EP2695179A1 - Installation pour le traitement par bombardement ionique de deux surfaces opposees - Google Patents
Installation pour le traitement par bombardement ionique de deux surfaces opposeesInfo
- Publication number
- EP2695179A1 EP2695179A1 EP12711402.3A EP12711402A EP2695179A1 EP 2695179 A1 EP2695179 A1 EP 2695179A1 EP 12711402 A EP12711402 A EP 12711402A EP 2695179 A1 EP2695179 A1 EP 2695179A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- installation
- support
- ion
- beams
- applicators
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000010849 ion bombardment Methods 0.000 title claims abstract description 26
- 238000010884 ion-beam technique Methods 0.000 claims abstract description 16
- 238000000034 method Methods 0.000 claims abstract description 12
- 238000009434 installation Methods 0.000 claims description 43
- 238000006073 displacement reaction Methods 0.000 claims description 10
- 230000000873 masking effect Effects 0.000 claims description 6
- 150000002500 ions Chemical class 0.000 description 31
- 238000003672 processing method Methods 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 238000013022 venting Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching
- H01J37/3053—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching for evaporating or etching
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B60—VEHICLES IN GENERAL
- B60S—SERVICING, CLEANING, REPAIRING, SUPPORTING, LIFTING, OR MANOEUVRING OF VEHICLES, NOT OTHERWISE PROVIDED FOR
- B60S1/00—Cleaning of vehicles
- B60S1/02—Cleaning windscreens, windows or optical devices
- B60S1/04—Wipers or the like, e.g. scrapers
- B60S1/32—Wipers or the like, e.g. scrapers characterised by constructional features of wiper blade arms or blades
- B60S1/38—Wiper blades
- B60S2001/3898—Wiper blades method for manufacturing wiper blades
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/202—Movement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/31—Processing objects on a macro-scale
- H01J2237/3151—Etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/30—Electron or ion beam tubes for processing objects
- H01J2237/31—Processing objects on a macro-scale
- H01J2237/316—Changing physical properties
Definitions
- the present invention relates to the field of surface treatment by ion bombardment.
- the ion bombardment means make it possible to incorporate ions into a surface of an object, in particular to influence the mechanical properties of this surface (hardness, tribology, etc.).
- the ionic bombardment means conventionally comprise, as those described in FR-A-2 899 242, ion generator means and ion applicator means.
- the ion applicator usually comprises means selected for example from electrostatic ion beam shaping lenses, a diaphragm, a shutter, a collimator, an ion beam analyzer and a beam controller. ions.
- the ion generator usually comprises means selected for example from an ionization chamber, an electron cyclotron resonance ion source, an ion accelerator and an ion separator.
- FR-A-2,899,242 proposes to house all the ion bombardment means (ion generator and ion applicator) as well as the surfaces to be treated in a vacuum chamber. Vacuum means are connected to this chamber. These vacuum means must allow to obtain a relatively high vacuum in the chamber, for example of the order of 10 "2 mbar to 10" 6 mbar.
- the object of the invention is in particular to reduce the ionic bombardment treatment time of surfaces of one or more objects, by using relatively simple means.
- the subject of the invention is an installation for the treatment by ionic bombardment of surfaces, of the type comprising:
- ionic bombardment means comprising a first applicator of ions for emitting a first ion beam
- the ion bombardment means comprise a second ion applicator intended to emit a second ion beam
- the installation further comprising:
- a support intended to bear two opposite surfaces to be treated delimiting at least one object
- two ion-emitting ion-emitting applicators By using two ion-emitting ion-emitting applicators to one of the corresponding opposite surfaces, two opposing surfaces of an object or objects can be processed simultaneously, these surfaces being placed in front of each beam emitted by a ion applicator.
- Two opposite surfaces of the same object can therefore be treated, which reduces the processing time required to date by at least half.
- the object is placed on a support and a single surface is treated. It is then necessary to return the object to be able to treat the surface opposite to the previous surface treated.
- This overturning operation may also involve a cycle of re-venting the vacuum chamber to return the coin and re-evacuation, which further increases the overall processing time required to deal with the two opposing surfaces of the same coin. object.
- the device may further include one or more of the following features.
- the two beams of the two applicators are emitted in substantially parallel directions and opposite directions.
- the two beams of the two applicators are emitted in substantially aligned directions.
- the assembly comprising the support and the object surfaces carried by this support forms a screen between the beams of opposite directions so that any disturbances between the beams of opposite directions are avoided.
- the support is removably mounted in the vacuum chamber. It is therefore easier to place the object or objects to be treated in the support. It is also possible to prepare the assembly formed by the object (s) to be treated and the support and to store this assembly near the vacuum chamber while waiting for it to be available. This reduces the loading and unloading time of the vacuum chamber.
- the installation further comprises means for masking at least a portion of the opposite surfaces.
- the masking means form part of the support of the surfaces to be treated.
- the positioning means of the support comprises means for moving the support in the vacuum chamber.
- the means for positioning the support comprise means for moving the support in translation substantially perpendicular to the directions of the beams.
- the means for moving the support comprise means carrying the support pivoting about a pivot axis substantially orthogonal or parallel to the beam directions.
- the invention also relates to an ionic surface bombardment treatment method in which the surfaces to be treated are placed in a vacuum chamber, characterized in that the vacuum chamber is that of an installation as described above.
- FIG. 1 is a schematic perspective view of an installation according to a first embodiment of the invention
- FIG. 2 is a diagrammatic sectional view along plane II-II of FIG.
- FIG. 3 is a schematic elevational view of an installation according to a second embodiment of the invention.
- FIG. 4 is a schematic elevational view of an installation according to a third embodiment of the invention.
- FIG. 5 is a schematic elevational view of an installation according to a fourth embodiment of the invention.
- FIG. 1 shows an installation 10 for the treatment by ion bombardment of surfaces comprising a vacuum chamber 12 in which a support 14 is removably mounted.
- This support 14 is intended to carry objects 16 which it is desired to treat surfaces 18, more particularly, as is shown in more detail in FIG. 2, opposite surfaces 18a, 18b of objects 16.
- This installation 10 also comprises ion bombardment means which comprise first and second ion applicators 20, arranged on either side of the support 14 carrying the surfaces 18 to be treated.
- This installation 10 further comprises means 30 for positioning the support 14 between the two ion applicators 20 and 22.
- means 30 for positioning the support 14 between the two ion applicators 20 and 22.
- FIGS. 1 and 2 the installation 10 is shown in operation, that is to say while the ion applicators 20 and 22 emit ion beams 24 and 26 respectively to the opposite surfaces. 18a and 18b.
- FIG. 2 which is a partial and enlarged sectional view along the plane 1111 of FIG. 1, it can be seen that the two ion applicators 20 and 22 are arranged facing each other in the vacuum chamber 12, so as to each emit an ion beam 24, 26 to the other applicator. These two beams 24, 26 are emitted in parallel directions and opposite directions. In this case, the emission directions of the two beams coincide.
- These two applicators 20, 22 thus make it possible to treat two opposite surfaces 18a and 18b of an object 16 carried by the support 14.
- the object 16, called twin blade wipers comprises two wiping blades 28 interconnected by a sacrificial central element 29.
- the positioning means 30 of the support 14 comprise means for moving the support 14 in translation perpendicularly to the directions of the beams 24, 26.
- the positioning means 30 can, for example, comprise guide means in translation of the support 14, in two perpendicular directions, shown in Figure 1 by the arrows T and P.
- the support 14 comprises a lower portion 14a and an upper portion 14b. These two parts 14a and 14b of the support 14 may be formed by two separate parts. In this case, the upper part 14b is pivotally mounted on the lower part 14a by means of a hinge 32. When the support 14 is closed, as shown in Figures 1 to 5, the two parts 14a, 14b of the support define between them at least one housing 34. When it is desired to place binoculars 16 in the support 14, the two parts 14a, 14b of the support 14 are pivoted relative to one another in order to 14. A binocular 16 can then be placed in each housing 34 provided to receive a binocular 16 and close the support 14 by rotating the two parts 14a, 14b relative to each other.
- parts Suitable supports 14 form a mask 36 of at least a portion of the opposed surfaces 18a, 18b to be treated.
- parts to be treated are binoculars wiper blade, but it is clear that other pieces of shapes and variable material can be processed.
- binoculars 16 of wiper blades 28 which are desired to be treated by ion bombardment are considered.
- This support 14 is then placed in the chamber 12 of the installation 10, between the two ion applicators 20, 22 thanks to positioning means 30.
- the support 14 is positioned so that an end of a binocular 16 is located between the two ion applicators 20, 22, preferably equidistant from each applicator.
- the vacuum chamber 12 is closed and the adequate vacuum level is obtained by means of pumping means to reach a vacuum of up to 10 "6 mbar.
- the ion bombardment means generates an ion plasma which is then accelerated and directed to the surfaces 18a, 18b to be processed through the ion applicators 20, 22.
- the means 30 for moving the support make it possible to move the support
- the displacement means 30 of the support 14 move the support 14 in translation, perpendicularly to the directions of the beams 24, 26, and perpendicularly to the first displacement in translation, in order to exposing to the beams 24, 26 a binocular 16 not yet treated by ion bombardment.
- This second displacement is shown in Figure 1 by the arrow P.
- the support 14 is moved again in the direction represented by the arrow T, so that the beams 24, 26 treat the entire length of the binocular 16.
- the chamber 12 is returned to atmospheric pressure in order to extract the support 14.
- the installation 10 is then available for processing other objects.
- FIGS. 3 to 5 show an installation 10 according to the second to fourth embodiments of the installation, respectively.
- elements similar to those of the preceding figures are designated by identical references.
- the positioning means 30 comprise a carousel 40 bearing, for example, four supports 14.
- This carousel 40 forms means pivoting about an axis 38 substantially orthogonal to the direction of the beams 24. 26.
- the pivot axis 38 of the positioning means 30 is disposed in the vacuum chamber 12 so that the supports 14 can be placed one after the other between the two beams. ions 24, 26, equidistant from each of the applicators 20, 22.
- the positioning means 30 comprise moving means (not shown) of the carousel 40 (and therefore of each support 14 carried by the carousel 40) in translation parallel to the pivot axis 38 and perpendicular to the direction of the beams 24, 26.
- the support 14 After having placed the objects 16 which it is desired to treat two opposite surfaces 18a, 18b in a support 14, the support 14 is fixed on the carousel 40 shown in FIG. 3. It can be seen that in this example, the carousel 40 makes it possible to fix four supports 14.
- the ion bombardment means emit beams of ions 24, 26 for treating two opposite surfaces of objects carried by a first support 14 which is arranged between the beams 24, 26 equidistant from each ion applicator 20, 22.
- the method is similar to the method described above with respect to the first embodiment and differs mainly in that once the opposite surfaces of the objects 16 carried by a first support 14 have been treated, the positioning means 30 pivot about the axis 38 in order to position a second support 14 between the beams 24, 26, equidistant from each ion applicator 20, 22.
- the chamber 12 is brought back to atmospheric pressure in order to extract each support 14.
- the installation 10 is then available for processing other objects.
- the positioning means 30 comprise a carousel 40, for example carrying four supports 14, two of which are visible in FIG. 3.
- This carousel 40 forms means pivoting about an axis 38 substantially parallel to the direction of the beams 24, 26.
- the positioning means 30 allow, in this embodiment, positioning four supports 14 in the plane perpendicular to the direction of the beams 24, 26 and placing them one after the other. another between the two ion beams 24, 26, equidistant from each of the applicators 20, 22.
- the ion bombardment processing method does not involve moving the support 14 in translation between the two ion beams 24, 26 during the treatment, unlike the methods of the first and second embodiments.
- the supports 14 are removably mounted on the positioning means 30.
- the positioning means 30 can also be removably mounted in the vacuum chamber 12.
- FIG. 5 represents a fourth embodiment of the installation 10 in which the support 14 carries objects 42 of which only a surface 44 requires treatment by ion bombardment.
- the positioning means 30 comprise a carousel 40, carrying for example a support 14.
- This carousel 40 forms means pivoting about an axis 38 and is arranged so that the ion applicators 20, 22 are diametrically opposed with respect to the axis 38 of the carousel 40, that is to say that the axis 38 is an axis of symmetry of the ion applicators 20, 22.
- This axis 38 is substantially perpendicular to the direction beams 24, 26.
- the positioning means 30 of the support 14 comprise, in addition to the means pivoting about the axis 38, translation displacement means perpendicular to the direction of the beams 24, 26 and means pivoting about an axis perpendicular to the directions of the beams. 24, 26 and at the axis 38.
- the objects 42 are headlamps and are arranged on the support 14 so that at least two of the surfaces to be treated 44 of these plates 42 are diametrically opposed with respect to the axis 38 and can each be positioned in front of one of the two ion beams 24, 26.
- this installation 10 also comprises masking means 46 of at least a portion of the opposite surfaces 44 of the plates 42, these masking means 46 being distinct from the support 14.
- objects 42 may, for example, also be masks, hubcaps, housings, reflectors or projector screens for a motor vehicle.
- the method of treatment in an installation according to this fourth embodiment differs mainly from other methods because the surfaces to be treated 44 opposite are not carried by the same object.
- the installation 10 comprise as many pairs of applicators 20, 22 as there are binoculars 16 carried by the support 14. thus treat all the binoculars 16 of the support 14 at the same time.
- two pairs of ion applicators 20, 22 could be placed to treat the opposite surfaces carried by two supports 14.
- two pairs of applicators 20, 22 are arranged in a cross in a plane perpendicular to the pivot axis 38.
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1153074A FR2973811A1 (fr) | 2011-04-08 | 2011-04-08 | Installation pour le traitement par bombardement ionique de deux surfaces opposees |
| PCT/EP2012/055779 WO2012136583A1 (fr) | 2011-04-08 | 2012-03-30 | Installation pour le traitement par bombardement ionique de deux surfaces opposees |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP2695179A1 true EP2695179A1 (fr) | 2014-02-12 |
Family
ID=45922687
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP12711402.3A Withdrawn EP2695179A1 (fr) | 2011-04-08 | 2012-03-30 | Installation pour le traitement par bombardement ionique de deux surfaces opposees |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP2695179A1 (fr) |
| FR (1) | FR2973811A1 (fr) |
| WO (1) | WO2012136583A1 (fr) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106702318B (zh) * | 2016-12-12 | 2018-11-23 | 京东方科技集团股份有限公司 | 掩膜框架及制造方法和掩膜板 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61163270A (ja) * | 1985-01-12 | 1986-07-23 | Nissin Electric Co Ltd | イオン蒸着薄膜形成装置 |
| US5009743A (en) * | 1989-11-06 | 1991-04-23 | Gatan Incorporated | Chemically-assisted ion beam milling system for the preparation of transmission electron microscope specimens |
| JPH06132001A (ja) * | 1992-09-03 | 1994-05-13 | Sony Corp | シートメッシュ及び透過型電子顕微鏡用試料及びその作製方法 |
| DE4232998A1 (de) * | 1992-10-01 | 1994-04-07 | Basf Ag | Verfahren zur Oberflächenbehandlung von Kunststoffteilen |
| CZ293994B6 (cs) * | 1994-04-25 | 2004-09-15 | The Gillette Company | Holicí břit, způsob jeho výroby, a holicí jednotka |
| DE29507225U1 (de) * | 1995-04-29 | 1995-07-13 | Grünewald, Wolfgang, Dr.rer.nat., 09122 Chemnitz | Ionenstrahlpräparationsvorrichtung für die Elektronenmikroskopie |
| US5958134A (en) * | 1995-06-07 | 1999-09-28 | Tokyo Electron Limited | Process equipment with simultaneous or sequential deposition and etching capabilities |
| US5922179A (en) * | 1996-12-20 | 1999-07-13 | Gatan, Inc. | Apparatus for etching and coating sample specimens for microscopic analysis |
| KR19990047679A (ko) * | 1997-12-05 | 1999-07-05 | 박호군 | 이온 빔을 이용한 재료의 표면 처리 장치 |
| DE19802740A1 (de) * | 1998-01-26 | 1999-07-29 | Leybold Systems Gmbh | Verfahren zur Behandlung von Oberflächen von Substraten aus Kunststoff |
| DE10017974C2 (de) * | 2000-04-11 | 2002-12-05 | Bosch Gmbh Robert | Scheibenwischerblatt und Verfahren zur Herstellung von vulkanisierten Elastomeren |
| FR2899242B1 (fr) | 2007-04-05 | 2010-10-22 | Quertech Ingenierie | Procede de durcissement par implantation d'ions d'helium dans une piece metallique |
| US20080271277A1 (en) * | 2007-04-27 | 2008-11-06 | Mitsuba Corporation | Rubber product for wiping, rubber for wiper blade, method for producing rubber for wiper blade, and wiper unit |
-
2011
- 2011-04-08 FR FR1153074A patent/FR2973811A1/fr not_active Withdrawn
-
2012
- 2012-03-30 EP EP12711402.3A patent/EP2695179A1/fr not_active Withdrawn
- 2012-03-30 WO PCT/EP2012/055779 patent/WO2012136583A1/fr not_active Ceased
Non-Patent Citations (1)
| Title |
|---|
| See references of WO2012136583A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| FR2973811A1 (fr) | 2012-10-12 |
| WO2012136583A1 (fr) | 2012-10-11 |
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| RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: BRAUN, ALEXIS Inventor name: DOUPEUX, SEVERIN Inventor name: BRETAGNOL, FREDERIC Inventor name: BRASSIER, MARC |
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| DAX | Request for extension of the european patent (deleted) | ||
| 17Q | First examination report despatched |
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| STAA | Information on the status of an ep patent application or granted ep patent |
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| 18D | Application deemed to be withdrawn |
Effective date: 20161005 |