EP3289441B1 - Stripe-mapping in einem speicher - Google Patents

Stripe-mapping in einem speicher Download PDF

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Publication number
EP3289441B1
EP3289441B1 EP16808099.2A EP16808099A EP3289441B1 EP 3289441 B1 EP3289441 B1 EP 3289441B1 EP 16808099 A EP16808099 A EP 16808099A EP 3289441 B1 EP3289441 B1 EP 3289441B1
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Prior art keywords
stripes
stripe
memory devices
elements
stripe map
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English (en)
French (fr)
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EP3289441A4 (de
EP3289441A1 (de
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Edward MCGLAUGHLIN
Joseph M. Jeddeloh
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Micron Technology Inc
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Micron Technology Inc
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1076Parity data used in redundant arrays of independent storages, e.g. in RAID systems
    • G06F11/108Parity data distribution in semiconductor storages, e.g. in SSD
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0602Interfaces specially adapted for storage systems specifically adapted to achieve a particular effect
    • G06F3/061Improving I/O performance
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0602Interfaces specially adapted for storage systems specifically adapted to achieve a particular effect
    • G06F3/0614Improving the reliability of storage systems
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0602Interfaces specially adapted for storage systems specifically adapted to achieve a particular effect
    • G06F3/0614Improving the reliability of storage systems
    • G06F3/0619Improving the reliability of storage systems in relation to data integrity, e.g. data losses, bit errors
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0628Interfaces specially adapted for storage systems making use of a particular technique
    • G06F3/0629Configuration or reconfiguration of storage systems
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0628Interfaces specially adapted for storage systems making use of a particular technique
    • G06F3/0638Organizing or formatting or addressing of data
    • G06F3/064Management of blocks
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0628Interfaces specially adapted for storage systems making use of a particular technique
    • G06F3/0655Vertical data movement, i.e. input-output transfer; data movement between one or more hosts and one or more storage devices
    • G06F3/0656Data buffering arrangements
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0668Interfaces specially adapted for storage systems adopting a particular infrastructure
    • G06F3/0671In-line storage system
    • G06F3/0673Single storage device
    • G06F3/0679Non-volatile semiconductor memory device, e.g. flash memory, one time programmable memory [OTP]
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0668Interfaces specially adapted for storage systems adopting a particular infrastructure
    • G06F3/0671In-line storage system
    • G06F3/0683Plurality of storage devices
    • G06F3/0688Non-volatile semiconductor memory arrays
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/06Digital input from, or digital output to, record carriers, e.g. RAID, emulated record carriers or networked record carriers
    • G06F3/0601Interfaces specially adapted for storage systems
    • G06F3/0668Interfaces specially adapted for storage systems adopting a particular infrastructure
    • G06F3/0671In-line storage system
    • G06F3/0683Plurality of storage devices
    • G06F3/0689Disk arrays, e.g. RAID, JBOD

Definitions

  • the present disclosure relates generally to semiconductor memory devices, methods, and systems, and more particularly, to stripe mapping in memory.
  • Memory devices are typically provided as internal, semiconductor, integrated circuits in computers or other electronic devices. There are many different types of memory including volatile and non-volatile memory. Volatile memory can require power to maintain its data and includes random-access memory (RAM), dynamic random access memory (DRAM), and synchronous dynamic random access memory (SDRAM), among others. Non-volatile memory can provide persistent data by retaining stored information when not powered and can include NAND flash memory, NOR flash memory, read only memory (ROM), Electrically Erasable Programmable ROM (EEPROM), Erasable Programmable ROM (EPROM), and phase change random access memory (PCRAM), among others.
  • RAM random-access memory
  • DRAM dynamic random access memory
  • SDRAM synchronous dynamic random access memory
  • NAND flash memory NAND flash memory
  • NOR flash memory read only memory
  • ROM read only memory
  • EEPROM Electrically Erasable Programmable ROM
  • EPROM Erasable Programmable ROM
  • PCRAM phase change random access memory
  • a solid state drive can include non-volatile memory, e.g., NAND flash memory and NOR flash memory, and/or can include volatile memory, e.g., DRAM and SRAM, among various other types of non-volatile and volatile memory.
  • Flash memory devices including floating gate flash devices and charge trap flash (CTF) devices using semiconductor-oxide-nitride-oxide-semiconductor and metal-oxide-nitride-oxide-semiconductor capacitor structures that store information in charge traps in the nitride layer, may be utilized as non-volatile memory for a wide range of electronic applications. Flash memory devices typically use a one-transistor memory cell that allows for high memory densities, high reliability, and low power consumption.
  • An SSD can be used to replace hard disk drives as the main storage device for a computer, as the solid state drive can have advantages over hard drives in terms of performance, size, weight, ruggedness, operating temperature range, and power consumption.
  • SSDs can have superior performance when compared to magnetic disk drives due to their lack of moving parts, which may avoid seek time, latency, and other electromechanical delays associated with magnetic disk drives.
  • SSD manufacturers can use non-volatile flash memory to create flash SSDs that may not use an internal battery supply, thus allowing the drive to be more versatile and compact.
  • An SSD can include a number of memory devices, e.g., a number of memory chips (as used herein, "a number of" something can refer to one or more of such things, e.g., a number of memory devices can refer to one or more memory devices).
  • a memory chip can include a number of dies and/or logical units (LUNs). Each die can include a number of memory arrays and peripheral circuitry thereon.
  • the memory arrays can include a number of memory cells organized into a number of physical pages, and the physical pages can be organized into a number of blocks.
  • a redundant array of independent disks is an umbrella term for computer data storage schemes that divide and/or replicate data among multiple memory devices.
  • the multiple memory devices in a RAID array may appear to a user and the operating system of a computer as a single memory device, e.g., disk.
  • a RAID operated with multiple hard disk drives (HDDs).
  • United States Patent Application Publication No.: US 2011/078496 A1 to Jeddeloh discloses a method for stripe management.
  • a block table is used to keep track of which portions of the memory system constitute which stripes. Writing and reading operations to the memory system are performed in accordance with the block table.
  • the present disclosure includes methods and apparatuses for redundant array of independent disks (RAID) stripe mapping in memory.
  • One method embodiment includes writing data in a number of stripes across a storage volume of a plurality of memory devices according to a stripe map; wherein each of the number of stripes includes a number of elements; and wherein the stripe map includes a number of stripe indexes to identify the number of stripes and a number of element identifiers to identify elements included in each of the number of stripes.
  • a stripe map can be created that is indexed by stripe.
  • the stripe map can include stripe index for each stripe that will be used when writing data to a number of memory devices.
  • the stripe map can also identify each element, e.g., page, on a number of memory devices that will be included in the stripes.
  • the striping map can identify a first stripe with a stripe index of the first stripe and also identify a number of elements, e.g., pages, that will be included in the first stripe.
  • a stripe can include a number of pages and each of the number of pages of a stripe can be coupled to different channels of a memory system.
  • a stripe map can be used to define stripes in a memory system so that each stripe has elements with varied bit error rates. Memory systems with elements that have varied bit error rates can decrease the likelihood that a particular stripe will have multiple elements that return errors when reading a stripe.
  • Figure 1 is a functional block diagram of an apparatus in the form of a computing system including at least one memory system in accordance with a number of embodiments of the present disclosure.
  • a host 110 e.g., a memory device 120, a memory array, controller, and/or sensing circuitry might also be separately considered an "apparatus.”
  • the memory system 104 e.g., a solid state drive (SSD)
  • the memory system 104 can include a host interface 106, a memory controller 108, which can be implemented in hardware, e.g., control circuitry, firmware, and/or software, and a number of memory devices 110-1,..., 110-N, e.g., solid state memory devices including non-volatile multilevel memory cells.
  • SSD solid state drive
  • the memory devices 110-1, ..., 110-N can provide a storage volume for the memory system, e.g., with a file system formatted to the memory devices.
  • the memory controller 108 can be an application specific integrated circuit (ASIC) coupled to a printed circuit board including the physical host interface 106 and memory devices 110-1, ..., 110-N.
  • ASIC application specific integrated circuit
  • the memory controller 108 can be coupled to the host interface 106 and to the memory devices 110-1, ..., 110-N by a plurality of channels.
  • the memory controller 108 can be configured to perform the operations described herein, in addition to other memory operations as will be appreciated by those skilled in the art.
  • the host interface 106 can be used to communicate information between the memory system 104 and another device such as a host 102.
  • Host 102 can include a memory access device, e.g., a processor.
  • a processor can intend a number of processors, such as a parallel processing system, a number of coprocessors, etc.
  • hosts examples include laptop computers, personal computers, digital cameras, digital recording and playback devices, mobile telephones, PDAs, memory card readers, interface hubs, and the like.
  • the host interface 106 can be in the form of a standardized interface.
  • the physical host interface 106 can be a serial advanced technology attachment (SATA), peripheral component interconnect express (PCIe), or a universal serial bus (USB), among other connectors and interfaces.
  • SATA serial advanced technology attachment
  • PCIe peripheral component interconnect express
  • USB universal serial bus
  • host interface 106 can provide an interface for passing control, address, information, and other signals between the memory system 104 and a host system 102 having compatible receptors for the host interface 106.
  • the memory controller 108 can include host interface circuitry that can be coupled to and/or incorporated with the host interface 106.
  • the host interface circuitry can interface with the host system 102 through a number of layers, e.g., a physical layer, a link layer, and/or a transport layer.
  • a number of layers for a particular host interface can be defined by an interface standard such as serial advanced technology attachment (SATA), peripheral component interconnect express (PCIe), universal serial bus (USB), etc.
  • a transport layer can indicate at least a transport layer as part of a SATA standard and/or a transaction layer as part of a PCIe standard.
  • a transport layer according to a SATA standard can be analogous to a transaction layer according to a PCIe standard. Embodiments are not limited to a particular standard.
  • the host interface circuitry can convert command packets received from the host system, e.g., from a PCIe bus, into command instructions for converting host-memory translation responses into host system commands for transmission to the requesting host.
  • the host interface circuitry can construct SATA command packets from PCIe based transaction layer packets.
  • the host interface circuitry can be configured to receive information associated with a plurality of addresses from the host system 102.
  • the memory controller 108 can include host-memory translation circuitry configured to translate host addresses to memory addresses, e.g., addresses associated with a received command such as a read and/or write command.
  • the host-memory translation circuitry might, for example, convert host sector read and write operations to commands directed to specific portions of the memory devices 110-1, ..., 110-N.
  • Each host operation can be translated into single or multi-sector memory device 110-1, ..., 110-N operation.
  • host read and write commands can be translated into memory device 110-1, ..., 110-N read and write commands.
  • write information can be striped across a plurality of channels to a number of solid state memory devices, e.g., in association with a RAID operation.
  • striping includes splitting information so that it is stored across a plurality of channels, for example on more than one device.
  • the portions of the more than one device that store the split information are collectively referred to as a stripe.
  • mirroring can include storing duplicate copies of information on more than one device.
  • the memory controller 108 can maintain an LBA table and/or a block table (not shown).
  • the LBA table can store the physical page address of pages in the number of memory devices 110-1, ..., 110-N and include corresponding logical addresses.
  • the LBA table can be indexed by the LBA that is contained in an associated command, e.g., an associated SATA command.
  • the LBA table can be used to look-up physical page addresses that correspond to logical block addresses where corresponding information can be stored.
  • the block table can store information for erasable blocks in the number of memory devices 110-1, ..., 110-N.
  • Information stored in the block table can include valid page information, erase count, and other status information.
  • Information accessed from the block table can be indexed by physical block address.
  • the memory controller 108 can communicate with the memory devices 110-1, ..., 110-N to read, write, and erase information, among other operations.
  • the memory devices 110-1, ..., 110-N are illustrated being coupled to a collective memory controller 108, a number of embodiments of the present disclosure can include a discrete non-volatile memory controller for each memory channel.
  • a memory device 110-1, ..., 110-N can include a number of arrays of memory cells, e.g., non-volatile memory cells.
  • the arrays can be flash arrays with a NAND architecture, for example.
  • the control gates of memory cells of a "row” can be coupled with an access, e.g., word, line, while the memory cells can be coupled in series source to drain in a "string" between a select gate source transistor and a select gate drain transistor.
  • the string can be connected to a data line, e.g., bit line, by the select gate drain transistor.
  • the use of the terms "row” and "string” implies neither a linear nor an orthogonal arrangement of memory cells.
  • the manner of connection of the memory cells to the bit lines and source lines depends on whether the array is a NAND architecture, a NOR architecture, or some other memory array architecture.
  • the memory devices 110-1, ..., 110-N can include a number of memory cells that can be grouped.
  • a group can include a number of memory cells, such as a page, block, plane, die, an entire array, or other groups of memory cells.
  • some memory arrays can include a number of pages of memory cells that make up a block of memory cells.
  • a number of blocks can be included in a plane of memory cells.
  • a number of planes of memory cells can be included on a die.
  • a 128 GB memory device can include 4314 bytes of information per page, e.g., 4096 bytes of write information plus 218 bytes of overhead information, 128 pages per block, 2048 blocks per plane, and 16 planes per device.
  • the memory controller 108 can include a first stripe map 120 and a second stripe map 122.
  • at least a portion of the first stripe map 120 and/or at least a portion of the second stripe map 122 can also be stored in the memory devices 110-1, ..., 110-N, in the host system 102, and/or in a separate storage location (not shown).
  • a second stripe map 122 can be an inverse of the first stripe map 102, where both the first and second stripe maps 120 and 122 include the same information, but the first stripe map 120 is indexed by stripe index and the second stripe map 122 is indexed by page identifier.
  • the first stripe map 120 can be used to associate a number of pages with a particular stripe and the second stripe map 122 can be used to associate a number of stripes with a particular page.
  • the first stripe map 120 can be a data structure that associates particular pages in memory devices 110-1, ..., 110-N to particular stripes.
  • the first stripe map 120 can include a number of stripe indexes, where each of the number of strip indexes identify a stripe in memory devices 110-1, ..., 110-N.
  • the first stripe map 120 can associate particular pages of memory devices 110-1, ..., 110-N with the stripes identified by the stripe indexes of the first stripe map 120.
  • the memory controller 108 can select particular pages to associate with particular stripes in the stripe map based on the bit error rate of a particular page and/or a physical location of a particular page within memory devices 110-1, ..., 110-N. For example, the memory controller 108 can select some pages with lower bit error rates and some pages with higher bit error rates to include in the stripes, so that each of the stripes would include pages having a varied bit error rates. Stripes that include pages have a varied bit error rates are less likely to have uncorrectable ECC errors, therefore an ECC operation can be used to correct errors when reading the stripe.
  • the memory controller 108 can select pages based on the physical location of the pages on memory devices 110-1, ..., 110-N. For example, the memory controller 108 can select some pages that are located near the edge of an array, e.g., "edge pages," and some pages that located towards the center of an array, so that each of the stripes would include pages with varied physical locations on memory devices 110-1, ..., 110-N.
  • the memory controller 108 can include stripes in the stripe map that have a varying number of pages. For example, one stripe can include 6 pages and another stripe can include 5 pages. Also, a particular page can be included in more than one stripe on memory devices 110-1, ..., 110-N.
  • the page identifiers can include channel, device, block, and/or page information to identify the location of a particular page in memory devices 110-1, ..., 110-N.
  • the page identifiers can include a physical address of the page.
  • the page identifiers can be used by the channel controller 108 to locate the page when performing a read and/or write operation.
  • the host-memory translation circuitry can include first and/or second level error detection circuitry (not shown in Figure 1 ). Although referred to as error detection circuitry, the error detection circuitry can also perform error correction.
  • First level error detection circuitry can be configured to apply error correction such as BCH error correction, as will be understood by one of ordinary skill in the art, to detect and/or correct errors associated with information stored in the memory devices 110-1, ..., 110-N.
  • the first level error detection circuitry can provide 29 bits of error correction over a 1080-bit code word.
  • the second level error detection circuitry can detect errors that are not correctable by the first level error detection, e.g., uncorrectable error correction code (UECC) errors, such as by determining that there are more than a threshold amount of correctable errors.
  • Second level error detection circuitry can include RAID exclusive or (XOR) circuitry.
  • the RAID XOR circuitry can calculate parity information based on information received from the host interface circuitry. For each bit written to a number of the memory devices 110-1, ..., 110-N, a parity bit can be calculated by RAID XOR circuitry and written to a particular one of the memory devices 110-1, ..., 110-N.
  • the second stripe map 122 can be a data structure that associates particular stripes in memory devices 110-1, ..., 110-N to particular pages in memory devices 110-1, ..., 110-N.
  • the second stripe map 122 can be indexed by page and include a number of page identifiers, where each of the number of page identifiers identify a page in memory devices 110-1, ..., 110-N.
  • the second stripe map 122 can indicate which stripes are associated with pages that are indexed in the second stripe map 122.
  • the second stripe map 122, which is indexed by page can be the inverse of the first stripe map 120, which is indexed by stripe.
  • the second stripe map 122 can be used by second level error detection circuitry to perform a RAID read error recovery operation.
  • a RAID read error recovery operation can be performed when an UECC error occurs and data from a bad page that is part of one or more stripes in memory devices 110-1, ..., 110-N can be moved to different pages.
  • a bad page can be a page where a UECC error occurs when performing a read operation.
  • the RAID read error recovery operation can use the second stripe map 122 by locating the page identifier of the bad page in the second stripe map 122 and determine the stripes in memory devices 110-1, ..., 110-N that included the bad page.
  • the stripes that are identified by the second stripe map 122 as including the bad page can be updated so that the data from the bad page is recovered using parity data and the data is moved to a different page in memory devices 110-1, ..., 110-N.
  • the first stripe map 120 can then be updated to associate the page identifier of the different page with the updated stripes in memory devices 110-1, ..., 110-N.
  • the embodiment of Figure 1 can include additional circuitry that is not illustrated so as not to obscure embodiments of the present disclosure.
  • the memory system 104 can include address circuitry to latch address signals provided over I/O connections through I/O circuitry. Address signals can be received and decoded by a row decoder and a column decoder to access the memory devices 110-1, ..., 110-N. It will be appreciated by those skilled in the art that the number of address input connections can depend on the density and architecture of the memory devices 110-1, ..., 110-N.
  • FIG 2 illustrates a diagram of a portion of a memory device 210 in accordance with a number of embodiments of the present disclosure.
  • Memory device 210 can be a device such as memory devices 110-1 to 110-N shown in Figure 1 .
  • memory device 210 can include a number of physical blocks 260-0 (BLOCK 0), 260-1 (BLOCK 1), ..., 260-M (BLOCK M) of memory cells.
  • the indicator "M" is used to indicate that the memory device 210 can include a number of physical blocks.
  • the number of physical blocks in memory device 210 may be 128 blocks, 4,096 blocks, or 32,768 blocks, however embodiments are not limited to a particular number or multiple of physical blocks in a memory device.
  • the memory device 210 can be, for example, a NAND flash memory device 210 such that, for example, the memory cells in each physical block 260-0, 260-1, ..., 260-M can be erased together as a unit, e.g., the cells in each physical block can be erased in a substantially simultaneous manner. For instance, the cells in each physical block can be erased together in a single erasing operation.
  • the indicator "R” is used to indicate that a physical block, e.g., 260-0, 260-1, ..., 260-M, can include a number of rows.
  • the number of rows, e.g., word lines, in each physical block can be 32, but embodiments are not limited to a particular number of rows 270-0, 270-1, ..., 270-R per physical block.
  • each row 270-0, 270-1, ..., 270-R can include one or more physical pages, e.g., an even page and an odd page.
  • a physical page refers to a unit of writing and/or reading, e.g., a number of cells that are written and/or read together or as a functional group of memory cells. Accordingly, an even page and an odd page can be written and/or read with separate writing and/or reading operations.
  • a page can store information in a number of sectors 280-0, 280-1, ..., 280-S.
  • the indicator "S" is used to indicate that a page can include a number of sectors.
  • Information can include system and/or user data.
  • Each sector 280-0, 280-1, ..., 280-S can store system and/or user data and can include overhead information, such as error correction code (ECC) information, and logical block address (LBA) information.
  • ECC error correction code
  • LBA logical block address
  • logical block addressing is a scheme that can be used by a host for identifying a sector of information, e.g., each sector can correspond to a unique LBA.
  • a sector is the smallest addressable portion of a storage volume.
  • a sector of information can be a number of bytes of information, e.g., 256 bytes, 512 bytes, or 1,024 bytes.
  • an SSD can have 4, 8, or 16 sectors in a page, where a sector can be 512 bytes, and an SSD can have 128, 256, or 512 pages per physical block, therefore physical block sizes are 131072 bytes, 262144 bytes, and 524288 bytes. Embodiments are not limited to these examples.
  • the physical blocks 260-0, 260-1, ..., 260-M, rows 270-0, 270-1, ..., 270-R, sectors 280-0, 280-1, ..., 280-S, and pages are possible.
  • the rows 270-0, 270-1, ..., 270-R of the physical blocks 260-0, 260-1, ..., 260-M can each store information corresponding to a single sector which can include, for example, more or less than 512 bytes of information.
  • Figure 3 illustrates a block diagram of a storage volume 340 operated on a stripe-basis.
  • the storage volume 340 can be provided by a file system formatted to a number of solid state memory devices, e.g., solid state memory devices 110-1, ..., 110-N in Figure 1 , in a memory system, e.g., memory system 104 in Figure 1 .
  • each solid state memory-device can be associated with a memory channel 342-1, ..., 342-(N-1), 342-N.
  • embodiments are not limited to one channel per memory device, e.g., memory chip, as some embodiments may include multiple channels per device.
  • One memory chip can be coupled to a memory controller by more than one channel, e.g., in the case of a memory chip including more than one physical plane of memory cells.
  • Information can be written in a number of stripes 344-1, 344-2, ..., 344-P across the storage volume 340 provided by the number of solid state memory devices.
  • a memory system can receive write information from a host system, e.g., host 102 shown in Figure 1 .
  • the memory system e.g., RAID XOR circuitry associated with memory controller 108 in Figure 1 , can calculate parity information for the write information.
  • the write information and parity information can be striped across the storage volume 340 such that write information can be written across a subset of the number of available channels, e.g., channels 342-1, ..., 342-(N-1) and parity information can be written across a second subset of the number of available channels, e.g., channel 342-N.
  • a memory system can include eight channels where seven channels are used for writing write information and one channel is used for writing parity information.
  • parity information can be written across different channels for different stripes.
  • Embodiments are not limited to using N-1 of N channels for write information and a single channel for parity information.
  • RAID structure and/or stripe size can be programmable options.
  • a RAID structure can represent an implementation of a RAID storage scheme devised to divide and/or replicate information across multiple memory devices. For example, information can be striped and/or mirrored across two or more devices. Striping can include dividing write information into elements and storing at least one element in each of a number of memory devices. Mirroring can include redundantly storing a copy of write information in at least two memory devices. Both striping and mirroring can include the use of error detection. Parity information can be stored in the same memory devices as write information and/or in a separate device from the devices storing write information. According to a number of embodiments of the present disclosure, the particular RAID structure to be implemented by a memory system can be a programmable option.
  • a stripe size can refer to the number of channels across which information is striped.
  • a stripe size for a memory system can be a programmable option such that any number of the channels available to the memory system can be used for a stripe.
  • a memory system including 32 channels and a number of corresponding memory devices can have any stripe size from 2 to 32 channels.
  • Some embodiments can include logically segregating a non-volatile memory into at least two portions, each portion including a subset of the number of channels associated with the non-volatile memory. Such embodiments can include operating the non-volatile memory system on a stripe basis for each of the at least two portions independently.
  • a number of pages of write information and parity information can be written in each stripe, where a first stripe is written across only one subset of the number of channels of the memory system and a second stripe is written across only a different subset of the number of channels of the memory system.
  • a stripe size can change during operation of the memory system.
  • a block table can be used to keep track of which portions of the memory system correspond to which stripes.
  • ECC circuitry associated with the memory controller 108 in Figure 1 can calculate first level error correction information for elements of write information and/or second level correction, e.g., parity, information stored in the memory devices.
  • Figure 3 includes an illustration of write information 346 and first level error correction information 348 being stored in association with channels 342-1, ..., 342-(N-1) and parity information 350 and first level error correction information 348 being stored in association with channel 342-N.
  • first level error correction information can be used in an attempt to correct the error before and/or without implementing a second level of error correction, e.g., the correction associated with parity information described above.
  • a memory system may store sufficient first level error correction information to enable a threshold number of erroneous bits to be corrected. If an error is detected, e.g., a UECC error during a write operation, that includes more bit errors than are correctable with the first level error correction information, then the second level of error correction, e.g., using the second stripe map and the parity information described above, may be implemented, e.g., the information associated with the error(s) may be recreated using parity information and a remainder of the write information.
  • an error e.g., a UECC error during a write operation, that includes more bit errors than are correctable with the first level error correction information
  • the second level of error correction e.g., using the second stripe map and the parity information described above, may be implemented, e.g., the information associated with the error(s) may be recreated using parity information and a remainder of the write information.
  • Figure 4 illustrates a stripe map 420 in accordance with a number of embodiments of the present disclosure. Although "pages" are referred to in this example, stripes can comprise elements other than pages.
  • the stripe map 420 is a table including a stripe index column 430 and a number of page identifier columns 434.
  • a number of stripes are indicated by stripe indexes 432-1, 432-2,432-3, ..., 432-V.
  • stripe indexes 432-1, 432-2, 432-3, ..., 432-V are associated with a number of pages.
  • stripe index 432-1 is associated with page identifiers 436-1, 436-2, 436-3, and 436-4;
  • stripe index 432-2 is associated with page identifiers 436-5, 436-3, 436-6, and 436-4;
  • stripe index 432-3 is associated with page identifiers 436-2, 436-7, 436-4, and 436-1;
  • stripe index 432-V is associated with page identifiers 436-8, 436-7, 436-4, and 436-W.
  • Two or more stripes can include common pages.
  • stripe indexes 432-1, 432-2, and 432-3 are all associated with page identifier 436-4.
  • stripes can be associated with different numbers of pages.
  • stripe index 432-1 is associated with four pages and stripe index 432-V is associated with three pages.
  • Data can be written to memory devices according the stripe map so that when data is written to a stripe identified by a stripe index, the data will be written to the associated pages as indicated in the stripe map.
  • the page identifiers can include channel, device, block, and/or page information.
  • each stripe can include a parity page and the parity page of each stripe can be indicated by the page identifier in one of the columns of the stripe map.
  • the parity page of each stripe can be identified by the page identifier in the second column of the stripe map.
  • Figure 5 illustrates a stripe map 522 in accordance with a number of embodiments of the present disclosure.
  • stripes can comprise elements other than pages.
  • Stripe map 522 can be an inverse of stripe map 420 described above in association with Figure 4 .
  • the stripe map 522 is a table including a number of stripe index columns 430 and a page identifier column 534.
  • a number of pages are indicated by page identifiers 536-1, 536-2, 536-3, 536-4, 536-5, 536-6, 536-7, 536-8 ..., 532-V.
  • Each of the page identifiers 536-1, 536-2, 536-3, 536-4, 536-5, 536-6, 536-7, 536-8 ..., 532-V are associated with a number of stripes indicated by striped indexes 532-1, 532-2, 532-3,..., 532-V.
  • page identifier 536-3 is associated the stripes that are referenced by stripe indexes 532-1 and 532-2. Therefore, in response to an UECC error, the stripe map table 531 can be used to perform a RAID read error recovery operation.
  • a RAID read error recovery operation can include moving data from a bad page that is part of one or more stripes to different pages.
  • the RAID read error recovery operation can use the stripe map 522 to locate the page identifier of the bad page in the stripe map 522 and determine the stripes that included the bad page.
  • the stripes that are identified by the stripe map 522 as including the bad page can be updated so that the data from the bad page is recovered using parity data and the data is moved to a different page.
  • Stripe map 420 from Figure 4 can then be updated to associate the page identifier of the different page with the updated stripes.
  • the present disclosure includes methods and devices for RAID stripe mapping in memory.
  • One method embodiment includes writing data in a number of stripes across a storage volume of a plurality of memory devices according to a stripe map; wherein each of the number of stripes includes a number of elements; and wherein the stripe map includes a number of stripe indexes to identify the number of stripes and a number of element identifiers to identify elements included in each of the number of stripes.

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Claims (15)

  1. Ein Verfahren zum Streifenzuordnen, das Folgendes umfasst:
    Schreiben von Daten in einer Anzahl von Streifen über ein Speichervolumen einer Vielzahl von Speichergeräten (110-1, ..., 110-N, 210) gemäß einer ersten Streifenzuordnung (120, 420),
    wobei jeder der Anzahl von Streifen (344-1, 344-2, ..., 344-P) eine Anzahl von Elementen beinhaltet;
    wobei die erste Streifenzuordnung (120, 420) eine Anzahl von Streifenindizes (430), um die Anzahl von Streifen zu identifizieren, und eine Anzahl von Elementkennungen, um die Elemente zu identifizieren, die in jedem der Anzahl von Streifen beinhaltet sind, beinhaltet;
    wobei das Verfahren durch Folgendes gekennzeichnet ist:
    Speichern einer zweiten Streifenzuordnung (122, 522), wobei die zweite Streifenzuordnung (122, 522) eine umgekehrte Streifenzuordnung der ersten Streifenzuordnung (120, 420) ist;
    Durchführen einer Lesefehlerwiederherstellungsoperation für eine redundante Anordnung unabhängiger Festplatten (RAID = Redundant Array of Independent Disks) durch Lokalisieren der Elementkennung eines schlechten Elements in der Anzahl von Streifen in der zweiten Streifenzuordnung, Bestimmen von einem oder mehreren Streifen der Anzahl von Streifen, die das schlechte Element beinhalten, durch Verwenden der zweiten Streifenzuordnung, und Wiederherstellen von Daten des schlechten Elements durch Verwenden von Paritätsdaten und Bewegen der Daten des schlechten Elements zu einem anderen Element; und Aktualisieren der ersten Streifenzuordnung, um die Elementkennung des anderen Elements mit dem einen oder den mehreren Streifen der Anzahl von Streifen zu assoziieren.
  2. Verfahren nach Anspruch 1, wobei das Verfahren das Erzeugen der ersten Streifenzuordnung (120, 420) durch Assoziieren von jedem der Anzahl von Streifenindizes (430) mit einem Teil der Elemente in der Vielzahl von Speichergeräten (110-1, ..., 110-N, 210) beinhaltet.
  3. Verfahren nach Anspruch 1, wobei das Verfahren das Erzeugen der ersten Streifenzuordnung (120, 420) durch Assoziieren von jedem der Anzahl von Streifen (344-1, 344-2, ..., 344-P) mit einer Paritätselementkennung (436) beinhaltet.
  4. Verfahren nach Anspruch 1, wobei das Verfahren das Erzeugen der ersten Streifenzuordnung (120, 420) durch Auswählen der Elemente, die in der Anzahl von Streifen (344-1, 344-2, ..., 344P) beinhaltet sein sollen, basierend auf einer mit den Elementen assoziierten Bitfehlerrate beinhaltet.
  5. Verfahren nach Anspruch 1, wobei das Verfahren das Erzeugen der ersten Streifenzuordnung (120, 420) durch Auswählen der Elemente, die in der Anzahl von Streifen beinhaltet sein sollen, basierend auf einem Ort der Elemente innerhalb der Vielzahl von Speichergeräten (110-1, ..., 110-N, 210) beinhaltet.
  6. Verfahren nach Anspruch 1, wobei das Schreiben von Daten in der Anzahl von Streifen (344-1, 344-2, ..., 344-P) das Aufteilen der Daten auf die Anzahl von Elementen und das Schreiben der Anzahl von Elementen zu der Vielzahl von Speichergeräten (110-1, ..., 110-N, 210) beinhaltet.
  7. Verfahren nach Anspruch 6, wobei das Schreiben der Anzahl von Elementen zu der Vielzahl von Speichergeräten (110-1, ..., 110-N, 210) das Schreiben von mindestens einem Element zu jedem der Vielzahl von Speichergeräten (110-1, ..., 110-N, 210) beinhaltet.
  8. Verfahren nach Anspruch 6, wobei das Schreiben der Anzahl von Elementen zu der Vielzahl von Speichergeräten (110-1, ..., 110-N, 210) das Schreiben von mindestens einem Element zu jedem von einem Teilsatz der Vielzahl von Speichergeräten (110-1, ..., 110-N, 210) beinhaltet.
  9. Verfahren nach Anspruch 8, wobei das Schreiben von mindestens einem Element zu jedem von einem Teilsatz der Vielzahl von Speichergeräten (110-1, ..., 110-N, 210) das Schreiben einer jeweiligen Seite der Schreibdaten zu jedem von einem Teilsatz der Vielzahl von Speichergeräten (110-1, ..., 110-N, 210) beinhaltet.
  10. Eine Vorrichtung, die Folgendes umfasst:
    eine Anzahl von Speichergeräten (110-1, ..., 110-N, 210);
    eine Steuereinheit, die mit der Anzahl von Speichergeräten (110-1, ..., 110-N, 210) gekoppelt ist und für Folgendes konfiguriert ist:
    Speichern einer ersten Streifenzuordnung (120, 420), umfassend Elementkennungen für jedes Element einer Anzahl von Streifen, in der Anzahl von Speichergeräten (110-1, ..., 110-N, 210), wobei die erste Streifenzuordnung (120,420) konkrete Elemente von konkreten Streifen definiert;
    Schreiben von Daten zu der Anzahl von Speichergeräten (110-1, ..., 110-N, 210), wobei die Daten zu Elementen der Anzahl von Streifen geschrieben werden, die durch die erste Streifenzuordnung (120,420) definiert werden;
    dadurch gekennzeichnet, dass die Steuereinheit ferner für Folgendes konfiguriert ist:
    Speichern einer zweiten Streifenzuordnung (122, 522), die eine umgekehrte Streifenzuordnung der ersten Streifenzuordnung umfasst;
    Durchführen einer Lesefehlerwiederherstellungsoperation für eine redundante Anordnung unabhängiger Festplatten (RAID) durch Lokalisieren der Elementkennung eines schlechten Elements in der Anzahl von Streifen in der zweiten Streifenzuordnung,
    Bestimmen von einem oder mehreren Streifen der Anzahl von Streifen, die das schlechte Element beinhalten, durch Verwenden der zweiten Streifenzuordnung, und
    Wiederherstellen von Daten des schlechten Elements durch Verwenden von Paritätsdaten und Bewegen der Daten des schlechten Elements zu einem anderen Element; und
    Aktualisieren der ersten Streifenzuordnung, um die Elementkennung des anderen Elements mit dem einen oder den mehreren Streifen der Anzahl von Streifen zu assoziieren.
  11. Vorrichtung nach Anspruch 10, wobei die Elementkennungen (434, 534) für jedes Element Kanal-, Geräte-, Block-und Seiteninformationen beinhalten.
  12. Vorrichtung nach Anspruch 10, wobei die konkreten Elemente von konkreten Streifen (3441, 344-2, ..., 344-P) unterschiedliche Bitfehlerraten beinhalten.
  13. Vorrichtung nach Anspruch 10, wobei die konkreten Elemente von konkreten Streifen (3441, 344-2, ..., 344-P) basierend auf physischen Orten (260, 270, 280) in der Anzahl von Speichergeräten (110-1, ..., 110-N, 210) ausgewählt sind.
  14. Vorrichtung nach Anspruch 10, wobei die physischen Orte (260, 270, 280) basierend auf Bitfehlerraten ausgewählt sind, die mit den physischen Orten (260, 270, 280) assoziiert sind.
  15. Vorrichtung nach Anspruch 10, wobei ein beliebiges Element von einer Anzahl von Elementen in einem konkreten Streifen (344-1, 344-2, ..., 344-P) beinhaltet sein kann.
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Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9529672B2 (en) * 2014-09-25 2016-12-27 Everspin Technologies Inc. ECC word configuration for system-level ECC compatibility
US10073621B1 (en) * 2016-03-31 2018-09-11 EMC IP Holding Company LLC Managing storage device mappings in storage systems
US10545825B2 (en) * 2016-04-29 2020-01-28 Synamedia Limited Fault-tolerant enterprise object storage system for small objects
CN107870730B (zh) * 2016-09-23 2020-11-20 伊姆西Ip控股有限责任公司 用于管理存储系统的方法和系统
US10365983B1 (en) * 2017-04-27 2019-07-30 EMC IP Holding Company LLC Repairing raid systems at per-stripe granularity
US10719399B2 (en) 2018-01-08 2020-07-21 International Business Machines Corporation System combining efficient reliable storage and deduplication
US10901840B2 (en) * 2018-06-28 2021-01-26 Western Digital Technologies, Inc. Error correction decoding with redundancy data
US11017112B2 (en) * 2018-07-03 2021-05-25 Tyson York Winarski Distributed network for storing a redundant array of independent blockchain blocks
US10747614B2 (en) * 2018-07-23 2020-08-18 Micron Technology, Inc. Hybrid iterative error correcting and redundancy decoding operations for memory sub-systems
CN111124269B (zh) 2018-10-31 2023-10-27 伊姆西Ip控股有限责任公司 用于存储管理的方法、电子设备和计算机可读存储介质
CN111124262B (zh) * 2018-10-31 2023-08-22 伊姆西Ip控股有限责任公司 独立盘冗余阵列(raid)的管理方法、设备和计算机可读介质
US11204716B2 (en) 2019-01-31 2021-12-21 EMC IP Holding Company LLC Compression offloading to RAID array storage enclosure
US11055188B2 (en) * 2019-04-12 2021-07-06 EMC IP Holding Company LLC Offloading error processing to raid array storage enclosure
TWI708260B (zh) * 2019-08-15 2020-10-21 華邦電子股份有限公司 儲存裝置及存取方法
US10970170B2 (en) * 2019-08-29 2021-04-06 Micron Technology, Inc. Shared parity protection
KR20220023476A (ko) * 2020-08-21 2022-03-02 에스케이하이닉스 주식회사 레이드 데이터 저장 장치 및 이를 포함하는 데이터 저장 시스템
KR20220072242A (ko) * 2020-11-25 2022-06-02 삼성전자주식회사 비휘발성 메모리 장치의 데이터 기입 방법 및 이를 수행하는 비휘발성 메모리 장치
KR20220077573A (ko) * 2020-12-02 2022-06-09 에스케이하이닉스 주식회사 메모리 시스템 및 메모리 시스템의 동작방법
US11520656B2 (en) 2021-03-19 2022-12-06 Micron Technology, Inc. Managing capacity reduction and recovery due to storage device failure
US11520500B2 (en) 2021-03-19 2022-12-06 Micron Technology, Inc. Managing capacity reduction when downshifting multi-level memory cells
US11892909B2 (en) 2021-03-19 2024-02-06 Micron Technology, Inc. Managing capacity reduction due to storage device failure
US11733884B2 (en) 2021-03-19 2023-08-22 Micron Technology, Inc. Managing storage reduction and reuse with failing multi-level memory cells
US11307931B1 (en) * 2021-03-19 2022-04-19 Micron Technology, Inc. Using zones to manage capacity reduction due to storage device failure
US11650881B2 (en) 2021-03-19 2023-05-16 Micron Technology, Inc. Managing storage reduction and reuse in the presence of storage device failures
US11605439B2 (en) * 2021-03-31 2023-03-14 Micron Technology, Inc. Remapping bad blocks in a memory sub-system
US11822814B2 (en) * 2022-02-28 2023-11-21 Western Digital Technologies, Inc. Dynamic XOR bin mapping in memory devices
US12001685B2 (en) * 2022-03-31 2024-06-04 Cohesity, Inc. Performing an in-line erasure coding process using a write-ahead log

Family Cites Families (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5570376A (en) * 1994-10-05 1996-10-29 Sun Microsystems, Inc. Method and apparatus for identifying faults within a system
US6513093B1 (en) * 1999-08-11 2003-01-28 International Business Machines Corporation High reliability, high performance disk array storage system
US8266367B2 (en) * 2003-12-02 2012-09-11 Super Talent Electronics, Inc. Multi-level striping and truncation channel-equalization for flash-memory system
US6902882B2 (en) * 2000-05-23 2005-06-07 Kerong Gu Methods of monitoring production of gene products and uses thereof
US6996742B2 (en) * 2000-11-28 2006-02-07 Sedna Patent Services, Llc Method for regenerating and streaming content from a video server using RAID 5 data striping
JP3682256B2 (ja) * 2001-11-30 2005-08-10 株式会社東芝 ディスクアレイ装置及び同装置におけるパリティ処理方法
JP3702231B2 (ja) * 2002-01-31 2005-10-05 株式会社東芝 ディスクアレイ装置及び同装置における動的記憶容量拡張方法
JP4238514B2 (ja) 2002-04-15 2009-03-18 ソニー株式会社 データ記憶装置
US7386663B2 (en) * 2004-05-13 2008-06-10 Cousins Robert E Transaction-based storage system and method that uses variable sized objects to store data
US7380157B2 (en) * 2004-10-27 2008-05-27 Pillar Data Systems, Inc. Staggered writing for data storage systems
US7386758B2 (en) * 2005-01-13 2008-06-10 Hitachi, Ltd. Method and apparatus for reconstructing data in object-based storage arrays
TWI350526B (en) 2005-11-21 2011-10-11 Infortrend Technology Inc Data access methods and storage subsystems thereof
JP5242264B2 (ja) * 2008-07-07 2013-07-24 株式会社東芝 データ制御装置、ストレージシステムおよびプログラム
US8266501B2 (en) * 2009-09-29 2012-09-11 Micron Technology, Inc. Stripe based memory operation
TWI497293B (zh) 2009-12-17 2015-08-21 Ibm 固態儲存裝置內之資料管理
US9582431B2 (en) * 2010-03-22 2017-02-28 Seagate Technology Llc Storage address space to NVM address, span, and length mapping/converting
IT1399634B1 (it) * 2010-04-26 2013-04-26 G S G Srl Macchina per il trattamento di miscele alimentari ad attivazione centralizzata
US8898206B1 (en) * 2010-04-28 2014-11-25 Netapp, Inc. Mechanism for distributed inode to path traversal in a striped volume system
US8417877B2 (en) * 2010-08-31 2013-04-09 Micron Technology, Inc Stripe-based non-volatile multilevel memory operation
JP5388976B2 (ja) * 2010-09-22 2014-01-15 株式会社東芝 半導体記憶制御装置
US8775868B2 (en) 2010-09-28 2014-07-08 Pure Storage, Inc. Adaptive RAID for an SSD environment
CN103348330B (zh) 2010-12-01 2017-05-24 希捷科技有限公司 采用独立硅元件的动态较高级冗余模式管理
KR101732030B1 (ko) 2010-12-22 2017-05-04 삼성전자주식회사 데이터 저장 장치 및 그것의 동작 방법
US9251059B2 (en) * 2011-09-23 2016-02-02 Avalanche Technology, Inc. Storage system employing MRAM and redundant array of solid state disk
US8694849B1 (en) * 2011-12-19 2014-04-08 Pmc-Sierra Us, Inc. Shuffler error correction code system and method
WO2013119074A1 (ko) 2012-02-09 2013-08-15 Noh Sam Hyuk 신뢰성 있는 ssd를 위한 효율적인 raid 기법
US8327185B1 (en) 2012-03-23 2012-12-04 DSSD, Inc. Method and system for multi-dimensional raid
JP6039699B2 (ja) * 2012-07-23 2016-12-07 株式会社日立製作所 ストレージシステム及びデータ管理方法
US9348758B2 (en) 2012-09-24 2016-05-24 Sk Hynix Memory Solutions Inc. Virtual addressing with multiple lookup tables and RAID stripes
US8862818B1 (en) 2012-09-27 2014-10-14 Emc Corporation Handling partial stripe writes in log-structured storage
US8977594B2 (en) 2012-12-21 2015-03-10 Zetta Inc. Systems and methods for state consistent replication
GB2517435A (en) * 2013-08-19 2015-02-25 Ibm Fast data back-up and restore between volatile and flash memory
US9405783B2 (en) 2013-10-02 2016-08-02 Netapp, Inc. Extent hashing technique for distributed storage architecture
US9274888B2 (en) * 2013-11-15 2016-03-01 Qualcomm Incorporated Method and apparatus for multiple-bit DRAM error recovery
US20150363118A1 (en) * 2014-06-17 2015-12-17 Netapp, Inc. Techniques for harmonic-resistant file striping
US9021297B1 (en) 2014-07-02 2015-04-28 Pure Storage, Inc. Redundant, fault-tolerant, distributed remote procedure call cache in a storage system
US9639268B2 (en) * 2014-08-21 2017-05-02 Datrium, Inc. Distributed data storage system with key-based addressing
KR20160083762A (ko) * 2015-01-02 2016-07-12 삼성전자주식회사 스토리지 시스템에서의 매핑 테이블 관리 방법 및 이를 적용한 스토리지 시스템

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
None *

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US9766837B2 (en) 2017-09-19
CN107743617A (zh) 2018-02-27
CN107743617B (zh) 2019-06-04
US10339005B2 (en) 2019-07-02
EP3289441A4 (de) 2018-09-05
WO2016200764A1 (en) 2016-12-15
EP3289441A1 (de) 2018-03-07
US20170357467A1 (en) 2017-12-14
US11042441B2 (en) 2021-06-22
US20160364181A1 (en) 2016-12-15
KR20180005284A (ko) 2018-01-15
KR101874290B1 (ko) 2018-07-03
JP2018517213A (ja) 2018-06-28
US20190324847A1 (en) 2019-10-24
TW201709044A (zh) 2017-03-01
TWI599946B (zh) 2017-09-21
JP6422600B2 (ja) 2018-11-14

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