EP2359370A1 - Composés actifs rédox organiques à stockage de charges réversible et substrats et dispositifs de mémoire moléculaire les comprenant. - Google Patents
Composés actifs rédox organiques à stockage de charges réversible et substrats et dispositifs de mémoire moléculaire les comprenant.Info
- Publication number
- EP2359370A1 EP2359370A1 EP09775163A EP09775163A EP2359370A1 EP 2359370 A1 EP2359370 A1 EP 2359370A1 EP 09775163 A EP09775163 A EP 09775163A EP 09775163 A EP09775163 A EP 09775163A EP 2359370 A1 EP2359370 A1 EP 2359370A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- group
- substrate
- groups
- compound
- redox active
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 83
- 150000001875 compounds Chemical class 0.000 title claims abstract description 74
- 238000003860 storage Methods 0.000 title claims abstract description 24
- 230000002441 reversible effect Effects 0.000 title claims abstract description 16
- 239000012634 fragment Substances 0.000 claims abstract description 26
- 229910052751 metal Inorganic materials 0.000 claims abstract description 18
- 239000002184 metal Substances 0.000 claims abstract description 18
- 125000006850 spacer group Chemical group 0.000 claims abstract description 10
- 229910021645 metal ion Inorganic materials 0.000 claims abstract description 9
- 239000007787 solid Substances 0.000 claims abstract description 6
- 229910052710 silicon Inorganic materials 0.000 claims description 48
- 239000010703 silicon Substances 0.000 claims description 47
- -1 n-octyl group Chemical group 0.000 claims description 40
- 239000000463 material Substances 0.000 claims description 27
- 230000006870 function Effects 0.000 claims description 23
- 239000004065 semiconductor Substances 0.000 claims description 20
- 125000004432 carbon atom Chemical group C* 0.000 claims description 17
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 16
- 125000003545 alkoxy group Chemical group 0.000 claims description 13
- 125000003118 aryl group Chemical group 0.000 claims description 13
- 125000000217 alkyl group Chemical group 0.000 claims description 12
- 125000000623 heterocyclic group Chemical group 0.000 claims description 12
- 239000002356 single layer Substances 0.000 claims description 11
- 239000001257 hydrogen Substances 0.000 claims description 9
- 229910052739 hydrogen Inorganic materials 0.000 claims description 9
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 8
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 claims description 7
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 claims description 7
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 claims description 6
- 125000004429 atom Chemical group 0.000 claims description 6
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- 125000004093 cyano group Chemical group *C#N 0.000 claims description 6
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 6
- YNPNZTXNASCQKK-UHFFFAOYSA-N phenanthrene Chemical compound C1=CC=C2C3=CC=CC=C3C=CC2=C1 YNPNZTXNASCQKK-UHFFFAOYSA-N 0.000 claims description 6
- 125000005843 halogen group Chemical group 0.000 claims description 5
- MDBVZFGSKMWJFD-UHFFFAOYSA-N OP(O)=O.OP(O)(O)=O Chemical compound OP(O)=O.OP(O)(O)=O MDBVZFGSKMWJFD-UHFFFAOYSA-N 0.000 claims description 4
- 125000003342 alkenyl group Chemical group 0.000 claims description 4
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- 125000001181 organosilyl group Chemical group [SiH3]* 0.000 claims description 4
- XBDYBAVJXHJMNQ-UHFFFAOYSA-N Tetrahydroanthracene Natural products C1=CC=C2C=C(CCCC3)C3=CC2=C1 XBDYBAVJXHJMNQ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052736 halogen Inorganic materials 0.000 claims description 3
- 150000002367 halogens Chemical class 0.000 claims description 3
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 3
- 239000007769 metal material Substances 0.000 claims description 3
- IFLREYGFSNHWGE-UHFFFAOYSA-N tetracene Chemical compound C1=CC=CC2=CC3=CC4=CC=CC=C4C=C3C=C21 IFLREYGFSNHWGE-UHFFFAOYSA-N 0.000 claims description 3
- IFVTZJHWGZSXFD-UHFFFAOYSA-N biphenylene Chemical group C1=CC=C2C3=CC=CC=C3C2=C1 IFVTZJHWGZSXFD-UHFFFAOYSA-N 0.000 claims description 2
- 125000006575 electron-withdrawing group Chemical group 0.000 claims description 2
- 125000000843 phenylene group Chemical group C1(=C(C=CC=C1)*)* 0.000 claims description 2
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- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 9
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 9
- 150000004032 porphyrins Chemical class 0.000 description 9
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 8
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- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
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- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 description 5
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- 239000010931 gold Substances 0.000 description 5
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- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 5
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- 150000003376 silicon Chemical class 0.000 description 5
- 239000002904 solvent Substances 0.000 description 5
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 4
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 4
- NQRYJNQNLNOLGT-UHFFFAOYSA-N Piperidine Chemical compound C1CCNCC1 NQRYJNQNLNOLGT-UHFFFAOYSA-N 0.000 description 4
- 238000004873 anchoring Methods 0.000 description 4
- 239000012298 atmosphere Substances 0.000 description 4
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- 238000005984 hydrogenation reaction Methods 0.000 description 4
- 238000005470 impregnation Methods 0.000 description 4
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- ZWIHJOKUNKKRAD-UHFFFAOYSA-N 4-(4-prop-2-enylhepta-1,6-dien-4-yl)aniline Chemical compound NC1=CC=C(C(CC=C)(CC=C)CC=C)C=C1 ZWIHJOKUNKKRAD-UHFFFAOYSA-N 0.000 description 3
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 3
- SIKJAQJRHWYJAI-UHFFFAOYSA-N Indole Chemical compound C1=CC=C2NC=CC2=C1 SIKJAQJRHWYJAI-UHFFFAOYSA-N 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 3
- RWRDLPDLKQPQOW-UHFFFAOYSA-N Pyrrolidine Chemical compound C1CCNC1 RWRDLPDLKQPQOW-UHFFFAOYSA-N 0.000 description 3
- 229910018540 Si C Inorganic materials 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 150000008064 anhydrides Chemical class 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 3
- 238000004587 chromatography analysis Methods 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 229910052737 gold Inorganic materials 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- 238000007654 immersion Methods 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- AUHZEENZYGFFBQ-UHFFFAOYSA-N mesitylene Substances CC1=CC(C)=CC(C)=C1 AUHZEENZYGFFBQ-UHFFFAOYSA-N 0.000 description 3
- 125000001827 mesitylenyl group Chemical group [H]C1=C(C(*)=C(C([H])=C1C([H])([H])[H])C([H])([H])[H])C([H])([H])[H] 0.000 description 3
- 125000004433 nitrogen atom Chemical group N* 0.000 description 3
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- 229910010271 silicon carbide Inorganic materials 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- FCEHBMOGCRZNNI-UHFFFAOYSA-N 1-benzothiophene Chemical compound C1=CC=C2SC=CC2=C1 FCEHBMOGCRZNNI-UHFFFAOYSA-N 0.000 description 2
- 238000005160 1H NMR spectroscopy Methods 0.000 description 2
- UJOBWOGCFQCDNV-UHFFFAOYSA-N 9H-carbazole Chemical compound C1=CC=C2C3=CC=CC=C3NC2=C1 UJOBWOGCFQCDNV-UHFFFAOYSA-N 0.000 description 2
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- YLQBMQCUIZJEEH-UHFFFAOYSA-N Furan Chemical compound C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 2
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- 238000004458 analytical method Methods 0.000 description 2
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- 238000004566 IR spectroscopy Methods 0.000 description 1
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- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
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- 229910006069 SO3H Inorganic materials 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical group [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 1
- 229910004411 SrTe Inorganic materials 0.000 description 1
- FZWLAAWBMGSTSO-UHFFFAOYSA-N Thiazole Chemical compound C1=CSC=N1 FZWLAAWBMGSTSO-UHFFFAOYSA-N 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 229910007709 ZnTe Inorganic materials 0.000 description 1
- GEIAQOFPUVMAGM-UHFFFAOYSA-N ZrO Inorganic materials [Zr]=O GEIAQOFPUVMAGM-UHFFFAOYSA-N 0.000 description 1
- 125000002252 acyl group Chemical group 0.000 description 1
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- 239000012964 benzotriazole Substances 0.000 description 1
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- 229910052794 bromium Inorganic materials 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- UHYPYGJEEGLRJD-UHFFFAOYSA-N cadmium(2+);selenium(2-) Chemical compound [Se-2].[Cd+2] UHYPYGJEEGLRJD-UHFFFAOYSA-N 0.000 description 1
- 239000011203 carbon fibre reinforced carbon Substances 0.000 description 1
- 125000004112 carboxyamino group Chemical group [H]OC(=O)N([H])[*] 0.000 description 1
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- 229910017052 cobalt Inorganic materials 0.000 description 1
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- KTWOOEGAPBSYNW-UHFFFAOYSA-N ferrocene Chemical compound [Fe+2].C=1C=C[CH-]C=1.C=1C=C[CH-]C=1 KTWOOEGAPBSYNW-UHFFFAOYSA-N 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
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- 125000004170 methylsulfonyl group Chemical class [H]C([H])([H])S(*)(=O)=O 0.000 description 1
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- 238000010422 painting Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000002161 passivation Methods 0.000 description 1
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N phenylbenzene Natural products C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
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- PBMFSQRYOILNGV-UHFFFAOYSA-N pyridazine Chemical compound C1=CC=NN=C1 PBMFSQRYOILNGV-UHFFFAOYSA-N 0.000 description 1
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- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
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- 125000005208 trialkylammonium group Chemical group 0.000 description 1
- 150000003852 triazoles Chemical class 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- 229910052984 zinc sulfide Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0009—RRAM elements whose operation depends upon chemical change
- G11C13/0014—RRAM elements whose operation depends upon chemical change comprising cells based on organic memory material
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0009—RRAM elements whose operation depends upon chemical change
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/701—Organic molecular electronic devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/615—Polycyclic condensed aromatic hydrocarbons, e.g. anthracene
- H10K85/621—Aromatic anhydride or imide compounds, e.g. perylene tetra-carboxylic dianhydride or perylene tetracarboxylic di-imide
Definitions
- the present invention relates to organic redox active compounds with reversible charge storage, that is, capable of reversibly storing charges.
- the present invention further relates to a substrate and a molecular memory device comprising these organic redox active compounds as charge storage molecules. More specifically, this substrate is a substrate made of a semiconductor material, at a surface of which organic redox active compounds with reversible charge storage are chemically grafted.
- the invention also relates to an electronic device, in particular a portable electronic device, comprising at least one such molecular memory device.
- memory device is meant a device able to receive, store and / or restore data.
- the technical field of the invention may, in general, be defined as that of the nonvolatile molecular memories.
- RAMs also called RAM memories (corresponding to the English terminology “Random Access Memory” which means “Random Access Memory”) which are so-called volatile memories, because the data they contain are lost after a few seconds, when the power supply is cut off and in which data can be written, read or rewritten as many times as necessary
- ROM memories are memories programmed by the manufacturer and said non-volatile, because they keep the data contained therein in the absence of supply voltage, and in which the data is accessible only in reading
- Flash memories combine both the advantages of RAM (in terms of writing, reading and erasing data blocks) and those of ROMs (in terms of permanence of the content even when switched off), the Flash name coming from the fact that the operations of erasing the memories are very fast, because these memories are erasable by complete sector, and not by individual cell
- Non-volatile memory technology based on semiconductor materials is currently facing two major problems.
- the first concerns the increasing difficulty in reducing the size of these devices in order to reduce their unit cost and increase the storage density.
- the second is the need to use large programming voltages that are typically greater than 10V. Ideal operating voltages should be below IV.
- Molecular memories which are hybrid electronic devices that use chemical molecules as a means of reversibly storing electrical charges, can solve both of these problems.
- the principle of these devices is based on the storage of charges at the level of molecules that are generally metal complexes.
- these metal complexes In order to be able to store one or more charges, these metal complexes must have well-defined redox properties and exist in at least two oxidation states or redox states.
- the molecule then has at least two states of charges, one of these states being the "erased” state, and the other being the "written” state.
- the transition from one state to another is by charge transfer via a redox reaction mechanism, applying a certain bias voltage to the molecule.
- These charge storage molecular memories have made it possible to reduce the size of the devices and to use lower supply voltages. It has, moreover, been demonstrated that the charge transfer rate can be adjusted by modulating the thickness of the layer, for example of silica, on which the molecules are grafted.
- hybrid molecular memory devices comprising a film of active redox molecules which are in particular porphyrins, metallocenes such as ferrocene, linear and cyclic polyenes, tetrathiafulvalenes , tetraselenafulvalenes, metal coordination complexes, etc.
- the film may in particular be in the form of a self-assembled monolayer (or "SAM” for "Self-Assembled Monolayer”).
- self-assembly refers to the spontaneous formation of complex hierarchical structures from simple elements.
- the phenomenon of self-assembly is at the base of the formation of SAM, LbL or Langmuir-Blodgett layers.
- the forces involved in this phenomenon are of supramolecular type, including Van der Waals, dipoles, and hydrogen bonds.
- US-B2-6, 943, 054 [2] describes the coupling of an organic molecule, in particular a a heat-resistant active redox molecule with an anchor group, with the surface of a semiconductor, by contacting the molecule with the surface and heating the surface to a temperature of at least 200oC, whereby the anchor group forms a covalent bond with the surface.
- Monolayers of porphyrin on a silicon substrate (100) are especially prepared.
- US-B2-7, 324, 385 [3] relates to molecular memories comprising a thin layer of charge storage molecules which are macrocyclic complexes of metal ions.
- This thin layer may especially be in the form of a self-assembled monolayer (or SAM for SeIf-Assembled Monolayer).
- the anchoring groups allowing the immobilization of the active redox moiety on the surface of the electrode can be linked to this surface via a single group-and we will then speak of an immobilization or fixation "monopod "- or through several groups-and then speak of an immobilization or fixation” polypode "or” multipode "for example tripod-.
- the document US-A1-2005 / 0243597 [4] relates to a device for the manufacture of molecular memories in which a solution of the active storage molecules is applied to the surface of a substrate in particular so as to form a self-assembled monolayer ( or SAM for Self-Assembled Monolayer).
- SAM Self-Assembled Monolayer
- the formation of monolayers on silicon is based on the creation of covalent bond of type Si-C between the substrate and the molecule.
- the reaction to generate this type of bond is known as hydrosylilation and has been studied very extensively in the literature.
- most articles, patents and patent applications that deal with attachment, immobilization, fixation of molecules on silicon surfaces relate to molecules having a single anchoring function.
- the multipode molecules and especially tripods mentioned in the literature mainly comprise metal ions, which has many drawbacks especially in terms of pollution, high cost, and mass.
- redox active molecules must, in addition, have an electrical stability, that is to say in other words, a retention of the charge once stored and stable redox conditions.
- active redox molecules must also have a chemical stability, that is to say they must not undergo, under the conditions of use, chemical reactions leading to their degradation or the formation of unwanted by-products.
- the purpose of the present invention is to provide molecules, organic redox active compounds with reversible charge storage, able to store charges in a reversible manner, which meet the needs listed above, among others, and which satisfy the criteria and requirements mentioned above.
- the object of the present invention is still to provide molecules, organic redox active compounds with reversible charge storage that do not have the disadvantages, defects, limitations and disadvantages of molecules, prior art organic redox active compounds with charge storage of prior art and that solve the problems posed by these compounds.
- R represents a deconjugant group
- M represents an organic redox active fragment, comprising no metal ion or metal, capable of reversibly storing at least one filler
- T represents a tripod group comprising three groups F, linked to the same atom, and capable of grafting chemically, preferably covalently, to a surface of a solid substrate;
- Y represents a spacer group separating the active organic redox fragment M from the tripod group T.
- the substrate may be of a metal material, an insulating material, or a semiconductor material, or two or more of these materials.
- the surface of the substrate may be semiconductive, insulating, or metallic.
- the reversible charge-storage organic redox active compounds of formula (I) according to the invention are novel compounds which have never been described in the prior art and which are fundamentally different from the organic redox active compounds of the prior art. .
- the compounds of formula (I) according to the invention have a completely new specific structure comprising, at the same time, associated in the same structure, the following four essential elements R, M, T and Y: a tripod group T comprising three groups F, linked to the same atom, and capable of grafting chemically, preferably covalently, to a surface of a substrate.
- These groups F can also be called functions or groups of anchoring.
- this tripod group Due to the presence of this tripod group, the compound, the molecule according to the invention has all the advantages typically associated with this type of groups mentioned above, as well as in document [9], particularly in terms of robustness obtained layers, stability, high graft density and therefore reliable reading, and better organization of the layer of molecules deposited on the substrate; an optionally deconjugant spacer group Y which carries said tripod group T which separates and, advantageously, electrically isolates the organic redox active fragment M from the tripod group T and which makes it possible to control the transfer of the charges from the substrate, for example made of silicon, to the M organic redox active moiety; an organic redox active fragment M which allows the reversible storage of at least one filler.
- this redox active moiety is an organic moiety, which does not include a metal entity capable of storing a charge, which is free of metal ion or metal.
- the compounds according to the invention are entirely organic compounds without metal entities capable of storing a charge, free of metal ions (in their structure) or metals, which results in many advantages among which we can mention the reduction of pollution by metal salts or metals both during the manufacture of molecular memory devices and when they are rejected, the reduction of the cost of these devices, and the reduction of the total mass of the devices.
- a deconjugant group R which makes it possible to control, modulate, control the charge injection in the organic redox active fragment M, and thus to control, modulate, control the charge transfer potentials between the fragment M and the substrate.
- the group R can be easily modified, modulated, it is preferably an electrically insulating group.
- this group consisting for example of an alkyl chain and / or its size, one can easily control the injection of charges. In principle, the longer and more cumbersome the chain, the more insulating it will be and the more difficult it will be to inject the charges.
- the inventors have associated in the same molecule a deconjugant group, preferably an electrically insulating group R and an organic redox active fragment M, which ensures the control of the injection of the charges.
- the spacer group Y makes it possible to control the transfer of charges from the substrate.
- the flow of charges from and to the fragment M, and from and to the substrate is therefore perfectly controlled in the compounds according to the invention.
- the compounds according to the invention in their part devoted to the storage of charges (M) do not comprise any metallic entity capable of storing a charge, do not comprise ions. metal or metal and yet have excellent electrical and chemical stability properties.
- the compounds according to the invention fulfill the requirements and criteria mentioned above.
- the oxidation states of the compounds according to the invention are clearly distinct.
- the charge transfer potential of the compounds according to the invention is low, for example from -5 to +5 volts and, as already mentioned above, can be further reduced for example up to -2 volts in the case of long and / or bulky R groups, especially R groups containing carbon chains, in particular long carbon chains, for example from 6 to 16 carbon atoms, in particular from 8 to 12 carbon atoms.
- the use of the redox molecules according to the invention in memory devices makes it possible to considerably reduce the energy consumption of these memory devices.
- the compounds according to the invention meet, inter alia, the needs listed above, solve the problems that were presented by the compounds of the prior art, and do not have the disadvantages of these compounds of the prior art while presenting the all the benefits of these compounds.
- substrate in a metallic material means a substrate made of a solid material selected among metals, metal alloys known to those skilled in the art such as noble metals, especially Ag, Au, Pt, Pd, transition metals, such as Cu or Ni, and alloys comprising these metals;
- substrate made of an insulating material is meant a substrate made of a solid material chosen from insulating materials such as oxides such as SiO 2 , TiO 2 , ZrO;
- substrate in a semiconductor material is meant a substrate made of a solid material chosen from semiconductor materials known to those skilled in the art such as silicon, germanium, SiGe, ZnS, ZnSe, ZnTe , CdS, CdSe, CdTe, MgS, MgSe, MgTe, CaS, CaSe, CaTe, SrS, SrSe, SrTe, BaS, BaSe, BaTe, GaN, GAP, GaAs, GaSb, InP, InAs, InSb, AlS, AlP, AlSb, PbS, PbSe.
- semiconductor materials known to those skilled in the art such as silicon, germanium, SiGe, ZnS, ZnSe, ZnTe , CdS, CdSe, CdTe, MgS, MgSe, MgTe, CaS, CaSe, CaTe, SrS, SrSe, SrTe, BaS
- the preferred semiconductor materials are silicon, germanium, gallium and their derivatives, optionally doped for example with boron or with phosphorus.
- the crystalline orientation of the substrate may vary. Thus, in the case of silicon, it may have a crystalline orientation (100) or (111), whether intrinsic or doped.
- the substrate may be of a single material or a mixture of two or more materials.
- the surface of the substrate in particular silicon, can be cleaned before use, before grafting the compounds according to the invention by implementing standard cleaning and / or pickling procedures.
- the surface in particular made of silicon, can be cleaned in one or more of the following solvents used simultaneously or successively: acetone, toluene, ethanol and water and then pickled with a conventional solution of wafer cleaning ( "Wafers") such as a mixture of sulfuric acid and hydrogen peroxide, for example in volume proportions of 3/1.
- wafers such as a mixture of sulfuric acid and hydrogen peroxide, for example in volume proportions of 3/1.
- the surface may be immersed for a period of generally 1 to 5 minutes in this mixture, then rinsed thoroughly with deionized water and dried for example under a stream of argon.
- H 2 SO 4 and H 2 O 2 makes it possible to etch the surface, for example made of silicon, and to eliminate any trace of organic residue before grafting.
- oxides can be removed from the surface of the substrate and the surface can then be hydrogenated (passivated with hydrogen).
- a native oxide layer SiO 2 is formed spontaneously in the air and it is recommended to eliminate it before grafting the compounds according to the invention.
- This oxide layer may be removed by etching, for example using a 1% hydrofluoric acid solution.
- the surface can thus be immersed in the HF solution for a period of, for example, 1 minute, and then dried.
- the hydrogenation of the surface in other words its passivation with hydrogen, can be carried out by any known method known to those skilled in the art, for example by bringing the surface to be passivated into contact with an ammonium fluoride solution. .
- this substrate may be in any form, for example a block (or a part), or a coating, for example with a thickness of 10 nm to 100 microns.
- the surface to which the compounds of formula (I) according to the invention are grafted is preferably a flat surface.
- Active redox or “active redox” means that this compound, this molecule or this fragment can be oxidized or reduced by applying an adequate tension; - By electrically insulating group, it is generally understood that this group limits or totally or partially prevents the transfer, the transport of electrical charges, and regulates, modulates, quantitatively controls this transport, transfer; By deconjugant group, it is generally meant that this group breaks the conjugation by breaking the recovery of the pi orbitals;
- tripod group within the meaning of the invention is meant that this group comprises three groups F, linked to a single atom such as an atom carbon or silicon, these three groups F preferably being identical, and preferably being allyl groups;
- chemical grafting is meant, in what precedes and what follows, an immobilization of the compound (s) of formula (I) mentioned above on the substrate via a chemical bond advantageously covalent, or even iono-covalent. It is specified that this immobilization is done on the surface of the substrate.
- group F capable of grafting chemically to said substrate is meant groups reactive with the reactive groups present on the surface of the substrate, advantageously of semiconductor material, such as Si-H silane groups in the case of a hydrogenated silicon substrate. .
- spacer group is generally meant a unit consisting of at least one atom, separating two functional entities.
- the group R represents a group, deconjugant, preferably electrically insulating.
- the group R is chosen from hydrogen; alkyl groups; alkoxy groups; heterocycles; aryl groups.
- the group R is an n-octyl group or an n-dodecyl group.
- alkyl used for radicals, groups, alkyl, as well as for groups, radicals, fragment groups, comprising an alkyl part, means, unless otherwise indicated, a linear or branched, or cyclic, carbon chain.
- alkyl radical is a linear or branched radical
- one or more carbon atoms of the radical may be replaced by one or more carbonyl groups and / or one or more heteroatoms chosen from nitrogen, oxygen and of sulfur.
- the alkyl radical is a cyclic radical, it generally has from 3 to 30 carbon atoms, preferably from 4 to 16 carbon atoms, better still from 4 to 8 carbon atoms, more preferably from 5 to 7 carbon atoms. carbon atoms and does not comprise a carbon-carbon double bond, and one or more carbon atoms of the cyclic radical can be replaced by one or more carbonyl groups.
- alkoxy used for the alkoxy radicals as well as for the groups comprising an alkoxy moiety means, unless otherwise indicated, an O-alkyl chain, the term alkyl having the meaning indicated above.
- heterocycle is intended to mean a ring, saturated or unsaturated, aromatic or otherwise, containing 5 to 12 ring members, preferably 5 to 7 ring members, and preferably 1 to 3 heteroatoms chosen from nitrogen atoms, sulfur and oxygen. These heterocycles may be condensed on other heterocycles, or on other especially aromatic rings such as a phenyl group. These heterocycles may, in addition, be quaternized in particular by an alkyl radical.
- heterocycles condensed or not, there may be mentioned by way of example the rings: thiophene, benzothiophene, furan, benzofuran, indole, indoline, carbazole, pyridine, dehydroquinoline, chromone, julodinine, thiadiazole, triazole, isoxazole, oxazole, thiazole, isothiazole, imidazole, pyrrazole, triazine, thiazine, pyrazine, pyridazine, pyrimidine, diazepine, oxazepine, benzotriazole, benzoxazole, benzimidazole, benzothiazole, morpholine, piperidine, piperazine, azetidine, pyrrolidine, aziridine, pyrrole, piperidine.
- a heterocycle may optionally be substituted.
- it carries one or more substituents, identical or not, chosen (s) generally from optionally substituted, linear or branched C 1 -C 16, preferably C 1 -C 10 , carboxyl or linear or branched alkoxycarbonyl alkyl radicals.
- the alkoxy is C1-C16, preferably C1-C10, amino, aminoalkyl or aminoalkyl carbamoyl (H 2 N -alkyl-NH-CO-), wherein the alkyl moiety is linear or branched C1-C16, preferably C1-C10.
- one or more of the carbon atoms of the heterocyclic groups may be replaced by one or more carbonyl groups.
- aryl is understood to mean, unless otherwise specified, a cyclic conjugated system having a C 6 to C 30 aromatic character which may be substituted by one or more identical or different groups chosen from halogen atoms; linear or branched C1-C18, preferably C1-C10 alkyl radicals; linear or branched C1-C16, preferably C1-C10 alkoxy radicals; optionally substituted aryloxy radicals; mesyl (CH3-SO2-); cyano; carboxamido; -CO 2 H; suifo (SO 3 H); -PO 3 H 2 ; -PO 4 H 2 ; hydroxyl; amino; mono or disubstituted amino such as mono (C 1 -C 4 ) alkylamino or dialkyl (C 1 -C 4 ) amino.
- aryl is also understood to mean a radical, in particular a divalent radical such as a biphenyl radical, comprising several aryl radicals as defined above connected by a single bond or by an alkyl chain.
- the aryl group is a phenyl group or a naphthyl group which may be substituted as indicated above.
- the organic redox active fragment M is advantageously chosen from fragments comprising one or more pi-conjugated polycyclic groups such as naphthalene, phenanthrene, anthracene, tetracene or coronene.
- the fragment M must allow the reversible storage of at least one charge, but advantageously the redox system of this fragment must have multiple and accessible redox states and allow to store several charges, for example from 2 to 4 charges.
- the organic redox active fragment M corresponds to the following formula (IIA), (IIB), (IIC), (IID) or (IIIE):
- n is an integer that can take any value from 0 to 6, such as 0, 1, 2, 3.
- the fragment M is a naphthalene tetracarboxydiimide fragment.
- the organic redox active fragment M is based on coronene and phenanthrene.
- the fragment M can also be optionally substituted with one or more electron donor or electron-acceptor groups for modulating the oxidation and reduction levels.
- the electron-donor group (s) can in particular be chosen from alkyl groups, alkoxy groups and amines.
- the electron-receptor group (s) can in particular be chosen from halogens, carbonyls and nitrile function.
- the spacer group Y is electrically insulating, it is generally chosen from the divalent groups corresponding to the monovalent groups mentioned for the R group, namely the divalent alkyl groups (alkylene); divalent alkoxy groups; heterocycles (aromatic or non-aromatic or aromatic) divalent; and divalent aryl groups.
- Preferred groups for Y are phenylene group and diphenylene group.
- the groups F capable of bonding chemically, preferably covalently to a surface of a substrate made of a material, preferably a semiconductor material are typically chosen from functions, groups, hydroxyl, mercapto, selenyl, telluryl, cyano, isocyano, carboxyl, amino, dihydroxyphosphoryl, dithio, dithiocarboxyl, diazonium, halo, alkenyl such as allyl, alkynyl, alkoxyl, silyl, phosphate phosphonate; and the carbon chains, preferably of 1 to 5 carbon atoms, advantageously 3 carbon atoms, comprising one or more functions, groups chosen from functions, groups, hydroxyl, mercapto, selenyl, telluryl, cyano, isocyano, carboxyl, amino , dihydroxyphosphoryl, dithio, dithiocarboxyl, diazonium,
- the preferred group F is the allyl group.
- the compound according to the invention may advantageously have the following formula (IIIA), (IIIB), (IIIC), (IIID), or (IIIE):
- R2 represents hydrogen or an electron donor or electron withdrawing group.
- Preferred compounds according to the invention are the following compounds: N- [4- (4-Allylhepta-1,6-dien-4-yl) phenyl] -1,4,5,8-naphthalenetetracarboxydiimide; N- [4- (4-Allylhepta-1,6-dien-4-yl) phenyl] -N'-n-octyl-1,4,5,8-naphthalenetetracarboxydiimide
- the compounds according to the invention may be generally prepared by coupling from a first precursor, comprising a redox active fragment as defined previously and a deconjugant group R, and a second precursor comprising a tripod group, which may be previously bonded to the substrate, and a spacer group Y, as previously defined.
- first precursor comprising a redox active fragment as defined previously and a deconjugant group R
- second precursor comprising a tripod group, which may be previously bonded to the substrate, and a spacer group Y, as previously defined.
- precursors are commonly referred to as precursors of the compound (I).
- the first precursor or entity and the second precursor or entity advantageously comprise complementary functions capable of leading to the formation of a covalent bond between the two precursors, the two entities, when they are placed under suitable conditions, preferentially soft and non-destabilizing for the other functions present on the precursors, entities.
- the functions allowing the coupling are located on the redox fragment, for the first precursor, and on the spacer group Y, for the second precursor.
- condensation reactions which may, for example, lead to ester or imide bonds. Indeed, it is typically performed by simple heating. In this respect, reference may in particular be made to the examples.
- the invention also relates to a substrate, preferably a semiconductor material, at a surface of which are chemically grafted, preferably covalently, organic redox active compounds capable of storing charges of formula (I) according to the invention as defined above.
- This substrate may be defined as being a substrate made of an organic hybrid material (the compound of formula (I)) / inorganic (the solid material, for example a semiconductor, an insulator, or a metal substrate).
- organic hybrid material the compound of formula (I)
- inorganic the solid material, for example a semiconductor, an insulator, or a metal substrate.
- this semiconductor material is silicon, optionally doped.
- the substrate may be a substrate having optionally undergone cleaning and / or etching and / or removal of surface oxides and hydrogenation treatments.
- various techniques may be envisaged, in particular liquid techniques, that is to say the techniques for impregnating the abovementioned substrate with an organic solution comprising the compound (s) of formula (I) or its precursors as defined above.
- the chemical grafting on the surface of the substrate in a material, preferably semiconductor can be carried out by one of the following impregnation techniques: - soaking-shrinkage (known under the English terminology “dip-coating”) ; centrifugal coating (known under the terminology “spin-coating”); laminar coating (known by the English terminology “laminar-flow-coating”); spraying (known under the terminology “spray-coating”); spreading (known as “soak coating”); roll coating (known under the terminology “roll to roll process”); brush coating (known under the terminology “painting coating”); screen printing (known as “screen printing”).
- This operation is generally followed by a step allowing the reaction between the surface, for example silicon, and the tripod, for example a tripod group comprising F groups of allyl type. As indicated in the examples, it may be a heating step, for example to 180oC, to create the covalent bonds between the molecule and the surface.
- the reaction implemented in this step can be varied in nature and can in particular be photoassisted.
- the step of preparing the compound (I) from its precursors, by coupling, and the grafting reaction between the surface of the substrate and the tripod group are performed at the same time.
- this duration may be from 1 to 48 hours, for example 16 hours.
- reaction can be followed by suitable spectroscopic means such as infrared spectroscopy or X-ray photoelectron spectroscopy (XPS).
- suitable spectroscopic means such as infrared spectroscopy or X-ray photoelectron spectroscopy (XPS).
- the solvent of said solution can be easily chosen by those skilled in the art.
- This solvent may for example be selected from THF, aliphatic alcohols from 1 to 8C such methanol and ethanol, halogenated solvents, aromatic solvents, and mixtures thereof.
- the concentration of the compound (I) or its precursors in said solution can be easily determined by those skilled in the art, it is generally from 10 -3 to 1 M.
- the temperature at which the impregnation is carried out can also be easily determined by those skilled in the art, it is generally 20 ° C. to 80 ° C., preferably this impregnation is carried out at ambient temperature.
- a preferred method for carrying out the grafting of the molecules (I) according to the invention is a process involving a thermal hydrosilylation reaction.
- Silicon surfaces of different crystallinities can be used.
- Thermal hydrosilylation can be achieved by placing the freshly etched and hydrogenated silicon substrates in a solution of mesitylene containing the molecule of formula (I) according to the invention and then heating at reflux for example for 2 hours.
- the reaction is generally carried out under an inert atmosphere, for example an argon atmosphere.
- the process for preparing the inorganic-organic hybrid material substrate according to the invention may comprise a treatment step intended to eliminate the residues of the grafting reaction as well as the unreacted species.
- This treatment may consist of rinsing the hybrid material with an organic solvent which is preferably the same solvent used for grafting.
- the substrate is generally dried in inorganic-organic hybrid material.
- the compounds according to the invention can form a monolayer on the surface of the substrate, for example with a thickness of 2 to 3 nm.
- the present invention also relates to a molecular memory device comprising an organic redox active compound with charge storage reversible composition of formula (I) according to the invention, or comprising a substrate, advantageously a semiconductor material, at a surface of which is chemically grafted, advantageously covalently, a redox active compound with reversible charge storage of formula (I) according to the invention, as defined above.
- the substrate is preferably an electrode of the molecular memory device and preferably a working electrode.
- a device is known to those skilled in the art and will not be described in more detail herein. It differs from the known devices only by the implementation of the specific compounds according to the invention. Such a device and its manufacture are described for example in document US-A1-2003 / 0111670 [13].
- the device according to the invention has all the advantages already mentioned above, and related to the use of the molecules of formula (I) according to the invention.
- the invention also relates to an electronic device comprising at least one memory device as defined above, the device being able to be chosen from portable electronic devices, such as digital cameras, cell phones, printers, laptops or devices for reading and sound recording such as MP3 players.
- portable electronic devices such as digital cameras, cell phones, printers, laptops or devices for reading and sound recording such as MP3 players.
- the invention relates to the use of the compounds of formula (I) as suitable molecules storing charges in a molecular memory device
- FIG. 1A is the spectrum of X-ray photoelectron spectrophotometry ("XPS” or "X-Ray Photoelectron Spectroscopy” in English) of molecule 1 according to the invention, in which R is a hydrogen, prepared in example 1, grafted onto a hydrogenated silicon substrate (100). This spectrum gives the number of electrons emitted as a function of the electron binding energy (in eV);
- FIGS. 1B, 1C, 1D and 1E are enlargements of parts of the spectrum of FIG. 1A which respectively relate to the peaks involving carbon, nitrogen, silicon, and oxygen atoms of the molecule 1;
- FIGS. 2B, 2C and 2D are enlargements of parts of the spectrum of FIG. 2A which relate respectively to the peaks involving silicon, nitrogen and carbon atoms of molecule 2;
- Figure 3 is a schematic vertical sectional view of the measuring device used to determine the electrical properties of the molecules 1, 2 and 3 according to the invention, prepared in Examples 1, 2 and 3;
- FIG. 4A is a graph which gives the capacitance C (in F / cm 2 ) as a function of the gate voltage VG (in volts) for a monolayer of the molecules 1 according to the invention, grafted onto a silicon substrate, and integrated in the device of Figure 3; the upper curve (D) was set at 70 Hz and the lower layer (O) was set at 500 Hz;
- FIG. 4B is a graph which gives the conductance G (in S / cm 2 ) as a function of the gate voltage VG (in volts) for a monolayer of the molecules 1 according to the invention, grafted onto a silicon substrate, and integrated in the device of Figure 3; the upper curve (D) was set at 70 Hz and the lower layer (O) was set at 500 Hz;
- FIG. 5A is a graph which gives the capacitance C (in F / cm 2 ) as a function of the gate voltage VG (in volts) for a monolayer of the molecules 2 according to the invention, grafted onto a silicon substrate, and integrated in the device of Figure 3; the upper curve (O) was set at 70 Hz and the lower layer (D) was set at 500 Hz; FIG.
- 5B is a graph which gives the conductance G (in S / cm 2 ) as a function of the gate voltage VG (in volts) for a monolayer of the molecules 2 according to the invention, grafted onto a silicon substrate, and integrated in the device of Figure 3; the upper curve (D) was set at 70 Hz and the lower layer (O) was set at 500 Hz.
- FIG. 6A is a graph which gives the capacitance C (in F / cm 2 ) as a function of the gate voltage VG (in volts) for a monolayer of the molecules 3 according to the invention, grafted onto a silicon substrate, and integrated in the device of Figure 3; the upper curve (O) was set at 70 Hz and the lower layer (D) was set at 500 Hz.
- FIG. 6B is a graph which gives the conductance G (in S / cm 2 ) as a function of the gate voltage VG (in volts) for a monolayer of the molecules 3 according to the invention, grafted onto a silicon substrate, and integrated in the device of Figure 3; the upper curve (D) was set at 70 Hz and the lower layer (O) was set at 500 Hz.
- Step 1 Synthesis of N- [4- (4-Allylhepta- 1, 6-dien-4-yl) phenyl] -1,4,5,8-naphthalenetetracarboxyanhydride.
- 1,4,5,8-naphthalene tetracarboxydianhydride (.9 g, 22 mmol) is dissolved in 100 ml of Anhydrous DMF at 160oC.
- 4- (4-Allylhepta-1,6-dien-4-yl) aniline (5 g, 22 mmol) previously dissolved in 50 mL of anhydrous DMF is added dropwise to the anhydride solution. The reaction is refluxed 12h.
- Step 2 Synthesis of N- [4- (4-Allylhepta- 1, 6-dien-4-yl) phenyl] -1,4,5,8-naphthalenetetracarboxydiimide (Molecule 1).
- N-octyl-1,8-naphthalene dicarboximide 4,5-dicarboxyanhydride (leq., 1 g, 2.64 mmol ) is dissolved in 50 mL of anhydrous DMF at 160oC.
- 4- (4-Allylhepta- 1, 6-dien-4-yl) aniline (leq., 0.6 g, 2.64 mmol) previously dissolved in 10 mL anhydrous DMF is added to the anhydride solution. drop. The reaction is refluxed 15h.
- N-dodecyl-1,8-naphthalene dicarboximide 4,5-dicarboxyanhydride (leq) is dissolved in 50 ml of anhydrous DMF. at 160oC.
- 4- (4-Allylhepta-1,6-dien-4-yl) aniline (leq.) Previously dissolved in 10 mL of anhydrous DMF is added to the anhydride solution dropwise. The reaction is refluxed 14h.
- EXAMPLE 4 Grafting of Molecules 1, 2 and 3 on a Silicon Substrate
- the grafting of the molecules 1, 2 and 3 according to the invention is carried out by a thermal hydrosilylation reaction on a hydrogenated silicon surface.
- this hydrosilylation reaction see document [12], already cited.
- the crystalline orientation of the substrate is Si (100). It is a boron-doped 7-10 ⁇ -cm P-type conductive substrate, the size of the active surface is 150 ⁇ 300 ⁇ m 2 and 100 ⁇ 790 ⁇ m 2 .
- the device is first stripped with a mixture of concentrated H 2 SO 4 and H 2 O 2 (v / v 3/1). ). The device is immersed for 1 to 5 minutes in this solution and rinsed abundantly with deionized water and then dried under an argon flow.
- Hydrogenation is then carried out by immersion in 1% HF for 5 minutes of the surface which has been etched with hydrofluoric acid.
- Si-H functions is followed by X-ray photoelectron spectroscopy ("XPS") and Infrared.
- XPS X-ray photoelectron spectroscopy
- the grafting of the molecules is carried out as already specified by a hydrosilylation reaction by placing the freshly etched silicon substrate in a mesitylene solution containing the molecule and then heating at reflux for 2 hours. The reaction is carried out under an inert atmosphere.
- Grafted surfaces are characterized by X-ray photoelectron spectroscopy ("XPS").
- XPS measurements are made with a S-Probe spectrometer using a Ka monochromatic line (1486.6 eV photons) at a dwell time of 100 ms and an energy pass of 50 eV .
- the signal is obtained at a starting angle ("take-off angle") ⁇ (measured relative to the surface) of 35 °.
- the pressure in the analysis chamber is 10 ⁇ 9 Torr or less at each measurement.
- the reference used for the binding energies is the peak Au 4f peak at 84 eV.
- the signal C Is at 284.6 eV shows that no charge effect is observed.
- Photoelectrons are detected using a hemispherical sphere of analysis, with an angular limit of 30 ° and an energy resolution of 850 meV.
- FIG. 1A gives the spectrum of X-ray photoelectron spectrophotometry ("XPS") of the molecule 1 according to the invention, grafted on a substrate made of silicon (100) hydrogenated, and FIGS. IB to IE are enlargements of parts of the spectrum. of Figure IA.
- XPS X-ray photoelectron spectrophotometry
- Table 1 gives the numerical values of the parameters describing the spectrum of FIG.
- FIG. 2A gives the spectrum of X-ray photoelectron spectrophotometry ("XPS") of molecule 2 according to the invention, grafted onto a substrate made of silicon (100) hydrogenated, and FIGS. 2B to 2D are enlargements of parts of the spectrum of Figure 2A.
- XPS X-ray photoelectron spectrophotometry
- the active surface of the capacitance (150 ⁇ 300 ⁇ m 2 ) comprising the molecules according to the invention (1) grafted on the silicon (2), is constructed at the center of thin walls (3) of SiO 2 formed over a thickness of 500 nm by oxide thermal SiO 2 (4) then on a thickness of 10 ⁇ m by SiO 2 which was grown by PECVD (5).
- PECVD is grown with sacrificial oxide SiO 2 to a thickness of 10 nm on the active silicon surface, and this oxide is removed by pickling by immersion in a 1% aqueous HF solution for one minute, and then drying under argon just before the grafting of the molecules (1) according to the invention. Hydrogenation is then carried out under the conditions already mentioned above.
- the grafting of the molecules (1) is carried out as already described above, by a thermal hydrosilylation reaction by placing the freshly etched silicon substrate in a mesitylene solution containing the molecule and then heating at reflux for 2 hours. The reaction must be conducted under an inert atmosphere.
- C-V Capacitance-Voltage
- G-V Conductance-Voltage
- the measurements were performed using a potentiometer (6) Agilent ® 4284 A in an inert atmosphere (Nitrogen).
- the grid voltage (VG) is applied using a silver electrode (7).
- VG grid voltage
- a drop of electrolyte (8) 1.0 M solution of tetrabutylammonium hexafluorophosphate in propylene carbonate
- the silver electrode (7) is immersed in the drop of electrolyte (8).
- the results of the measurements of the electrical properties of the molecules 1, 2 and 3 according to the invention grafted onto silicon were respectively plotted on the graphs of FIGS. 4A and 4B (molecule 1), 5A and 5B (molecule 2), and 6A and 6B. (molecule 3).
- Table 2 gives the Potential (in V) corresponding to the appearance of the redox peaks for each of the molecules according to the invention prepared in Examples 1 to 3 grafted onto silicon.
- the capacitance and conductance curves (C-V and G-V) show the presence of two peaks, characteristic of the responses of the two redox states of the molecules.
- Table 2 clearly shows that the addition of a chain, for example C8 or C12, makes it possible to modulate the charge transfer potentials between the core pi-conjugated and silicon compared to the case without chain, thus further reducing the potentials.
- a chain for example C8 or C12
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Abstract
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0858485A FR2939794B1 (fr) | 2008-12-11 | 2008-12-11 | Composes actifs redox organiques a stockage de charges reversible et substrats et dispositifs de memoire moleculaire les comprenant |
| PCT/EP2009/066770 WO2010066812A1 (fr) | 2008-12-11 | 2009-12-09 | Composés actifs rédox organiques à stockage de charges réversible et substrats et dispositifs de mémoire moléculaire les comprenant. |
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| Publication Number | Publication Date |
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| EP2359370A1 true EP2359370A1 (fr) | 2011-08-24 |
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| EP09775163A Withdrawn EP2359370A1 (fr) | 2008-12-11 | 2009-12-09 | Composés actifs rédox organiques à stockage de charges réversible et substrats et dispositifs de mémoire moléculaire les comprenant. |
Country Status (5)
| Country | Link |
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| US (1) | US20120205605A1 (fr) |
| EP (1) | EP2359370A1 (fr) |
| JP (1) | JP2012511542A (fr) |
| FR (1) | FR2939794B1 (fr) |
| WO (1) | WO2010066812A1 (fr) |
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| FR2980989A1 (fr) * | 2011-10-06 | 2013-04-12 | Commissariat Energie Atomique | Procede de fonctionnalisation d'un substrat solide autre qu'un substrat en or par des composes chimiques specifiques |
| JP6561123B2 (ja) * | 2015-08-04 | 2019-08-14 | 富士フイルム株式会社 | 有機薄膜トランジスタ、有機薄膜トランジスタの製造方法、有機薄膜トランジスタ用材料、有機薄膜トランジスタ用組成物、有機半導体膜、化合物 |
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| US7312100B2 (en) * | 2003-05-27 | 2007-12-25 | The North Carolina State University | In situ patterning of electrolyte for molecular information storage devices |
| DE10324388A1 (de) * | 2003-05-28 | 2004-12-30 | Infineon Technologies Ag | Schaltungselement mit einer ersten Schicht aus einem elektrisch isolierenden Substratmaterial und Verfahren zur Herstellung eines Schaltungselements |
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- 2008-12-11 FR FR0858485A patent/FR2939794B1/fr not_active Expired - Fee Related
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- 2009-12-09 JP JP2011540087A patent/JP2012511542A/ja active Pending
- 2009-12-09 WO PCT/EP2009/066770 patent/WO2010066812A1/fr not_active Ceased
- 2009-12-09 US US13/139,276 patent/US20120205605A1/en not_active Abandoned
- 2009-12-09 EP EP09775163A patent/EP2359370A1/fr not_active Withdrawn
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| Publication number | Publication date |
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| WO2010066812A1 (fr) | 2010-06-17 |
| JP2012511542A (ja) | 2012-05-24 |
| FR2939794A1 (fr) | 2010-06-18 |
| FR2939794B1 (fr) | 2011-03-25 |
| US20120205605A1 (en) | 2012-08-16 |
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