EP2192764A4 - Solid state imaging element and imaging device - Google Patents
Solid state imaging element and imaging deviceInfo
- Publication number
- EP2192764A4 EP2192764A4 EP08828905A EP08828905A EP2192764A4 EP 2192764 A4 EP2192764 A4 EP 2192764A4 EP 08828905 A EP08828905 A EP 08828905A EP 08828905 A EP08828905 A EP 08828905A EP 2192764 A4 EP2192764 A4 EP 2192764A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- solid state
- imaging device
- state imaging
- imaging element
- imaging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003384 imaging method Methods 0.000 title 2
- 239000007787 solid Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/41—Extracting pixel data from a plurality of image sensors simultaneously picking up an image, e.g. for increasing the field of view by combining the outputs of a plurality of sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
- H04N25/59—Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/703—SSIS architectures incorporating pixels for producing signals other than image signals
- H04N25/707—Pixels for event detection
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007230180 | 2007-09-05 | ||
PCT/JP2008/002427 WO2009031303A1 (en) | 2007-09-05 | 2008-09-04 | Solid state imaging element and imaging device |
Publications (3)
Publication Number | Publication Date |
---|---|
EP2192764A1 EP2192764A1 (en) | 2010-06-02 |
EP2192764A4 true EP2192764A4 (en) | 2013-01-02 |
EP2192764B1 EP2192764B1 (en) | 2015-05-20 |
Family
ID=40428627
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP20080828905 Active EP2192764B1 (en) | 2007-09-05 | 2008-09-04 | Solid state imaging element and imaging device |
Country Status (7)
Country | Link |
---|---|
US (1) | US8269838B2 (en) |
EP (1) | EP2192764B1 (en) |
JP (1) | JP4844854B2 (en) |
KR (1) | KR101090149B1 (en) |
CN (1) | CN101796823B (en) |
TW (1) | TWI401949B (en) |
WO (1) | WO2009031303A1 (en) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101796643B (en) * | 2007-09-05 | 2013-04-10 | 国立大学法人东北大学 | Solid-state imaging device and method for manufacturing the same |
JP5412152B2 (en) * | 2009-03-18 | 2014-02-12 | 株式会社日立国際電気 | Imaging method and imaging apparatus |
JP4807440B2 (en) * | 2009-06-19 | 2011-11-02 | カシオ計算機株式会社 | Video signal processing circuit, imaging apparatus, and video signal processing method |
US20120211642A1 (en) * | 2009-10-27 | 2012-08-23 | Konica Minolta Opto, Inc. | Solid-State Imaging Device |
US20120300092A1 (en) * | 2011-05-23 | 2012-11-29 | Microsoft Corporation | Automatically optimizing capture of images of one or more subjects |
US9001107B2 (en) * | 2011-07-14 | 2015-04-07 | SK Hynix Inc. | Image pixel and image pixel control method |
JP5959187B2 (en) * | 2011-12-02 | 2016-08-02 | オリンパス株式会社 | Solid-state imaging device, imaging device, and signal readout method |
KR101368244B1 (en) * | 2011-12-30 | 2014-02-28 | 주식회사 실리콘웍스 | Circuit for sensing threshold voltage of organic light emitting diode display device |
JP5796509B2 (en) * | 2012-02-16 | 2015-10-21 | 株式会社島津製作所 | Flow cytometer |
US9292569B2 (en) * | 2012-10-02 | 2016-03-22 | Oracle International Corporation | Semi-join acceleration |
JP5639670B2 (en) * | 2013-02-01 | 2014-12-10 | 浜松ホトニクス株式会社 | Image acquisition apparatus and imaging apparatus |
CN103347150A (en) * | 2013-06-24 | 2013-10-09 | 王旭亮 | Video-detection-type monitoring digital video camera and dynamic detection method thereof |
KR101605195B1 (en) | 2013-07-08 | 2016-03-21 | 주식회사 레이언스 | Image sensor and method of driving the same |
KR101496924B1 (en) * | 2013-07-08 | 2015-03-04 | 주식회사 레이언스 | Image sensor and method of driving the same |
JP2015060053A (en) | 2013-09-18 | 2015-03-30 | 株式会社東芝 | Solid-state imaging device, control device, and control program |
WO2015047052A1 (en) | 2013-09-30 | 2015-04-02 | 주식회사 엘지화학 | Organic light emitting device |
KR102071298B1 (en) * | 2013-09-30 | 2020-03-02 | 주식회사 실리콘웍스 | Sample and hold circuit and source driver having the same |
US9386220B2 (en) * | 2013-12-06 | 2016-07-05 | Raytheon Company | Electro-optical (EO)/infrared (IR) staring focal planes with high rate region of interest processing and event driven forensic look-back capability |
EP2899967A1 (en) * | 2014-01-24 | 2015-07-29 | Université Catholique De Louvain | Image sensor |
US9743023B2 (en) | 2014-01-24 | 2017-08-22 | Universite Catholique De Louvain | Image sensor with switchable biasing arrangement |
WO2015110647A1 (en) * | 2014-01-24 | 2015-07-30 | Universite Catholique De Louvain | Image sensor |
EP2899966A1 (en) * | 2014-01-24 | 2015-07-29 | Université Catholique De Louvain | Image sensor |
JP6612056B2 (en) * | 2014-05-16 | 2019-11-27 | 株式会社半導体エネルギー研究所 | Imaging device and monitoring device |
JP6777421B2 (en) | 2015-05-04 | 2020-10-28 | 株式会社半導体エネルギー研究所 | Semiconductor device |
CN112218015B (en) * | 2015-09-30 | 2024-02-23 | 株式会社尼康 | Image pickup element, image pickup device, and electronic apparatus |
WO2017095549A2 (en) * | 2015-10-21 | 2017-06-08 | Massachusetts Institute Of Technology | Methods and apparatus for true high dynamic range (thdr) time-delay-and-integrate (tdi) imaging |
CN108713315B (en) * | 2016-03-16 | 2020-02-21 | 株式会社理光 | Photoelectric conversion device, image reading apparatus, and image forming apparatus |
US10313610B2 (en) * | 2016-04-14 | 2019-06-04 | Qualcomm Incorporated | Image sensors with dynamic pixel binning |
EP3367669B1 (en) * | 2017-02-24 | 2019-07-03 | Melexis Technologies NV | Sample and hold device |
JP6769349B2 (en) | 2017-03-03 | 2020-10-14 | 株式会社リコー | Solid-state image sensor and image sensor |
EP3373575B1 (en) * | 2017-06-01 | 2019-09-04 | Specialised Imaging Limited | Pixel sensor element, image sensor, imaging device, and method |
US10955551B2 (en) | 2017-10-16 | 2021-03-23 | Sensors Unlimited, Inc. | Pixel output processing circuit with laser range finding (LRF) capability |
US10520589B2 (en) | 2017-10-16 | 2019-12-31 | Sensors Unlimited, Inc. | Multimode ROIC pixel with laser range finding (LRF) capability |
JP7150469B2 (en) * | 2018-05-17 | 2022-10-11 | キヤノン株式会社 | Imaging device and imaging system |
CN112602194A (en) * | 2018-08-23 | 2021-04-02 | 国立大学法人东北大学 | Optical sensor and signal reading method thereof, and area type optical sensor and signal reading method thereof |
CN112311964B (en) * | 2019-07-26 | 2022-06-07 | 华为技术有限公司 | Pixel acquisition circuit, dynamic vision sensor and image acquisition equipment |
JP7330124B2 (en) * | 2020-03-19 | 2023-08-21 | 株式会社東芝 | Solid-state imaging device |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1207686A1 (en) * | 2000-11-16 | 2002-05-22 | STMicroelectronics Limited | Solid state imaging device |
US6590611B1 (en) * | 1997-11-28 | 2003-07-08 | Nikon Corporation | Solid-state image-pickup devices and methods for motion detection |
WO2006109683A1 (en) * | 2005-04-07 | 2006-10-19 | Tohoku University | Light sensor, solid-state image pickup device and method for operating solid-state image pickup device |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62190753A (en) * | 1986-02-18 | 1987-08-20 | Agency Of Ind Science & Technol | Semiconductor device for extracting contour |
JPS63174356A (en) * | 1987-01-14 | 1988-07-18 | Agency Of Ind Science & Technol | Semiconductor device for image processing |
JP3116967B2 (en) * | 1991-07-16 | 2000-12-11 | ソニー株式会社 | Image processing apparatus and image processing method |
JPH0773339B2 (en) | 1992-06-04 | 1995-08-02 | 学校法人近畿大学 | Imaging device |
US6753904B1 (en) * | 1997-08-12 | 2004-06-22 | Nikon Corporation | Solid-state imaging apparatus for motion detection |
JP4326050B2 (en) * | 1998-09-22 | 2009-09-02 | ハイスペック合資会社 | High-speed image sensor |
JP2001005166A (en) * | 1999-06-17 | 2001-01-12 | Nec Corp | Pattern inspection method and pattern inspection apparatus |
JP2001189893A (en) * | 1999-12-28 | 2001-07-10 | Toshiba Corp | Solid-state image pickup device |
JP3704052B2 (en) | 2000-03-28 | 2005-10-05 | リンク・リサーチ株式会社 | High-speed imaging device and high-speed imaging device |
US7027092B2 (en) * | 2001-09-17 | 2006-04-11 | Hewlett-Packard Development Company, L.P. | Image capture and storage device |
US20040012684A1 (en) * | 2002-07-16 | 2004-01-22 | Fairchild Imaging | Image reconstruction techniques for charge coupled devices |
CN100525401C (en) * | 2004-04-12 | 2009-08-05 | 国立大学法人东北大学 | Solid-state imaging device, optical sensor, and solid-state imaging device operation method |
JP5066704B2 (en) | 2005-02-04 | 2012-11-07 | 国立大学法人東北大学 | Solid-state imaging device and method of operating solid-state imaging device |
JP2007166581A (en) * | 2005-11-16 | 2007-06-28 | Matsushita Electric Ind Co Ltd | Solid-state imaging apparatus for high-speed photography |
-
2008
- 2008-09-04 CN CN2008801056187A patent/CN101796823B/en active Active
- 2008-09-04 JP JP2009531125A patent/JP4844854B2/en active Active
- 2008-09-04 WO PCT/JP2008/002427 patent/WO2009031303A1/en active Application Filing
- 2008-09-04 KR KR1020107003062A patent/KR101090149B1/en active IP Right Grant
- 2008-09-04 EP EP20080828905 patent/EP2192764B1/en active Active
- 2008-09-04 US US12/676,532 patent/US8269838B2/en active Active
- 2008-09-05 TW TW097134049A patent/TWI401949B/en active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6590611B1 (en) * | 1997-11-28 | 2003-07-08 | Nikon Corporation | Solid-state image-pickup devices and methods for motion detection |
EP1207686A1 (en) * | 2000-11-16 | 2002-05-22 | STMicroelectronics Limited | Solid state imaging device |
WO2006109683A1 (en) * | 2005-04-07 | 2006-10-19 | Tohoku University | Light sensor, solid-state image pickup device and method for operating solid-state image pickup device |
Non-Patent Citations (2)
Title |
---|
CHEN Y ET AL: "High-Speed CMOS Image Sensor Circuits With In Situ Frame Storage", IEEE TRANSACTIONS ON NUCLEAR SCIENCE, IEEE SERVICE CENTER, NEW YORK, NY, US, vol. 51, no. 4, 1 August 2004 (2004-08-01), pages 1648 - 1656, XP011116239, ISSN: 0018-9499, DOI: 10.1109/TNS.2004.832584 * |
See also references of WO2009031303A1 * |
Also Published As
Publication number | Publication date |
---|---|
JP4844854B2 (en) | 2011-12-28 |
JPWO2009031303A1 (en) | 2010-12-09 |
KR20100038445A (en) | 2010-04-14 |
CN101796823A (en) | 2010-08-04 |
EP2192764A1 (en) | 2010-06-02 |
KR101090149B1 (en) | 2011-12-06 |
CN101796823B (en) | 2012-05-23 |
TW200922309A (en) | 2009-05-16 |
US8269838B2 (en) | 2012-09-18 |
EP2192764B1 (en) | 2015-05-20 |
WO2009031303A1 (en) | 2009-03-12 |
TWI401949B (en) | 2013-07-11 |
US20100182470A1 (en) | 2010-07-22 |
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