EP3548972B1 - Method for optimising the tribological properties of a timepiece component - Google Patents

Method for optimising the tribological properties of a timepiece component Download PDF

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EP3548972B1
EP3548972B1 EP17808909.0A EP17808909A EP3548972B1 EP 3548972 B1 EP3548972 B1 EP 3548972B1 EP 17808909 A EP17808909 A EP 17808909A EP 3548972 B1 EP3548972 B1 EP 3548972B1
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ions
substrate
silicon
components
layer
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German (de)
French (fr)
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EP3548972A1 (en
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Frédéric Dreyer-Gonzales
Arnaud HOURIET
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Officine Panerai AG
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Officine Panerai AG
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    • GPHYSICS
    • G04HOROLOGY
    • G04BMECHANICALLY-DRIVEN CLOCKS OR WATCHES; MECHANICAL PARTS OF CLOCKS OR WATCHES IN GENERAL; TIME PIECES USING THE POSITION OF THE SUN, MOON OR STARS
    • G04B15/00Escapements
    • G04B15/14Component parts or constructional details, e.g. construction of the lever or the escape wheel
    • CCHEMISTRY; METALLURGY
    • C10PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
    • C10NINDEXING SCHEME ASSOCIATED WITH SUBCLASS C10M RELATING TO LUBRICATING COMPOSITIONS
    • C10N2030/00Specified physical or chemical properties which is improved by the additive characterising the lubricating composition, e.g. multifunctional additives
    • C10N2030/06Oiliness; Film-strength; Anti-wear; Resistance to extreme pressure
    • CCHEMISTRY; METALLURGY
    • C10PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
    • C10NINDEXING SCHEME ASSOCIATED WITH SUBCLASS C10M RELATING TO LUBRICATING COMPOSITIONS
    • C10N2040/00Specified use or application for which the lubricating composition is intended
    • C10N2040/06Instruments or other precision apparatus, e.g. damping fluids

Definitions

  • the present invention relates to the field of watchmaking. It relates, more particularly, to a watch component intended to undergo dynamic friction and having improved tribological properties, as well as a method for optimizing the tribological properties of such a watch component.
  • This material also has the advantage of having interesting tribological properties, which suggested that it would be possible to have two silicon parts rub against each other, without having to resort to lubrication. Indeed, the interaction between moving parts, which is necessary for the operation of a timepiece mechanism, induces friction which is detrimental to the efficiency of the mechanism and which wears out the parts. It is therefore necessary to lubricate the parts of the components which undergo this friction. However, the oils traditionally used age and degrade, posing problems of maintenance of the movement, in particular.
  • improved tribological properties is meant a reduction in the coefficient of friction, a reduction in wear with respect to a given stress or to given conditions (surface condition, hygrometry, temperature, topology, etc.).
  • the purpose of the present invention is to propose an alternative to the methods proposed above, making it possible to obtain a watch component intended to undergo dynamic friction, which has improved tribological properties, in particular by the implementation of the ion implantation of certain elements. under specific conditions.
  • the document WO 2009/043391 describes a barrel spring for a mechanical watch, said barrel spring being made of a base material and comprising under at least part of its surface ions implanted in an associated implantation zone being made harder and more rigid than said material base, in order to increase the bending rigidity and thus the energy storage capacity of said barrel spring.
  • the invention relates to a method for optimizing the tribological properties of a watch component intended to undergo dynamic friction during its normal operation, produced on the basis of a substrate comprising a layer of silicon whose crystallographic structure comprises at least one of the monocrystalline, polycrystalline or amorphous forms, said substrate being reinforced by a protective layer produced on its surface during an operation for protecting the substrate, said method comprising a step of ion implantation of at least one ion, by ion bombardment on the surface of said component.
  • a toothed wheel meshing with another therefore undergoes dynamic friction at the level of the contact surfaces of its teeth, which is also the case between certain components of the escapement, in particular an anchor, an escape wheel or the part of the escapement.
  • a frictional resonator such as a platter peg, which experiences dynamic friction where it interacts with neighboring components.
  • a spiral spring being integral on the one hand with its peak and on the other hand with the balance shaft, it does not undergo any dynamic friction in the sense of the invention and is therefore excluded from its scope since no relative displacement is only present at the points of contact between the spring and the components with which it interacts.
  • silicon layer encompasses substrates for which, within the layer, the silicon does not form atomic bond with other atoms.
  • the different crystallographic natures of silicon are included in the scope of the invention and dopings or possible impurities present in the substrate are also possible and included in the scope of the claims.
  • a single layer of silicon, forming a silicon core, is also included in the scope of protection.
  • this protective layer is obtained by an effective protective operation and a natural oxidation layer is not a protective layer within the meaning of the present application, because it does not result from a protective operation as as such, carried out in an effective and positive manner.
  • a protective layer made of SiO 2 obtained by an oxidation step measures at least 50 nm in thickness, which cannot be obtained with natural oxidation.
  • the substrate takes the form of a single layer of silicon 10, covered with a protective layer 12.
  • the substrate takes the form of two layers of silicon 10, separated and covered with a protective layer 12. There could thus be an alternation of several layers of silicon.
  • the substrate comprises a core 14 covered with a layer of silicon 10 whose thickness is such that its tribological properties are equivalent to those of a silicon substrate.
  • the protection layer 12 covers the silicon layer.
  • the thickness of the silicon layer is greater than the depth of ion implantation, so that the ions do not penetrate into the core.
  • the invention relates to a method for optimizing the tribological properties of a watch component intended to undergo dynamic friction, produced on the basis of a substrate comprising a layer of silicon whose crystallographic structure comprises at least one of the forms monocrystalline, polycrystalline or amorphous, said substrate being reinforced by a protective layer produced on its surface during a substrate protection operation, said method comprising a step of ion implantation of at least one ion, by ion bombardment the surface of said component, in which the implantation step is carried out with C ions, at a dose greater than 5.10 17 ions/cm 2 and/or with N ions, at a dose greater than 1.10 16 ions/cm 2 .
  • the ion-implanted zone 16 is shared between the substrate, illustrated here in the form of a single layer of silicon 10, and the protective layer 12, the substrate having an implantation (in number of ions) greater than the protective layer.
  • the figure 4 has such a configuration. It is observed, more specifically, that the ions present in the protective layer are few, or even very few in number and that they are essentially concentrated in a precise zone of the substrate.
  • ion bombardment for example, ion beam, MEWA - Metal Vapor Vacuum Arc
  • the curve of density of the ions according to the depth of the component forms a narrow Gaussian showing this concentration in a precise region.
  • the distribution will be done with a concentration of ions with a decreasing tendency according to the depth reached.
  • a plasma atmosphere for example, Plasma Immersion Ion Implantation
  • one or the other of these general methods may be preferable, or even a combination of the two.
  • the implanted zone is located at least in the substrate.
  • the implanted zone 16 is located only in the protective layer 12 ( figure 5 ). This is particularly the case with a protective layer having a greater thickness than the implantation depth obtained with a given energy. More commonly, the implanted zone is located at least in the protective layer.
  • the ion-implanted zone can be located either in the protection layer only, or in the substrate only or shared between the protection layer and the substrate, that is to say in the region of the interface between the layer protection and the substrate.
  • the figure 1 shows the friction coefficient of a substrate on a ruby sphere, rolling on the substrate over a distance of 100m (abscissa).
  • the first centimeters of the curve correspond to a break-in and the establishment of regular conditions, and are not significant.
  • Curve A is the reference curve, obtained for a substrate without ion implantation.
  • Curve B is obtained for an identical substrate, implanted ionically with a dose of C ions of 2.10 17 ions/cm 2 , with an energy of 600 keV.
  • Curve C is obtained for an identical substrate, implanted ionically with a dose of C ions of 1.10 18 ions/cm 2 , with an energy of 600 keV. It can be seen that the coefficient of friction of the sample represented on curve B has a higher coefficient of friction than the reference sample, whereas the ion implantation of curve C makes it possible to reduce this coefficient of friction over almost all the length of the path traveled by the sphere.
  • the figure 2 shows the average coefficients of friction measured under conditions similar to those of the figure 1 , apart from the energy which in this case is 35keV, depending on the implantation dose, and on different substrates with a layer of SiO 2 of different thickness, which explains the results which are not directly comparable.
  • the effects obtained with a dose of 5.10 17 ions/cm 2 are already interesting.
  • the values of the dashed curve are extrapolations.
  • the nitrogen ions can be implanted in the protective layer, in the substrate, or in the region of the interface between the substrate and the protective layer, mainly in the substrate, or even only in the substrate if the energy is sufficient.
  • ion-implanted components as proposed above, to produce components subjected to repeated or significant shocks or friction, in particular the components of the escapement, in particular an anchor, a steering wheel anchor or part of a resonator subject to friction, such as a platter peg.
  • the invention also relates to the process for implanting the components described above, also defining a method for optimizing the tribological properties of a horological component as mentioned above, produced on the basis of a substrate comprising a layer of silicon 10 whose crystallographic structure comprises at least one of the monocrystalline, polycrystalline or amorphous forms, said substrate being reinforced by a protective layer 12 produced on its surface during a substrate protection operation.
  • the method comprises a step of ion implantation of at least one ion, by ion bombardment on the surface of said component.
  • the implantation step can be carried out with C ions, at a dose greater than 5.10 17 ions/cm 2 , preferably greater than 1.10 18 ions/cm 2 and with an energy greater than 600keV, or with ions N, at a dose greater than 1.10 16 ions/cm 2 and with an energy greater than 600keV.
  • the implantation is carried out on the components when, after etching, they have been detached from the base wafer in which they are etched.
  • the areas of the components that it is relevant to treat at the tribological level are the side faces which, in general in watchmaking, are those which are exposed to friction.
  • the side faces which, in general in watchmaking, are those which are exposed to friction.
  • the protection operation fundamental in the present application.
  • the lateral flanks of the components can pass at any place of the crystallographic lattice.
  • the ion implantation is directional and that the ion bombardment can have a variable angle of incidence on the side faces of the component, a tribological improvement is obtained which is averaged over the entire side surface. of the component and which is significant. Consequently, the method proposed in the present application can be applied with substrates of any crystallographic orientation, given that, at the level of the lateral surfaces, the part can assume all crystallographic orientations.

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Description

Domaine techniqueTechnical area

La présente invention se rapporte au domaine de l'horlogerie. Elle concerne, plus particulièrement, un composant horloger destiné à subir un frottement dynamique et présentant des propriétés tribologiques améliorées, ainsi qu'une méthode d'optimisation des propriétés tribologiques d'un tel composant horloger.The present invention relates to the field of watchmaking. It relates, more particularly, to a watch component intended to undergo dynamic friction and having improved tribological properties, as well as a method for optimizing the tribological properties of such a watch component.

Etat de la techniqueState of the art

Dans les évolutions récentes de l'horlogerie, les nouveaux matériaux et les techniques de microfabrication ont ouvert de nouvelles voies de développement. Notamment, l'utilisation de silicium pour réaliser des composants horlogers destinés à subir des frottements dynamiques a permis de réaliser des pièces aux formes complexes, intégrant plusieurs fonctions dans une seule pièce.In recent developments in watchmaking, new materials and microfabrication techniques have opened up new avenues of development. In particular, the use of silicon to make watch components intended to undergo dynamic friction has made it possible to produce parts with complex shapes, integrating several functions in a single part.

Ce matériau présente également l'avantage d'avoir des propriétés tribologiques intéressantes, qui ont laissé penser qu'il serait possible de faire frotter l'une sur l'autre deux pièces en silicium, sans devoir recourir à une lubrification. En effet, l'interaction entre des pièces en mouvement, qui est nécessaire au fonctionnement d'un mécanisme horloger, induit des frottements qui sont néfastes au rendement du mécanisme et qui usent les pièces. Il est donc nécessaire de lubrifier les parties des composants qui subissent ces frottements. Or, les huiles utilisées traditionnellement vieillissent et se dégradent, posant des problèmes d'entretien du mouvement, notamment.This material also has the advantage of having interesting tribological properties, which suggested that it would be possible to have two silicon parts rub against each other, without having to resort to lubrication. Indeed, the interaction between moving parts, which is necessary for the operation of a timepiece mechanism, induces friction which is detrimental to the efficiency of the mechanism and which wears out the parts. It is therefore necessary to lubricate the parts of the components which undergo this friction. However, the oils traditionally used age and degrade, posing problems of maintenance of the movement, in particular.

Jusqu'à ce jour, l'utilisation de silicium sans huilage permet de faire fonctionner des mouvements horlogers ou certaines parties de mécanisme, mais sans remplir tout le cahier des charges permettant un fonctionnement sur une longue période, compatible avec une utilisation quotidienne.To date, the use of silicon without oiling has made it possible to operate watch movements or certain parts of mechanisms, but without fulfilling all the specifications allowing operation over a long period, compatible with daily use.

Les recherches menées récemment ont tenté d'optimiser les lubrifiants utilisés, ou de proposer des structures permettant d'améliorer la diffusion d'huile au niveau des zones de frottements de pièces en silicium. D'autres recherches ont visé également à développer des couches de matériaux, destinées à revêtir les zones de frottement, afin de proposer une lubrification dite sèche, c'est-à-dire n'employant pas de lubrifiant liquide, mais permettant d'améliorer les propriétés tribologiques d'un composant, dans les zones ainsi revêtues.Research carried out recently has attempted to optimize the lubricants used, or to propose structures making it possible to improve the diffusion of oil at the level of the friction zones of silicon parts. Other research has also aimed to develop layers of materials, intended to coat the friction zones, in order to propose a so-called dry lubrication, that is to say not using a liquid lubricant, but allowing to improve the tribological properties of a component, in the areas thus coated.

Par propriétés tribologiques améliorées, on entend une réduction du coefficient de frottement, une réduction de l'usure par rapport à une contrainte donnée ou à des conditions données (état de surface, hygrométrie, température, topologie, etc...).By improved tribological properties is meant a reduction in the coefficient of friction, a reduction in wear with respect to a given stress or to given conditions (surface condition, hygrometry, temperature, topology, etc.).

La présente invention a pour but de proposer une alternative aux méthodes proposées précédemment, permettant d'obtenir un composant horloger destiné à subir un frottement dynamique, qui présente des propriétés tribologiques améliorées, notamment par la mise en œuvre de l'implantation ionique de certains éléments dans des conditions particulières.The purpose of the present invention is to propose an alternative to the methods proposed above, making it possible to obtain a watch component intended to undergo dynamic friction, which has improved tribological properties, in particular by the implementation of the ion implantation of certain elements. under specific conditions.

En effet, l'implantation ionique sur un type particulier de composant horloger réalisé en silicium a déjà été proposée (voir par exemple les documents CH708067 , CH709628 et CH699780 ), ceci afin de procéder à des modifications des propriétés thermoélastiques d'un ressort spiral pour organe réglant, et non pour l'amélioration de ses propriétés tribologiques. Or, ces documents ne font état que de peu d'informations quant aux paramètres de mise en œuvre ainsi que certaines caractéristiques résultantes de la pièce. En effet, dans le cas de cette application très particulière, il s'agit de faire varier des rapports volumétriques entre les zones implantées et celles non implantées, et c'est la concentration, exprimée en ions/cm3 (ou en at/cm3) qui prime. Il semble notamment que les paramètres énoncés dans le document CH709628 ne favorisaient pas, voir péjoraient dans certains cas, les propriétés tribologiques du ressort spiral. Dans le cadre d'un ressort spiral, de tels effets néfastes sur les propriétés tribologiques n'ont pas la moindre importance, puisque de tels composants ne subissent aucun frottement dynamique lors de leur fonctionnement, et ne suggèrent donc pas une solution au problème susmentionné. Par ailleurs, l'implantation ionique sur d'autres types de composants horlogers a également été réalisée. Par exemple, le document WO 2009/043391 décrit un ressort de barillet pour montre mécanique, ledit ressort de barillet étant réalisé dans un matériau de base et comportant sous au moins une partie de sa surface des ions implantés dans une zone d'implantation associée étant rendue plus dure et plus rigide que ledit matériau de base, afin d'augmenter la rigidité à la flexion et ainsi la capacité de stockage d'énergie dudit ressort de barillet.Indeed, ion implantation on a particular type of watchmaking component made of silicon has already been proposed (see for example the documents CH708067 , CH709628 and CH699780 ), in order to modify the thermoelastic properties of a spiral spring for a regulating member, and not to improve its tribological properties. However, these documents state only little information as to the implementation parameters as well as certain resulting characteristics of the part. Indeed, in the case of this very particular application, it is a question of varying the volumetric ratios between the implanted zones and those not implanted, and this is the concentration, expressed in ions/cm 3 (or in at/cm 3 ) which takes precedence. In particular, it seems that the parameters set out in the document CH709628 did not promote, or even detracted in some cases, the tribological properties of the spiral spring. As part of a spiral spring, such adverse effects on the tribological properties are not of the slightest importance, since such components do not experience any dynamic friction during their operation, and therefore do not suggest a solution to the aforementioned problem. Furthermore, ion implantation on other types of watch components has also been carried out. For example, the document WO 2009/043391 describes a barrel spring for a mechanical watch, said barrel spring being made of a base material and comprising under at least part of its surface ions implanted in an associated implantation zone being made harder and more rigid than said material base, in order to increase the bending rigidity and thus the energy storage capacity of said barrel spring.

Divulguation de l'inventionDisclosure of Invention

De façon plus précise, l'invention concerne une méthode d'optimisation des propriétés tribologiques d'un composant horloger destiné à subir un frottement dynamique lors de son opération normal, réalisé à base d'un substrat comprenant une couche de silicium dont la structure cristallographique comprend au moins l'une des formes monocristalline, polycristalline ou amorphe, ledit substrat étant renforcé par une couche de protection réalisée à sa surface au cours d'une opération de protection du substrat, ladite méthode comprenant une étape d'implantation ionique d'au moins un ion, par bombardement ionique à la surface dudit composant.More specifically, the invention relates to a method for optimizing the tribological properties of a watch component intended to undergo dynamic friction during its normal operation, produced on the basis of a substrate comprising a layer of silicon whose crystallographic structure comprises at least one of the monocrystalline, polycrystalline or amorphous forms, said substrate being reinforced by a protective layer produced on its surface during an operation for protecting the substrate, said method comprising a step of ion implantation of at least one ion, by ion bombardment on the surface of said component.

Brève description des dessinsBrief description of the drawings

D'autres détails de l'invention apparaîtront plus clairement à la lecture de la description qui suit, faite en référence aux dessins annexés dans lequel :

  • la figure 1 illustre les frottements mesurés avec un composant horloger implanté ioniquement à différentes doses, en fonction de la distance (en m) parcourue au contact du composant par une sphère en rubis,
  • la figure 2 illustre l'évolution du coefficient de frottement moyen mesuré dans les conditions de la figure 1 pour un composant horloger selon l'invention, en fonction de la dose d'implantation,
  • les figures 3, 4, 5 et 6 représentent différentes possibilités d'implantation dans un substrat, et
  • les figures 7, 8 et 9 proposent différentes configurations de substrat pouvant convenir à la mise en œuvre de l'invention.
Other details of the invention will appear more clearly on reading the following description, made with reference to the appended drawings in which:
  • the figure 1 illustrates the friction measured with an ion implanted watch component at different doses, depending on the distance (in m) traveled in contact with the component by a ruby sphere,
  • the figure 2 illustrates the evolution of the average coefficient of friction measured under the conditions of the figure 1 for a watch component according to the invention, as a function of the implantation dose,
  • the figures 3, 4, 5 and 6 represent different possibilities of implantation in a substrate, and
  • the figures 7, 8 and 9 propose different substrate configurations that may be suitable for the implementation of the invention.

Mode de réalisation de l'inventionEmbodiment of the invention

Les récentes recherches menées par la déposante sur l'amélioration des propriétés tribologiques de composants horlogers destinés à subir un frottement dynamique, particulièrement de composants réalisés à base d'un substrat comprenant une couche de silicium ont permis de montrer que l'implantation ionique permettait d'obtenir des résultats prometteurs. Les composants concernés sont destinés à interagir dynamiquement avec un autre composant afin de transmettre une fonction cinématique l'un à l'autre. Ceci s'effectue par contact dynamique entre les éléments, c'est-à-dire par un contact qui se varie lors d'au moins une partie du temps de l'interaction et qui ne reste pas toujours statique. En d'autres termes, cette transmission implique l'engendrement d'un déplacement relatif entre les deux composants à leurs points de contact, ce contact générant des forces de réaction et ainsi des frottements dynamiques à ces endroits. Une roue dentée engrenant avec une autre subit donc un frottement dynamique au niveau des surfaces de contact de sa denture, ce qui est également le cas entre les certains composants de l'échappement, notamment une ancre, une roue d'ancre ou la partie d'un résonateur subissant des frottements, telle qu'une cheville de plateau, qui subissent des frottements dynamiques aux endroits où ils interagissent avec des composants voisins. Par contre, un ressort spiral étant solidaire d'une part avec son piton et d'autre part avec l'axe de balancier, il ne subit aucun frottement dynamique dans le sens de l'invention et est donc exclu de sa portée puisqu'aucun déplacement relatif n'est présent aux points de contact entre le ressort et les composants avec lesquels il interagit.Recent research carried out by the applicant on the improvement of the tribological properties of watchmaking components intended to undergo dynamic friction, particularly components made from a substrate comprising a layer of silicon, has made it possible to show that ion implantation makes it possible to obtain promising results. The components concerned are intended to dynamically interact with another component in order to transmit a kinematic function to each other. This is done by dynamic contact between the elements, that is to say by a contact which varies during at least part of the time of the interaction and which does not always remain static. In other words, this transmission involves the generation of a relative displacement between the two components at their points of contact, this contact generating reaction forces and thus dynamic friction at these places. A toothed wheel meshing with another therefore undergoes dynamic friction at the level of the contact surfaces of its teeth, which is also the case between certain components of the escapement, in particular an anchor, an escape wheel or the part of the escapement. a frictional resonator, such as a platter peg, which experiences dynamic friction where it interacts with neighboring components. On the other hand, a spiral spring being integral on the one hand with its peak and on the other hand with the balance shaft, it does not undergo any dynamic friction in the sense of the invention and is therefore excluded from its scope since no relative displacement is only present at the points of contact between the spring and the components with which it interacts.

Dans la présente demande, l'expression « couche de silicium » englobe des substrats pour lesquels, au sein de la couche, le silicium ne forme pas de liaison atomique avec d'autres atomes. Les différentes natures cristallographiques du silicium (monocristallin, polycristallin et amorphe, seules ou en combinaison) sont comprises dans la portée de l'invention et des dopages ou d'éventuelles impuretés présentes dans le substrat sont également possibles et englobés dans la portée des revendications. Une couche unique de silicium, formant un noyau de silicium, est également comprise dans la portée de la protection.In the present application, the expression "silicon layer" encompasses substrates for which, within the layer, the silicon does not form atomic bond with other atoms. The different crystallographic natures of silicon (monocrystalline, polycrystalline and amorphous, alone or in combination) are included in the scope of the invention and dopings or possible impurities present in the substrate are also possible and included in the scope of the claims. A single layer of silicon, forming a silicon core, is also included in the scope of protection.

Un tel résultat était inattendu, car la fragilité des substrats à base de silicium rend nécessaire l'utilisation d'une couche de protection sur les substrats, afin de pouvoir les manipuler et les utiliser. Ainsi, qu'il s'agisse de substrats réalisés en silicium monocristallin, en silicium polycristallin ou en silicium amorphe, dans le domaine de l'horlogerie, ces substrats subissent toujours une opération de protection au cours de laquelle une couche de protection est réalisée à la surface du substrat, par modification du substrat. Ces couches de protection peuvent être une couche d'oxyde obtenue par oxydation du substrat ou une couche de nitrure obtenue par nitruration du substrat. On peut encore envisager que la couche de protection soit obtenue par dépôt.Such a result was unexpected, because the fragility of silicon-based substrates makes it necessary to use a protective layer on the substrates, in order to be able to handle and use them. Thus, whether the substrates are made of monocrystalline silicon, polycrystalline silicon or amorphous silicon, in the field of watchmaking, these substrates always undergo a protection operation during which a protective layer is produced at the surface of the substrate, by modifying the substrate. These protective layers can be an oxide layer obtained by oxidation of the substrate or a nitride layer obtained by nitriding of the substrate. It is also possible to envisage that the protective layer be obtained by deposition.

Comme mentionné, cette couche de protection est obtenue par une opération effective de protection et une couche d'oxydation naturelle n'est pas une couche de protection au sens de la présente demande, car elle ne résulte pas d'une opération de protection en tant que telle, réalisée de manière effective et positive.As mentioned, this protective layer is obtained by an effective protective operation and a natural oxidation layer is not a protective layer within the meaning of the present application, because it does not result from a protective operation as as such, carried out in an effective and positive manner.

A titre d'exemple, une couche de protection réalisée en SiO2 obtenue par une étape d'oxydation, mesure au moins 50 nm d'épaisseur, ce qui ne peut être obtenu avec une oxydation naturelle.By way of example, a protective layer made of SiO 2 obtained by an oxidation step measures at least 50 nm in thickness, which cannot be obtained with natural oxidation.

Ainsi, la présence d'une couche de protection, avec comme conséquence le fait que le silicium n'est pas directement à l'extérieur du composant, en contact avec les autres composants horlogers avec lesquels il peut interagir, fait qu'il était difficile d'anticiper les effets d'une implantation ionique dans le substrat, plus généralement à la surface du composant.Thus, the presence of a protective layer, with the consequence that the silicon is not directly outside the component, in contact with the other horological components with which it can interact, makes it difficult to anticipate the effects of an ion implantation in the substrate, more generally on the surface of the component.

Les figures 7, 8 et 9 représentent ainsi différentes configurations de substrat et de couche de protection pouvant être mises en œuvre dans le cadre de l'invention. A la figure 7, le substrat prend la forme d'une couche simple de silicium 10, recouvert d'une couche de protection 12. A la figure 8, le substrat prend la forme de deux couches de silicium 10, séparées et recouvertes d'une couche de protection 12. On pourrait ainsi avoir une alternance de plusieurs couches de silicium. Enfin, à la figure 9, le substrat comprend un noyau 14 recouvert d'une couche de silicium 10 dont l'épaisseur est telle que ses propriétés tribologiques sont équivalentes à celles d'un substrat en silicium. La couche de protection 12 recouvre la couche de silicium. De préférence, l'épaisseur de la couche de silicium est supérieure à la profondeur d'implantation ionique, de manière à ce que les ions ne pénètrent pas dans le noyau.The figures 7, 8 and 9 thus represent different substrate and protective layer configurations that can be implemented within the scope of the invention. To the figure 7 , the substrate takes the form of a single layer of silicon 10, covered with a protective layer 12. At the figure 8 , the substrate takes the form of two layers of silicon 10, separated and covered with a protective layer 12. There could thus be an alternation of several layers of silicon. Finally, at the figure 9 , the substrate comprises a core 14 covered with a layer of silicon 10 whose thickness is such that its tribological properties are equivalent to those of a silicon substrate. The protection layer 12 covers the silicon layer. Preferably, the thickness of the silicon layer is greater than the depth of ion implantation, so that the ions do not penetrate into the core.

Ainsi, l'invention concerne une méthode d'optimisation des propriétés tribologiques d'un composant horloger destiné à subir un frottement dynamique, réalisé à base d'un substrat comprenant une couche de silicium dont la structure cristallographique comprend au moins l'une des formes monocristalline, polycristalline ou amorphe, ledit substrat étant renforcé par une couche de protection réalisée à sa surface au cours d'une opération de protection du substrat, ladite méthode comprenant une étape d'implantation ionique d'au moins un ion, par bombardement ionique à la surface dudit composant, dans lequel l'étape d'implantation est effectuée avec des ions C, à une dose supérieure à 5.1017 ions/cm2 et/ou avec des ions N, à une dose supérieure à 1.1016 ions/cm2.Thus, the invention relates to a method for optimizing the tribological properties of a watch component intended to undergo dynamic friction, produced on the basis of a substrate comprising a layer of silicon whose crystallographic structure comprises at least one of the forms monocrystalline, polycrystalline or amorphous, said substrate being reinforced by a protective layer produced on its surface during a substrate protection operation, said method comprising a step of ion implantation of at least one ion, by ion bombardment the surface of said component, in which the implantation step is carried out with C ions, at a dose greater than 5.10 17 ions/cm 2 and/or with N ions, at a dose greater than 1.10 16 ions/cm 2 .

De manière avantageuse, la zone implantée ioniquement 16 est partagée entre le substrat, illustré ici en la forme d'une simple couche de silicium 10, et la couche de protection 12, le substrat présentant une implantation (en nombre d'ions) supérieure à la couche de protection. La figure 4 présente une telle configuration. On constate, plus précisément, que les ions présents dans la couche de protection sont peu, voire très peu nombreux et qu'ils sont essentiellement concentrés dans une zone précise du substrat. Dans le cas d'une implantation ionique effectuée par bombardement ionique (par exemple, ion beam, MEWA - Metal Vapor Vacuum Arc), la courbe de densité des ions en fonction de la profondeur du composant forme une gaussienne étroite montrant cette concentration dans une région précise. Dans le cas d'une implantation ionique effectuée sous atmosphère plasma (par exemple, Plasma Immersion Ion Implantation), la répartition se fera avec une concentration d'ions à tendance décroissante en fonction de la profondeur atteinte. Selon les substrats à traiter et la complexité de la géométrie, l'une au l'autre de ces méthodes générales peut être préférable, voire, une combinaison des deux.Advantageously, the ion-implanted zone 16 is shared between the substrate, illustrated here in the form of a single layer of silicon 10, and the protective layer 12, the substrate having an implantation (in number of ions) greater than the protective layer. The figure 4 has such a configuration. It is observed, more specifically, that the ions present in the protective layer are few, or even very few in number and that they are essentially concentrated in a precise zone of the substrate. In the case of an ion implantation carried out by ion bombardment (for example, ion beam, MEWA - Metal Vapor Vacuum Arc), the curve of density of the ions according to the depth of the component forms a narrow Gaussian showing this concentration in a precise region. In the case of an ion implantation carried out under a plasma atmosphere (for example, Plasma Immersion Ion Implantation), the distribution will be done with a concentration of ions with a decreasing tendency according to the depth reached. Depending on the substrates to be treated and the complexity of the geometry, one or the other of these general methods may be preferable, or even a combination of the two.

On ne peut exclure que, avec une implantation sous une énergie suffisante, il soit possible de n'avoir des ions que dans le substrat (couche de silicium 10) et pas dans la couche de protection 12 (figure 3). De manière plus courante, la zone implantée est située au moins dans le substrat.It cannot be excluded that, with an implantation under sufficient energy, it is possible to have ions only in the substrate (silicon layer 10) and not in the protective layer 12 ( picture 3 ). More commonly, the implanted zone is located at least in the substrate.

L'inverse est également possible, c'est-à-dire que la zone implantée 16 soit située uniquement dans la couche de protection 12 (figure 5). C'est notamment le cas avec une couche de protection présentant une épaisseur plus importante que la profondeur d'implantation obtenue avec une énergie donnée. De manière plus courante, la zone implantée est située au moins dans la couche de protection.The reverse is also possible, that is to say that the implanted zone 16 is located only in the protective layer 12 ( figure 5 ). This is particularly the case with a protective layer having a greater thickness than the implantation depth obtained with a given energy. More commonly, the implanted zone is located at least in the protective layer.

Ainsi, la zone implantée ioniquement peut être située soit dans la couche de protection uniquement, soit dans le substrat uniquement ou partagée entre la couche de protection et le substrat, c'est-à-dire dans la région de l'interface entre la couche de protection et le substrat.Thus, the ion-implanted zone can be located either in the protection layer only, or in the substrate only or shared between the protection layer and the substrate, that is to say in the region of the interface between the layer protection and the substrate.

Notamment en raison des modifications structurelles ou cristallographiques, ou des modifications des interactions entre le substrat et la couche de protection, dues à l'implantation ionique, les propriétés tribologiques d'un tel composant implanté, sont améliorées.In particular because of structural or crystallographic modifications, or modifications of the interactions between the substrate and the protective layer, due to ion implantation, the tribological properties of such an implanted component are improved.

On a notamment constaté une amélioration des propriétés tribologiques de composants horlogers présentant une zone implantée ioniquement majoritairement, ou même uniquement avec des ions C, implantés avec une dose supérieure à 5.1017 ions/cm2, de préférence supérieure à 1.1018 ions/cm2.In particular, an improvement has been observed in the tribological properties of watch components having a zone implanted ionically mainly, or even only with C ions, implanted with a dose greater than 5× 10 17 ions/cm 2 , preferably greater than 1×10 18 ions/cm 2 .

Ainsi, la figure 1 montre le coefficient de frottement d'un substrat sur une sphère en rubis, roulant sur le substrat sur une distance de 100m (en abscisse). Les premiers centimètres de la courbe correspondent à un rodage et à la mise en place de conditions régulières, et ne sont pas significatifs. La courbe A est celle de référence, obtenue pour un substrat sans implantation ionique. La courbe B est obtenue pour un substrat identique, implanté ioniquement avec une dose d'ions C de 2.1017 ions/cm2, avec une énergie de 600keV. La courbe C est obtenue pour un substrat identique, implanté ioniquement avec une dose d'ions C de 1.1018 ions/cm2, avec une énergie de 600keV. On constate que le coefficient de frottement de l'échantillon représenté sur la courbe B présente un coefficient de frottement plus élevé que l'échantillon de référence, alors que l'implantation ionique de la courbe C permet de diminuer ce coefficient de frottement sur quasiment toute la longueur du trajet parcouru par la sphère.Thus, the figure 1 shows the friction coefficient of a substrate on a ruby sphere, rolling on the substrate over a distance of 100m (abscissa). The first centimeters of the curve correspond to a break-in and the establishment of regular conditions, and are not significant. Curve A is the reference curve, obtained for a substrate without ion implantation. Curve B is obtained for an identical substrate, implanted ionically with a dose of C ions of 2.10 17 ions/cm 2 , with an energy of 600 keV. Curve C is obtained for an identical substrate, implanted ionically with a dose of C ions of 1.10 18 ions/cm 2 , with an energy of 600 keV. It can be seen that the coefficient of friction of the sample represented on curve B has a higher coefficient of friction than the reference sample, whereas the ion implantation of curve C makes it possible to reduce this coefficient of friction over almost all the length of the path traveled by the sphere.

La figure 2 montre les coefficients de frottement moyens mesurés dans des conditions similaires à celles de la figure 1, hormis l'énergie qui est dans ce cas de 35keV, en fonction de la dose d'implantation, et sur des substrats différents avec une couche de SiO2 d'épaisseur différente, ce qui explique les résultats non comparables directement. Les effets obtenus avec une dose de 5.1017 ions/cm2 sont déjà intéressants. Les valeurs de la courbe en traitillé sont des extrapolations. D'autre part, aucune mesure entre le substrat non implanté (dose = 0.1016 ions/cm2) et une dose de 25.1016 ions/cm2 n'a été effectuée, et les résultats sur un autre échantillon donnant des résultats non linéaires (péjoration avant amélioration), aucune extrapolation ne peut être proposée.The figure 2 shows the average coefficients of friction measured under conditions similar to those of the figure 1 , apart from the energy which in this case is 35keV, depending on the implantation dose, and on different substrates with a layer of SiO 2 of different thickness, which explains the results which are not directly comparable. The effects obtained with a dose of 5.10 17 ions/cm 2 are already interesting. The values of the dashed curve are extrapolations. On the other hand, no measurement between the non-implanted substrate (dose = 0.10 16 ions/cm 2 ) and a dose of 25.10 16 ions/cm 2 was carried out, and the results on another sample giving nonlinear results (deterioration before improvement), no extrapolation can be proposed.

D'autres tests ont permis de montrer qu'une implantation réalisée majoritairement, ou même uniquement avec des ions N, avec une dose > 1.1016 ions/cm2, permettait également d'améliorer les propriétés tribologiques d'un composant réalisé à base d'un substrat à base de silicium, notamment son coefficient de frottement.Other tests have made it possible to show that an implantation carried out mainly, or even only with N ions, with a dose > 1.10 16 ions/cm 2 , also made it possible to improve the tribological properties of a component produced from a silicon-based substrate, in particular its coefficient of friction.

Tout comme avec le carbone, les ions azote peuvent être implantés dans la couche de protection, dans le substrat, ou dans la région de l'interface entre le substrat et la couche de protection, majoritairement dans le substrat, voire uniquement dans le substrat si l'énergie est suffisante.Just as with carbon, the nitrogen ions can be implanted in the protective layer, in the substrate, or in the region of the interface between the substrate and the protective layer, mainly in the substrate, or even only in the substrate if the energy is sufficient.

Dans une variante avantageuse, on peut implanter de manière combinée des ions C et des ions N, soit alternativement, soit simultanément, selon le type d'installation utilisé.In an advantageous variant, it is possible to implant C ions and N ions in a combined manner, either alternately or simultaneously, depending on the type of installation used.

On pourra, de préférence, utiliser des composants implantés ioniquement, tels que proposés ci-dessus, pour réaliser des composants soumis à des chocs ou des frottements répétés ou importants, notamment les composants de l'échappement, notamment une ancre, une roue d'ancre ou la partie d'un résonateur subissant des frottements, telle qu'une cheville de plateau.It is possible, preferably, to use ion-implanted components, as proposed above, to produce components subjected to repeated or significant shocks or friction, in particular the components of the escapement, in particular an anchor, a steering wheel anchor or part of a resonator subject to friction, such as a platter peg.

L'invention concerne également le procédé d'implantation des composants décrits ci-dessus, définissant également une méthode d'optimisation des propriétés tribologiques d'un composant horloger tel que mentionné ci-dessus, réalisé à base d'un substrat comprenant une couche de silicium 10 dont la structure cristallographique comprend au moins l'une des formes monocristalline, polycristalline ou amorphe, ledit substrat étant renforcé par une couche de protection 12 réalisée à sa surface au cours d'une opération de protection du substrat. Selon l'invention, la méthode comprend une étape d'implantation ionique d'au moins un ion, par bombardement ionique à la surface dudit composant.The invention also relates to the process for implanting the components described above, also defining a method for optimizing the tribological properties of a horological component as mentioned above, produced on the basis of a substrate comprising a layer of silicon 10 whose crystallographic structure comprises at least one of the monocrystalline, polycrystalline or amorphous forms, said substrate being reinforced by a protective layer 12 produced on its surface during a substrate protection operation. According to the invention, the method comprises a step of ion implantation of at least one ion, by ion bombardment on the surface of said component.

Ainsi, l'étape d'implantation peut être effectuée avec des ions C, à une dose supérieure à 5.1017 ions/cm2, de préférence supérieure à 1.1018 ions/cm2 et avec une énergie supérieure à 600keV, ou avec des ions N, à une dose supérieure à 1.1016 ions/cm2 et avec une énergie supérieure à 600keV.Thus, the implantation step can be carried out with C ions, at a dose greater than 5.10 17 ions/cm 2 , preferably greater than 1.10 18 ions/cm 2 and with an energy greater than 600keV, or with ions N, at a dose greater than 1.10 16 ions/cm 2 and with an energy greater than 600keV.

L'implantation est réalisée sur les composants lorsque, après gravure, ils ont été détachés du wafer de base dans lequel ils sont gravés. En effet, les zones des composants qu'il est pertinent de traiter au niveau tribologique, sont les faces latérales qui, en général dans l'horlogerie, sont celles qui sont exposées aux frottements. Ainsi, au niveau du wafer, non seulement ces faces latérales ne sont pas encore définies et donc pas accessibles non plus pour pouvoir réaliser l'opération de protection, fondamentale dans la présente demande. Pour des raisons de commodité de manipulation, il est néanmoins possible que les composants restent solidaires du wafer ou d'une partie du wafer, au moins en un point, pour permettre une manipulation par batch des composants, les composants pouvant être séparés aisément du support formé par le wafer, par exemple en cassant la jonction entre le wafer et le composant, après que ce dernier ait subit les opérations de protection et d'implantation ionique.The implantation is carried out on the components when, after etching, they have been detached from the base wafer in which they are etched. Indeed, the areas of the components that it is relevant to treat at the tribological level, are the side faces which, in general in watchmaking, are those which are exposed to friction. Thus, at the wafer level, not only these side faces are not yet defined and therefore not accessible either to be able to carry out the protection operation, fundamental in the present application. For reasons of handling convenience, it is nevertheless possible for the components to remain attached to the wafer or to a part of the wafer, at least at one point, to allow batch handling of the components, the components being able to be easily separated from the support. formed by the wafer, for example by breaking the junction between the wafer and the component, after the latter has undergone protection and ion implantation operations.

On notera que, du côté des faces latérales des composants, en fonction de la structure cristallographique du wafer, on aura des flancs non homogènes au niveau cristallographique. Par exemple, avec un wafer 111, les flancs latéraux des composants peuvent passer à tout endroit de la maille cristallographique. Malgré cela, et malgré le fait que l'implantation ionique est directionnelle et que le bombardement ionique peut présenter un angle d'incidence variable sur les faces latérales du composant, on obtient une amélioration tribologique qui se moyenne sur l'ensemble de la surface latérale du composant et qui est significative. Par conséquent, la méthode proposée dans la présente demande trouve à s'appliquer avec des substrats d'orientation cristallographique quelconque, étant donné que, au niveau des surfaces latérales, la pièce pourra prendre toutes les orientations cristallographiques.It will be noted that, on the side of the lateral faces of the components, depending on the crystallographic structure of the wafer, there will be non-homogeneous flanks at the crystallographic level. For example, with a wafer 111, the lateral flanks of the components can pass at any place of the crystallographic lattice. Despite this, and despite the fact that the ion implantation is directional and that the ion bombardment can have a variable angle of incidence on the side faces of the component, a tribological improvement is obtained which is averaged over the entire side surface. of the component and which is significant. Consequently, the method proposed in the present application can be applied with substrates of any crystallographic orientation, given that, at the level of the lateral surfaces, the part can assume all crystallographic orientations.

Ainsi est proposée une nouvelle voie dans l'amélioration des propriétés tribologiques des composants horlogers. L'homme du métier peut, sur la base de l'enseignement de la présente demande, envisager de jouer sur les paramètres d'implantation en termes de dose et d'énergie, ou encore de durée de traitement, mais sans toutefois sortir du cadre de la présente invention défini par les revendications.Thus, a new way is proposed in the improvement of the tribological properties of watchmaking components. The skilled person can, on the basis of the teaching of the present application, consider playing on the implantation parameters in terms of dose and energy, or even treatment duration, but without departing from the scope of the present invention defined by the claims.

L'homme du métier pourra même envisager d'avoir plusieurs zones implantées 16, à des profondeurs différentes, typiquement deux, séparées par une zone non implantée ou faiblement implantée, indépendamment de la couche (de protection ou de silicium). Une telle structure peut notamment être obtenue en effectuant deux étapes d'implantation avec des paramètres différents, notamment au niveau de l'énergie d'implantation (figure 6).Those skilled in the art could even consider having several implanted zones 16, at different depths, typically two, separated by a non-implanted or weakly implanted zone, independently of the layer (of protection or of silicon). Such a structure can in particular be obtained by carrying out two implantation steps with different parameters, in particular at the level of the implantation energy ( figure 6 ).

Claims (5)

  1. Method for optimizing the tribological properties of a timepiece component intended to undergo dynamic friction, realised on the basis of a substrate comprising a layer of silicon (10) of which the crystallographic structure comprises at least one of the monocrystalline, polycrystalline or amorphous forms, said substrate being reinforced by a protection layer (12) realised on its surface during a substrate protection operation, said method comprising a step of ion implantation of at least one ion, by ion bombardment on the surface of said component,
    wherein the implantation step is performed with C ions, with a dose greater than 5.1017 ions/cm2 and/or with N ions, with a does greater than 1.1016 ions/cm2.
  2. Method according to Claim 1, characterized in that the dose of C ions is greater than 1.1018 ions/cm2.
  3. Method according to one of Claims 1 and 2, characterized in that it is realised on formed components, at least partially detached from a base wafer, to allow treatment of the lateral faces of said components.
  4. Method according to one of the preceding claims, characterized in that said ions are implanted with an energy greater than 600 keV.
  5. Method according to one of the preceding claims, characterized in that said protection layer is realised in SiO2 obtained by an oxidation step and measuring at least 50 nm thickness.
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ES2165315B1 (en) * 2000-03-31 2003-08-01 Consejo Superior Investigacion PROCEDURE FOR MANUFACTURE OF SILICON CARBIDE LAYERS (SIC) BY ION CARBON AND RECOGNIZED IONIC IMPLEMENTATION.
DE602006004055D1 (en) * 2005-06-28 2009-01-15 Eta Sa Mft Horlogere Suisse REINFORCED MICROMECHANICAL PART
WO2009043391A1 (en) * 2007-10-05 2009-04-09 Creepservice Sarl Barrel spring with high energy storage capacity and method for making same
CH699780B1 (en) * 2008-10-22 2014-02-14 Richemont Int Sa of self-compensating balance spring watch.
CH708067B1 (en) * 2008-10-22 2014-11-28 Richemont Int Sa of self-compensating balance spring watch.
CH705724B9 (en) * 2011-11-03 2016-05-13 Sigatec Sa micromechanical component, in particular for watches.
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