EP3529033A1

EP3529033A1 - Measuring device and method for measuring two or three-dimensional film topography and method for recognising in-line patterns in two or three-dimensional film topography

Info

Publication number: EP3529033A1
Application number: EP17768662.3A
Authority: EP
Inventors: Christoph Lettowsky; Paul Walach
Original assignee: Reifenhaeuser GmbH and Co KG Maschinenenfabrik
Current assignee: Reifenhaeuser GmbH and Co KG Maschinenenfabrik
Priority date: 2016-10-18
Filing date: 2017-08-01
Publication date: 2019-08-28
Also published as: CN109906139A; US20190255754A1; BR112019007654A2; WO2018072768A1; DE112017005257A5; CA3040586A1

Abstract

The invention relates to the detection and use of film topography (23) of a film web (13, 40, 51) produced in blow film or casting film methods for improving the quality of the film web (13, 40, 51). In particular, film topography (23) can be quantitatively detected using said the invention. In another aspect of the invention, the film topography (23) is analysed using a pattern recognition algorithm and is optionally allocated an error image (50). This information is used in order to improve the quality of the film web (13, 40, 51) by controlling action recommendations dependent on the error image and to quantitatively detect the flatness of a film web (13, 40, 51). The invention also relates to an influencing element (30) for influencing the properties of a film web (13, 40, 51) in the position where the film topography (23) is determined.

Description

MEASURING DEVICE AND METHOD FOR MEASURING / INLINE PATTERN RECOGNITION OF A TWO OR THREE-DIMENSIONAL FOLIENTOPOGRAPHY

The invention relates to a measuring device for measuring a two- or three-dimensional film topography, a system for producing a film web, a method for inline pattern recognition of defect images in a two- or three-dimensional film topography, a method for controlling the production process of a film web for preventing defects, a method for controlling the production process of a film web to prevent defects, a method for inline flatness determination, a system for producing a film web and a method for determining inline a first error, in particular flatness error.

In blown film extrusion, a plastic melt provided by the extruder is formed by means of a blow head through an annular gap to form a film tube. The film tube is then guided from the calibration basket and folded in the flat.

Due to process-related deviations in the film topography and / or different cooling and / or uneven local stresses so-called flatness errors occur. These have in particular undesirable effects on the processability of the films and on the windability of the films.

Flatness deviations of films are nowadays made visible by cutting an approximately 10 meter long film sample which is spread and swept out on the floor. A more qualified measuring method for a flatness measurement of non-wound film webs is currently unknown in the prior art.

For other web materials, in particular stiffer web materials such as steel, aluminum and paper webs, measuring systems for flatness measurement are known on the market. These have not yet been used in the film industry. Larger hurdles are expected in the use of these systems, since the flatness error of flexible foil webs is superimposed by a multiplicity of influences.

The optical sensors for determining the flatness used for stiffer sheet materials project a line onto the material web, detect by an optical sensor the behavior of this line in an outgoing web and apply, for example, a method which consists of the detected behavior of the line projected onto the running web to close the flatness error.

A flatness error, for example, causes a "restless" behavior of the line, and the height of the deviation of the measurement line from a set average indicates a quantitative value of the flatness.

In the case of steel, aluminum and paper webs, this type of flatness measurement works well, since these materials have a high or at least comparatively high rigidity. However, in view of the completely different stability of a blown film, the flatness measurement for metal strips is alien to the general here.

Due to the flexibility of a film web, the flatness of a web in its appearance and thus the measurement of this error ("restless line") of other errors that have other causes, but in the same way on the Appearance of the train and thus the measurement express superimposed. As an example, folds are called, which are caused by too high or too low web tension in the film. These are folds that occur in the web direction.

A conclusion on the actual flatness is thus not possible by a simple measurement, as it works with steel, aluminum and paper webs.

WO 2007/107147 AI discloses a method for detecting the flatness deviation of flexible, sheet-like, wound flat goods immediately when unwinding from a roll.

DE 40 24 326 A1 discloses an apparatus and a method for reducing the film sag and the tension profile, wherein the film web is heated, cooled and stretched.

The invention has for its object to provide the prior art an improvement or an alternative.

According to a first aspect of the invention, the object is achieved by a measuring device for measuring a two-dimensional or three-dimensional film topography of a film web produced in the blown or cast film method with a radiation source, in particular a light source, a detector and a data processing and evaluation unit, wherein the radiation source and the detector has a different position, the radiation source projects a radiation pattern onto a designated path of the film web, the radiation pattern being in particular a line with, in particular, parallel light, the detector is set up to detect the projected radiation pattern, in particular to detect the projected line, the detector is focused on the projected radiation pattern, in particular the projected line, and the data processing and evaluation unit has programming, the programming for carrying out a triangulation method and / or he a reflection method and / or a transmission method for determining the film topography is set up.

Conceptually, the following is explained:

First of all, it should be expressly pointed out that in the context of the present 80 patent application, indefinite articles and numbers such as "a", "two", etc. should as a rule be understood as "at least" information, ie as "at least one ..." , "At least two ...", etc., unless expressly stated in the respective context or it is obvious or technically imperative for the skilled person that there only "exactly one ...", "exactly two ...", etc . can be meant.

85 A "measuring device" means a measuring system, which consists of a light source and a detector, wherein the light source emits a light beam on a film web and a reflected and / or transmitted light beam is detected by a detector, wherein the light image detected by the detector for determining and evaluation of the film topography.The measuring device may be for single-layer or multi-layer

90 film webs are used, each with one or more layers. Furthermore, a measuring device may have additional adaptive illumination of the background. The measuring device can illuminate the object, in particular the film web, in the transillumination method and / or in the incident light method and / or in the schlieren method. The object may be against a light background and / or against a dark background

95 be illuminated. For dark backgrounds, a dark background distinguishes between a near dark background and a distant dark background. In particular, the measuring device uses a triangulation method and / or a reflection method and / or a transmission method.

A "film topography" describes the geometric shape of an outer side of the film web.Outside of the film web can be understood both sides of the film web.The film topography is also to be understood macroscopically and not microscopically. but the shape of the film web or the contour of the film web are understood. Here, the film topography can be referred to as a two-dimensional or three-dimensional film topography as needed.

The "film web" can either be a single-layer film web or a tubular film web, whereby the hose can be split or tubular. Film Stretch "is to be understood as the logical / abstract web of the film and not necessarily as the film itself. The film may be on the film path. The film does not have to be on the film path. The film line is a "designated track of the film web".

A "radiation source" is any natural or physical-technical source of radiation.

A "light source" is a natural or physical-technical place of origin of electromagnetic radiation, in particular of light.A light source is to be understood as any light source, ie a light source with arbitrary frequency and intensity of the wavelength distribution In particular, a light source means laser light, white light, LED light or infrared light, and a light source also means a combined source for different types of light of any combination.

A "sensor" or "detector" is a technical component that can quantify certain physical or chemical properties and / or the physical condition of its environment qualitatively or as a "measurand." These quantities are detected by means of physical or chemical effects transformed into an analog or digital electrical signal. A "radiation pattern" is a pattern of radiation, in particular electromagnetic radiation A "pattern" is a structure, in particular a static structure, which can be recognized by its repeated identical appearance.

Depending on the sensor used, it has an analog-to-digital converter and a measured value memory or data memory, and the data acquisition system can record several measurands in parallel.

A "data processing and evaluation unit" is an electronic entity that organizes data volumes in an organized manner, with the goal of obtaining information about these data sets or changing those data sets by recording data in records, according to a human procedure or machine and output as result.

A "triangulation method" is a geometric method for optical distance measurement by means of precise angle measurement within triangles.Thus triangulation can be used to measure surfaces by determining the positions of individual points Triangulation of the reflected light determines the position of individual surface points, whereby the film topography is determined and evaluated.

A "reflection method" makes use of the properties of reflection of waves at an interface where the characteristic impedance or refractive index of the propagation medium changes to evaluate the properties of a medium In the case of a film web, light is projected onto the film and the reflection is viewed in a matrix camera The reflection image considered is used to determine and evaluate the film topography. A "transmission method" is a method in which the transmittance of a medium for waves is evaluated by means of the transmittance.When a wave strikes a different medium of finite thickness, it is partly reflected at the interfaces depending on the material properties of the medium The remaining part is transmitted through the deviating medium and exits on the opposite side of the deviating medium.The film topography is determined and evaluated on the basis of the reflected light, which is detected with a matrix camera.

Properties of the deviating medium can be determined on the basis of the "transmittance" as the quotient of the wave intensity behind and in front of the deviating medium For the purpose of quantification, a piece of film web can sometimes be cut into narrow longitudinal strips at great expense and, depending on the differences in length, the degree of distortion in the film topography can be estimated both methods do not allow fast process adaptations for current film production, and neither method can quantify a film topography State of the art currently not known.

By way of derogation, it is proposed here to quantitatively detect the two- or three-dimensional film topography of a film web produced in the blown or cast film method with a measuring device consisting of a radiation source, in particular a light source, a detector and a data processing and evaluation unit. and evaluation unit has programming, whereby the for implementing a triangulation method and / or a reflection method and / or a transmission method for determining the film topography.

The invention thus describes a method for unambiguous flatness determination of flexible films. The aim of the method is a flatness measurement on foils, which can provide a quantitative value alone for the flatness and is not superimposed by other influences.

For this purpose, either the influence of the factors that causally influence the image of the defect must be isolated from other influencing factors. If this is not possible, the flatness is calculated from the superimposed measurement result using an algorithm.

A preferred embodiment can be realized in that the radiation source and the detector have a different position, the radiation source projects a radiation pattern onto a designated travel path of the film web and the detector is set up to detect the projected radiation pattern.

The detector is preferably focused on the radiation pattern projected onto the designated running path of the film web.

An optional embodiment makes it possible for the measuring device to in-line quantitatively record the film topography of a film web produced in the blown or cast film process.

It is specifically conceivable, inter alia, that the film topography of the film web can be passed on in real time in the form of digital data from the measuring device.

In a preferred embodiment, the radiation pattern projected onto the designated running path of the film web is a simple line, in particular the line may run as a straight line at the designated running path of the film web. It can advantageously be achieved hereby that a two- or three-dimensional folio topography of a film web produced in the blown or cast film process can be detected quantitatively.

Furthermore, it can advantageously be achieved that the recorded film topography can be digitally stored and / or further processed and / or used to improve the product properties of the film web.

Preferably, the radiation source and the detector are positioned in a common housing.

For example, it is conceivable that the radiation source and the detector are connected to one another in a particularly rigid housing.

Advantageously, it can thereby be achieved that the measuring device consisting of radiation source and detector is less susceptible to external influences, in particular against misalignment of the measuring device.

Furthermore, it can advantageously be achieved that a change in position of the measuring device can be carried out more easily by translation and / or rotation.

Advantageously, it can also be achieved that the measuring device can be robustly protected in a common housing, as a result of which the measuring device on the one hand is protected against operating materials and / or other environmental influences and on the other hand can not be adjusted unintentionally. Optionally, the radiation pattern projected onto the designated running path of the film web extends across the machine direction over the entire width of the designated running path of the film web.

Conceptually, the following is explained: The "machine direction" is the direction in which the designated path of travel of the film web passes through the machine, in particular, the machine direction is not a global direction, but may change with the designated run distance of the film web through the machine.

It can advantageously be achieved in this way that the film topography can be detected quantitatively on the complete width of the film web. The radiation pattern projected onto the designated running path of the film web preferably proceeds in the machine direction and has a length.

Conceptually, the following is explained:

The "length" of the radiation pattern is to be understood as the expression of the radiation pattern on the designated running surface of the film web by the machine, in particular the running surface can be synonymous with the running distance.

Advantageously, this can be achieved in that the three-dimensionality of the film topography can be better detected.

Optionally, the radiation pattern projected onto the designated running path of the film web extends at an angle diagonally across the designated running path of the film web.

Advantageously, this can achieve that the components of the measuring device need not be positioned above and / or below the designated running distance of the film web.

Preferably, an adjusting device is provided for the angle. Conceptually, the following is explained: An "adjusting device" is a device which is adapted to adjust something, in particular an adjusting device is a device for adjusting the angle.

It can advantageously be achieved by this that the measuring device can be easily adapted to different film widths.

Optionally, the device has a second detector, which is likewise connected to the data processing and evaluation unit and has a different position from the first detector and the radiation source.

It can advantageously be achieved by this that the three-dimensionality of the film topography can be better detected. In particular, the height coordinate of the film copography can be detected with a lower measurement inaccuracy.

According to a second aspect of the invention, the object solves a system for producing a film web, wherein the system comprises an extruder for plasticizing a thermoplastic, a nozzle for the escape of the plastic, a deflection and a winder, wherein the system comprises a measuring device for inline measuring a two-dimensional or three-dimensional film topography according to any one of the preceding claims.

Conceptually, the following is explained:

A nozzle is a device that is adapted to allow a plastic to escape, in particular, a nozzle means a slot die or a ring die, and a nozzle may have a plurality of actuators configured to adjust a die gap.

It will be appreciated that the advantages of a measuring device for measuring a two-dimensional or three-dimensional film topography of a blown or cast film method can be obtained. web of film having a radiation source, in particular a light source, a detector and a data processing and evaluation unit, as described above, directly onto a system for producing a film web, the plant comprising an extruder for plasticizing a thermoplastic, a nozzle for exiting the plastic, a deflection and a winder, wherein the system comprises a measuring device for inline measuring a two-dimensional or three-dimensional film topography according to a first aspect of the invention, extend.

It should be expressly understood that the subject matter of the second aspect may be advantageously combined with the subject matter of the first aspect of the invention.

According to a third aspect of the invention, the object solves a system for producing a film web, wherein the system comprises an extruder for plasticizing a thermoplastic, a nozzle for the emergence of the plastic, a deflection, a winder and a measuring device for inline measuring a two-dimensional or three-dimensional Folientopografie according to a first aspect of the invention, wherein the system uses an acting on a property and / or orientation of the film web influencing element, in particular, the influencing element has an influencing device, the measurement of the film topography in the sphere of influence of the influencing element takes place, the influencing element set up for it is to reduce an error pattern of a second error, in particular completely, in order to increase the error pattern of a first error as a result of the influencing method compared with the error picture of the second error to infer the extent of the first error.

Conceptually, the following is explained:

An "influencing element" consists of a device, in particular an "influencing device", and a method, in particular a "influencing method" for influencing a property and / or an orientation of a film web Influence by the influencing element is reversible and or irreversible to a property and / or an orientation of a film web. In particular, an influencing element influences the film topography of a film web. An "error" is the deviation of a state specified with respect to the desired state, specifically an error in the two-dimensional or three-dimensional film topography, so an error describes a two-dimensional or three-dimensional deviation from the desired film topography.

An "error image" is a two-dimensional or three-dimensional representation of an error.

The prior art has heretofore provided that, depending on the embodiment of a blown or cast film, a film web was passed through a treatment section in which influences with reversible and / or irreversible consequences for a property and / or orientation of a film web acted. The prior art did not provide that the two-dimensional or three-dimensional film topography of a film web was detected within a treatment section.

By way of derogation, a system for producing a film web is proposed here, the system having a measuring device for inline measuring a two-dimensional or three-dimensional film topography in accordance with a first aspect of the invention, and the film topography being measured within the influence of an influencing element.

The film topography of a film web often has multiple defect images that may be interdependent or independent. Advantageously, it can be achieved by the system with influencing element proposed here that an error pattern of a second error can be reduced, in particular completely, so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element. In a particularly advantageous embodiment, it can be achieved that the defect images, which do not contribute to the defect image of a flatness of a film, can be reduced or prevented.

The tension fluctuations in the film web are preferably reduced by means of a regulation of a dancer roller. Conceptually, the following is explained:

A "control" is an interaction of continuous acquisition of a measured variable and the control of a system as a function of a specification for the measured variable, whereby a constant comparison of the measured variable and the specification for the measured variable takes place.

A "dancer roll" is a roll that is set up to keep the web tension constant in a film web, and in particular, a dancer roll is adapted to reduce the variations in tension.

It is concretely conceivable, inter alia, that the tension fluctuations in the film web are reduced by a controlled dancer roller and thus the tensile stresses in the film web are kept constant. In particular, the controller can be designed to operate faster and more accurately than a conventional PID controller.

It can advantageously be achieved hereby that an error pattern of a second error can be reduced, in particular completely, so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element. Optionally, the tensions in the film web are isolated with a nip before and / or after the film topography measurement.

Conceptually, the following is explained:

A "nip" is a pair of rollers that is set up so that a designated running distance of the film web runs between the pair of rollers, so that, among other things, it is conceivable that the stresses in the film web are influenced and insulated with a nip before and / or after the film topography measurement become.

Advantageously, it can thereby be achieved that an error pattern of a second error can be reduced, in particular completely, so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

Preferably, stresses in the film web with a nip before and / or after the film topography measurement are specifically caused in the film web.

It can advantageously be achieved hereby that an error pattern of a second error can-in particular be completely reduced-so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

Optionally, the tensile stresses in the film web are adjusted in a targeted manner to the ideal tensile stress level with a nip before and / or after the film topography measurement.

An ideal tensile stress level results in such a way that the defect image of a second defect can in particular be completely reduced. Advantageously, it can thereby be achieved that a fault pattern of a second fault can be completely reduced, in particular, so that the fault pattern of a first fault can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element. The film topography measurement preferably takes place after a web center control which forces a centric shrinkage of the film web into the film topography measurement system.

Conceptually, the following is explained:

A "railway center control" is a device which is adapted to guarantee a centric running in of a designated course of the film web and / or to assist with the aid of control engineering measures.

It can advantageously be achieved hereby that an error pattern of a second error can be reduced, in particular completely, so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element. Optionally, the film topography measurement is carried out before or after a deflection roller.

Conceptually, the following is explained:

A "deflection roller" is a roller on which the designated running distance of the film web has a change of direction.

It can advantageously be achieved hereby that an error pattern of a second error can be reduced, in particular completely, so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

The film topography measurement preferably takes place after a spreader element. A "spreading element" is a device for influencing a film web, which is designed to stretch the width of a film web.The width of the film web can be stretched reversibly and in the elastic range of the material behavior of the plastic, so that the However, the width of the film web behind the influence region of the spreader element can correspond to the width of the film web before the influence region of the widening element The width of the film web can also be stretched irreversibly and in the plastic range of the material behavior of the plastic, so that the width of the film web is beyond the influence range of the spreader element is greater than the width of the film web before the sphere of influence of the spreader element.

In a particularly preferred embodiment, the evaluation of the film topography takes place within the sphere of influence of the spreader element of the film web.

Thus, inter alia, by the use of a spreader element wrinkling in the film web can be reduced or avoided by transverse contraction as a result of the tensile load on the film web.

Optionally, the film topography measurement is carried out after a trimming station.

Conceptually, the following is explained: A "trimming station" is a device which is set up to trimming one or both foil edge regions of the film web, ie to cut off one or both foil edge regions and to remove the section. Specifically, among other things, it is conceivable that the determination of the film topography takes place behind a trimming station, as a result of which the film web has a constant film width and / or the inhomogeneity at the edge regions in the film web is reduced or avoided.

The film topography measurement preferably takes place after a slot device.

Conceptually, the following is explained:

A "slot device" is a device which is set up to cut open one or both film folds of the film web, which can advantageously be used to reduce an error pattern of a second error, in particular completely, so that the error pattern of a first error compared to a measurement a film topography outside the sphere of influence of an influencing element can be detected more accurately or equally well.

It can furthermore be advantageously achieved that the measurement of the film topography can be carried out on a single film web layer, whereby any influences from a second film web layer can be excluded.

Optionally, the film topography measurement follows a tension measuring roller.

Conceptually, the following is explained:

A "tension measuring roller" is a device which is set up to measure the tensile force acting on a film web, whereby the tensile stresses in the film web can also be determined. It is concretely possible, inter alia, that the film topography measurement takes place behind a tension measuring roller and the measuring distance of the tension measuring roller is used to control or regulate the tensile force acting on the film web at the location of the tension measuring roller. Thus, the tension level can be adjusted in the range in which the film topography measurement is performed.

It is to be expressly understood that the subject matter of the third aspect may be advantageously combined with the subject matter of the foregoing aspects of the invention, cumulatively either alone or in any combination.

According to a fourth aspect of the invention, the object solves a method for inline pattern recognition of defect images in a two- or three-dimensional film topography of a film web, which is produced in the blown film or cast film method, wherein a two-dimensional or three-dimensional film topography is determined inline as a measured variable, in particular With a measuring device according to the first aspect of the invention, the measured film topography is forwarded to a data processing and evaluation unit, the data processing and evaluation unit systematically classifies the film topography with a pattern recognition algorithm on the basis of pattern properties predefined in a database contained error images and the error images identified.

The following is explained conceptually: A "sensor" or "detector" is a technical component which can quantify selectively physical or chemical properties and / or the physical condition of its environment qualitatively or as a "measurand" detected by physical or chemical effects and converted into an analog or digital electrical signal. A "measured value" is the instantaneous value of a "measurand". A "measured variable setpoint" is the default value for a measured variable.

A "database" is an electronic data management system whose task is to store large amounts of data efficiently, consistently and permanently, and to provide required subsets of the stored data in different, user-friendly forms of presentation for users and application programs.

A "pattern" or "error pattern" refers to an error structure. The fault structure consists of one or more superimposed fault patterns. In the course of this patent application, the characteristics of the error patterns are carried out. From a pattern, one or more defect images can be identified by their properties. A "pattern property" includes all objectively and subjectively perceivable properties of the pattern.

An "algorithm" is a clear guide to solving a problem or class of problems.The algorithm consists of finitely many, well-defined, individual steps, so that they can be implemented in a computer program or written in human language Problem solving transfers a specific input to a specific output.

The state of the art has heretofore provided that the operator of a blown or cast film plant has visually detected patterns in the film topography and qualitatively compared them with his familiar experiences in accordance with his experiences and his heuristic knowledge. By way of derogation, an automated method is suggested here which displays patterns of defect images in a two- or three-dimensional film topography of a film web with a pattern recognition algorithm classified systematically in accordance with predefined pattern properties in a database, separating the defect images contained in the pattern and identifying the defect images. In other words, it is proposed to automatically analyze a film topography of a film web on the basis of a predetermined pattern property, thus to identify the defect images contained in the film topography and to evaluate their respective characteristics.

It is conceivable, among other things, that the database is composed of linearly independent error images as well as of the possible combinations of linearly dependent error images, so that a clear characterization of the occurring error images can take place.

It is also conceivable, inter alia, that the automatic method compares the measured folio-topography pattern with the film-topography patterns contained in the database and selects the film-biasing pattern with the least deviation from the measured film-topography pattern.

It is also concretely conceivable, among other things, that the database contains characteristic features of film topography patterns and their characteristics, in particular the orientation of elevations in the film topography, the maximum deflection of a survey, the distance between two surveys and other characteristic features of a film topography pattern, and an algorithm This data makes an assignment of error images to the measured film topography.

Characteristic features of a defect image are, in particular, the number of defects over the width of a film web, the manner of occurrence of a defect, in particular a continuous occurrence or a cyclic occurrence and or an increasing or decreasing manifestation of the occurrence. Furthermore, the position of a defect on the film web is a characteristic feature of a defect image, in particular a helical or rectilinearly distributed position of the defect and / or a distribution of defects transverse to the web or along the web or at an angle distribution of defects, in particular under an angle greater than 1 °, but less than 89 °, deviation from the machine direction.

Of course it is also possible that the measured film topography has only a defect image or even no defect image, the latter in particular in the case of a completely flat film web.

The objective of the method is, inter alia, to separate defect images in a measured film topography, to identify them later and to evaluate the severity of the defect image.

In a particularly advantageous embodiment, the algorithm divides the recognized patterns into individual patterns, stores these data, supplies them to an evaluation unit and compares them with historical data.

Furthermore, in a particularly preferred embodiment, possible causes and possible corrective actions for individual fault patterns can be stored in the database. It can advantageously be achieved hereby that the pattern in the film topography can be automatically recognized and assigned to one or more superimposed defect images.

Furthermore, it can be advantageously achieved that the expression of a defect image can be detected automatically. In addition, it can advantageously be achieved that the database contains possible countermeasures and shows the machine operator promising countermeasures for stopping a faulty image.

The predefined pattern properties preferably include a number of defects over the width of the film web. Conceptually, the following is explained:

A "defect" is a bump in a film topography with a central plane.

This advantageously makes it possible to automatically detect the pattern in the film topography based on the number of defects in the film topography over the width of the film web and to automatically assign one or more overlapping defect images with the respective degree of their expression, thereby increasing the accuracy of the inline print. Pattern recognition is increasing.

Optionally, the predefined pattern characteristics include a continuous or cyclic occurrence of defect images.

It is concretely conceivable, inter alia, that inline pattern recognition uses the characteristic of occurrence of defect images to characterize the defects, in particular a continuous or cyclic occurrence of defect images.

It can advantageously be achieved hereby that the pattern in the film topography can be automatically recognized on the basis of predefined pattern properties and automatically assigned to one or more overlapping defect images with the respective degree of their expression, in particular a cyclic or continuous occurrence of defect images in the film topography be used as a characteristic feature of the pattern in the film topography, whereby the accuracy of inline pattern recognition increases. The predefined pattern properties preferably include an increasing or decreasing characteristic of defect images.

Specifically, it is conceivable, inter alia, that inline pattern recognition uses the characteristic of predefined pattern properties for characterizing the defects, in particular an increasing or decreasing characteristic of defect images.

It can advantageously be achieved hereby that the pattern in the film topography can be automatically recognized on the basis of predefined pattern properties and automatically assigned to one or more superimposed defect images with the respective degree of their expression, in particular an increasing or decreasing expression of defect images in the film topography be used as a characteristic feature of the pattern in the film topography, whereby the accuracy of inline pattern recognition increases.

Optionally, the predefined pattern properties include a location of the defect images on the film web.

It is conceivable, among other things, that inline pattern recognition uses a characteristic position of defect images on the film web to characterize the defects.

It can thereby be advantageously achieved that the pattern in the film topography can be automatically recognized on the basis of predefined pattern properties and automatically assigned to one or more superimposed defect images with the respective degree of their expression, in particular a position of defect images in the film topography as a characteristic feature of the pattern be used in the film topography, whereby the accuracy of the inline pattern recognition increases.

The predefined pattern properties preferably include a helical course of the defect images on the film web. Specifically, it is conceivable inter alia that the inline pattern recognition uses a characteristic course of defect images on the film web across the width of the film web and the distance of the film web for characterizing the defects, in particular a helical course of the defect images.

This advantageously makes it possible to automatically recognize the pattern in the film topography on the basis of predefined pattern properties and automatically assign it to one or more overlapping defect images with the respective degree of their expression; in particular, a helical course of defect images in the film topography can be used as a characteristic feature of the invention Patterns are used in the film topography, whereby the accuracy of inline pattern recognition increases. Optionally, the predefined pattern properties include a rectilinear course of the defect images on the film web.

Specifically, among other things, it is conceivable that the inline pattern recognition utilizes a characteristic course of defect images on the film web across the width of the film web and / or the path of the film web for characterizing the defects, in particular a rectilinear course of the defect images.

This advantageously makes it possible to automatically recognize the pattern in the film topography on the basis of predefined pattern properties and to automatically assign one or more overlapping defect images to the respective measure of their expression; in particular, a rectilinear course of defect images in the film topography can be used as a characteristic feature of the invention Patterns are used in the film topography, whereby the accuracy of inline pattern recognition increases.

Preferably, the predefined pattern properties include a position of the defect images on the film web with respect to the film web width. Specifically, among other things, it is conceivable that the inline pattern recognition uses the characteristic of predefined pattern properties for characterizing the defects, in particular a position of the defect images on the film web in relation to the film web width.

Advantageously, it can thereby be achieved that the pattern in the film topography can be automatically recognized on the basis of predefined pattern properties and automatically assigned to one or more overlapping defect images with the respective degree of their expression, in particular a position of the defect images on the film web with respect to the film web width be used in the film topography as a characteristic feature of the pattern in the film topography, whereby the accuracy of the inline pattern recognition increases. Optionally, the predefined pattern characteristics include a location of the defect images on the film web with respect to the machine direction.

Specifically, among other things, it is conceivable that the inline pattern recognition uses the characteristic of predefined pattern properties for characterizing the defects, in particular a position of the defect images on the film web with respect to the machine direction. It can thereby be advantageously achieved that the pattern in the film topography can be automatically recognized on the basis of predefined pattern properties and automatically assigned to one or more superimposed defect images with the respective degree of their expression; in particular, a position of the defect images on the film web with respect to the machine direction in the film topography can be used as a characteristic feature of the pattern in the film topography, whereby the accuracy of the inline pattern recognition increases.

Preferably, the predefined pattern characteristics include an alignment of the defect images with respect to an angle between 1 ° and 89 ° to the machine direction on the film web. Specifically, it is conceivable inter alia that the inline pattern recognition uses the characteristic of predefined pattern properties for characterizing the defects, in particular the alignment of the defect images with respect to an angle between 1 ° and 89 ° to the machine direction on the film web.

It can thereby advantageously be achieved that the pattern in the film topography can be automatically recognized on the basis of predefined pattern properties and automatically assigned to one or more superimposed defect images with the respective degree of their expression; in particular, an alignment of the defect images on the film web with respect to An angle between 1 ° and 89 ° to the machine direction on the film web in the film topography can be used as a characteristic feature of the pattern in the film topography, whereby the accuracy of inline pattern recognition increases.

Optionally, the causes of the error images are analyzed.

Concretely, it is conceivable, among other things, that the database contains possible causes of the defect images and / or analyzes the causes of the defect images on the basis of heuristic data in the database.

Advantageously, it can thereby be achieved that the machine operator can be shown promising countermeasures for stopping a defect image and thus the production of the film web within desired film web properties can be improved. Preferably, the pattern recognition algorithm is self-learning.

Conceptually, the following is explained:

"Self-learning" is understood to mean that the algorithm can learn from and generalize examples, so that the algorithm does not simply memorize examples, but recognizes patterns and laws in the learning data. Thus, among other things, in a particularly preferred embodiment, it is possible that the pattern recognition algorithm can also evaluate unknown data.

Advantageously, it can thereby be achieved that the algorithm fills in gaps in the database itself and / or automatically analyzes and / or detects possible causes of the defect images even with previously unknown defect images. Optionally, the pattern recognition algorithm learns through inputs from the machine operator.

Thus, it is concretely conceivable, inter alia, that when a familiar pattern of an error pattern occurs, the machine operator supplements the database with information about the error pattern. Advantageously, this can be achieved that the inline pattern recognition can be quickly supplemented by the knowledge previously available to the machine operator, whereby the accuracy of the inline pattern recognition increases.

The database preferably contains the pattern properties for the individual defect images. Advantageously, this can be achieved that the operator of the system for producing a film web one or more causes for the occurrence of an error can be communicated so that they can be fixed faster and / or while maintaining a predefined Fehlerabstellprozesses by the operator.

Furthermore, it can advantageously be achieved that a method can be made possible with which the system is able to independently turn off a cause for the occurrence of a defect image, so that the quality in the production of film webs can be automatically improved. Optionally, the database of the pattern properties for the individual defect images contains recommended actions for stopping or reducing an error image by changing a manipulated variable in the production process of the film web.

Conceptually, the following is explained:

An "actuator" or "actuator" is particularly suitable for influencing an output of a system.

A "manipulated variable" is the output variable of the actuator The current value of the manipulated variable is a "manipulated variable".

It is concretely conceivable, inter alia, that the system for producing a film web passes on its electronic control recommendations for the shutdown or reduction of a defect image to the plant operator, in particular recommendations for changing a manipulated variable in the production process of film webs. Advantageously, this can be achieved that the operator of the system for producing a film web one or more causes of the occurrence of a defect and the necessary change in a manipulated variable in the manufacturing process of the film web can be communicated so that the cause faster and or while maintaining a predefined Fehlerabstellprozesses can be remedied by changing a manipulated variable by the operator.

Furthermore, a method can advantageously be made possible with which the system is in a position to turn off a cause for the occurrence of a defect image independently, so that the quality in the production of film webs can be automatically improved. Preferably, the manipulated variable in the manufacturing process contains a formulation of the thermoplastic material.

Conceptually, the following is explained: A "recipe" is a specific composition of a thermoplastic in the mixing ratio of its constituents, so it is concretely conceivable, inter alia, that the system for producing a film web via its electronic control recommendations for the setting off or reducing a defect image by changing a manipulated variable in the manufacturing process of Advantageously, this can be achieved by the operator of the system for producing a film web having one or more causes for the occurrence of a defect image and the necessary change in a manipulated variable in the film Manufacturing process of the film web can be communicated so that the cause faster and / or hobe while maintaining a predefined Fehlerabstellprozesses by changing a manipulated variable by the operator n, in particular by changing a manipulated variable for influencing the formulation of the thermoplastic material.

Furthermore, it can advantageously be achieved that a method can be made possible with which the system is able to independently shut down a cause for the occurrence of a defect image, so that the quality in the production of film webs can be improved automatically.

Optionally, the manipulated variable in the manufacturing process contains a nozzle cross-section for the exit of the plastic.

Concretely, among other things, it is conceivable that the system for producing a film web passes on its electronic control recommendations for action for reducing or reducing an error pattern by changing a manipulated variable in the production process of film webs to the plant operator, in particular changing a manipulated variable for influencing the Nozzle cross-section for the exit of the plastic. Advantageously, this can be achieved that the operator of the system for producing a film web one or more causes of the occurrence of a defect and the necessary change in a manipulated variable in the manufacturing process of the film web can be communicated so that the cause faster and / or while maintaining a predefined Fehlerabstellprozesses by changing a manipulated variable can be corrected by the operator, in particular by changing a manipulated variable for influencing the nozzle cross-section to the escape of the plastic. Furthermore, it can advantageously be achieved that a method can be made possible with which the system is able to independently turn off a cause for the occurrence of a defect image, so that the quality in the production of film webs can be automatically improved.

Preferably, the manipulated variable in the manufacturing process includes the setting of a flattening.

Conceptually, the following is explained:

A "flattening" is a device that is configured to collapse a film tube into a doubly flattened film web.

Specifically, among other things, it is conceivable that the system for producing a film web on its electronic control action recommendations for stopping or reducing a defect image by changing a manipulated variable in the manufacturing process of film webs to the plant operator passes, in particular changing a manipulated variable for influencing a setting the flattening.

Advantageously, this can be achieved that the operator of the system for producing a film web one or more causes for the occurrence of a defect image and the necessary change in a manipulated variable in the manufacturing process of the film web can be communicated, so that the cause faster and / or while maintaining one predefined Fehlerabstellprozesses by changing a manipulated variable can be corrected by the operator, in particular by changing a manipulated variable for influencing a setting of the flattening.

Furthermore, it can advantageously be achieved that a method can be made possible with which the system is able to independently turn off a cause for the occurrence of a defect image, so that the quality in the production of film webs can be automatically improved. Optionally, the manipulated variable in the manufacturing process includes the setting of a side guide.

Conceptually, the following is explained:

A "side guide" is a device that is set up to guide a film web in such a way that it retains a specific orientation, so that, among other things, it is conceivable that the system for producing a film web via its electronic control system offers recommendations for stopping or reducing it In this way, it can advantageously be achieved that the operator of the installation for producing a film web has one or more causes for the occurrence an error pattern and the necessary change in a manipulated variable in the manufacturing process of the film web can be communicated, so that the cause faster and / or while maintaining a predefined Fehlerabstellprozesses by changing a manipulated variable from the operator can be eliminated, in particular by changing a manipulated variable for influencing a setting of the side guide. Furthermore, it can advantageously be achieved that a method can be made possible with which the system is able to independently shut down a cause for the occurrence of a defect image, so that the quality in the production of film webs can be improved automatically.

Preferably, the manipulated variable in the manufacturing process includes the setting of a flat position actuator.

Conceptually, the following is explained:

A "flatness actuator" is a device that is adapted to influence the flatness of a film web.

Concretely, among other things conceivable that the system for producing a film web on its electronic control recommendations for stopping or reducing a defect image by changing a manipulated variable in the production process of film webs to the plant operator passes, in particular changing a manipulated variable for influencing a setting of the flatness actuator.

Advantageously, this can be achieved that the operator of the system for producing a film web one or more causes of the occurrence of a defect and the necessary change in a manipulated variable in the manufacturing process of the film web can be communicated so that the cause faster and / or while maintaining a predefined Fehlerabstellprozesses by changing a manipulated variable can be corrected by the operator, in particular by changing a manipulated variable for influencing a setting of the flatness actuator.

Furthermore, it can advantageously be achieved that a method can be made possible with which the system is able to independently shut off a cause for the occurrence of a fault image, so that the quality in the production of film webs can be automatically improved. Optionally, the manipulated variables in the manufacturing process are divided into segmented control zones. Conceptually, the following is explained:

A "segmented control zone" is a device for adjusting a manipulated variable, whereby the manipulated variable can be adjusted in segments.

Thus, it is specifically conceivable, among other things, that the manipulated variable can be adjusted as a function of a further characteristic, in particular as a function of the film width.

In this way, it can advantageously be achieved that the manipulated variable can be adjusted as a function of a further characteristic, in particular as a function of the film width, whereby the influencing possibilities increase to a defect image and a change in a manipulated variable can be made as required as a function of a further characteristic.

It should be expressly understood that the subject matter of the fourth aspect may be advantageously combined with the subject matter of the foregoing aspects of the invention, cumulatively either singly or in any combination.

According to a fifth aspect of the invention, the object solves a method for controlling the manufacturing process of a film sheet for preventing defect images using a pattern recognition method according to the fourth aspect of the invention and an action recommendation from the pattern recognition database automatically for controlling the manufacturing method the film web is used.

Conceptually, the following is explained:

A "control" is an adjustment of a manipulated variable.

A "disturbance variable" is a parameter that has a deviation from its ideal state. It is concretely conceivable, inter alia, that the system for producing a film web recognizes error images occurring in the film topography of the film web with the aid of inline pattern recognition according to the fourth aspect of the invention, from the database an action recommendation for reducing or preventing the error image as a function of a manipulated variable of the system for producing a film web, and which controls the change in the manipulated variable resulting from the difference between the recommended action and the current manipulated variable.

In a preferred embodiment, the method can be used to detect a flatness error over its characteristic defect image in the film topography by means of the inline pattern recognition according to the fourth aspect of the invention and by an automated control intervention on a manipulated variable of the plant for producing a film web in his To reduce or eliminate expression.

Specifically, it is conceivable, among other things, that the database contains a manipulated variable combination with which error images are avoided.

In a preferred embodiment, the method can be used to detect defect image in the film topography characterized by wrinkles in the film web by means of the inline pattern recognition according to the fourth aspect of the invention and by an automated control intervention on a manipulated variable of the system Producing a film web to reduce or eliminate its manifestation.

In a particularly advantageous embodiment, the database learns by feedback of the operator, so that an error image can be advantageously recognized even better future and a correspondingly effective countermeasure can be taken.

A possible fault pattern, which can advantageously be reduced with the control in its expression, are folds occurring in the machine direction in the film web. Possible causes of this fault pattern are too high or too low a tensile stress in the film web, an impermissible temperature in the film web and / or an insufficient or defective spreader element in the system for producing the film web.

A possible error pattern, which can advantageously be reduced with the controller in terms of its expression, are occurring folds in the film web which deviate with an angle of 2 ° or more but less than 89 ° from the machine direction. Possible causes for this error pattern are a poor or insufficient alignment of the system for producing the film web, a poor or insufficient alignment of a roller or a deflection roller and / or a too high and / or non-uniform contact pressure in a nip of the system for producing the film web. It is understood that the advantages of a method for inline pattern recognition of flaw images in a two- or three-dimensional film topography of a film web produced in the blown or cast film process according to the fourth aspect of the invention, as described above, are directly related to a process for Controlling the manufacturing process of a film web for preventing flaw images, wherein a pattern recognition method according to the fourth aspect of the invention is applied and an action recommendation from the pattern recognition database is automatically used to control the film web manufacturing process.

In addition, it can advantageously be achieved that the database contains possible countermeasures and uses them automatically to control the machine, whereby the occurrence of occurring error images can be reduced or the occurrence of defect images can be prevented, whereby the quality of produced film webs increases.

It is to be expressly understood that the subject matter of the fifth aspect may be advantageously combined with the subject matter of the foregoing aspects of the invention, cumulatively either alone or in any combination. According to a sixth aspect of the invention, the object solves a method for controlling the manufacturing process of a film web for preventing defect images, wherein a pattern recognition method according to the fourth aspect of the invention is applied and a recommended action from the pattern recognition database automatically for controlling the film web manufacturing process is being used. It is concretely possible, inter alia, that a task which is taken over by a controller according to the fifth aspect of the invention is now taken over by a regulation.

In a particularly suitable embodiment, a setting value of a system for producing a film web of a thermoplastic material, which leads to a film topography without error and / or which was determined with the scheme by any disturbances were successfully corrected, stored in a special manipulated variable memory, so that this manipulated variable can be used again for producing a film web without defects in the film topography.

It is understood that the advantages of a method for inline pattern recognition of flaw images in a two- or three-dimensional film topography of a film web produced in the blown or cast film process according to the fourth aspect of the invention, as described above, are directly related to a process for Controlling the manufacturing method of a film web for preventing flaw images, wherein a pattern recognition method according to the fourth aspect of the invention is applied and an action recommendation from the pattern recognition database is automatically used for controlling the film web manufacturing process.

In addition, it can advantageously be achieved that the system automatically corrects errors occurring even in the smallest detectable form, whereby the expression of occurring defects can be reduced or the occurrence of defects can be prevented, whereby the quality of produced film webs increases. It is to be expressly understood that the subject matter of the sixth aspect may be advantageously combined with the subject matter of the foregoing aspects of the invention, cumulatively either alone or in any combination.

According to a seventh aspect of the invention, the object is achieved by a method for the in-line plan position determination of a film web produced in the blown or cast film method, wherein a method for inline pattern recognition according to the fourth aspect of the invention is used.

Defects in the flatness are in particular foil sags in the tension-free state and / or a sheet travel of the film web. So there can be foils with an ideally constant thickness, which nevertheless can have a flatness error, and there can be foils with a thickness deviation that nevertheless have an ideal flatness. The cause of a flatness error lies in locally different lengths of the film web.

The state of the art so far provided that the flatness of a film web was detected on the basis of a film sample. For this purpose, the flatness of the film web was made visible on the basis of about 10 meters long cut out of the film sheet piece of film sample, which was spread on the floor and swept. A more qualified measuring method for the flatness of the film web is currently not known in the prior art.

By way of derogation, it is proposed here to determine the flatness of a film web on the basis of the characteristic of a flaw characteristic in the film topography of a film web, the film topography being determined by an inline pattern recognition method according to the fourth aspect of the invention.

It is concretely conceivable, inter alia, that the flatness is determined in the manner described on a single-layer film web or a double-flattened film web. In a particularly suitable embodiment of the method, the flatness of a film web can be clearly determined. It is understood that the advantages of a method for inline pattern recognition of defect images in a two- or three-dimensional film topography of a film web, which is produced in the blown film or cast film method, according to the fourth aspect of the invention, as described above directly on Method for inline flatness determination of a film web produced in the blown or cast film method, wherein a method for inline pattern recognition according to the fourth aspect of the invention is used, extending.

It is to be expressly understood that the subject matter of the seventh aspect may be advantageously combined with the subject matter of the foregoing aspects of the invention, cumulatively, either singly or in any combination.

According to an eighth aspect of the invention, the object solves a system for producing a film web, wherein the system comprises an extruder for plasticizing a thermoplastic, a nozzle for the escape of the plastic, a deflection and a winder, wherein the device comprises a measuring device according to the first aspect of the invention, and the data processing and evaluation unit comprises programming, the programming being arranged to carry out a method according to the fourth aspect of the invention.

It goes without saying that the advantages of a measuring device for measuring a two-dimensional or three-dimensional film topography of a film web produced in blown or cast film method with a radiation source, in particular a light source, a detector and a Datenverarbeitungs- and -auswerteeinheit, as above under the first Aspect of the invention described and the advantages of a method for inline pattern recognition of defects in a two- or three-dimensional film topography of a film web, which is produced in the blown film or cast film method, according to the fourth aspect of the invention, as described above directly on a plant for producing a film web, the system comprising an extruder for plasticizing a thermoplastic, a nozzle for exiting the plastic, a diverter and a winder, the apparatus having a measuring device according to the first aspect of the invention, and the data processing and evaluation unit having a programming, the programming being adapted to carry out a method according to the fourth aspect of the invention, extend.

The system for producing a film web preferably has an influencing element according to the third aspect of the invention. It is understood that the advantages of a system for producing a film web, wherein the system comprises an extruder for plasticizing a thermoplastic, a nozzle for exiting the plastic, a deflection, a winder and a measuring device for inline measuring a two-dimensional or three-dimensional films - Topography according to a first aspect of the invention, wherein the system uses an acting on a property and / or orientation of the film web influencing element, in particular, the influencing element on an influencing device, the measurement of the film topography in the sphere of influence of the influencing element takes place, the influencing element for is set up to reduce an error pattern of a second error, in particular completely, in order to increase the error pattern of a first error to dimension d., which becomes more pronounced as a result of the influencing method than the error picture of the second error According to a third aspect of the invention, as described above, it directly relates to a plant for producing a film web, the plant having an extruder for plasticizing a thermoplastic, a nozzle for exiting the plastic, a deflection and a winder the apparatus comprises a measuring device according to the first aspect of the invention, and the data processing and evaluation unit has programming, the programming being arranged to carry out a method according to the fourth aspect of the invention.

Optionally, the system for producing a film web in the form of a blown film or cast film is formed. Advantageously, it can be achieved that the advantages of a blown film or cast film plant on a system for producing a film web, wherein the system comprises an extruder for plasticizing a thermoplastic material, a nozzle for leakage of the plastic, a deflection and a winder, wherein the Before 995 direction comprises a measuring device according to the first aspect of the invention, and the data processing and evaluation unit has a programming, wherein the programming is arranged to carry out a method according to the fourth aspect of the invention extend.

It is to be expressly understood that the subject matter of the eighth aspect may be advantageously combined with the subject matter of the foregoing aspects of the invention, both cumulatively alone or in any combination.

According to a ninth aspect of the invention, the object solves a method for inline determination of a first error, in particular flatness error, of a film web produced in the blown or cast film method by means of a two- or multi-dimensional image.

1005 lientopografiemess method, wherein the film web has the first and a second error, wherein the method uses an acting on a property and or orientation of the film web influencing, in particular an influencing element according to the third aspect of the invention, an error pattern of the second error - in particular completely - to reduce, over a result of the influencing procedure

1010 compared to the error image of the second error increasing error pattern of the first error on the extent of the first error infer.

It is understood that the advantages of a system for producing a film web, wherein the plant comprises an extruder for plasticizing a thermoplastic, a nozzle for the exit of the plastic, a deflection, a winder and a measuring device for inline measuring a two-dimensional or three-dimensional film topography according to a first aspect of the invention, the system having an influence on a property and / or an orientation of the film web. Accordingly, in particular, the influencing element has an influencing device, the measurement of the film topography within the sphere of influence of the influencing element.

1020 elementes, wherein the influencing element is adapted to reduce an error pattern of a second error - in particular completely - in order to infer over a due to the influencing method against the error image of the second error increasing error pattern of a first error on the extent of the first error after A third aspect of the invention, as described above, directly relates to a

1025 are for in-line determining a first error, in particular flatness error, of a film web produced in the blown or cast film process by means of a two- or more-dimensional film topography measurement process, wherein the film web has the first and a second defects, wherein the process relates to a property and / or an orientation of the film web acting influence, in particular a

1030 influencing element according to the third aspect of the invention in order to reduce an error pattern of the second error - in particular completely - in order to infer over the error of the first error due to the influencing method over the error image of the second error increasing error pattern of the first error on the extent of the first error extend.

The tension fluctuations in the film web in the region of the 1035 film topography measurement are preferably reduced by means of a control of a dancer roller.

In concrete terms, it is conceivable, among other things, that the tension fluctuations in the film web in the region of the film topography measurement are reduced by a controlled dancer roller and thus the tensile stresses are kept constant. In particular, the controller can be designed to operate faster and more accurately than a conventional PID-1040 controller.

Advantageously, it can thereby be achieved that a fault pattern of a second fault can be completely reduced, in particular, so that the fault pattern of a first fault can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element. 1045 Optionally, the tensions in the film web are isolated with a nip before and / or after the film topography measurement.

It is specifically conceivable, inter alia, that the stresses in the film web are influenced and isolated with a nip before and / or after the film topography measurement.

It can advantageously be achieved hereby that an error pattern of a second error -1050 -can be completely reduced in particular so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

In this way, it can advantageously be achieved that a fault pattern of a second fault can be completely reduced, in particular completely, so that the fault pattern of a first fault can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

Optionally, the tensile stresses in the film web with a nip before and / or after 1060 of the film topography measurement are set specifically to the ideal tensile stress level.

An ideal tensile stress level results in such a way that the defect image of a second defect can in particular be completely reduced.

It can advantageously be achieved hereby that a fault pattern of a second fault can be completely reduced, in particular completely, so that the fault pattern of a first fault can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

The film topography measurement preferably takes place after a web center control which forces a centric shrinkage of the film web into the film topography measurement system. In this way, it can advantageously be achieved that an error pattern of a second error -1070 -can be completely reduced in particular so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

Optionally, the film topography measurement is carried out before or after a deflection roller.

It can advantageously be achieved in this way that an error pattern of a second error -in particular completely-can be reduced, so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

The film topography measurement preferably takes place after a spreader element.

It can advantageously be achieved by this means that an error pattern of a second error-1085 in particular completely-can be reduced so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

Specifically, among other things, it is conceivable, among other things, that the determination of the film topography takes place behind a trimming station, as a result of which the film web has a constant film width and / or the inhomogeneity at the edge regions in the film web is reduced or avoided. It can advantageously be achieved hereby that an error pattern of a second error can-in particular be completely reduced-so that the error image of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

The film topography measurement preferably takes place after a protective device.

It can advantageously be achieved hereby that an error pattern of a second error can be completely reduced, in particular, so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

Optionally, the film topography measurement follows a tension measuring roller.

It is concretely conceivable, among other things, that the film topography measurement takes place behind a tension measuring roller and the measured value of the tension measuring roller is used to control or regulate the tensile force acting on the film web at the location of the tension measuring roller. Thus, the tension level can be adjusted in the range in which the film topography measurement is performed.

Advantageously, it can thereby be achieved that an error pattern of a second error can be completely reduced, in particular so that the error pattern of a first error can be detected more accurately or equally well than a measurement of a film topography outside the influence range of an influencing element.

Preferably, the method is combined with a pattern recognition according to the fourth aspect of the invention.

It is understood that the advantages of a method for inline pattern recognition of 1115 defect images in a two-dimensional or three-dimensional film topography of a film web, which is produced in the blown film or cast film method, according to the fourth aspect. pect of the invention, as described above, directly to a method for in-line determination of a first defect, in particular flatness error, of a film web produced in the blown or cast film process by means of a two-dimensional or multidimensional

1120 len foil topography measuring method, wherein the film web has the first and a second error, wherein the method uses an acting on a property and / or orientation of the film web influencing, in particular an influencing element according to the third aspect of the invention, an error pattern of the second error - in particular completely - in order to obtain information on a

In order to infer the error pattern of the first error that has become more severe than the error pattern of the second error to the extent of the first error.

It is to be expressly understood that the subject matter of the ninth aspect may be advantageously combined with the subject matter of the foregoing aspects of the invention, cumulatively, either singly or in any combination.

The invention will be explained in more detail below on the basis of an exemplary embodiment with reference to the drawing. Show there

1 schematically a system for producing a film web, in particular a blown film line, with a measuring device for measuring a film topography, in particular a blown film line,

FIG. 2 schematically shows an influencing element in the area of the film topography measurement and FIG

Fig. 3 shows schematically an error image.

The blown film line 1 in FIG. 1 consists essentially of an extruder 2, a blow head 3, a reversing turn-off take-off 4, a treatment section 5 and a 1140 coiler 6. The extruder 2 conveys and plasticizes a plastic melt which exits through an annular gap nozzle (not numbered) in the die 3. The exiting plastic melt forms a film bubble 7, which is folded in a flattening 8 to a double flattened film web 13.

1145 The doubly flattened film web 13 is withdrawn from a deduction roller pair 9, 10 and further passed into the reversing turn-off vent 4.

The reversing turn-off trigger is driven by a motor 11 and performs a reversion movement 12, by which deviations in the film thickness profile of the doubly flattened film web 13 are transferred.

1150 Behind the reversing turn-off take-off 4, the doubly flattened film web is fed to the treatment section 5, which draws the doubly flattened film web 13 uniaxially in the machine direction in this exemplary embodiment.

Behind the treatment section 5, the double flattened film web 13 is fed to the winder 6 and wound up there to form a film roll.

1155 passes between the treatment section 5 and the winder 6, the double flattened film web 13 a film thickness profile measuring device 14, which determines a film thickness profile 15 of the doubly flattened film web 13.

The film thickness profile 15 of the doubly flattened film web 13 is fed together with a reversing angle 16 of the reversing turn-off take-off 4 to a data processing 1160 and evaluation unit 17.

The data processing and evaluation unit 17 is set up to carry out a method for determining a thickness distribution system as well as a method for adjusting the film thickness profile and to control the annular gap nozzle of the blow head 3. Also, the double flattened film web 13 passes between the treatment strip 1165 and the winder 6, a film topography measuring system 18 consisting of a radiation source 19 and a detector 20.

The radiation source 19 projects a radiation pattern 21 onto the double flattened film web 13 at position 22.

The detector 20 is adapted to detect the radiation pattern 21 on the double-layered film web 13. In particular, the detector 20 is focused on the position 22 of the film web 13.

The detected film topography 23 is transmitted electronically from the film topography measurement system 18 to the data processing and evaluation unit 17.

The data processing and evaluation unit 17 is configured to perform a method for 1175 inline pattern recognition of defect images (not numbered) based on the measured film topography 23.

In addition, the data processing and evaluation unit 17 is set up to carry out a method of controlling the blown film unit 1, which aims at reducing or completely preventing defect images (not numbered) in the film topography 23 (not numbered) ,

For this purpose, the data processing and evaluation unit 17 can forward corresponding control commands to the manipulated variables (not numbered) and thus act on the blown film process.

In this exemplary embodiment, the gap thickness 1185 (not numbered) of the blow head 3, the reversing movement 12 of the reversing turn-off trigger 4 and the manipulated variable 24 of the treatment section 5 are available as manipulated variables (not numbered).

For this purpose, the manipulated variable 24 of the treatment section 5 is transmitted electronically to the control unit 25 of the treatment section 5. The influencing element 30 in FIG. 2 consists essentially of a first nip 1190 31 and a second nip 32 and a film topography measuring system 33.

The first nip 31 consists of a first squeegee roller 34 and a second squeegee roller 35. The second nip 32 consists of a first squeegee roller 36 and a second squeegee roller 37.

The film topography measuring system 33 essentially consists of a radiation source 1195 and a detector 39. The radiation source 38 projects a radiation pattern 42 onto the film web 40 at the position 43. The detector 39 is set up to detect the radiation pattern 42 on the film web 40. In particular, the detector 39 is focused on the position 43 of the film web 40.

The film web 40 runs in the machine direction 41 into the influencing element 30, passes 1200 the first nip 31, the radiation pattern 42 there, continues to the second nip 32 and leaves the influencing element 30 again.

The influencing element 30 is configured to influence the web tension 44 at the position 43 of the film topography measurement with the film topography measurement system 33.

1205 The defect image 50 of the film web 51 consists essentially of folds 53, 54, 55, 56, 57, 58, 59, 60, 62, 63, 66, which extend substantially in the machine direction 52.

List of reference numbers used

1 blown film line

2 extruders

3 blowing head

4 reversing turn-off trigger

5 treatment route

6 winder

7 foil bubble

8 flattening

9 take-off roller

10 take-off roll

11 engine

12 reversing movement

13 double laid film web

14 Film thickness profile measuring device

15 film thickness profile

16 reversing angle

17 Data processing and evaluation unit

18 film topography measuring system

19 radiation source

20 detector

21 radiation pattern

22 position

23 Film topography

24 manipulated variable

25 setting unit

30 influencing element

31 Nip

32 Nip

33 Film topography measuring system 34 squeegee roller

35 squeegee roller

36 squeegee roller

37 squeegee roller 38 radiation source

39 detector

40 film web

41 machine direction

42 radiation pattern 43 position

44 web tension

50 error image

51 film web

52 Machine direction 53 Crease

54 fold

55 fold

56 fold

57 fold

58 fold

59 fold

60 fold

62 fold

63 fold

66 fold

Claims

claims:

1. (measuring device) Measuring device for measuring a two- or three-dimensional film topography of a blown or cast film produced film web with a radiation source, in particular a light source, a detector and a Datenverarbeitungs- and -auswerteeinheit, characterized in that the radiation source and the detector have different position, the radiation source is arranged for projecting a radiation pattern on a designated running distance of the film web, wherein the radiation pattern is preferably a line with in particular parallel light, the detector is adapted to detect the projected radiation pattern, in particular to detect the projected line, the detector is focused on the projected radiation pattern, in particular the projected line, and the data processing and evaluation unit has a programming, wherein the programming for carrying out a triangulation method is un d / or a reflection method and / or a transmission method for determining the film topography is set up.

2. Measuring device according to claim 1, characterized in that the radiation source and the detector are positioned in a common housing.

3. Measuring device according to claim 1 or 2, characterized in that projected onto the designated running distance of the film web radiation pattern querab extends to the machine direction over the entire width of the designated running distance of the film web.

4. Measuring device according to one of the preceding claims, characterized in that the radiation pattern projected onto the designated running path of the film web extends in the machine direction and has a length.

5. Measuring device according to one of the preceding claims, characterized in that the projected on the designated course of the film web radiation pattern extends at an angle diagonally across the designated running distance of the film web.

6. Measuring device according to claim 5, characterized in that an adjusting device is provided for the angle.

7. Measuring device according to one of the preceding claims, characterized in that the device comprises a second detector, which is also connected to the Datenverarbeitungs- and -auswerteeinheit and one of the first detector and the radiation source has different position.

8. (system with measuring device) Plant for producing a film web, wherein the system comprises an extruder for plasticizing a thermoplastic, a nozzle for the escape of the plastic, a deflection and a winder, characterized in that the system comprises a measuring device for inline Measuring a two-dimensional or three-dimensional film topography according to one of the preceding claims.

9. (defect image reduction) Plant according to claim 8, characterized in that the system has an influencing element acting on a property and / or an orientation of the film web, wherein the influencing element may have an influencing device, the measurement of the film topography is provided in the influence region of the influencing element, the influencing element being set up to produce a defect image of a second defect, in particular completely - to reduce over a stronger as a result of the influencing method compared to the error image of the second error error pattern of a first error on the extent of the first error.

10. Plant for producing a film web according to claim 9, characterized in that the system comprises a dancer roller for reducing tension fluctuations in the film web by means of a control.

11. Plant according to claim 9 or 10, characterized in that the plant relative to its machine direction before and / or after the Folienmembrane has a nip to isolate the stresses in the film web with the nip before and / or after the film topography measurement ,

12. Plant according to one of claims 9 to 11, characterized in that the plant relative to their machine direction before and / or after the film topography measurement has a nip to the voltages in the film web with the nip before and / or after the film topography measurement targeted in to cause the film web.

13. Installation according to one of claims 9 to 12, characterized in that the plant relative to their machine direction before and / or after the film topography measurement has a nip to the tensile stresses in the film web with to adjust the nip to the ideal tension level before and / or after the film topography measurement.

14. Installation according to one of claims 9 to 13, characterized in that the film topography measurement downstream of a web center control, which forces a central shrinkage of the film web in the film topography measurement system, is arranged.

15. Installation according to one of claims 9 to 14, characterized in that the film topography measurement is arranged before or after a deflection roller.

16. Installation according to one of claims 9 to 15, characterized in that the film topography measurement is arranged after a spreader element.

17. Installation according to one of claims 9 to 16, characterized in that the film topography measurement is arranged after a trimming station.

18. Plant according to one of claims 9 to 17, characterized in that the film topography measurement is arranged according to a slot device.

19. Plant according to one of claims 9 to 18, characterized in that the film topography measurement is arranged after a tension measuring roller.

20. (in-line pattern recognition method) A method for inline pattern recognition of defect images in a two- or three-dimensional film topography of a film web, which is produced in the blown film or cast film process, characterized in that a two-dimensional or three-dimensional film topography is determined inline as a measured variable, in particular with a measuring device according to one of claims 1 to 7, the particular film topography is forwarded to a data processing and evaluation unit, the data processing unit systematically classifies the film topography with a pattern recognition algorithm based on predefined pattern properties in a database, separates the defect images contained in the pattern and identifies the defect images.

21. The method according to claim 20, characterized in that the predefined pattern properties include a number of defects over the width of the film web.

22. The method according to any one of claims 20 or 21, characterized in that the predefined pattern characteristics include a continuous or cyclic occurrence of error images.

23. The method according to any one of claims 20 to 22, characterized in that the predefined pattern characteristics include an increasing or decreasing expression of defect images.

24. The method according to any one of claims 20 to 23, characterized in that the predefined pattern properties include a position of the defect images on the film web.

25. The method according to any one of claims 20 to 24, characterized in that the predefined pattern properties include a helical course of the defect images on the film web.

26. The method according to any one of claims 20 to 25, characterized in that the predefined pattern properties include a rectilinear course of the defect images on the film web.

27. The method according to any one of claims 20 to 26, characterized in that the predefined pattern properties include a position of the defect images on the film web with respect to the film web width.

28. The method according to any one of claims 20 to 27, characterized in that the predefined pattern properties include a position of the defect images on the film web with respect to the machine direction.

29. Method according to claim 20, characterized in that the predefined pattern properties include an alignment of the defect images with respect to an angle between 1 ° and 89 ° to the machine direction on the film web.

30. The method according to any one of claims 20 to 29, characterized in that the causes of the error images are analyzed.

31. The method according to any one of claims 20 to 30, characterized in that the pattern recognition algorithm is self-learning.

32. The method according to any one of claims 20 to 31, characterized in that the pattern recognition algorithm learns by inputs of the machine operator.

33. The method according to any one of claims 20 to 32, characterized in that the database contains the pattern properties of the individual defect images causes.

34. The method according to any one of claims 20 to 33, characterized in that the database of the pattern properties to the individual defect images contains recommendations for the shutdown or reduction of a defect image by changing a manipulated variable in the manufacturing process of the film web.

35. The method according to any one of claims 20 to 34, characterized in that the manipulated variable in the manufacturing process contains a recipe of the thermoplastic material.

36. The method according to any one of claims 20 to 35, characterized in that the manipulated variable in the manufacturing process includes a nozzle cross section for the escape of the plastic.

37. The method according to any one of claims 20 to 36, characterized in that the manipulated variable in the manufacturing process includes the setting of a flattening.

38. The method according to any one of claims 20 to 37, characterized in that the manipulated variable in the manufacturing process includes the setting of a side guide.

39. The method according to any one of claims 20 to 38, characterized in that the manipulated variable in the manufacturing process includes the setting of a flatness actuator.

40. The method according to any one of claims 20 to 39, characterized in that the manipulated variables are divided in the manufacturing process into segmented control zones.

41. The method according to any one of claims 20 to 40, characterized in that for controlling the manufacturing process of a film web for reducing or preventing error images, a recommended action from the database of pattern recognition is automatically used to control the manufacturing process of the film web.

42. The method according to any one of claims 20 to 41, characterized in that for controlling the production process of a film web for preventing or reducing From the error images, a recommended action from the database of pattern recognition is automatically used to control the production process of the film web.

43. (inline flatness determination method) Use of the method according to one of claims 20 to 33 for the in-line flatness determination of a film web produced in the blown or cast film process.

44. (system with DAQ system and process execution) Plant for producing a film web, wherein the plant has an extruder for plasticizing a thermoplastic, a nozzle for the escape of the plastic, a deflection and a winder, characterized in that the device A measuring device according to any one of claims 1 to 7, and the data processing and evaluation unit comprises programming, the programming being adapted to carry out a method according to any one of claims 20 to 43.

45. A system according to claim 44, characterized in that the system for producing a film web has an influencing element according to one of claims 9 to 19.

46. Installation according to one of claims 44 or 45, characterized in that the system is designed for producing a film web in the form of a blown film or cast film.

47. (interference-free error determination method) Method for determining inline determination of a first error, in particular flatness error, of a film web produced in the blown or cast film method by means of a two-dimensional or multi-dimensional film topography measurement method, wherein the film web has the first and a second defect, characterized in that the method uses an influence acting on a property and / or an alignment of the film web, in particular an influencing element according to one of claims 9 to 19, in order to obtain a defect image of the second defect. In particular, completely - to reduce in order to draw on a stronger as a result of the influencing method against the error image of the second error error pattern of the first error on the extent of the first error.

48. The method according to claim 47, characterized in that the tensile stress fluctuations in the film web in the area of the Fohentopografiemessung be reduced by means of a regulation of the dancer roller.

49. The method according to any one of claims 47 or 48, characterized in that the stresses in the film web are isolated with a nip before and / or after the film topografiemessung.

50. The method according to any one of claims 47 to 49, characterized in that stresses in the film web with a nip before and / or after the Folientopo- grafiemessung specifically induced in the film web.

51. The method according to any one of claims 47 to 50, characterized in that the tensile stresses in the film web are set with a nip before and / or after the Fohentopografiemessung targeted to the ideal Zugspannungsniveau.

52. The method according to any one of claims 47 to 51, characterized in that the film topography measurement after a web center control, which forces a centric shrinkage of the film web in the film topography measuring system, takes place.

53. The method according to any one of claims 47 to 52, characterized in that the film topography measurement takes place before or after a deflection roller.

54. The method according to any one of claims 47 to 53, characterized in that the film topography measurement is carried out according to a spreader element.

55. The method according to any one of claims 47 to 54, characterized in that the film topography measurement is carried out after a trimming station.

56. The method according to any one of claims 47 to 55, characterized in that the film topography measurement is carried out according to a slit device.

57. The method according to any one of claims 47 to 56, characterized in that the film topography measurement is carried out according to a tension measuring roller.

58. The method according to any one of claims 47 to 57, characterized in that the method is combined with a pattern recognition according to one of claims 20 to 40.