EP4024435A4 - Röntgenstrahlenquelle und steuerverfahren dafür - Google Patents
Röntgenstrahlenquelle und steuerverfahren dafür Download PDFInfo
- Publication number
- EP4024435A4 EP4024435A4 EP19943133.9A EP19943133A EP4024435A4 EP 4024435 A4 EP4024435 A4 EP 4024435A4 EP 19943133 A EP19943133 A EP 19943133A EP 4024435 A4 EP4024435 A4 EP 4024435A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- control method
- source device
- ray source
- ray
- control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J1/00—Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
- H01J1/02—Main electrodes
- H01J1/30—Cold cathodes, e.g. field-emissive cathode
- H01J1/304—Field-emissive cathodes
- H01J1/3042—Field-emissive cathodes microengineered, e.g. Spindt-type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/045—Electrodes for controlling the current of the cathode ray, e.g. control grids
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/06—Cathodes
- H01J35/065—Field emission, photo emission or secondary emission cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/02—Manufacture of electrodes or electrode systems
- H01J9/022—Manufacture of electrodes or electrode systems of cold cathodes
- H01J9/025—Manufacture of electrodes or electrode systems of cold cathodes of field emission cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2201/00—Electrodes common to discharge tubes
- H01J2201/30—Cold cathodes
- H01J2201/304—Field emission cathodes
- H01J2201/30446—Field emission cathodes characterised by the emitter material
- H01J2201/30453—Carbon types
- H01J2201/30469—Carbon nanotubes (CNTs)
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/06—Cathode assembly
- H01J2235/062—Cold cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/06—Cathode assembly
- H01J2235/068—Multi-cathode assembly
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Cold Cathode And The Manufacture (AREA)
- X-Ray Techniques (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/KR2019/010970 WO2021040079A1 (ko) | 2019-08-28 | 2019-08-28 | 엑스선 소스 장치 및 그 제어 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
EP4024435A1 EP4024435A1 (de) | 2022-07-06 |
EP4024435A4 true EP4024435A4 (de) | 2023-08-09 |
Family
ID=74685232
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP19943133.9A Pending EP4024435A4 (de) | 2019-08-28 | 2019-08-28 | Röntgenstrahlenquelle und steuerverfahren dafür |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP4024435A4 (de) |
JP (1) | JP7407476B2 (de) |
CN (1) | CN114303220A (de) |
WO (1) | WO2021040079A1 (de) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2024035843A1 (en) * | 2022-08-10 | 2024-02-15 | X-Sight Incorporated | Design for field emitter x-ray source reliability |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7220971B1 (en) * | 2004-12-29 | 2007-05-22 | The University Of North Carolina At Chapel Hill | Multi-pixel electron microbeam irradiator systems and methods for selectively irradiating predetermined locations |
WO2015175765A1 (en) * | 2014-05-15 | 2015-11-19 | Elwha Llc | Applications of graphene grids in vacuum electronics |
US20170084417A1 (en) * | 2014-05-13 | 2017-03-23 | Samsung Electronics Co., Ltd. | Electron emitting device using graphene and method for manufacturing same |
US20180158640A1 (en) * | 2016-12-07 | 2018-06-07 | Electronics And Telecommunications Research Institute | Field emission apparatus |
US20190088437A1 (en) * | 2017-09-21 | 2019-03-21 | Korea University Research And Business Foundation | Carbon nanotube electron emitter, method of manufacturing the same and x-ray source using the same |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8102108B2 (en) * | 2003-12-05 | 2012-01-24 | Zhidan Li Tolt | Low voltage electron source with self aligned gate apertures, fabrication method thereof, and devices using the electron source |
JP4693884B2 (ja) * | 2008-09-18 | 2011-06-01 | キヤノン株式会社 | マルチx線撮影装置及びその制御方法 |
KR101082678B1 (ko) * | 2009-01-16 | 2011-11-15 | 고려대학교 산학협력단 | 탄소나노튜브 얀을 이용한 표면 전계전자 방출원 및 이에 이용되는 탄소나노튜브 얀 제조방법 |
KR20140106291A (ko) * | 2013-02-26 | 2014-09-03 | 삼성전자주식회사 | 평판형 엑스선 발생기를 구비한 엑스선 영상 시스템, 엑스선 발생기 및 전자 방출소자 |
KR20150026363A (ko) * | 2013-09-02 | 2015-03-11 | 삼성전자주식회사 | 전계 방출 소자 및 전계 방출 소자의 게이트 전극의 제조 방법 |
KR101892525B1 (ko) * | 2014-07-03 | 2018-10-04 | (주)바텍이우홀딩스 | 휴대용 엑스선 촬영 장치 |
US11329311B2 (en) * | 2018-01-19 | 2022-05-10 | Florida State University Research Foundation, Inc. | Lithium battery using lithium polysulfide as the cathode active material |
-
2019
- 2019-08-28 CN CN201980099793.8A patent/CN114303220A/zh active Pending
- 2019-08-28 JP JP2022513387A patent/JP7407476B2/ja active Active
- 2019-08-28 EP EP19943133.9A patent/EP4024435A4/de active Pending
- 2019-08-28 WO PCT/KR2019/010970 patent/WO2021040079A1/ko unknown
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7220971B1 (en) * | 2004-12-29 | 2007-05-22 | The University Of North Carolina At Chapel Hill | Multi-pixel electron microbeam irradiator systems and methods for selectively irradiating predetermined locations |
US20170084417A1 (en) * | 2014-05-13 | 2017-03-23 | Samsung Electronics Co., Ltd. | Electron emitting device using graphene and method for manufacturing same |
WO2015175765A1 (en) * | 2014-05-15 | 2015-11-19 | Elwha Llc | Applications of graphene grids in vacuum electronics |
US20180158640A1 (en) * | 2016-12-07 | 2018-06-07 | Electronics And Telecommunications Research Institute | Field emission apparatus |
US20190088437A1 (en) * | 2017-09-21 | 2019-03-21 | Korea University Research And Business Foundation | Carbon nanotube electron emitter, method of manufacturing the same and x-ray source using the same |
Non-Patent Citations (1)
Title |
---|
See also references of WO2021040079A1 * |
Also Published As
Publication number | Publication date |
---|---|
WO2021040079A1 (ko) | 2021-03-04 |
JP7407476B2 (ja) | 2024-01-04 |
CN114303220A (zh) | 2022-04-08 |
EP4024435A1 (de) | 2022-07-06 |
JP2022545826A (ja) | 2022-10-31 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: REQUEST FOR EXAMINATION WAS MADE |
|
17P | Request for examination filed |
Effective date: 20220225 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
|
DAV | Request for validation of the european patent (deleted) | ||
DAX | Request for extension of the european patent (deleted) | ||
RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01J 35/04 20060101ALI20230330BHEP Ipc: H01J 1/304 20060101ALI20230330BHEP Ipc: H01J 9/02 20060101ALI20230330BHEP Ipc: H01J 35/06 20060101ALI20230330BHEP Ipc: H01J 35/14 20060101ALI20230330BHEP Ipc: H01J 35/02 20060101AFI20230330BHEP |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20230712 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01J 35/04 20060101ALI20230706BHEP Ipc: H01J 1/304 20060101ALI20230706BHEP Ipc: H01J 9/02 20060101ALI20230706BHEP Ipc: H01J 35/06 20060101ALI20230706BHEP Ipc: H01J 35/14 20060101ALI20230706BHEP Ipc: H01J 35/02 20060101AFI20230706BHEP |