EP3627120A4 - Temperature measurement device and temperature measurement method - Google Patents
Temperature measurement device and temperature measurement method Download PDFInfo
- Publication number
- EP3627120A4 EP3627120A4 EP17910027.6A EP17910027A EP3627120A4 EP 3627120 A4 EP3627120 A4 EP 3627120A4 EP 17910027 A EP17910027 A EP 17910027A EP 3627120 A4 EP3627120 A4 EP 3627120A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- temperature measurement
- measurement device
- measurement method
- temperature
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000009529 body temperature measurement Methods 0.000 title 2
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K3/00—Thermometers giving results other than momentary value of temperature
- G01K3/005—Circuits arrangements for indicating a predetermined temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K2219/00—Thermometers with dedicated analog to digital converters
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2017/018169 WO2018211554A1 (en) | 2017-05-15 | 2017-05-15 | Temperature measurement device and temperature measurement method |
Publications (3)
Publication Number | Publication Date |
---|---|
EP3627120A1 EP3627120A1 (en) | 2020-03-25 |
EP3627120A4 true EP3627120A4 (en) | 2020-04-29 |
EP3627120B1 EP3627120B1 (en) | 2021-08-18 |
Family
ID=64273462
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP17910027.6A Active EP3627120B1 (en) | 2017-05-15 | 2017-05-15 | Temperature measurement device and temperature measurement method |
Country Status (5)
Country | Link |
---|---|
US (1) | US11268865B2 (en) |
EP (1) | EP3627120B1 (en) |
JP (1) | JP7006687B2 (en) |
CN (1) | CN110612436B (en) |
WO (1) | WO2018211554A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6962795B2 (en) * | 2017-11-22 | 2021-11-05 | ルネサスエレクトロニクス株式会社 | Semiconductor devices and semiconductor systems |
CN112904924B (en) * | 2019-12-04 | 2022-10-18 | 华润微集成电路(无锡)有限公司 | Circuit for detecting chip temperature and corresponding method for detecting chip temperature |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8217708B2 (en) * | 2008-11-14 | 2012-07-10 | Seiko Instruments Inc. | Temperature sensor |
US20150276497A1 (en) * | 2014-03-27 | 2015-10-01 | Fujitsu Semiconductor Limited | Temperature measurement device, integrated circuit, and temperature measurement method |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SU1364911A1 (en) * | 1986-07-14 | 1988-01-07 | Институт Электродинамики Ан Усср | Method of determining temperature |
CN2081530U (en) * | 1990-10-15 | 1991-07-24 | 辽宁八达高校科技开发集团 | P-n junction sensor for measuring and controlling temp. |
US6149299A (en) * | 1997-12-11 | 2000-11-21 | National Semiconductor Corporation | Direct temperature sensing of a semiconductor device semiconductor device |
US7010440B1 (en) * | 2003-11-25 | 2006-03-07 | Analog Devices, Inc. | Method and a measuring circuit for determining temperature from a PN junction temperature sensor, and a temperature sensing circuit comprising the measuring circuit and a PN junction |
TW200524139A (en) * | 2003-12-24 | 2005-07-16 | Renesas Tech Corp | Voltage generating circuit and semiconductor integrated circuit |
JP4808069B2 (en) * | 2006-05-01 | 2011-11-02 | 富士通セミコンダクター株式会社 | Reference voltage generator |
WO2009017223A1 (en) * | 2007-08-02 | 2009-02-05 | Toppan Printing Co., Ltd. | Semiconductor evaluation circuit |
JP2010114877A (en) * | 2008-10-06 | 2010-05-20 | Panasonic Corp | Operational amplifier circuit and display unit |
US8308358B2 (en) * | 2009-06-25 | 2012-11-13 | Texas Instruments Incorporated | Circuit and method for beta variation compensation in single-transistor temperature sensor |
JP2011220777A (en) | 2010-04-07 | 2011-11-04 | New Japan Radio Co Ltd | Voltage generation circuit |
JP2012042241A (en) * | 2010-08-16 | 2012-03-01 | Renesas Electronics Corp | Leakage current measurement circuit and leakage current measurement method |
JP6126949B2 (en) * | 2013-09-02 | 2017-05-10 | ルネサスエレクトロニクス株式会社 | Temperature sensor |
IN2013MU03413A (en) * | 2013-10-29 | 2015-09-25 | Maxim Integrated Products | |
US10359321B2 (en) | 2014-12-23 | 2019-07-23 | Texas Instruments Incorporated | On-chip circuit and method for accurately measuring die temperature of an integrated circuit |
CN104460811B (en) * | 2014-12-26 | 2016-01-20 | 昆腾微电子股份有限公司 | Reference voltage temperature coefficient calibration circuit and method of work thereof |
JP6426018B2 (en) * | 2015-02-03 | 2018-11-21 | エイブリック株式会社 | Overheat detection circuit and power supply |
KR102282192B1 (en) * | 2015-07-23 | 2021-07-27 | 삼성전자 주식회사 | Semiconductor device with mismatch detection and recovery circuit |
US10352775B2 (en) * | 2015-09-25 | 2019-07-16 | Micron Technology, Inc. | Systems and methods for reducing temperature sensor reading variation due to device mismatch |
US11231736B2 (en) * | 2017-11-17 | 2022-01-25 | Samsung Electronics Co., Ltd. | Reference voltage generating circuit method of generating reference voltage and integrated circuit including the same |
-
2017
- 2017-05-15 CN CN201780090565.5A patent/CN110612436B/en active Active
- 2017-05-15 WO PCT/JP2017/018169 patent/WO2018211554A1/en unknown
- 2017-05-15 JP JP2019518608A patent/JP7006687B2/en active Active
- 2017-05-15 EP EP17910027.6A patent/EP3627120B1/en active Active
-
2019
- 2019-11-05 US US16/674,928 patent/US11268865B2/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8217708B2 (en) * | 2008-11-14 | 2012-07-10 | Seiko Instruments Inc. | Temperature sensor |
US20150276497A1 (en) * | 2014-03-27 | 2015-10-01 | Fujitsu Semiconductor Limited | Temperature measurement device, integrated circuit, and temperature measurement method |
Non-Patent Citations (1)
Title |
---|
See also references of WO2018211554A1 * |
Also Published As
Publication number | Publication date |
---|---|
CN110612436A (en) | 2019-12-24 |
WO2018211554A1 (en) | 2018-11-22 |
JP7006687B2 (en) | 2022-01-24 |
EP3627120B1 (en) | 2021-08-18 |
JPWO2018211554A1 (en) | 2020-05-14 |
US11268865B2 (en) | 2022-03-08 |
CN110612436B (en) | 2022-01-07 |
EP3627120A1 (en) | 2020-03-25 |
US20200064206A1 (en) | 2020-02-27 |
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