EP2761356A4 - Microscope device - Google Patents

Microscope device

Info

Publication number
EP2761356A4
EP2761356A4 EP12834935.4A EP12834935A EP2761356A4 EP 2761356 A4 EP2761356 A4 EP 2761356A4 EP 12834935 A EP12834935 A EP 12834935A EP 2761356 A4 EP2761356 A4 EP 2761356A4
Authority
EP
European Patent Office
Prior art keywords
microscope device
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP12834935.4A
Other languages
German (de)
French (fr)
Other versions
EP2761356B1 (en
EP2761356A1 (en
Inventor
Rainer Uhl
Martin Schropp
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Miltenyi Biotec GmbH
FEI Co
Original Assignee
FEI Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by FEI Co filed Critical FEI Co
Priority to EP23204576.5A priority Critical patent/EP4354118A3/en
Publication of EP2761356A1 publication Critical patent/EP2761356A1/en
Publication of EP2761356A4 publication Critical patent/EP2761356A4/en
Application granted granted Critical
Publication of EP2761356B1 publication Critical patent/EP2761356B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G02B21/08—Condensers
    • G02B21/14—Condensers affording illumination for phase-contrast observation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
EP12834935.4A 2011-09-29 2012-09-28 Microscope device Active EP2761356B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP23204576.5A EP4354118A3 (en) 2011-09-29 2012-09-28 Microscope device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102011114500.5A DE102011114500B4 (en) 2011-09-29 2011-09-29 microscope device
PCT/US2012/058027 WO2013049646A1 (en) 2011-09-29 2012-09-28 Microscope device

Related Child Applications (1)

Application Number Title Priority Date Filing Date
EP23204576.5A Division EP4354118A3 (en) 2011-09-29 2012-09-28 Microscope device

Publications (3)

Publication Number Publication Date
EP2761356A1 EP2761356A1 (en) 2014-08-06
EP2761356A4 true EP2761356A4 (en) 2015-02-25
EP2761356B1 EP2761356B1 (en) 2023-11-08

Family

ID=47878605

Family Applications (2)

Application Number Title Priority Date Filing Date
EP12834935.4A Active EP2761356B1 (en) 2011-09-29 2012-09-28 Microscope device
EP23204576.5A Pending EP4354118A3 (en) 2011-09-29 2012-09-28 Microscope device

Family Applications After (1)

Application Number Title Priority Date Filing Date
EP23204576.5A Pending EP4354118A3 (en) 2011-09-29 2012-09-28 Microscope device

Country Status (6)

Country Link
US (1) US9606345B2 (en)
EP (2) EP2761356B1 (en)
JP (1) JP6224595B2 (en)
CN (1) CN103890633B (en)
DE (1) DE102011114500B4 (en)
WO (1) WO2013049646A1 (en)

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WO2015052936A1 (en) * 2013-10-09 2015-04-16 株式会社ニコン Structured illumination microscope device
DE102013017124A1 (en) 2013-10-15 2015-04-16 Carl Zeiss Microscopy Gmbh Scanning microscope and method for operating a scanning microscope
JP6270615B2 (en) * 2014-05-02 2018-01-31 オリンパス株式会社 SAMPLE IMAGE DATA GENERATION DEVICE AND SAMPLE IMAGE DATA GENERATION METHOD
US9797767B2 (en) 2014-08-26 2017-10-24 General Electric Company Calibration of microscopy systems
US10746980B2 (en) 2014-08-26 2020-08-18 General Electric Company Calibration of microscopy systems
US11300773B2 (en) 2014-09-29 2022-04-12 Agilent Technologies, Inc. Mid-infrared scanning system
DE102014017001A1 (en) * 2014-11-12 2016-05-12 Carl Zeiss Ag Microscope with low distortion error
US9953428B2 (en) 2015-03-03 2018-04-24 Microsoft Technology Licensing, Llc Digital camera unit with simultaneous structured and unstructured illumination
RU2718149C2 (en) * 2015-03-19 2020-03-30 Конинклейке Филипс Н.В. Scanning illumination for digital pathology
DE102015209758A1 (en) * 2015-05-28 2016-12-01 Carl Zeiss Microscopy Gmbh Arrangement and method for beam shaping and light sheet microscopy
JP7195738B2 (en) * 2015-06-02 2022-12-26 ライフ テクノロジーズ コーポレーション Systems and methods for calibrating structured-light imaging systems and capturing structured-light images
DE102015109645B3 (en) 2015-06-17 2016-09-08 Carl Zeiss Microscopy Gmbh Method for multiline detection
CN105158224B (en) * 2015-09-09 2017-10-20 深圳大学 A kind of method and system for improving multi-photon imaging signal intensity
DE102015116598A1 (en) 2015-09-30 2017-03-30 Carl Zeiss Microscopy Gmbh Method and microscope for high-resolution imaging by means of SIM
JPWO2017060954A1 (en) 2015-10-05 2018-07-19 オリンパス株式会社 Imaging device
ITUB20154591A1 (en) * 2015-10-12 2017-04-12 Crestoptics S R L CONFOCAL MICROSCOPY AND RELATIVE PROCEDURE OF ACQUISITION AND PROCESSING OF IMAGES
US10845759B2 (en) * 2016-05-06 2020-11-24 Uwm Research Foundation, Inc. Snapshot optical tomography system and method of acquiring an image with the system
DE102016007839A1 (en) 2016-06-28 2017-12-28 Horst Wochnowski High-resolution method for microscopy and nanostructuring of substrate surfaces based on the SIM method (Structured Illumination Microscopy)
FR3054321B1 (en) * 2016-07-25 2018-10-05 Centre National De La Recherche Scientifique - Cnrs - SYSTEM AND METHOD FOR MEASURING A PHYSICAL PARAMETER OF A MEDIUM
US10908072B2 (en) 2016-12-15 2021-02-02 The Board Of Regents Of The University Of Texas System Total internal reflection and transmission illumination fluorescence microscopy imaging system with improved background suppression
CN107101982A (en) * 2017-03-09 2017-08-29 深圳先进技术研究院 Fluorescence microscopy device
EP3692328A4 (en) 2017-10-02 2021-04-21 Nanotronics Imaging, Inc. Apparatus and method to reduce vignetting in microscopic imaging
TWI791046B (en) * 2017-10-02 2023-02-01 美商奈米創尼克影像公司 Apparatus and method to reduce vignetting in microscopic imaging
KR102058780B1 (en) * 2017-11-29 2019-12-23 (주)로고스바이오시스템스 A method for auto-focus controlling in a line-scanning confocal microscopy and the apparatus therefor
CA3086974A1 (en) * 2018-02-09 2019-08-15 Alcon Inc. System inverting controller for laser scanning systems
EP3614190A1 (en) 2018-08-20 2020-02-26 Till GmbH Microscope device with virtual objective
DE102018124984A1 (en) * 2018-10-10 2020-04-16 Friedrich-Schiller-Universität Jena Method and device for high-resolution fluorescence microscopy
CN111122568B (en) * 2018-11-01 2022-04-22 华中科技大学苏州脑空间信息研究院 High-flux optical tomography method and imaging system
US11347040B2 (en) * 2019-02-14 2022-05-31 Double Helix Optics Inc. 3D target for optical system characterization
DE102019129932B4 (en) * 2019-11-06 2023-12-21 Technische Universität Braunschweig Optical detection device and method for operating an optical detection device
DE102020123669A1 (en) 2020-09-10 2022-03-10 Carl Zeiss Microscopy Gmbh Procedure for SIM microscopy
DE102020123668A1 (en) 2020-09-10 2022-03-10 Carl Zeiss Microscopy Gmbh Methods for image evaluation for SIM microscopy and SIM microscopy methods
CN113219643B (en) * 2021-05-11 2022-07-12 浙江大学 Optical microscope focusing stabilization method and system based on incoherent imaging edge blurring
DE102023102991B3 (en) 2023-02-08 2024-02-01 Till I.D. Gmbh Method for generating microscopic slice images of 3-dimensional fluorescent objects as well as device, computer program and computer-readable storage medium

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WO2008080032A2 (en) * 2006-12-21 2008-07-03 Howard Hughes Medical Institute Systems and methods for 3-dimensional interferometric microscopy
WO2008152605A1 (en) * 2007-06-15 2008-12-18 Koninklijke Philips Electronics N.V. Multi-spot scanning optical device for imaging of a sample

Also Published As

Publication number Publication date
EP4354118A2 (en) 2024-04-17
DE102011114500B4 (en) 2022-05-05
EP2761356B1 (en) 2023-11-08
JP6224595B2 (en) 2017-11-01
EP2761356A1 (en) 2014-08-06
US20140313576A1 (en) 2014-10-23
CN103890633B (en) 2016-10-26
EP4354118A3 (en) 2024-06-26
DE102011114500A1 (en) 2013-04-04
WO2013049646A1 (en) 2013-04-04
US9606345B2 (en) 2017-03-28
CN103890633A (en) 2014-06-25
JP2014532197A (en) 2014-12-04

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