EP2654045A3 - Röntgenteleskop - Google Patents
Röntgenteleskop Download PDFInfo
- Publication number
- EP2654045A3 EP2654045A3 EP13161913.2A EP13161913A EP2654045A3 EP 2654045 A3 EP2654045 A3 EP 2654045A3 EP 13161913 A EP13161913 A EP 13161913A EP 2654045 A3 EP2654045 A3 EP 2654045A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- distance
- atomic planes
- monocrystalline
- ray
- coordinate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Telescopes (AREA)
- Radiation Pyrometers (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CZ20120265A CZ2012265A3 (cs) | 2012-04-17 | 2012-04-17 | Rentgenový teleskop |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP2654045A2 EP2654045A2 (de) | 2013-10-23 |
| EP2654045A3 true EP2654045A3 (de) | 2017-01-25 |
Family
ID=47998317
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP13161913.2A Withdrawn EP2654045A3 (de) | 2012-04-17 | 2013-04-02 | Röntgenteleskop |
Country Status (2)
| Country | Link |
|---|---|
| EP (1) | EP2654045A3 (de) |
| CZ (1) | CZ2012265A3 (de) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5923720A (en) * | 1997-06-17 | 1999-07-13 | Molecular Metrology, Inc. | Angle dispersive x-ray spectrometer |
| US6317483B1 (en) * | 1999-11-29 | 2001-11-13 | X-Ray Optical Systems, Inc. | Doubly curved optical device with graded atomic planes |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4084089A (en) * | 1976-12-20 | 1978-04-11 | North American Philips Corporation | Long wave-length X-ray diffraction crystal and method of manufacturing the same |
-
2012
- 2012-04-17 CZ CZ20120265A patent/CZ2012265A3/cs not_active IP Right Cessation
-
2013
- 2013-04-02 EP EP13161913.2A patent/EP2654045A3/de not_active Withdrawn
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5923720A (en) * | 1997-06-17 | 1999-07-13 | Molecular Metrology, Inc. | Angle dispersive x-ray spectrometer |
| US6317483B1 (en) * | 1999-11-29 | 2001-11-13 | X-Ray Optical Systems, Inc. | Doubly curved optical device with graded atomic planes |
Non-Patent Citations (2)
| Title |
|---|
| R. K. SMITHER: "New method for focusing x rays and gamma rays", REVIEW OF SCIENTIFIC INSTRUMENTS., vol. 53, no. 2, 1 January 1982 (1982-01-01), US, pages 131, XP055329674, ISSN: 0034-6748, DOI: 10.1063/1.1136941 * |
| TRICE J B ET AL: "ORIENTED GRAPHITE X-RAY DIFFRACTION TELESCOPE", IEEE TRANSACTIONS ON NUCLEAR SCIENCE,, vol. NS-22, no. 1, 1 February 1975 (1975-02-01), pages 620 - 625, XP001436419 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CZ303940B6 (cs) | 2013-07-03 |
| CZ2012265A3 (cs) | 2013-07-03 |
| EP2654045A2 (de) | 2013-10-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| 17P | Request for examination filed |
Effective date: 20130405 |
|
| AK | Designated contracting states |
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| AX | Request for extension of the european patent |
Extension state: BA ME |
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| PUAL | Search report despatched |
Free format text: ORIGINAL CODE: 0009013 |
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| AK | Designated contracting states |
Kind code of ref document: A3 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
|
| AX | Request for extension of the european patent |
Extension state: BA ME |
|
| RIC1 | Information provided on ipc code assigned before grant |
Ipc: G21K 1/06 20060101AFI20161219BHEP |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
| 18D | Application deemed to be withdrawn |
Effective date: 20170726 |