EP2124231A3 - Aperture for an imaging device - Google Patents

Aperture for an imaging device Download PDF

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Publication number
EP2124231A3
EP2124231A3 EP09160478A EP09160478A EP2124231A3 EP 2124231 A3 EP2124231 A3 EP 2124231A3 EP 09160478 A EP09160478 A EP 09160478A EP 09160478 A EP09160478 A EP 09160478A EP 2124231 A3 EP2124231 A3 EP 2124231A3
Authority
EP
European Patent Office
Prior art keywords
radiation
planar surface
additional
contour
partially
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP09160478A
Other languages
German (de)
French (fr)
Other versions
EP2124231A2 (en
Inventor
Kurt Osterloh
Uwe Ewert
Uwe Zscherpel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bundesanstalt fuer Materialforschung und Pruefung BAM
Original Assignee
Bundesanstalt fuer Materialforschung und Pruefung BAM
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bundesanstalt fuer Materialforschung und Pruefung BAM filed Critical Bundesanstalt fuer Materialforschung und Pruefung BAM
Publication of EP2124231A2 publication Critical patent/EP2124231A2/en
Publication of EP2124231A3 publication Critical patent/EP2124231A3/en
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Diaphragms For Cameras (AREA)

Abstract

Die Erfindung betrifft eine Blende (100), insbesondere für eine bildgebende Einrichtung (200), welche geeignet ist, von einer Strahlungsquelle (10) ausgehende, insbesondere hochenergetische, Strahlung (12) zu begrenzen und entlang einer optischen Achse x nach dem Lochkameraprinzip auf einen Abbildungsbereich (14) zu richten, wobei die Blende (100) die Strahlung (12) wenigstens teilweise absorbierende Bereiche (18, 28a, 28b, 26) umfasst und wobei in der Blende (100) ein erster Spalt (32) oder zumindest ein erster die Strahlung (12) gering absorbierender Bereich vorhanden ist, welcher mindestens eine erste nicht-ebene Oberfläche und eine zweite nicht-ebene Oberfläche aufweist, welche ihn von den die Strahlung (12) wenigstens teilweise absorbierenden Bereichen (18, 28a, 28b, 26) abgrenzen; wobei die Kontur der ersten nicht-ebenen Oberfläche zumindest teilweise durch eine Funktion z(x,y)= f(y)*x+n(y) beschrieben werden kann und wobei die Kontur der zweiten nicht-ebenen Oberfläche zumindest teilweise komplementär zu der Kontur der ersten nicht-ebenen Oberfläche ist.The invention relates to a diaphragm (100), in particular for an imaging device (200), which is suitable for limiting radiation (12) emanating from a radiation source (10), in particular high-energy radiation, and along an optical axis x for a hole camera principle The imaging area (14), wherein the diaphragm (100) comprises the radiation (12) at least partially absorbing areas (18, 28a, 28b, 26) and wherein in the diaphragm (100), a first gap (32) or at least a first the region (12) of low absorption is present, which has at least one first non-planar surface and a second non-planar surface which separates it from the regions (18, 28a, 28b, 26) which at least partially absorb the radiation (12) differentiate; wherein the contour of the first nonplanar surface may be at least partially described by a function z ( x, y ) = f ( y ) * x + n ( y ), and wherein the contour of the second nonplanar surface is at least partially complementary to that Contour of the first non-planar surface is.

Es ist vorgesehen, dass in der Blende (100) mindestens ein zusätzlicher Spalt (32a, 32b) oder zumindest mindestens ein zusätzlicher die Strahlung (12) gering absorbierender Bereich vorhanden ist, wobei jeder zusätzliche Spalt (32a, 32b) oder die Strahlung (12) gering absorbierende Bereich jeweils mindestens eine erste zusätzliche nicht-ebene Oberfläche und eine zweite zusätzliche nicht-ebene Oberfläche aufweist, welche ihn von den die Strahlung (12) wenigstens teilweise absorbierenden Bereichen (18, 28a, 28b, 26) abgrenzen, und wobei zu jedem zusätzlichen Spalt (32a, 32b) oder die Strahlung (12) gering absorbierenden Bereich eine zugehörige affine Abbildung existiert, wobei jeweils die Kontur der ersten zusätzlichen nicht-ebenen Oberfläche nach Anwendung der zugehörigen affinen Abbildung zumindest teilweise durch die Funktion z(x,y) beschrieben werden kann und wobei jeweils die Kontur der zweiten zusätzlichen nicht-ebenen Oberfläche zumindest teilweise komplementär zu der Kontur der ersten zusätzlichen nicht-ebenen Oberfläche ist.

Figure imgaf001
It is envisaged that at least one additional gap (32a, 32b) or at least at least one additional region which absorbs the radiation (12) is present in the diaphragm (100), each additional gap (32a, 32b) or the radiation (12 ) low-absorbing region each having at least a first additional non-planar surface and a second additional non-planar surface, which delimit him from the radiation (12) at least partially absorbing regions (18, 28 a, 28 b, 26), and wherein An associated affine mapping exists for each additional slit (32a, 32b) or the radiation-absorbing region (12), wherein the contour of the first additional non-planar surface is at least partially determined by the function z ( x, y ) and wherein in each case the contour of the second additional non-planar surface is at least partially complementary to is the contour of the first additional non-planar surface.
Figure imgaf001
EP09160478A 2008-05-22 2009-05-18 Aperture for an imaging device Withdrawn EP2124231A3 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE200810025109 DE102008025109B4 (en) 2008-05-22 2008-05-22 Aperture for an imaging device

Publications (2)

Publication Number Publication Date
EP2124231A2 EP2124231A2 (en) 2009-11-25
EP2124231A3 true EP2124231A3 (en) 2010-06-16

Family

ID=40941484

Family Applications (1)

Application Number Title Priority Date Filing Date
EP09160478A Withdrawn EP2124231A3 (en) 2008-05-22 2009-05-18 Aperture for an imaging device

Country Status (2)

Country Link
EP (1) EP2124231A3 (en)
DE (1) DE102008025109B4 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009021750B4 (en) * 2009-05-12 2013-01-17 BAM Bundesanstalt für Materialforschung und -prüfung Pivotally movable slotted diaphragm device
EP2482288B1 (en) 2011-02-01 2013-09-04 BAM Bundesanstalt für Materialforschung und -prüfung Modular imaging device for high-energy radiation with slit diaphragm in the form of a control surface
KR102065158B1 (en) 2012-07-05 2020-01-10 아메리칸 사이언스 앤 엔지니어링, 인크. Variable angle collimator
DE102014103833B3 (en) * 2014-03-20 2015-07-09 Bundesrepublik Deutschland, Vertreten Durch Den Bundesminister Für Wirtschaft Und Energie, Dieser Vertreten Durch Den Präsidenten Der Bundesanstalt Für Materialforschung Und -Prüfung (Bam) Slit diaphragm for radiography applications
GB201515666D0 (en) * 2015-09-04 2015-10-21 Secr Defence Scanning beam collinator

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005029674A1 (en) * 2005-06-20 2006-12-28 BAM Bundesanstalt für Materialforschung und -prüfung Aperture for an imaging device

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3275831A (en) 1963-05-16 1966-09-27 Industrial Nucleonics Corp Radiation beam shutter collimator
DD240091A1 (en) * 1985-08-07 1986-10-15 Akad Wissenschaften Ddr LOCH CAMERA FOR ENORGY QUANTITY RADIATION
FR2652909B1 (en) 1989-10-11 1992-03-27 Commissariat Energie Atomique DEVICE FOR REAL TIME LOCATION OF RADIATION SOURCES.
FR2653896B1 (en) * 1989-11-02 1992-01-03 Informatek Sopha Medical Ste N GAMMA CAMERA EQUIPPED WITH A STENOPE CONE FOR PHOTOGRAPHIC TYPE ACQUISITION.
DE4000507A1 (en) * 1990-01-10 1991-07-11 Philips Patentverwaltung ARRANGEMENT FOR EXAMINING A TEST OBJECT WITH GAMMA OR X-RAY RADIATION
DE19603212C1 (en) 1996-01-30 1997-05-07 Karlsruhe Forschzent Gamma ray camera, e.g. for tomography
US6175615B1 (en) * 1999-04-12 2001-01-16 General Electric Company Radiation imager collimator
DE102007057261B3 (en) 2007-11-26 2009-08-06 BAM Bundesanstalt für Materialforschung und -prüfung Apparatus and method for producing slit diaphragms

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005029674A1 (en) * 2005-06-20 2006-12-28 BAM Bundesanstalt für Materialforschung und -prüfung Aperture for an imaging device

Also Published As

Publication number Publication date
DE102008025109B4 (en) 2010-06-17
DE102008025109A1 (en) 2009-12-03
EP2124231A2 (en) 2009-11-25

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