TWI793006B - Measuring device, measuring equipment for optical film process using the same and measuring method using the same - Google Patents

Abstract

A measuring device includes a ruler and a fixing device. The ruler has a ruler surface. The first fixing device is configured for connecting the ruler. The ruler surface could simulate a film surface of an optical film based on the fixing device being disposed on a roller.

Description

Measuring device, optical film process measuring equipment and measurement using it method

The embodiments of the present invention relate to a measurement device, an optical film manufacturing process measurement device and a measurement method using the measurement device.

Polarizers are optical components widely used in displays. As displays become more widely used, such as mobile phones and wearable devices, the requirements for the quality of polarizers are also getting higher and higher.

In the optical film manufacturing process, the optical properties of the polarizing film product can be adjusted by stretching the polarizing film, so the stretching width of the optical film is one of the important factors determining the yield. Usually, the width of the optical film is measured by personnel using a laser rangefinder before and after the process is started. However, in such a measurement method, the accuracy is easily affected by human beings, and there are doubts about the safety. Therefore, the embodiment of the present invention proposes a measurement device, an optical film manufacturing process measurement device and a measurement method using the same, which can improve the aforementioned conventional problems.

An embodiment of the invention provides a measuring device. The measuring device includes a ruler and a fixing device. The ruler gauge has a ruler gauge surface. The fixture is used to connect the ruler gauge. Based on the fixing device mounted on a first roller, the gauge surface simulates a surface of an optical film.

Another embodiment of the present invention provides an optical film process measuring device. The optical film process measurement equipment includes an optical film process device, a measurement device, a first camera and a processor. The optical film processing device includes a first roller. The measuring device includes a ruler and a fixing device. The ruler gauge has a ruler gauge surface. The fixture is used to connect the ruler gauge. Based on the fixing device mounted on a first roller, the gauge surface simulates a surface of an optical film. The first camera is used to capture a first image of the ruler plane. The processor is used to obtain a first dimension interval of the first dimension image according to the first dimension image, and obtain a first dimension of the first camera according to the first dimension interval and a first number of pixels in the first dimension interval. 1. Camera accuracy.

Another embodiment of the invention provides a measurement method. The measuring method uses a measuring device to measure an optical film. An optical film manufacturing device includes a first roller. A measuring device is erected on the first roller. The measuring device includes a ruler and a fixing device. The ruler has a ruler surface, and the fixing device is connected to the ruler. The measurement method includes the following steps: a first camera captures a first image of a ruler surface; according to the image of the first ruler surface, a first size interval of the image of the first ruler surface is obtained; and, According to the first size interval and the first number of pixels in the first size interval, a first imaging accuracy of the first camera is obtained.

In order to have a better understanding of the above-mentioned and other aspects of the present invention, the following specific examples are given in detail with the accompanying drawings as follows:

10.10': Optical film process measurement equipment

11:Optical film processing equipment

11A: Treatment tank

11B: The first roller

11C: Second roller

11C1: First Surface

11C2: Second Surface

12A: The first camera

12B: Second camera

13: Processor

14: Optical film

14e1: first edge

14e2: second edge

100: Measuring device

110: Ruler

110s: Ruler surface

120: The first fixture

121: the first connector

1211: Ontology

1211a: first perforation

1212: rotating part

1212b: through hole

1212A: connection part

1212B: bearing part

1212a: second perforation

1213: Operation Department

122: First shot

123: second shot

124: the second connector

125: Third shot

126: Anti-slip parts

130: second fixture

AX1, AX2: central axis

A1: First camera accuracy

A2: Second camera accuracy

C1: first center line scale value

C2: second center line scale value

dS1: first size interval

dS2: second size interval

H: Spacing

L1: Analog line

MA: The first dimension image

MA': The first measured optical film image

MA1: the first measurement scale value

MA2: second measurement scale value

MB: second-foot dimension image

MB': The second measured optical film image

MB1: The third measurement scale value

MB2: Fourth measurement scale value

MC1: first center line scale value

MC2: second center line scale value

P1: the number of first pixels

P2: second pixel number

W1: width

X, Y, Z: axes

△H1: first interval value

△H2: second interval value

FIG. 1 is a schematic diagram of an optical film manufacturing apparatus according to an embodiment of the present invention.

FIGS. 2A-2C show schematic diagrams of an optical film process measurement device at different viewing angles according to an embodiment of the present invention.

Fig. 3A is a schematic diagram of the first dimension image captured by the first camera in Fig. 2A.

Fig. 3B is a schematic diagram of the second dimension image captured by the second camera in Fig. 2A.

FIG. 4 shows a schematic diagram of the first connecting member in FIG. 2A.

Fig. 5A shows a schematic diagram of the ruler gauge in Fig. 2B not in contact with the simulated line.

Fig. 5B shows a schematic diagram of the ruler in Fig. 5A in contact with the simulated wire.

FIG. 6 is a schematic diagram of an optical film manufacturing equipment according to an embodiment of the present invention.

FIG. 7A is a schematic diagram of the first measured optical film image captured by the first camera in FIG. 6 .

FIG. 7B is a schematic diagram of a second measured optical film image captured by the second camera in FIG. 6 .

Please refer to Figures 1-3B. Figure 1 shows a schematic diagram of an optical film processing device 11 according to an embodiment of the present invention, and Figures 2A-2C show a schematic diagram of an optical film processing device according to an embodiment of the present invention. A schematic diagram of the optical film process measurement equipment 10 of an embodiment at different viewing angles, Figure 3A shows a schematic diagram of the first scale image MA captured by the first camera 12A in Figure 2A, and Figure 3B draws A schematic diagram of the second scale image MB captured by the second camera 12B in FIG. 2A is shown. To avoid too complicated lines in the drawing, the cameras 12A and 12B and the processor 13 are not shown in FIG. 2b , and the first fixing device 120 and the second fixing device 130 are not shown in FIG. 2C .

As shown in FIG. 1 , the optical film processing apparatus 11 includes at least one processing tank 11A, at least one first roller 11B, and at least one second roller 11C. In one embodiment, the optical film processing apparatus 11 can be used for a wet stretching process.

As shown in FIG. 1, the treatment liquid may be contained in the treatment tank 11A. The optical film 14 can be transported between the plurality of treatment tanks 11A by the first roller 11B and the second roller 11C, and immersed in the treatment liquid to be treated accordingly. In addition, since the placement position of the ruler 110 in the embodiment of the present invention is not limited, the measurement method in the embodiment of the present invention can measure the optical film outside the processing liquid and/or the optical film immersed in the processing liquid.

In one embodiment, the processing tank 11A can be used to manufacture the stretched optical film 14, and one of the multiple processing tanks 11A in FIG. 1 can be a swelling tank, a dyeing tank, a cross-linking tank, a cleaning tank or other wet processes. Processing tank. These processing tanks 11A can be selectively increased, decreased, repeatedly arranged, or other adjustments can be made. In one embodiment, during the process of manufacturing the optical film 14 , a stretching process may be performed on the polarizing film precursor. The elongation treatment can be carried out when passing through the swelling tank, and/or subsequent dyeing tank and cross-linking tank. According to some embodiments, from the swelling treatment to the crosslinking treatment, the accumulated extension of the polarizing film precursor The magnification is about 4.5 times to 8 times.

As shown in FIG. 1, the rollers are not limited to be located inside or outside the treatment tank 11A. For example, the first roller 11B and the second roller 11C can be located inside or outside the processing tank 11A at the same time; Out of slot 11A.

As shown in FIGS. 1 to 2C , the optical film process measurement equipment 10 includes the aforementioned optical film process device 11 , a measurement device 100 , a first camera 12A, a second camera 12B, and a processor 13 . Before measuring the geometric information of the optical film 14 , the imaging accuracy of the camera can be obtained first. Further examples are given below.

As shown in Figures 2A to 2C, the measuring device 100 includes a ruler 110, a first fixing device 120 and a second fixing device 130, the ruler 110 has a ruler surface 110s, the first fixing device 120 is connected to the ruler 110, and The second fixing device 130 is connected to the ruler 110, wherein, based on the first fixing device 120 and the second fixing device 130 erected on the first roller 11B, the ruler surface 110s can simulate the surface of the optical film arranged on the first roller 11B . The first camera 12A is used to capture the first ruler image MA of the ruler surface 110s. The processor 13 is used to: obtain the first size interval dS1 of the first ruler image MA according to the first ruler image MA and the first size interval dS1 and the first number of pixels P1 within the range of the first size interval dS1 , to obtain the first imaging accuracy A1. In this way, the first imaging accuracy A1 of the first camera 12A can be obtained by simulating the surface of the optical film through the ruler 110 without erecting a physical optical film.

In another embodiment, the measuring device 100 may also omit the second fixing device 130 .

As shown in FIG. 3A, the processor 13 is further used to: obtain the first imaging accuracy A1 according to the following formula (1), wherein dS1 represents the first size interval displayed by the first ruler image MA, and P1 represents the first dimension interval The first number of pixels P1 in a size interval dS1.

In detail, as shown in Figures 2C and 3A, the scale surface 110s has scales. The first gauge surface image MA shows the scale value of the gauge surface 110s. The first ruler surface image MA has a first measurement scale value MA1 and a second measurement scale value MA2, which respectively correspond to two scales of the ruler gauge 110 . The first size interval dS1 is equal to the difference between the first measurement scale value MA1 and the second measurement scale value MA2, such as an absolute value. As in formula (1), the processor 13 performs a quotient calculation on the first size interval dS1 and the first pixel number P1 within the range of the first size interval dS1, and the obtained quotient value is the first image taken by the first camera 12A Accuracy A1. Taking the first pixel number P1 as 3088 points and the first size interval dS1 as 440 mm as an example, the obtained first imaging accuracy A1 is 0.142 mm. The smaller the first camera accuracy A1 is, the higher the resolution of the image captured by the first camera 12A is, and the more accurate the information obtained therefrom is.

As shown in FIGS. 2C and 3A , the field of view of the first camera 12A does not include the end scale 111 of the size range of the ruler 110 . In this way, the two boundaries of the first scale image MA captured by the first camera 12A can respectively correspond to the first measurement scale value MA1 and the second measurement scale value MA2, the first measurement scale value MA1 and the second measurement scale value MA1 The measurement scale value MA2 can be obtained by analyzing the first scale image MA by the processor 13 . The first number of pixels P1 in the first size interval dS1 is roughly equal to the first camera 12A The camera resolution of , which can be known from the known performance of the first camera 12A, does not require additional calculations, thus reducing the burden on the processor 13 . In another embodiment, the field of view of the first camera 12A may include the end scale 111 of the size range of the scale 110 (the first measurement scale value MA1 is not the boundary of the first scale image MA), even so, The processor 13 can analyze the first scale image MA to obtain the first measurement scale value MA1, the second measurement scale value MA2 and the first pixel number P1 between them.

As shown in FIG. 2C , the positions of the first camera 12A and the second camera 12B respectively correspond to two opposite ends of the ruler 110 . The second camera 12B is used to capture the second ruler image MB of the ruler surface 110s. The processor 13 is further used to: obtain the second size range dS2 of the second size range image MB according to the second size range image MB, and obtain the second size range dS2 and the second number of pixels within the range of the second size range dS2 P2, obtaining the second imaging accuracy A2. In this way, the second imaging accuracy A2 of the second camera 12B can be obtained by simulating the surface of the optical film through the ruler 110 without erecting a physical optical film. The smaller the second camera accuracy A2 is, the higher the resolution of the image captured by the second camera 12B is, and the more accurate the information obtained is.

As shown in FIG. 3B, the processor 13 is further used to: obtain the second imaging accuracy A2 according to the following formula (2), wherein dS2 represents the second size interval displayed by the second ruler image MB, and P2 represents the second dimension interval The second number of pixels P2 in the two-size interval dS2.

In detail, as shown in Figures 2C and 3B, the scale surface 110s has scales. The second gauge surface image MB shows the scale value of the gauge surface 110s. second ruler The surface image MB has a corresponding third measurement scale value MB1 and a fourth measurement scale value MB2 , which respectively correspond to the two scales of the ruler 110 . The second size interval dS2 is equal to the difference between the third measurement scale value MB1 and the fourth measurement scale value MB2, such as an absolute value. As in formula (2), the processor 13 performs a quotient calculation on the second size interval dS2 and the second pixel number P2 within the range of the second size interval dS2, and the obtained quotient value is the second image taken by the second camera 12B Accuracy A2. The smaller the second camera accuracy A2 is, the higher the resolution of the image captured by the second camera 12B is, and the more accurate the information obtained is.

As shown in Figures 2C and 3B, the field of view of the second camera 12B does not include the endpoint scale 112 of the size range of the ruler 110, so that the second image MB of the second ruler gauge captured by the second camera 12B is The boundaries correspond to the third measurement scale value MB1 and the fourth measurement scale value MB2 respectively, and the second number of pixels P2 in the second size interval dS2 is roughly equal to the imaging resolution of the second camera 12B, which can be determined by the second camera Knowing the known performance of 12B, no additional calculation is required, which can reduce the burden on the processor 13 . In another embodiment, the field of view of the second camera 12B may include the end scale 112 of the size range of the ruler 110 (the fourth measurement scale value MB2 is not the boundary of the second ruler surface image MB), even so, The processor 13 can analyze the second scale image MB to obtain the third measurement scale value MB1 , the fourth measurement scale value MB2 and the second pixel number P2 between them.

As shown in Figures 3A and 3B, the processor 13 can use image analysis technology to analyze the image MA of the first ruler surface to obtain the first centerline C1 and the scale value of the first centerline of the first ruler image MA MC1, and analyzing the second ruler image MB to obtain the second centerline C2 and the second centerline of the second ruler image MB Two centerline scale values MC2, and record the position of the first centerline C1, the position of the second centerline C2, the first centerline scale value MC1 and the second centerline scale value MC2.

In one embodiment, the first measurement scale value MA1 and the second measurement scale value MA2 are symmetrical with respect to the first centerline C1, for example, the first measurement scale value MA1 and the second measurement scale value MA2 are respectively the first The scale values of the relative two edges (or borders) of the ruler surface image MA, so the processor 13 can obtain the first centerline scale value MC1 through the following formula (3). The formula (3) assumes that the first measurement scale value MA1 is less than The second measurement scale value MA2. Similarly, the third measurement scale value MB1 and the fourth measurement scale value MB2 are symmetrical with respect to the second center line C2, for example, the third measurement scale value MB1 and the fourth measurement scale value MB2 are respectively the second scale surface The scale values of the relative two edges (or boundaries) of the image MB, so the processor 13 can obtain the second centerline scale value MC2 through the following formula (4). The formula (4) assumes that the third measurement scale value MB1 is smaller than the fourth quantity Measure the scale value MB2.

As shown in FIG. 2C , the first camera 12A and the second camera 12B can be erected according to a known distance H. For example, the first camera 12A and the second camera 12B are arranged such that the lens centers thereof are separated by a predetermined distance H. In this embodiment, the length of the ruler gauge 110 is greater than the distance H, so that the first centerline scale value MC1 and the second centerline scale value MC2 can be obtained without moving the ruler gauge 110, wherein the first centerline scale value MC1 and the second central line scale value MC2 can be obtained or divided at the same time Obtained at different time points. In another embodiment, the length of the ruler 110 is less than the distance H. In this case, the first camera 12A can be made to correspond to one end of the ruler 110 with the end scale 111, and the same method as above can be used to obtain the first A centerline scale value MC1, and then move the ruler 110 so that the second camera 12B corresponds to one end of the ruler gauge 110 with the end scale 112, and use the same method as above to obtain the second centerline scale value MC2. Of course, the second centerline scale value MC2 can also be obtained first, and then the first centerline scale value MC1 can be obtained. The structure of the first fixing device 120 will be described below.

As shown in FIGS. 2A and 2B , the first fixing device 120 includes a first connecting member 121 , a first rod 122 and a second rod 123 . The first rod 122 passes through the first connecting member 121 and is used for placing on the first roller 11B. The second rod 123 passes through the first connecting member 121 and is used for carrying the ruler 110 . The first rod 122 and the second rod 123 are arranged in parallel, for example. There is a clearance (loose fit) between the first connecting member 121 and the first rod 122 , so that the first fixing device 120 and the first rod 122 can rotate relative to each other.

As shown in FIGS. 2A and 2B , the first fixing device 120 further includes a second connecting member 124 and a third rod 125 , and the third rod 125 passes through the second connecting member 124 . The first rod 122 passes through the second connecting member 124 . The first rod 122 can be placed on the second roller 11C located in the treatment tank 11A. The first bar 122 is located at the side of the first surface 11C1 of the second roller 11C, and the third bar 125 is located at the side of the second surface 11C2 of the second roller 11C or contacts the second surface 11C2, and the normal direction of the first surface 11C1 is the same as The normal directions of the second surface 11C2 are non-parallel, for example, they are vertical or an acute angle is formed between the two normal directions. Since the third rod 125 is located on the side of the second surface 11C2, it can prevent the first fixing device 120 from sliding down and disengaging from the first roller 11B and/or the second roller. Wheel 11c.

As shown in FIGS. 2A and 2B , the first fixing device 120 further includes an anti-slip member 126 connected to the first rod 122 and used to be placed on the second roller 11C. There is a friction resistance between the anti-slip member 126 and the second roller 11C, which can increase the sliding resistance between the first fixing device 120 and the second roller 11C. In one embodiment, the anti-slip member 126 has a rough structure, or contains materials capable of providing friction, such as rubber.

The second fixing device 130 has a structure similar to or the same as that of the first fixing device 120 . For example, the second fixing device 130 also includes a first connecting member 121 , a first rod 122 , a second rod 123 , a second connecting member 124 , a third rod 125 and an anti-slip member 126 . The structures and/or connections of the first connector 121, the first rod 122, the second rod 123, the second connector 124, the third rod 125 and the anti-slip member 126 of the second fixing device 130 are similar to or the same as those of the first connector 130. The structure and/or connection relationship of the first connecting member 121 , the first rod 122 , the second rod 123 , the second connecting member 124 , the third rod 125 and the anti-slip member 126 of the fixing device 120 will not be repeated here.

The structure of the first connecting member 121 will be described in detail below. Please refer to FIG. 4 , which shows a schematic diagram of the first connecting member 121 in FIG. 2A . The first connecting member 121 includes a body 1211 , a rotating portion 1212 and an operating portion 1213 . The body 1211 has a first through hole 1211a for allowing the first rod 122 (the first rod 122 is shown in FIG. 2A ) to pass through. The rotating part 1212 has a second through hole 1212a, and the second through hole 1212a is used for passing the second rod 123 (the second rod 123 is shown in FIG. 2A ). In one embodiment, the body 1211 extends along the X axis, and the first through hole 1211a extends along the Y axis. Through the body 1211 . The rotating part 1212 is rotatably connected to the main body 1211 , for example, the rotating part 1212 can rotate around the X axis relative to the main body 1211 . Since the rotating part 1212 is rotatably connected to the main body 1211, the central axis AX2 of the second through hole 1212a of the rotating part 1212 can rotate around the X axis to be parallel to the central axis AX1 of the first through hole 1211a, as shown in Figure 4, so that The first rod 122 passing through the first through hole 1211a is substantially parallel to the second rod 123 passing through the second through hole 1212a, as shown in FIG. 2A.

As shown in FIG. 4 , the operating part 1213 is connected to the main body 1211 , for example, the main body 1211 and the operating part 1213 are fixed so that the main body 1211 can rotate with the operating part 1213 .

As shown in FIGS. 4 and 2B , the second connecting member 124 includes a structure similar or identical to that of the first connecting member 121 . For example, the second connecting member 124 also includes a body 1211 and a rotating portion 1212 . The body 1211 has a first through hole 1211a, and the first through hole 1211a is used for the third rod 125 to pass through. The rotating part 1212 has a second through hole 1212a, and the second through hole 1212a is used for passing the first rod 122 therethrough. Since the rotating part 1212 is rotatably connected to the main body 1211, the central axis AX2 of the second through hole 1212a of the rotating part 1212 can rotate around the X axis to be perpendicular to the central axis AX1 of the first through hole 1211a, so that the first through hole 1211a The first rod 122 is substantially perpendicular to the second rod 123 passing through the second through hole 1212a, as shown in FIGS. 2A and 2B.

As shown in FIG. 4 , in one embodiment, the rotating part 1212 can rotate 360 degrees relative to the main body 1211 . In terms of structure, the rotating part 1212 includes a connecting part 1212A and a bearing part 1212B, and the connecting part 1212A is connected to the bearing part 1212B. The connecting part 1212A has a through hole 1212b through which the main body 1211 can pass, so that the main body 1211 can be combined with the rotating part 1212 and can be rotated relatively, for example, can be rotated 360 degrees. The aforementioned second through hole 1212a is formed in the carrying portion 1212B. The rotating part 1212 is a plate-shaped material, which includes a first end, a second end and a middle section, the middle section connects the first end and the second end, and the first end and the second end respectively have a first sub-through hole and a second The second son pierces the hole. In terms of manufacturing process, after the plate-shaped material is bent, the first end and the second end overlap to form the connecting portion 1212A, and the first sub-through hole at the first end coincides with the second sub-through hole at the second end to form a through hole. The hole 1212b, and the middle section of the rotating part 1212 forms the bearing part 1212B.

Please refer to Figures 5A~5B, Figure 5A shows a schematic diagram of the ruler gauge 110 in Figure 2 not in contact with the simulated line L1, and Figure 5B shows a schematic diagram of the ruler gauge 110 in Figure 5A in contact with the simulated line L1.

As shown in FIGS. 2A and 5A , the simulation line L1 can be, for example, a solid line that can be erected on the wheel surface of the first roller 11B, and the simulation line L1 can simulate a geometric line segment on the transmission surface of the optical film. As shown in FIG. 5A , when the first fixing device 120 is initially erected on the first roller 11B, the simulated line L1 and the ruler 110 are usually not in contact. As shown in FIG. 5B, the first connecting member 121 can be rotated (for example, rotating the operating part 1213) until the ruler gauge surface 110s of the ruler gauge 110 touches the simulation line L1. At this time, the position of the ruler gauge surface 110s can be regarded as the same as that of the optical film. surface. The aforementioned first ruler surface image MA and second ruler surface image MB are, for example, based on images captured by a camera when the ruler surface 110 s touches the simulation line L1 . In addition, the simulated line L1 can be in line contact with the ruler gauge surface 110s, for example, the simulated line L1 can contact the ruler gauge 110 along the entire width of the ruler gauge surface 110s; or, the simulated line L1 can point contact with the ruler gauge surface 110s, for example, simulate Line L1 can be A point that touches the gauge face 110s. In one embodiment, the simulated line L1 may be approximately parallel to the extending direction of the surface of the optical film; and/or the simulated line L1 may be approximately perpendicular to the scale surface 110s.

In one embodiment, the rotation amount of the first fixing device 120 and the second fixing device 130 can be the same (for example, the first fixing device 120 and the second fixing device 130 rotate synchronously), so that the scale 110 can translate upward along the X axis (that is, without rotation), wherein the X-axis is, for example, perpendicular to the scale surface 110s, and the Z-axis is, for example, parallel to the scale surface 110s. In another embodiment, the rotation amounts of the first fixing device 120 and the second fixing device 130 can be different, so that the scale 110 can rotate relative to the first fixing device 120 or the second fixing device 130 .

Then, in the actual optical film manufacturing process, the optical film measurement of the optical film manufacturing process will continue, wherein the installation of the first camera 12A and the second camera 12B in the measurement stage can be maintained, but the measurement device 100 is removed. The processor 13 can use the first camera 12A and the second camera 12B to obtain the geometric information of the actual optical film, such as the width of the optical film, the edge position of the optical film 14 , etc., which are further illustrated below.

Please refer to Figures 6-7B. Figure 6 shows a schematic diagram of an optical film process measurement device 10' according to an embodiment of the present invention, and Figure 7A shows the first image captured by the first camera 12A in Figure 6. A schematic diagram of a measured optical film image MA', and FIG. 7B is a schematic diagram of a second measured optical film image MB' captured by the second camera 12B in FIG. 6 .

As shown in Figure 6, the optical film process measurement equipment 10' includes at least An optical film manufacturing device 11 (shown in FIG. 1 ), at least one first camera 12A, at least one second camera 12B, and a processor 13 . The first camera 12A and/or the second camera 12B are movably arranged relative to the optical film manufacturing apparatus 11 . Furthermore, one first camera 12A and one second camera 12B can form a camera group. The optical film process measurement equipment 10' may include a camera group, which can move relative to the optical film process device 11 to an upstream or downstream position of one of the plurality of processing tanks 11A, so as to measure the optical film 14 transported during the optical film process. geometric information. In another embodiment, the optical film process measurement equipment 10' may include a plurality of camera groups, and each camera group may be arranged upstream or downstream of the corresponding processing tank 11A to measure the geometric information of the optical film 14. The processor 13 is electrically connected to the first camera 12A and the second camera 12B to analyze images captured by the first camera 12A and the second camera 12B.

As shown in FIG. 6 , the optical film 14 is placed on the surface of the first roller 11B in the optical film processing device 11 . Wherein, the position of the first camera 12A corresponds to the first edge 14e1 of the optical film 14, so that the field of view of the first camera 12A (the first measured optical film image MA') includes the first edge 14e1, and the position of the second camera 12B The position corresponds to the second edge 14e2 of the optical film 14, so that the field of view of the second camera 12B (the second measured optical film image MB′) includes the second edge 14e2.

As shown in Figures 6 and 7B, the first camera 12A can capture the first measured optical film image MA', the second camera 12B can capture the second measured optical film image MB', and the processor 13 can use image analysis technique, analyzing the first measured optical film image MA' to obtain the first position of the first edge 14e1 of the optical film 14, and analyzing the second measured optical film image MB' to obtain the second edge 14e2 of the optical film 14 the second position, and obtain the width W1 according to the first position and the second position. Taking the first measured optical film image MA' as an example, the processor 13 can use image analysis technology to analyze the first measured optical film image MA' to obtain the first centerline C1 (obtained in the measurement stage of Figs. 2A-2C its position) and the first interval pixel number of the first interval between the first edge 14e1, and according to the first imaging accuracy A1, obtain the first interval value ΔH1 corresponding to the first interval pixel number, wherein the first interval The value ΔH1 is defined as a positive value in a direction away from the middle position of the first camera 12A and the second camera 12B (or the middle position of the optical film 14 ) from the first centerline C1 , and negative in the opposite direction. Similarly, for the second measured optical film image MB', the processor 13 can use image analysis technology to analyze the second measured optical film image MB' to obtain the second centerline C2 (measurement in FIGS. 2A-2C ). stage has obtained the second interval pixel number of the second interval between its position) and the second edge 14e2, and according to the second imaging accuracy A2, obtain the second interval value ΔH2 corresponding to the second interval pixel number, wherein, The second interval value ΔH2 is defined as a positive value from the second central line C2 toward the middle position between the first camera 12A and the second camera 12B (or the middle position of the optical film 14 ), and vice versa. The processor 13 is further configured to obtain the width W1 of the optical film 14 according to the distance H, the first distance value ΔH1 and the second distance value ΔH2 . Specifically, the processor 13 can obtain the width W1 of the optical film 14 according to the following formula (5).

W1=H+△H1+△H2...(5)

Since the first imaging accuracy A1 and the second imaging accuracy A2 have been obtained before the actual measurement, the geometric information of the optical film obtained in the actual measurement is quite accurate. In addition, because the first camera 12A and the second camera 12B are set up in the actual process, it can be real-time Monitor the current status of the geometric information of the optical film. When the size of the optical film is found to be defective, the process can be improved immediately, such as adjusting the stretching speed and/or roller tension.

In one embodiment, the optical film 14 can move at a stretching speed (or moving speed) under the transmission of the rollers. The camera group can move at the same extension speed or at different speeds to monitor the current status of the geometric information of the corresponding position of the optical film. Alternatively, the optical film process measurement equipment 10' can be equipped with multiple camera groups, which can obtain the real-time width of the optical film 14 in each processing tank in real time, and can adjust the stretching parameters in real time to obtain better quality of the optical film.

In one embodiment, the aforementioned optical film 14 may be a polarizing film precursor, and the material includes polyvinyl alcohol (PVA) or other suitable materials. For example, the polarizing film precursor 200 can be a film of polyvinyl alcohol. Polyvinyl alcohol can be formed by saponifying polyvinyl acetate. According to some embodiments, polyvinyl acetate can be a monomer polymer of vinyl acetate, or a copolymer of vinyl acetate and other monomers, and the other monomers can be unsaturated carboxylic acids, olefins, unsaturated sulfonic acids , or vinyl ethers, etc. In some embodiments, the polyvinyl alcohol is modified, such as polyvinylformal, polyvinyl acetate, or polyvinylbutyral modified with aldehydes. In some embodiments, the thickness of the polarizing film precursor 200 is about 20 μm˜100 μm.

In one embodiment, the polarizing film precursor may be firstly guided to the swelling tank by rollers, so as to perform a swelling treatment on the polarizing film precursor. The swelling treatment can remove foreign matter on the surface of the polarizing film precursor and the plasticizer in the polarizing film precursor, and facilitates subsequent dyeing and crosslinking treatments.

The polarizing film precursor is then guided to a dyeing tank to perform a dyeing process on the polarizing film precursor. The bath liquid in the dyeing tank contains a dyeing agent. As the dyeing agent, dichroic dyes or other suitable water-soluble dichromatic dyes can be used. In some embodiments, the stain comprises iodine and potassium iodide.

The polarizing film precursor is then guided to the cross-linking tank to perform a cross-linking treatment on the polarizing film precursor. The bath solution in the crosslinking bath contains a crosslinking agent. As a crosslinking agent, boric acid can be used. After the cross-linking treatment, the polarizing film precursor can be guided to a cleaning tank to perform a cleaning treatment on the polarizing film precursor.

To sum up, the embodiment of the present invention proposes a measurement device, optical film manufacturing process measurement equipment and measurement method using the measurement device, which can simulate the measurement of the optical film with a ruler in advance. In this way, the measurement can be completed without actually erecting the optical film, and the waste of the polarizing film precursor or the optical film used for the measurement can be avoided. In addition, because the measurement method of the embodiment of the present invention can be used to measure the optical film immersed in the processing liquid, in one embodiment, by synchronously moving the camera according to the stretching speed of the optical film, or setting up multiple groups of cameras in the process equipment device, so that the real-time width of the optical film in each processing tank can be obtained in real time, and the stretching parameters can be adjusted in real time, so that better quality of the optical film can be obtained.

To sum up, although the present invention has been disclosed by the above embodiments, it is not intended to limit the present invention. Those skilled in the art of the present invention can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the embodiments of the present invention should be defined by the scope of the appended patent application.

11:Optical film processing equipment

11A: Treatment tank

11B: The first roller

11C: Second roller

110: Ruler

120: The first fixture

121: the first connector

1211: Ontology

1212: rotating part

1213: Operation Department

122: First shot

123: second shot

124: the second connector

125: Third shot

126: Anti-slip parts

130: second fixture

L1: Analog line

X, Y, Z: axes

Claims (17)

A measuring device, comprising: a ruler with a ruler surface; and a fixing device for connecting the ruler and including a first connecting piece, a first rod and a second rod, the first rod passing through the first connecting part and being placed on a first roller, the second rod passing through the first connecting part and carrying the ruler; wherein, the surface of the ruler simulates a surface of an optical film . The measuring device as described in claim 1, wherein the first connecting member includes: a body with a first through hole for the first rod to pass through; and a rotating part with a first Two through holes, the second through hole is used for passing the second rod; wherein, the rotating part is rotatably connected to the body. The measuring device as described in claim 1, wherein the fixing device includes: a second connecting member; and a third rod passing through the second connecting member; wherein the first rod passing through the second connecting member And for placing on a second roller, the first bar and the third bar are non-parallel. An optical film process measurement equipment, comprising: a measurement device as described in any one of claims 1 to 3; an optical film process device, including the first roller; A first camera is used to capture a first ruler surface image of the ruler surface; a simulated line is arranged on a wheel surface of the first roller, wherein the ruler surface touches the simulated line, the simulated The line is substantially parallel to an extension direction of the surface of the optical film and/or the simulated line is substantially perpendicular to the ruler plane; and a processor is used to obtain the first ruler plane according to the image of the first ruler plane A first imaging precision of the first camera is obtained according to a first size interval of the image and a first pixel count of the first size interval and the first size interval. The optical film process measurement equipment as described in claim 4, wherein the scale surface has a scale, the image of the first scale surface has a first measurement scale value and a second measurement scale value, and the first size interval It is equal to the difference between the first measurement scale value and the second measurement scale value. The optical film process measurement equipment as described in Claim 4, further includes: a second camera, used to: capture a second gauge surface image of the gauge surface; wherein, the processor is further used to: Obtaining a second size range of the second size range image according to the second size range image, and obtaining the second camera according to the second size range and a second pixel number of the second size range A second imaging accuracy; wherein, the position of the first camera and the position of the second camera respectively correspond to two opposite ends of the ruler. The optical film process measurement equipment as claimed in claim 4, wherein the optical film process device further includes a processing tank, and the first roller is located inside or outside the processing tank. The optical film process measurement equipment as described in Claim 4, wherein the optical film process device further includes a processing tank and a second roller, one of the first roller and the second roller is located in the processing tank, and The other of the first roller and the second roller is located outside the treatment tank. A measurement method, using the optical film process measurement equipment as described in any one of claims 4 to 8 to measure the optical film; the measurement method includes: arranging a simulation line on a wheel surface of the first roller, Based on the rule plane contacting the simulation line, using the first camera to capture the first rule face image of the rule face; according to the first rule face image, obtaining the first rule face image of the a first size interval; and according to the first size interval and the first number of pixels in the first size interval, obtain the first imaging accuracy of the first camera. The measurement method as described in claim item 9, wherein the ruler surface has a scale, and the image of the first ruler surface has a first measurement scale value and a second measurement scale value; the measurement method is further used for : Obtain a difference between the first measurement scale value and the second measurement scale value, and use the difference as the first size interval. The measurement method as described in claim item 9, further comprising: a second camera captures a second image of the ruler surface; according to the image of the second ruler surface, the second ruler surface is obtained a second dimension interval of one of the images; and A second imaging precision of the second camera is obtained according to the second size interval and a second pixel number in the second size interval. The measurement method as described in claim 9, wherein the ruler surface contacts the simulated line, the simulated line is approximately parallel to the extension direction of the surface of the optical film and/or the simulated line is approximately perpendicular to the ruler surface . The measurement method as described in claim 11, further comprising: placing the optical film on the wheel surface of the first roller; capturing a first measured optical film image by the first camera; capturing an image of the optical film by the second camera Take a second measured optical film image; obtain a first position of a first edge of the optical film in the first measured optical film image and a position of a second edge of the optical film in the second measured optical film image a second position; and obtaining a width of the optical film according to the first position and the second position. The measuring method as described in claim 13, further comprising: removing the measuring device; and placing the optical film on the wheel surface of the first roller after removing the measuring device. The measurement method as described in claim 13, wherein the first position of the first edge of the optical film in the first measured optical film image and the second position of the optical film in the second measured optical film image are acquired The step of the second position of the two edges further includes: Obtain a first interval pixel number of a first interval between the first centerline of the first measured optical film image and the first edge; according to the first imaging accuracy, obtain the first interval pixel number Corresponding to a first interval value; obtaining a second interval pixel number of a second interval between a second centerline of the second measured optical film image and the second edge; and according to the second imaging accuracy, Obtaining a second interval value corresponding to the number of pixels in the second interval; wherein, the step of obtaining the width of the optical film according to the first position and the second position further includes: according to a lens of the first camera A distance between the center and a lens center of the second camera, the first spacing value and the second spacing value obtain the width of the optical film. The measuring method according to Claim 9, wherein the first camera is movably arranged relative to the optical film processing device. The measuring method as described in claim 13, wherein the optical film has a stretching speed in the optical film processing device; the measuring method further includes: the first camera and the second camera are set at the stretching speed Synchronized movement.

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