EP3804478A4 - Gehäuse für halbleiterbauelement und verfahren zu dessen verwendung - Google Patents

Gehäuse für halbleiterbauelement und verfahren zu dessen verwendung Download PDF

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Publication number
EP3804478A4
EP3804478A4 EP19811278.1A EP19811278A EP3804478A4 EP 3804478 A4 EP3804478 A4 EP 3804478A4 EP 19811278 A EP19811278 A EP 19811278A EP 3804478 A4 EP3804478 A4 EP 3804478A4
Authority
EP
European Patent Office
Prior art keywords
semiconductor device
device package
package
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP19811278.1A
Other languages
English (en)
French (fr)
Other versions
EP3804478A1 (de
Inventor
Virgil Cotoco Ararao
Brent Hans Larson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TT Electronics PLC
Original Assignee
TT Electronics PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TT Electronics PLC filed Critical TT Electronics PLC
Publication of EP3804478A1 publication Critical patent/EP3804478A1/de
Publication of EP3804478A4 publication Critical patent/EP3804478A4/de
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/02002—Arrangements for conducting electric current to or from the device in operations
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
    • B81C1/00261—Processes for packaging MEMS devices
    • B81C1/00317—Packaging optical devices
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
    • B81B7/0006—Interconnects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14618—Containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2201/00—Specific applications of microelectromechanical systems
    • B81B2201/02—Sensors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2201/00—Specific applications of microelectromechanical systems
    • B81B2201/04—Optical MEMS
    • B81B2201/047—Optical MEMS not provided for in B81B2201/042 - B81B2201/045
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2203/00—Forming microstructural systems
    • B81C2203/01—Packaging MEMS
    • B81C2203/0109—Bonding an individual cap on the substrate
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2203/00—Forming microstructural systems
    • B81C2203/01—Packaging MEMS
    • B81C2203/0172—Seals
    • B81C2203/019—Seals characterised by the material or arrangement of seals between parts
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B81—MICROSTRUCTURAL TECHNOLOGY
    • B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C2203/00—Forming microstructural systems
    • B81C2203/03—Bonding two components
    • B81C2203/033—Thermal bonding
    • B81C2203/036—Fusion bonding
EP19811278.1A 2018-06-01 2019-05-28 Gehäuse für halbleiterbauelement und verfahren zu dessen verwendung Pending EP3804478A4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/995,510 US10693020B2 (en) 2018-06-01 2018-06-01 Semiconductor device package and method for use thereof
PCT/US2019/034185 WO2019231919A1 (en) 2018-06-01 2019-05-28 Semiconductor device package and method for use thereof

Publications (2)

Publication Number Publication Date
EP3804478A1 EP3804478A1 (de) 2021-04-14
EP3804478A4 true EP3804478A4 (de) 2022-03-09

Family

ID=68693249

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19811278.1A Pending EP3804478A4 (de) 2018-06-01 2019-05-28 Gehäuse für halbleiterbauelement und verfahren zu dessen verwendung

Country Status (5)

Country Link
US (1) US10693020B2 (de)
EP (1) EP3804478A4 (de)
JP (1) JP2021525956A (de)
TW (1) TW202013754A (de)
WO (1) WO2019231919A1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113200509A (zh) * 2021-04-08 2021-08-03 日月光半导体制造股份有限公司 电子元件及半导体封装装置
CN113200510A (zh) * 2021-04-29 2021-08-03 日月光半导体制造股份有限公司 半导体结构

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102237384A (zh) * 2010-04-23 2011-11-09 艾普特佩克股份有限公司 电子器件封装及其制造方法
WO2013062533A1 (en) * 2011-10-25 2013-05-02 Intel Corporation Interposer for hermetic sealing of sensor chips and for their integration with integrated circuit chips

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6140144A (en) * 1996-08-08 2000-10-31 Integrated Sensing Systems, Inc. Method for packaging microsensors
EP1041628A3 (de) * 1999-03-29 2008-05-28 Interuniversitair Microelektronica Centrum Vzw BGA-Bildsensor-Verpackung und deren Herstellungsmethode
JP4603231B2 (ja) * 2002-07-19 2010-12-22 パナソニック電工株式会社 火災感知器
JP2005045034A (ja) * 2003-07-22 2005-02-17 Nippon Aleph Corp フォトインタラプタ用光学装置
CA2468924A1 (en) 2004-01-14 2005-07-14 Laser Diagnostic Instruments International Inc. A device and method for non-contact sensing of low-concentration and trace substances
US7442570B2 (en) * 2005-03-18 2008-10-28 Invensence Inc. Method of fabrication of a AL/GE bonding in a wafer packaging environment and a product produced therefrom
JP2009042469A (ja) * 2007-08-08 2009-02-26 Sharp Corp 光モジュール、光モジュールの製造方法、光モジュールを用いて構成された光・電子複合回路、およびその製造方法
US8809923B2 (en) * 2008-02-06 2014-08-19 Omnivision Technologies, Inc. Backside illuminated imaging sensor having a carrier substrate and a redistribution layer
JP2010021219A (ja) 2008-07-09 2010-01-28 Nec Schott Components Corp パッケージングデバイス装置およびパッケージ用ベース部材
US20100289104A1 (en) * 2009-05-14 2010-11-18 Optopac Co., Ltd. Photosensor package
KR100976812B1 (ko) * 2010-02-08 2010-08-20 옵토팩 주식회사 전자 소자 패키지 및 그 제조 방법
US8659148B2 (en) * 2010-11-30 2014-02-25 General Electric Company Tileable sensor array
US8476087B2 (en) * 2011-04-21 2013-07-02 Freescale Semiconductor, Inc. Methods for fabricating sensor device package using a sealing structure
US20130050227A1 (en) 2011-08-30 2013-02-28 Qualcomm Mems Technologies, Inc. Glass as a substrate material and a final package for mems and ic devices
US8824706B2 (en) * 2011-08-30 2014-09-02 Qualcomm Mems Technologies, Inc. Piezoelectric microphone fabricated on glass
US9368429B2 (en) * 2011-10-25 2016-06-14 Intel Corporation Interposer for hermetic sealing of sensor chips and for their integration with integrated circuit chips
JP2017022056A (ja) * 2015-07-14 2017-01-26 日本放送協会 基板処理方法及びパッケージの気密封止方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102237384A (zh) * 2010-04-23 2011-11-09 艾普特佩克股份有限公司 电子器件封装及其制造方法
WO2013062533A1 (en) * 2011-10-25 2013-05-02 Intel Corporation Interposer for hermetic sealing of sensor chips and for their integration with integrated circuit chips

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2019231919A1 *

Also Published As

Publication number Publication date
WO2019231919A8 (en) 2021-02-11
WO2019231919A1 (en) 2019-12-05
US10693020B2 (en) 2020-06-23
JP2021525956A (ja) 2021-09-27
EP3804478A1 (de) 2021-04-14
US20190371944A1 (en) 2019-12-05
TW202013754A (zh) 2020-04-01

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