EP2893637A4 - Verfahren und vorrichtung für eine aktive negativverdichterschaltung - Google Patents

Verfahren und vorrichtung für eine aktive negativverdichterschaltung

Info

Publication number
EP2893637A4
EP2893637A4 EP13832732.5A EP13832732A EP2893637A4 EP 2893637 A4 EP2893637 A4 EP 2893637A4 EP 13832732 A EP13832732 A EP 13832732A EP 2893637 A4 EP2893637 A4 EP 2893637A4
Authority
EP
European Patent Office
Prior art keywords
capacitor circuit
active negative
negative
active
capacitor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP13832732.5A
Other languages
English (en)
French (fr)
Other versions
EP2893637A1 (de
Inventor
Dai Dai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tensorcom Inc
Original Assignee
Tensorcom Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US13/602,215 external-priority patent/US20140062545A1/en
Priority claimed from US13/602,216 external-priority patent/US9124279B2/en
Application filed by Tensorcom Inc filed Critical Tensorcom Inc
Publication of EP2893637A1 publication Critical patent/EP2893637A1/de
Publication of EP2893637A4 publication Critical patent/EP2893637A4/de
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H03M1/0818Continuously compensating for, or preventing, undesired influence of physical parameters of noise of clock feed-through
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H03M1/0809Continuously compensating for, or preventing, undesired influence of physical parameters of noise of bubble errors, i.e. irregularities in thermometer codes
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/124Sampling or signal conditioning arrangements specially adapted for A/D converters
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/34Analogue value compared with reference values
    • H03M1/36Analogue value compared with reference values simultaneously only, i.e. parallel type
    • H03M1/361Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type
    • H03M1/362Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type the reference values being generated by a resistive voltage divider
    • H03M1/365Analogue value compared with reference values simultaneously only, i.e. parallel type having a separate comparator and reference value for each quantisation level, i.e. full flash converter type the reference values being generated by a resistive voltage divider the voltage divider being a single resistor string

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Manipulation Of Pulses (AREA)
EP13832732.5A 2012-09-03 2013-09-02 Verfahren und vorrichtung für eine aktive negativverdichterschaltung Pending EP2893637A4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/602,215 US20140062545A1 (en) 2012-09-03 2012-09-03 Method and Apparatus for Reducing the Clock Kick-Back of ADC Comparators While Maintaining Transistor Matching Behavior
US13/602,216 US9124279B2 (en) 2012-09-03 2012-09-03 Method and apparatus for an active negative-capacitor circuit to cancel the input capacitance of comparators
PCT/US2013/057759 WO2014036543A1 (en) 2012-09-03 2013-09-02 Method and apparatus for an active negative-capacitor circuit

Publications (2)

Publication Number Publication Date
EP2893637A1 EP2893637A1 (de) 2015-07-15
EP2893637A4 true EP2893637A4 (de) 2016-05-18

Family

ID=50184478

Family Applications (1)

Application Number Title Priority Date Filing Date
EP13832732.5A Pending EP2893637A4 (de) 2012-09-03 2013-09-02 Verfahren und vorrichtung für eine aktive negativverdichterschaltung

Country Status (3)

Country Link
EP (1) EP2893637A4 (de)
CN (1) CN104718699A (de)
WO (2) WO2014036543A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9124279B2 (en) 2012-09-03 2015-09-01 Tensorcom, Inc. Method and apparatus for an active negative-capacitor circuit to cancel the input capacitance of comparators
US9917594B1 (en) * 2016-09-06 2018-03-13 Texas Instruments Incorporated Inbuilt threshold comparator
CN110995267A (zh) * 2019-11-08 2020-04-10 芯创智(北京)微电子有限公司 一种动态比较器、电子设备及其实现方法
CN115133932B (zh) * 2022-08-31 2022-12-23 睿力集成电路有限公司 一种数据采样电路、数据接收电路及存储器

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005286516A (ja) * 2004-03-29 2005-10-13 Handotai Rikougaku Kenkyu Center:Kk Nic回路及びadc回路
US20080088390A1 (en) * 2006-08-17 2008-04-17 Stmicroelectronics S.A. Negative capacity circuit for high frequencies applications

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06342561A (ja) * 1993-06-01 1994-12-13 Hitachi Ltd イコライザフィルタ及び磁気ディスクシステム
US6623510B2 (en) * 2000-12-07 2003-09-23 Integrated Vascular Systems, Inc. Closure device and methods for making and using them
KR100452643B1 (ko) * 2002-10-31 2004-10-14 주식회사 하이닉스반도체 저전원에서 안정적으로 동작하는 비교 장치
US6646509B2 (en) * 2002-01-23 2003-11-11 Broadcom Corporation Layout technique for matched resistors on an integrated circuit substrate
JP4045959B2 (ja) * 2003-01-20 2008-02-13 日本電気株式会社 利得可変電圧・電流変換回路とこれを用いたフィルタ回路
US20050156681A1 (en) * 2004-01-20 2005-07-21 Koji Takinami Voltage controlled oscillator
KR100562649B1 (ko) * 2004-12-20 2006-03-20 주식회사 하이닉스반도체 입력 신호 리시버 및 입력 신호 감지 방법
KR100657755B1 (ko) * 2005-03-11 2006-12-19 엘지전자 주식회사 연산증폭기
US7760024B2 (en) * 2005-10-07 2010-07-20 Cisco Technology, Inc System and method for increasing accuracy of transmitter power detection over a larger range of output power levels
KR100903154B1 (ko) * 2007-09-21 2009-06-17 한국전자통신연구원 캐스코드 증폭기 및 그를 이용한 차동 캐스코드 전압제어발진기
US7999620B2 (en) * 2008-12-12 2011-08-16 Analog Devices, Inc. Amplifier with dither
US7764215B2 (en) * 2008-12-31 2010-07-27 Hong Kong Applied Science And Technology Research Institute Co., Ltd. Multi-stage comparator with offset canceling capacitor across secondary differential inputs for high-speed low-gain compare and high-gain auto-zeroing
US8228120B2 (en) * 2009-05-29 2012-07-24 Intersil Americas Inc. Negative capacitance synthesis for use with differential circuits
US8238867B1 (en) * 2011-02-28 2012-08-07 Silicon Laboratories Inc Low noise amplifier (LNA) suitable for use in different transmission environments and receiver using such an LNA

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005286516A (ja) * 2004-03-29 2005-10-13 Handotai Rikougaku Kenkyu Center:Kk Nic回路及びadc回路
US20080088390A1 (en) * 2006-08-17 2008-04-17 Stmicroelectronics S.A. Negative capacity circuit for high frequencies applications

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2014036543A1 *

Also Published As

Publication number Publication date
WO2014036543A1 (en) 2014-03-06
CN104718699A (zh) 2015-06-17
EP2893637A1 (de) 2015-07-15
WO2014036542A1 (en) 2014-03-06

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RIC1 Information provided on ipc code assigned before grant

Ipc: H03M 1/36 20060101ALN20160407BHEP

Ipc: H03F 3/45 20060101AFI20160407BHEP

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