020S (de) Zierelemente für Oberflächen
EM87496260019S (de) Zierelemente für Oberflächen
EM87362010001S (de) Zierelemente für Oberflächen
EM87254020001S (de) Oberflächenmuster
EM87254020002S (de) Oberflächenmuster
EM150301090001S (de) Muster

Legal Events

Date Code Title Description
STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE

PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE

17P Request for examination filed

Effective date: 20220902

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

DAV Request for validation of the european patent (deleted)
DAX Request for extension of the european patent (deleted)
P01 Opt-out of the competence of the unified patent court (upc) registered

Effective date: 20230519

REG Reference to a national code

Ref country code: DE

Ref legal event code: R079

Free format text: PREVIOUS MAIN CLASS: G02F0001153000

Ipc: G02F0001150000

A4 Supplementary search report drawn up and despatched

Effective date: 20240122

RIC1 Information provided on ipc code assigned before grant

Ipc: G01N 25/72 20060101ALI20240116BHEP

Ipc: G02F 1/15 20190101AFI20240116BHEP

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: EXAMINATION IS IN PROGRESS

17Q First examination report despatched

Effective date: 20250904