Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R33/00—Arrangements or instruments for measuring magnetic variables
  • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
  • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
  • G01R33/09—Magnetoresistive devices
  • G01R33/096—Magnetoresistive devices anisotropic magnetoresistance sensors
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
  • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
  • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
  • G01R15/205—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using magneto-resistance devices, e.g. field plates
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
  • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
  • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
  • G01R15/207—Constructional details independent of the type of device used
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
  • G01R19/10—Measuring sum, difference or ratio
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
  • G01R33/00—Arrangements or instruments for measuring magnetic variables
  • G01R33/0005—Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types

Definitions

• the present invention relates to an electrical structure comprising a DC circuit and a current measuring device for measuring a current intensity of the DC circuit.
• the potential-free current measurement is used in a wide variety of technical areas that deal with electrical energy transmission - as in the field of automotive technology.
• current measurement also plays an important role in the safety management of a battery system.
• the current measurement is used, for example, for monitoring safety-relevant functions or for fault detection.
• the current measurement is usually done by
• the document DE 10 2012 006 269 A1 describes, for example, a sensor arrangement for measuring a current intensity.
• the sensor arrangement comprises a current sensor which has at least one current detection element which detects a load current through an electrical conductor and provides an electrical measurement signal as a function of this load current.
• the current detection element is preferably described in this document as a resistance element, wherein it is explained that this can also be a magnetic field sensor element.
• the document DE 198 38 536 A1 discloses an apparatus and a method for forming one or more magnetic field gradients by a current conductor which is straight at the location of the magnetic field measurement.
• a straight conductor with a recess such as a slot or a groove is presented.
• the magnetic field-sensitive element which is designed as Magnetfeldgradientenmeß réelle arranged.
• an electrical structure comprising a DC circuit and a current measuring device for measuring a current of the DC circuit
• the DC circuit comprises a DC power source, a positive line and a negative line, wherein the positive line with a positive pole of the DC power source and the negative line with a Negative pole of Power source is electrically connected
• the current measuring device comprises a measuring element, wherein the positive line and the negative lead at least in a measuring range parallel to each other and in the measuring range, the measuring element is arranged, wherein the measuring element is designed such that it is the current flow based on the anisotropic magnetoresistive effect measures a current.
• the electrical structure has a DC circuit and a current measuring device.
• the DC circuit includes a DC power source, a positive power line and a negative power line.
• the positive line of the DC circuit is according to the invention electrically connected to a positive pole of the DC power source.
• the negative line of the DC circuit is according to the invention electrically connected to a negative terminal of the DC power source. Plus line and minus line are thus flowed through by the same stream.
• the current measuring device of the contactless measurement of a current of the DC circuit (DC) is used. It has for this purpose a measuring element, wherein this measuring element is arranged according to the invention in a measuring range.
• the positive line and the minus line run parallel to each other in the measuring range.
• the measuring element is designed such that it measures a current during current flow on the basis of the anisotropic magnetoresistive effect.
• AMR anisotropic magnetoresistive
• the measuring element is arranged in a side view of the electrical structure in the measuring range above the plus line and the minus line.
• the measuring element is preferably arranged in a plan view of the electrical structure in the measuring range between the positive line and the negative line. It is particularly advantageous if, in a plan view of the electrical structure, the measuring element is arranged substantially centrally between the positive line and the negative line, that is, the distance of the positive line facing side edge of the measuring element to the positive line and the distance of the negative line facing Side edge of the measuring element to the negative lead are substantially equal.
• the distance between the positive and negative leads and the positioning of the sensing element above the positive and negative leads is determined by the maximum measured amperage and by the dimensions of the plus and minus conductors, essentially their cross-section.
• the current direction in the positive line is preferably opposite to the current direction in the negative line.
• the measuring element has a housing with electrical connections, a semiconductor chip and at least one magnetic field-sensitive element.
• the measuring element is an AMR sensor.
• the measuring element is arranged on a printed circuit board.
• the printed circuit board is the carrier of the measuring element and other electrical components and allows the electrical connection between the measuring element and other electrical components.
• the printed circuit board is a separation between a low voltage region (measuring element level) and a high voltage region (DC circuit level).
• the positive line and the negative line are essentially strip-like. These are in particular cuboid, non-ferromagnetic sheet metal parts made of, for example, copper or aluminum.
• cross section of the positive line and / or negative line need not be square - it may also be cylindrical, oval, etc. executed.
• the strip-like positive lead and the strip-like negative lead are symmetrically mirrored onto the vertical axis.
• the positive line and the negative line are particularly preferably arranged equidistantly in the measuring area.
• the DC power source is a battery, in particular a battery for a motor vehicle.
• Fig. 1 shows a plan view of an exemplary mechanical structure according to the invention.
• FIG. 2 shows a sectional view of an exemplary inventive mechanical construction.
• Fig. 3 shows schematically a plan view of a measuring element
• Fig. 4 shows a schematic perspective view of a
• Measuring element a positive line and a negative line.
• Fig. 1 shows a plan view of an exemplary electrical construction according to the invention.
• the electrical structure has a DC circuit 7 and a current measuring device 8.
• the DC circuit 7 comprises a DC power source, a positive power line 1 and a negative power line 2.
• the positive line 1 of the DC circuit 7 is electrically connected to a positive pole 3 of the DC power source.
• the negative line 2 of the DC circuit 7 is electrically connected to a negative terminal 4 of the DC power source.
• the current measuring device 8 is used for contactless measurement of a current intensity of the DC circuit 7 (DC). It has for this purpose a measuring element 5, wherein this measuring element 5 is arranged in a measuring range 6.
• the plus line 1 and the minus line 2 run parallel to one another in the measuring area 6.
• the positive line 1 and the negative line 2 are arranged equidistantly in the measuring range 6.
• the measuring element 5 is designed such that it measures a current during current flow on the basis of the anisotropic magnetoresistive effect.
• the measuring element 5 is arranged centrally in the measuring area 6 between the positive line 1 and the minus line 2 in the plan view of the electrical structure shown in FIG. 1 on a printed circuit board 9.
• the measuring element 5 in a plan view of the electrical structure in the measuring area 6 covers the positive line 1 and the minus line 2 at least partially.
• FIG. 3 also shows schematically the arrangement of the measuring element 5 in the measuring region 6 between the positive line 1 and the minus line 2.
• the plus line 1 and the minus line 2 run parallel to one another in the measuring area 6.
• the plus line 1 and the minus line 2 are equidistant in the measuring range 6.
• FIG. 2 shows a side view of an exemplary electrical construction according to the invention.
• the side view in this figure (FIG. 2) shows a sectional plane along the line AA shown in FIG. Again, the positive line 1 and the negative line 2, this time in cross section, are shown.
• the plus line 1 and the minus line 2 have a strip-like design and are arranged horizontally but vertically, so that the surfaces of the strips face one another on the left and right and the narrow sides of the strips point up and down.
• the positive line 1 and the negative line 2 are arranged equidistantly in the measuring range 6 and run parallel to each other. The entire surfaces of the strips are therefore arranged parallel to one another in the measuring area.
• the measuring element 5 is arranged in the illustrated side view of the electrical structure in the measuring range 6 above the positive line 1 and the negative line 2 on the circuit board 9. 4 also shows schematically the arrangement of the measuring element 5 in the measuring region 6 above the plus line 1 and the minus line 2.
• the positive line 1 and the minus line 2 run parallel to one another in the measuring range and are equidistant.
• 3 shows schematically a plan view of a measuring element 5, a positive line 1 and a minus line 2.
• the oppositely extending arrows shown in FIG. 3 indicate the current direction in the positive line 1 and the negative line 2.
• the current direction in the positive line is opposite to the current direction in the negative line.
• the positive line 1 and the minus line 2 are here essentially designed as elongated cuboid, like a strip. They are equidistant and parallel to each other.

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• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Condensed Matter Physics & Semiconductors (AREA)
• Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)

Applications Claiming Priority (2)

Publications (1)

Family

ID=55310819

Family Applications (1)

Country Status (4)

Families Citing this family (3)

Family Cites Families (13)

• 2016
  • 2016-02-05 EP EP16703305.9A patent/EP3265832A1/de not_active Withdrawn
  • 2016-02-05 WO PCT/EP2016/052548 patent/WO2016139028A1/de active Application Filing
  • 2016-02-05 US US15/553,253 patent/US20180045793A1/en not_active Abandoned
  • 2016-02-05 CN CN201680013688.4A patent/CN107407697A/zh active Pending

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