EP2391901A1 - Essai fonctionnel de composants avec isolation galvanique - Google Patents

Essai fonctionnel de composants avec isolation galvanique

Info

Publication number
EP2391901A1
EP2391901A1 EP10700737A EP10700737A EP2391901A1 EP 2391901 A1 EP2391901 A1 EP 2391901A1 EP 10700737 A EP10700737 A EP 10700737A EP 10700737 A EP10700737 A EP 10700737A EP 2391901 A1 EP2391901 A1 EP 2391901A1
Authority
EP
European Patent Office
Prior art keywords
circuit
voltage
component
test circuit
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP10700737A
Other languages
German (de)
English (en)
Inventor
Thomas Komma
Kai Kriegel
Jürgen RACKLES
Simon Hüttinger
Gernot Spiegelberg
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of EP2391901A1 publication Critical patent/EP2391901A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/27—Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects surrounding elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
    • G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies

Definitions

  • the invention relates to a method for functional testing and a function test circuit for a semiconductor switch, in particular for use in electric vehicles.
  • Permanent-magnet synchronous machines are used, for example, in electric cars for the drive. There they are - as in other applications - used in field weakening operation, i. the magnetic field is reduced by a field weakening current. As a result, higher speeds can be achieved.
  • a DC battery is provided as the drive system for the operation of the PSM, and a converter for converting the single-phase battery voltage into the three-phase motor supply is provided between the battery and the PSM.
  • One possible structure for protecting the battery is that one or more diodes are provided between the converter and the battery and one or more semiconductor switches are provided in parallel with the one or more diodes. It is very advantageous if at any time the semiconductor switch can be switched off.
  • the object of the present invention is to provide a functional test circuit by means of which the functionality of a component can be determined in a simple manner.
  • the object is achieved with regard to the test method by a test method having the features of claim 1.
  • the object is achieved by a test circuit having the features of claim 6.
  • the component is connected to an electrical test circuit, wherein the test circuit comprises a transformer. It is understood that it is expedient to make the connection once and thus connect the test circuit electrically fixed to the device to be tested.
  • the test circuit is then an integral part of the electronic structure in which the component is also provided. But it is also possible to make the connection only if a test is to be performed.
  • an AC voltage is generated in the test circuit.
  • This AC voltage learns by means of the usual rules, a spread in the sketchSclien and in the device.
  • the amplitude of the AC voltage at various points within the test circuit depends on the specific design of the test circuit, the dimensioning of the components, the frequency of the AC voltage and the conduction state of the device.
  • the conduction state of the component can be, for example, the state that conducts the component.
  • a semiconductor switch such as an IGBT
  • the output capacitance of the IGBT which affects the frequency dependent impedance for the AC voltage, is then shorted.
  • a line condition is the conduction through or blocking by a diode.
  • the line state is usually not influenced by a controller, but merely adjusts itself by the existing voltage difference across the diode. Nevertheless, the conduction state can be determined by its influence on the frequency-dependent impedance of the test circuit and the diode.
  • the line condition of the component is determined from the common impedance of the test circuit and the component for the alternating voltage.
  • the test circuit according to the invention for functional testing of a component has for this purpose a transformer. Furthermore, at least one feed circuit for generating an alternating voltage with a definable frequency is provided. Finally, at least one measuring circuit is provided for determining the impedance of the test circuit and the component at the frequency.
  • the advantage of the method according to the invention and the test circuit according to the invention is that both allow a potential-free test of the line state of the component. This is particularly advantageous when the device is temporarily subjected to a high voltage. This may for example be the case in electric cars in which the DC link voltages between battery and inverter can be 600V or more. In such cases, a determination of the line state and an electrical transmission of a corresponding signal to, for example, a microprocessor at a near-earth voltage level are possible. This significantly improves the security of the human access structure.
  • the test circuit it is useful to make the test circuit so that the measuring circuit is arranged with respect to the transformer on the primary side, while the component is connected to the secondary side. Then, namely, the measuring circuit is electrically isolated from the device and an otherwise potential separation, for example in an optical manner, is avoided.
  • the conduction state is, for example, the state of the electrical conduction, as is the case, for example, in the case of a semiconductor switch in the switched-on state.
  • Another example of this conduction state is a diode, with the voltages on both sides of the diode being such that the diode conducts.
  • An example of a different conduction state is a blocking state that occurs when the semiconductor switches are turned off or diodes when the voltages on both sides of the diode are adjusted accordingly.
  • the conduction state of the component basically influences the frequency-dependent common impedance of the test circuit and the component for the AC voltage.
  • a device in a conductive state will contribute only a small capacitance to the impedance since the intrinsic capacitance of the device elements is short-circuited by the device itself.
  • the component contributes a largely resistive component to the impedance.
  • the blocking state the opposite applies.
  • the component will contribute a largely capacitive or possibly also inductive component to the impedance.
  • the common impedance will almost always be different than in the line state to be tested.
  • the frequency is selected such that in the line state to be tested, the impedance becomes almost zero. This results in a particularly clear signal and even slight deviations of the device from its usual behavior can be detected.
  • test circuit next to the transformer further comprises at least one series capacitor and a series inductance. These are preferably in series with each other and the
  • This design of the test circuit advantageously requires the presence of a resonant frequency at which the impedance becomes practically zero.
  • the resonant frequency depends on the impedance of the component, ie on its conduction state.
  • the resonant frequency in the line condition to be tested is selected as the frequency for the AC voltage.
  • test circuit or test method is particularly suitable for switchable components such as semiconductor switches such as MOSFETs or IGBTs.
  • the test circuit or the test method is also suitable for components such as diodes, which are not directly controllable, but otherwise can change their conduction state. Such components have at least two different conduction states.
  • test circuit or the test method can be applied to a group of individual components.
  • a parallel Circuit can be tested from an IGBT and a diode. In this case, all existing components affect the common impedance.
  • test circuit and test method are by no means limited to the environment described above for electric vehicles. Rather, the method is universally applicable.
  • Both line states can be tested with an AC voltage by evaluating the respective resulting impedances for both line states.
  • the frequency of the alternating voltage can be adapted to one of the two line states by selecting the corresponding resonance frequency.
  • the impedance will then be zero or nearly zero in this conduction state and assume a different value in the other conduction state.
  • the test circuit expediently comprises only one device for generating the alternating voltage and the construction is as simple as possible.
  • the test circuit expediently comprises only one device for generating the alternating voltage, but the device is designed such that the frequency can be changed.
  • a third alternative is to generate two or possibly more AC voltages.
  • the test circuit preferably comprises two or more devices for generating an alternating voltage.
  • the frequencies can then be adapted to each one of the line conditions to be tested, that is, for example, the respective resonance frequency can be selected. Switching the frequency in the means for generating the AC voltage is unnecessary.
  • the determination of the impedance is carried out with the at least one measuring circuit which is provided in the test circuit.
  • the measuring circuit preferably comprises a frequency filter, in particular a high or low pass filter, in order to separate the signal of the AC voltage from other signals. This is particularly advantageous when several AC voltages of different frequencies are generated simultaneously.
  • an output resistance of the feed circuit is one of the resistors of the voltage divider and the other elements of the test circuit, ie the transformer and the component and optionally further elements such as series capacitor and series inductance of the other resistor of the voltage divider.
  • test circuit is a converter circuit with overvoltage protection, comprising:
  • Such a converter circuit is used, for example, in electric vehicles such as electric cars.
  • an IGBT is used as the semiconductor switch.
  • IGBTs with parallel diodes are typically already available as finished components.
  • a MOSFET is used as the semiconductor switch. This already contains a diode due to its construction. So it is useful when using a MOSFET no independent diode is needed anymore, the diode is part of the MOSFET.
  • the diode is expediently installed in the input line of the converter for positive voltage, ie the phase connection on the single-phase side of the converter. Furthermore, it is preferably installed so that it allows the flow of current into the inverter and blocks positive voltage from the inverter side.
  • the converter circuit protects a device connected on the single-phase side, for example a car battery, from overcharging by the diode. At the same time, however, a parallel connection of the diode is made possible by the parallel-arranged semiconductor switch, i. For example, a return from the direction of the inverter in the battery.
  • the converter circuit can be used advantageously in a drive system.
  • This has in addition to the converter circuit at least one electric motor, which is for example a permanent-magnet synchronous machine, which is designed in particular for a field-weakening operation.
  • the electric motor is expediently connected to the 3-phase output side of the converter circuit.
  • at least one single-phase battery is provided. This is connected to the single-phase input side of the converter circuit. It is expedient for the protection of the battery from overvoltage when the positive battery terminal is connected via the diode to the converter circuit.
  • Such a drive system can be used, for example, in an electric vehicle such as an electric car.
  • the drive system preferably has a device for determining a value representing the voltage on the single-phase input side of the converter.
  • the device could consist in a device for voltage measurement via an intermediate circuit capacitor provided in the region of the converter.
  • a supply of the electric motor is made from the battery in an engine operating state.
  • the motor which corresponds to "accelerating.”
  • the regenerative power state the battery is supplied by the electric motor, which is typically assumed during braking in an electric vehicle
  • An attempt is made to recover as much energy as possible from the movement of the vehicle and to store it in the battery, in which case the semiconductor switch is switched on in the regenerative mode, ie if a feedback is to take place, the diode of the converter circuit otherwise blocking the feedback is bridged by the semiconductor switch
  • the semiconductor switch is switched off, which in turn prevents the battery from being overcharged in conjunction with the blocking diode.
  • a value representing the voltage on the single-phase input side of the converter is preferably determined and, if this value at least reaches a threshold value, a disturbance of the converter determined and thus expediently turned off the semiconductor switch, if it is turned on.
  • the voltage can be measured via a DC link capacitor, which is provided on the single-phase side of the inverter.
  • the diode prevents the overvoltage from being passed on to the battery without any further action. In this case, it is prevented that the semiconductor switch is turned on, for example, during a braking operation. It is advantageous if the converter itself is designed such that it can withstand the voltages which can occur when the field-weakening current ceases. Then no separate protection for the inverter itself is necessary.
  • the test circuit in turn is used to determine at any time whether the semiconductor switch and the diode actually assume their desired or expected conduction states.
  • the battery voltage must be greater than the voltage to test the transmittance of the diode
  • the intermediate circuit voltage must be greater than the battery voltage. This case occurs during the recovery from the electric motor into the battery.
  • the semiconductor switch and the diode then absorb the differential voltage between the intermediate circuit voltage and the battery voltage.
  • the switching capability of the semiconductor switch can then be checked, for example by actively switching on the semiconductor switch. It is particularly advantageous if, in the engine operating state, i. E. During the short time of switching, the semiconductor switch is then tested for its function, whereby the time of switching is preferably so short that there is no appreciable delay of the electric vehicle.
  • FIG. 1 shows a test circuit
  • FIG. 2 shows a drive system with test circuit
  • FIG. 3 shows an operating diagram for the drive system
  • FIG. 4 shows the behavior of the impedance of the test circuit as a function of the frequency.
  • FIG. 1 shows schematically the construction of an exemplary test circuit 11 for a semiconductor switch 31.
  • the semiconductor switch 31 can be of any type and is therefore shown in FIG. 1 only as a simple switch.
  • the voltage-dependent output capacitance of the semiconductor switch 31 is shown as an additional capacitor 41.
  • test circuit 11 itself now has a parallel to the semiconductor switch 31 provided additional capacitor 32. This serves to increase the voltage-dependent output capacitance of the semiconductor switch 31 and thereby make it more independent of the voltage. Subsequent to the additional capacitor 32, a series circuit 44 is then provided. This has in series a first series capacitor 34, a
  • Transformer 33 a series inductor 35 and a second series capacitor 36.
  • a first and second AC voltage source 37, 38 which are connected in parallel to each other to the series circuit 44.
  • a first and a second measuring point 39, 40 are connected.
  • the components of the series circuit 44 together with the semiconductor switch 31 form a frequency-dependent impedance.
  • the behavior of this impedance is evaluated in order to detect whether the switching state of the semiconductor switch 31 corresponds to the desired switching state which, depending on the type of the semiconductor switch 31, is determined, for example, via the voltage applied to its gate.
  • FIG. 4 shows the profile of the total impedance of series circuit 44 and semiconductor switch 31 as a function of the frequency.
  • a first curve 45 which has an impedance minimum at a first test frequency, corresponds to the behavior when the semiconductor switch 31 is closed.
  • a second curve 46 which has an impedance minimum at a second test frequency, corresponds to the behavior at open semiconductor switch 31. Since its output capacitance is shorted when the switch is closed, the first test frequency is lower than the second test frequency.
  • the first AC voltage source 37 is now operated so that it generates an AC voltage with the first test frequency as a frequency.
  • the second AC voltage source 38 is operated to generate an AC voltage at the second test frequency as a frequency.
  • the AC voltage sources 37, 38 can be operated simultaneously, alternately, continuously, or only at certain test times.
  • the first measuring point 38 has a low-pass filter 42, which is tuned to the first test frequency used.
  • the low pass filter 42 is followed by a diode and in parallel a capacitor and a resistor.
  • a signal is tapped, which corresponds to the impedance of the series circuit 44 and the semiconductor switch 31 at the first test frequency.
  • this value will have a value dependent on specific properties of the individual components and the voltage on the semiconductor switch 31. However, if the switch is closed, the value will be practically zero.
  • the second measuring point 39 in turn has a high-pass filter 43, which is tuned to the second test frequency used.
  • the high-pass filter 43 is again followed by a diode and, in parallel, a capacitor and a resistor. At the resistor, a signal can be tapped, in this case the impedance of the series circuit 44 and the semiconductor switch 31 at the second test frequency corresponds.
  • this value when the switch is closed, this value will have a value dependent on specific properties of the individual components and the voltage on the semiconductor switch 31. The value will be practically zero when the switch is open.
  • the two measuring points 38, 39 thus provide a clear indication as to whether the switch actually operates closed, i. conducts and thus the voltage across the semiconductor switch 31 disappears to a dependent of the specific semiconductor switch 31 residual value and the self-capacitance is short-circuited. Also, it is possible to determine whether the semiconductor switch 31 is actually turned off, i. locks. Depending on the operating mode of the AC voltage sources 37, 38, this test can take place continuously.
  • the invention is not limited to certain types of semiconductor switch 31, but may be applied to any semiconductor switch 31 such as MOSFETs, IGBTs, but also for diodes. A specific application will be described below with reference to a second embodiment in conjunction with FIG.
  • a drive system for an electrically driven vehicle such as an electric car
  • the drive system has an electric motor 1 in the form of a permanent-magnet synchronous machine.
  • the electric motor 1 is used in field weakening operation.
  • Its three phase inputs are connected in a known manner with the output lines 9 of an inverter 2.
  • the converter 2 has, in a conventional design, starting from each of the three output lines 9 of the electric motor 1 two pairs each of a parallel-connected diode and semiconductor switches, which then in a known form are merged into two input lines 8.
  • the two input lines 8 are connected via a DC link capacitor 3. Furthermore, the two input lines 8 lead to the terminals of a DC battery 4.
  • the battery protection device 6 consists of a diode 5 and a parallel to the diode 5 connected IGBT 7.
  • the diode 5 is inserted so that it leads away in the direction of the battery 4 and blocks in the direction of the inverter 2 to the battery 4.
  • the IGBT 7 is connected to a controller 10.
  • the controller 10 further includes two electrical connections to a voltage measurement. Thus, the voltage drop across the intermediate circuit capacitor 3 voltage can be measured.
  • engine operation 22 will usually occur first.
  • the electric motor 1 is supplied from the battery 4 to drive the electric vehicle.
  • the IGBT 7 is turned off.
  • the drive system switches to the braking operation 23.
  • braking mode 23 finds a return from the electric motor 1 in the Battery 4 instead to recharge the battery 4 and thus perform an energy recovery.
  • the inverter 2 is then used as a rectifier.
  • the IGBT 7 is turned on in the braking operation 23 to bridge the diode 5 and to allow the backfeed.
  • the controller 10 performs the turning on and off of the IGBT 7. In this case, it measures the voltage drop across the intermediate circuit capacitor 3 and, on the basis of a predefined threshold value for the voltage, determines whether the converter 2 is working properly. If the converter 2 fails, the field-weakening current is missing and the magnets in the electric motor 1 induce an increased voltage in the output lines 9. If this voltage is passed through the converter 2 into the input lines 8, this voltage can lead to damage to the battery 4 , The controller 10 determines, however, based on the voltage measurement, if such an error case 21 is present. If the error case 21, the controller 10 turns off the IGBT 7. As a result, the power line in the direction of the battery 4 to be prevented again, since the diode 5 blocks. Thus, damage to the battery 4 is avoided.
  • test circuit 11 is added to the battery protection device 6 in the circuit of Figure 2, which is indicated in Figure 2 only simplified.
  • the test circuit 11 allows a constant or periodic check of the actual line state of the battery protection device 6. Since just in the electric vehicle in the battery protection device 6 voltages of more than 600 V may occur, it is particularly advantageous that the test here electrically isolated due to the transformer 33 can be done. The part of the test circuit 11 beyond the transformer can thus be operated at near-earth potential. Ben, in particular also the measuring points 39, 40 and a possibly associated evaluation processor, no matter whether this is now provided for the test circuit 11 or another already existing microprocessor is shared.
  • the voltage of the battery 4 is higher than the intermediate circuit voltage. This is the case in engine operation 22.
  • the intermediate circuit voltage must be higher than the voltage of the battery 4. This is the case in braking mode 23, that is, when it is fed back into the battery 4. In this case, both the blocking capability and the conductivity of the IGBT 7 can be tested by switching it off or on.
  • the brake operation 23 is briefly switched over. In this case, no mechanical braking is expediently carried out, but only the braking operation 23 is used for a short time in order to generate a voltage in the intermediate circuit which is above the voltage of the battery 4. As a result, a check of the IGBT 7 is made possible during the short changeover time into the braking operation 23.
  • the duration of the changeover to the braking operation 23 is expediently such that, on the one hand, the test of the IGBT 7 is made possible and, on the other hand, it is ensured by the inertia of the mechanical components of the electric vehicle that no noticeable effects are to be expected for the driver of the vehicle ,

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electric Propulsion And Braking For Vehicles (AREA)
  • Inverter Devices (AREA)

Abstract

L'invention concerne un procédé et un circuit pour l'essai fonctionnel d'un composant semiconducteur (31). L'essai fonctionnel s'effectue avec isolation galvanique grâce à un transformateur (33). L'essai lui-même se fonde sur la détermination de l'impédance, en fonction de la fréquence, d'un circuit en série (44) de capacités et d'inductances avec le composant semiconducteur. Cette impédance est fortement affectée par l'état de conduction du composant semiconducteur, c'est-à-dire par sa capacité momentanée de conduction ou de blocage.
EP10700737A 2009-02-02 2010-01-13 Essai fonctionnel de composants avec isolation galvanique Withdrawn EP2391901A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102009006970A DE102009006970A1 (de) 2009-02-02 2009-02-02 Potentialgetrennte Funktionsprüfung für Bauelemente
PCT/EP2010/050347 WO2010086226A1 (fr) 2009-02-02 2010-01-13 Essai fonctionnel de composants avec isolation galvanique

Publications (1)

Publication Number Publication Date
EP2391901A1 true EP2391901A1 (fr) 2011-12-07

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Family Applications (1)

Application Number Title Priority Date Filing Date
EP10700737A Withdrawn EP2391901A1 (fr) 2009-02-02 2010-01-13 Essai fonctionnel de composants avec isolation galvanique

Country Status (5)

Country Link
US (1) US8803540B2 (fr)
EP (1) EP2391901A1 (fr)
CN (1) CN102301252B (fr)
DE (1) DE102009006970A1 (fr)
WO (1) WO2010086226A1 (fr)

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Also Published As

Publication number Publication date
CN102301252B (zh) 2015-04-29
US20110291672A1 (en) 2011-12-01
WO2010086226A1 (fr) 2010-08-05
CN102301252A (zh) 2011-12-28
US8803540B2 (en) 2014-08-12
DE102009006970A1 (de) 2010-08-05

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