EP4100789A4 - Mitigating defects using polygon ablation pattern - Google Patents
Mitigating defects using polygon ablation patternInfo
- Publication number
- EP4100789A4 EP4100789A4 EP21751194.8A EP21751194A EP4100789A4 EP 4100789 A4 EP4100789 A4 EP 4100789A4 EP 21751194 A EP21751194 A EP 21751194A EP 4100789 A4 EP4100789 A4 EP 4100789A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- polygon
- ablation pattern
- mitigating defects
- mitigating
- defects
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000002679 ablation Methods 0.000 title 1
- 230000007547 defect Effects 0.000 title 1
- 230000000116 mitigating effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/15—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on an electrochromic effect
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10048—Infrared image
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US202062970581P | 2020-02-05 | 2020-02-05 | |
PCT/US2021/016937 WO2021159006A1 (en) | 2020-02-05 | 2021-02-05 | Mitigating defects using polygon ablation pattern |
Publications (2)
Publication Number | Publication Date |
---|---|
EP4100789A1 EP4100789A1 (en) | 2022-12-14 |
EP4100789A4 true EP4100789A4 (en) | 2024-02-21 |
Family
ID=77199444
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP21751194.8A Pending EP4100789A4 (en) | 2020-02-05 | 2021-02-05 | Mitigating defects using polygon ablation pattern |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP4100789A4 (en) |
CN (1) | CN115244457A (en) |
CA (1) | CA3167003A1 (en) |
WO (1) | WO2021159006A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9885934B2 (en) | 2011-09-14 | 2018-02-06 | View, Inc. | Portable defect mitigators for electrochromic windows |
EP2825911B1 (en) | 2012-03-13 | 2018-05-09 | View, Inc. | Pinhole mitigation for optical devices |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012154320A1 (en) * | 2011-03-31 | 2012-11-15 | Sage Electrochromics, Inc | Method and system for detecting and repairing defects in an electrochromic device using thermal imaging |
US20150108102A1 (en) * | 2012-05-18 | 2015-04-23 | View, Inc. | Circumscribing defects in optical devices |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8430707B2 (en) * | 2011-05-27 | 2013-04-30 | Sage Electrochromics, Inc. | Apparatus and method for repair of defects in an electronic energy control or display device |
US9885934B2 (en) * | 2011-09-14 | 2018-02-06 | View, Inc. | Portable defect mitigators for electrochromic windows |
CA2920077C (en) * | 2013-09-04 | 2018-04-24 | Saint-Gobain Glass France | Method for producing a pane with an electrically conductive coating with electrically isolated defects |
KR20190023374A (en) * | 2017-08-29 | 2019-03-08 | 윈포시스(주) | Method for testing display pannel |
-
2021
- 2021-02-05 WO PCT/US2021/016937 patent/WO2021159006A1/en unknown
- 2021-02-05 CN CN202180017900.5A patent/CN115244457A/en active Pending
- 2021-02-05 EP EP21751194.8A patent/EP4100789A4/en active Pending
- 2021-02-05 CA CA3167003A patent/CA3167003A1/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012154320A1 (en) * | 2011-03-31 | 2012-11-15 | Sage Electrochromics, Inc | Method and system for detecting and repairing defects in an electrochromic device using thermal imaging |
US20150108102A1 (en) * | 2012-05-18 | 2015-04-23 | View, Inc. | Circumscribing defects in optical devices |
Non-Patent Citations (1)
Title |
---|
See also references of WO2021159006A1 * |
Also Published As
Publication number | Publication date |
---|---|
CA3167003A1 (en) | 2021-08-12 |
WO2021159006A1 (en) | 2021-08-12 |
EP4100789A1 (en) | 2022-12-14 |
CN115244457A (en) | 2022-10-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE |
|
17P | Request for examination filed |
Effective date: 20220902 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
|
DAV | Request for validation of the european patent (deleted) | ||
DAX | Request for extension of the european patent (deleted) | ||
P01 | Opt-out of the competence of the unified patent court (upc) registered |
Effective date: 20230519 |
|
REG | Reference to a national code |
Ref country code: DE Ref legal event code: R079 Free format text: PREVIOUS MAIN CLASS: G02F0001153000 Ipc: G02F0001150000 |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20240122 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: G01N 25/72 20060101ALI20240116BHEP Ipc: G02F 1/15 20190101AFI20240116BHEP |