EP2005440A1 - Procédé pour faire fonctionner un dispositif de mémoire - Google Patents
Procédé pour faire fonctionner un dispositif de mémoireInfo
- Publication number
- EP2005440A1 EP2005440A1 EP07726878A EP07726878A EP2005440A1 EP 2005440 A1 EP2005440 A1 EP 2005440A1 EP 07726878 A EP07726878 A EP 07726878A EP 07726878 A EP07726878 A EP 07726878A EP 2005440 A1 EP2005440 A1 EP 2005440A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- block
- memory
- bit
- blocks
- bit pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 230000015654 memory Effects 0.000 title claims abstract description 89
- 238000000034 method Methods 0.000 title claims abstract description 51
- 230000008859 change Effects 0.000 claims description 17
- 238000004590 computer program Methods 0.000 claims description 12
- 238000012360 testing method Methods 0.000 claims description 4
- 238000012986 modification Methods 0.000 abstract 1
- 230000004048 modification Effects 0.000 abstract 1
- 230000002950 deficient Effects 0.000 description 17
- 238000012217 deletion Methods 0.000 description 10
- 230000037430 deletion Effects 0.000 description 10
- 230000008569 process Effects 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
- G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/88—Masking faults in memories by using spares or by reconfiguring with partially good memories
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
Definitions
- the invention relates to a method for operating a memory device, a device for operating a memory device, a memory device, a computer program and a computer program product.
- Memory devices or storage media have a limited life, which is essentially determined by the number of writes. As the number of writes increases, the data retention time is shortened. Therefore, in the development of memory devices, it is an objective to use memory devices sparingly with respect to the relevant operations and thus to provide memory hardware and the like. a. to save by reducing the write operations. If necessary, other resources, such as RAM, ROM, or runtime, may be used to an appropriate extent. In this way, an extension of the life of memory devices is to be achieved.
- the present invention relates to a method having the features of patent claim 1, a device having the features of patent claim 12, a memory device having the features of patent claim 13, a computer program having the features of patent claim 14 and a computer program product having the features of patent claim 15 ,
- a memory area is usually divided into, for example, logical blocks of the same size. Blocks can assume different states, such as free or busy. Blocks contain at least one management information that does not necessarily have to be stored together with the data.
- the data can be stored in linked lists of blocks. Each linked list consists of at least one block. As a rule, there is no fixed allocation of data and memory areas on the medium, so that the data are repeatedly stored in different blocks at different positions. As a result, the memory device is loaded more uniformly than with a fixed one
- Assignment of data to blocks or memory areas is the case. Before writing data, it is necessary to search for free or empty blocks. When searching for the free blocks, no defective blocks should be selected. Overall, however, the largest possible number of free blocks should always be available.
- a memory area, ie at least one memory cell, of a block is assigned a first bit pattern after performing an erase operation that is separate from a write operation. In the event of a tip over of at least one bit within this memory area, a state change can be detected for this block.
- the device according to the invention for operating a memory device having a number of blocks is designed to assign a bit pattern to a memory area, ie at least one memory cell, of a block after performing an erase operation that is separate from a write operation, so that in the case of Tipping over of at least one bit within the memory area for this block a state change can be detected.
- the invention also relates to a memory device which has a number of blocks and is adapted to assign a bit pattern to a memory area, thus at least one memory cell, of a block, after a deletion operation which is separate from a write operation, so that in the case of Tipping over of at least one bit within the memory area for this block a state change can be detected.
- All steps of the method according to the invention can be carried out with the device according to the invention and the storage device according to the invention. Intermediate see the device according to the invention and the memory device according to the invention may be an interaction.
- the device may be formed as a component of the memory device or the memory device as a component of the device.
- the computer program with program code means according to the invention is designed to perform all the steps of a method according to the invention when the computer program is executed on a computer or a corresponding computing unit, in particular a device according to the invention.
- the invention further relates to a computer program product with program code means which are stored on a computer-readable data carrier in order to perform all the steps of a method according to the invention when the computer program is executed on a computer or a corresponding arithmetic unit, in particular a device according to the invention.
- a block is classified as deleted by introducing a new state and marked accordingly by assigning the first of two possible bit values or bits to the at least one memory cell of the block.
- the erasure operation for a previous content of the block is performed separately from a new content write operation of that block, so that erase and write operations are performed, in particular independently of each other and separately from one another and not automatically or immediately after one another as otherwise usual.
- Blocks generally have a plurality of memory cells, at least one block can be used for storing, in particular one particular - A -
- non-volatile date this date can be stored by changing the content of memory cells of at least one block and deleted.
- the method is particularly suitable for a memory device in which the probability that the first bit value will become the second bit value by tipping over is greater than the probability that the second bit value will be tipped over to become the first bit value.
- the write operation and an assignment of the new state "erased” in particular so-called memory-related state changes of the block, which are usually caused by physical influences, can be better recognized by the at least one memory cell of the block first bit value is assigned.
- a marking of the block as deleted or an assignment of the state "deleted” in connection with the deletion operation can occur after, in particular immediately after, the deletion operation and thus subsequently thereto.
- this can also mean that the assignment of the state "deleted” can be implicitly carried out with the deletion process and thus as part of the deletion process.
- the invention it is possible, in particular in the case of block-oriented memory devices or file systems, for example in EEPROMs, to increase the lifetime of such memory devices and thus to improve the availability of a service for managing and / or storing, for example, non-volatile data.
- the presented method reduces the likelihood that physically defective blocks will be used to store data. In addition, it can be avoided that physically intact blocks are not used for storage.
- a block of memory is automatically cleared in known procedures when new data is written to the block.
- the blocks are automatically cleared in known procedures when new data is written to the block.
- the block can assume the further state "erased” without influencing the number of write operations or accesses.
- an assignment of this state or a corresponding marking of the block can be carried out when performing the deletion process.
- the deleted block can be marked accordingly. This allows a particular situation to be coded.
- the state “deleted” is marked by a specific bit pattern of the at least one memory cell of a memory area or of all the memory cells of the block and thus identified. By using the additional state “deleted", an extension of the lifetime of the memory device or a corresponding medium can be achieved. On the other hand, this is not possible if the delete and write operations are performed together.
- the mark with the new state "cleared” as well as a separation of the erase and write operation at the memory device is used to increase the probability of the correct recognition of a state of blocks.
- the framework conditions and a coding of the management information and the data of the respective block in the implementation of the method are suitably adapted.
- a block may be marked intact, in which case the block is either free or busy. If the block undergoes the particular memory-related state change, which is an unintentional or unwanted state change which is not caused by intervention by a user, the block can furthermore be marked as defective or suspicious. These State change may be due to at least one error and make itself felt automatically by tilting at least one bit of the at least one memory device. Depending on a type or frequency of the error, the block is either classified as suspicious or defective and classified accordingly. An explicit mark as suspicious or defective can be made.
- Blocks suspiciously marked or recognized may be observed for further development.
- An at least originally intact block can hereby be marked as suspicious after the occurrence of a first error.
- a block can only be marked as defective after two consecutive errors, with the second error having to appear suspicious in the state.
- an embodiment described below is based on the assumption that the method is used for a block-oriented file system or a block-oriented memory device with a number of blocks.
- Each block consists of data and administrative information which provides information about a status and type of the block as well as provides a pointer to the next block.
- test data can be used. By determining such check data, for the block in which at least one bit is skewed, it can be checked whether the content of the block is in the state that has been written. The test data can thus be used to detect alleged storage-related state changes as well as state changes caused by an intended operation.
- the state or status of the block is coded by the coding or a bit pattern of the memory cells.
- the memory cells can assume the binary values one ("1") and zero ("0").
- the memory cells may be assigned any suitable characters representing unique, preferably binary values.
- a record consists of a first block and can contain several more blocks, depending on the length of a date.
- each coding comprises eight memory cells, the coding being provided for defining and / or marking the state of the respective block.
- all values for the memory cells of the encoding are ones.
- the first memory cell of the coding is a one, the other memory cells are occupied with arbitrary bit values, with the exception of the free-block bit pattern.
- the first memory cell of the coding has a zero, the other memory cells are ones.
- a first memory cell encoding a further block of the data is a zero, the other memory cells are arbitrary, with the exception of the suspect block bit pattern.
- the coding can be coded in the coding for the status whether the block concerned is a first block or another block within the data record. Furthermore, there is a coding of the ID, under which the date can be found in the memory device.
- Occupied blocks therefore contain the value "logical O" on at least one memory cell, except for the first memory cell. These occupied blocks can be recognized in a further embodiment of the invention by determining the test data as correct or incorrect. Defective blocks look like suspicious blocks, but with the coding of defective blocks the value or bit value "0" is located at at least one other memory cell. If a block is to be marked as a free block, it is deleted. It is thus possible to exploit the additional state "erased" of the memory device by separating the erase and write operations. Marking a deleted and thus free block does not require write access. A write access occurs only when the deleted block is again described with data.
- the method may also include the possibility that by providing the bit pattern according to which the first bit value is assigned to the at least one memory cell and thus the block is marked as deleted, the deletion operation is carried out automatically, so that marking the block is deleted may also correspond to or include the deletion operation.
- the memory device or spared a medium because no write access is required to detect the state.
- the coding of a suspect block differs from the coding of a free block only by a memory cell. This bit at the state marking, preferably first memory cell of the coding is also used to distinguish a first block of a data set and the other blocks for this record.
- the error occurs at the state tagging memory cell of the free block coding, it may become a suspect block. If the error occurs at this memory-tagging memory cell on a suspect block, that block can be used without problems for each block of a data set except the first block.
- the discrimination of the coding of the first and all further blocks is chosen so that, with much greater probability, a first block in a list may become another block than that of a further block becomes a first block.
- codes in Table 1 can be used for other states.
- the status that only consists of "0" is well suited for marking defective blocks in the case of certain memories.
- a further function for cleaning up the memory device is provided.
- This feature includes, for example, releasing incomplete chains and marking suspect blocks. In all the operations mentioned, it may be necessary to recognize or mark the status of blocks. A precise approach for implementing the invention may depend on non-functional requirements of the system.
- the procedure can be specified in detail. In particular, it can be determined at what times and in which operations which types of blocks are marked as and which types of blocks may be used to store data.
- a marking for the at least one memory cell of a respective coding, whereby the status of the block is displayed by these at least one memory cell, is selected according to the application such that, in particular taking account of bit-tilting and aborted delete and write operations, blocks are defective due to the particular memory-related state change, with high probability as defective and intact blocks are recognized as intact.
- Errors can be, for example, physical errors in the storage hardware or incomplete writes caused by power interruptions or resets. Nevertheless, when a memory error is detected, either the corresponding block is often marked as defective and not reused or the error is ignored and the block is reused. In one embodiment of the present method, blocks may be marked as deleted and thus as free and further as intact, as suspicious and as defective. In this way it is possible to increase the availability of stored or stored data.
- the method may also include a strategy for reviving or reactivating suspect blocks.
- This strategy such as a revitalization on demand, after a period of time, and / or according to certain specifications, such that, for example, only a required number of blocks or all suspicious, non-defective blocks are revived.
- a particular design of this strategy also depends on the non-functional requirements of the storage device.
- An example of a weighting of non-functional requirements may include making a decision about whether data security or the lifetime of the storage device is more important. A possible question would be whether data loss with the consequence that a written datum can not be read or a memory leak with the consequence that a memory cell is erroneously recognized as being defective is more acceptable.
- inverse prerequisites may exist:
- the erased state of the memory cell corresponds to "0" and the probability of Bitkippern from “0” to “1” is greater than from “1” to "0".
- the coding may, for example, vary with regard to a structure and / or with regard to the components of the management information and data. This may relate to a status, ie the type and state of the block, a reference to a next block of a date and / or a use and types of checksums and their arrangement. Furthermore, the coding may vary depending on a type of the block-oriented memory device. It may, for example, be provided to store the management information separately from the data. In contrast, in a storage device designed for this purpose, the management information can be stored together with the data.
- the invention can be used in embedded systems, for example control devices in motor vehicles, which each have memory devices according to the invention and / or interact with them.
- Figure 1 shows a schematic representation of an embodiment of a device and a memory device with a block in one embodiment of the method
- the memory device 2 (dashed box) and device 4, shown schematically in FIG. 1, interact in carrying out the described embodiment of the method.
- the memory device 2 has any number of blocks 6 which are provided for storing data.
- FIG. 1 shows a block 6 in different states. The states are respectively marked by bit values associated with the memory cells 14 of the block 6.
- the block 6 is described with a date. This is marked by the fact that the first memory cell of the coding 14, the bit value "0", d. H. logicO, the four further memory cells 14 are assigned the bit values "1010" for characterizing the data in this embodiment.
- a content of the present block 6 is deleted by the device 4 and thus an erase operation 16 is performed.
- the first memory cell 14 and the four further memory cells 14 of the block 6 are respectively assigned the bit value "1", ie logical.
- the block 6 is marked as deleted, so that this deleted block 6 can be quickly identified in a search for free blocks to store new data.
- a change of state 18 should occur for the block 6, which in this embodiment is a memory-dependent change of state 18, this change in state takes place by tilting the bit value from "1" to "1" in the present embodiment. 0 "noticeable in the first memory cell 14 of the block.
- a probability for a memory-dependent tilting of a bit value from “1" to “0” is greater than from “0" to "1".
- Such accidental or unintentional tilting is usually caused by an error in the corresponding memory cell 14. Due to the choice for coding the memory cells 14 or for a bit pattern of the memory cells 14 of the block, the error-related tilting of the bit value, for example, automatically and thus automatically becomes noticeable, as a result of which the change in state 18 of the block 6 can be well recognized.
- a write operation 20 in which a new date is stored on the block 6 can take place.
- the first memory cell 14 of the block 6 is assigned the value "0".
- the further memory cells 14 are assigned bit values "0101" which characterize this new datum.
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Read Only Memory (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
Abstract
La présente invention concerne un procédé pour faire fonctionner un dispositif de mémoire (2) présentant un certain nombre de blocs (6). Selon ce procédé, une configuration binaire est associée à une région de mémoire, c'est-à-dire au moins une cellule de mémoire (14) d'un bloc (6), après l'exécution d'une opération d'effacement (16) qui s'effectue séparément d'une opération d'écriture (20), de manière à pouvoir identifier un changement d'état (18) concernant ce bloc (6) en cas de retournement d'au moins un bit dans la région de mémoire.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102006013763A DE102006013763A1 (de) | 2006-03-24 | 2006-03-24 | Verfahren zum Betreiben einer Speichereinrichtung |
PCT/EP2007/052382 WO2007110327A1 (fr) | 2006-03-24 | 2007-03-14 | Procédé pour faire fonctionner un dispositif de mémoire |
Publications (1)
Publication Number | Publication Date |
---|---|
EP2005440A1 true EP2005440A1 (fr) | 2008-12-24 |
Family
ID=38134769
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP07726878A Ceased EP2005440A1 (fr) | 2006-03-24 | 2007-03-14 | Procédé pour faire fonctionner un dispositif de mémoire |
Country Status (7)
Country | Link |
---|---|
US (1) | US8250321B2 (fr) |
EP (1) | EP2005440A1 (fr) |
JP (1) | JP2009531757A (fr) |
KR (1) | KR20080107426A (fr) |
CN (1) | CN101405816A (fr) |
DE (1) | DE102006013763A1 (fr) |
WO (1) | WO2007110327A1 (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8799188B2 (en) * | 2011-02-08 | 2014-08-05 | International Business Machines Corporation | Algorithm engine for use in a pattern matching accelerator |
JP5581256B2 (ja) * | 2011-03-28 | 2014-08-27 | 株式会社東芝 | メモリシステム、コントローラ、およびメモリシステムの制御方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3485938B2 (ja) * | 1992-03-31 | 2004-01-13 | 株式会社東芝 | 不揮発性半導体メモリ装置 |
US5761440A (en) * | 1994-09-15 | 1998-06-02 | International Business Machines Corporation | System and method utilizing multiple search trees to route data within a data processing network |
US5475693A (en) * | 1994-12-27 | 1995-12-12 | Intel Corporation | Error management processes for flash EEPROM memory arrays |
JPH11110304A (ja) * | 1997-09-30 | 1999-04-23 | Sanyo Electric Co Ltd | マイクロコンピュータ |
EP0926687B1 (fr) * | 1997-12-22 | 2005-03-02 | STMicroelectronics S.r.l. | Auto test et correction d'erreurs de pertes de charge dans une mémoire flash, effacable et programmable par secteurs |
WO2001022232A1 (fr) * | 1999-09-17 | 2001-03-29 | Hitachi, Ltd. | Memoire dans laquelle le nombre de corrections d'erreurs est enregistre |
US6671837B1 (en) * | 2000-06-06 | 2003-12-30 | Intel Corporation | Device and method to test on-chip memory in a production environment |
JP2003076604A (ja) * | 2001-09-03 | 2003-03-14 | Nec Access Technica Ltd | フラッシュメモリのログ情報収集方式および方法 |
JP4188744B2 (ja) * | 2003-04-08 | 2008-11-26 | 株式会社ルネサステクノロジ | メモリカード |
JP4172699B2 (ja) * | 2003-04-25 | 2008-10-29 | Tdk株式会社 | 不揮発性半導体メモリ |
JP4222879B2 (ja) | 2003-05-30 | 2009-02-12 | Tdk株式会社 | メモリコントローラ及びメモリコントローラを備えるフラッシュメモリシステム、並びに、フラッシュメモリの制御方法 |
-
2006
- 2006-03-24 DE DE102006013763A patent/DE102006013763A1/de not_active Withdrawn
-
2007
- 2007-03-14 CN CNA2007800103824A patent/CN101405816A/zh active Pending
- 2007-03-14 JP JP2009502008A patent/JP2009531757A/ja active Pending
- 2007-03-14 US US12/294,400 patent/US8250321B2/en not_active Expired - Fee Related
- 2007-03-14 KR KR1020087023184A patent/KR20080107426A/ko not_active Application Discontinuation
- 2007-03-14 WO PCT/EP2007/052382 patent/WO2007110327A1/fr active Application Filing
- 2007-03-14 EP EP07726878A patent/EP2005440A1/fr not_active Ceased
Non-Patent Citations (1)
Title |
---|
See references of WO2007110327A1 * |
Also Published As
Publication number | Publication date |
---|---|
KR20080107426A (ko) | 2008-12-10 |
US8250321B2 (en) | 2012-08-21 |
CN101405816A (zh) | 2009-04-08 |
DE102006013763A1 (de) | 2007-09-27 |
WO2007110327A1 (fr) | 2007-10-04 |
US20090319732A1 (en) | 2009-12-24 |
JP2009531757A (ja) | 2009-09-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE102012208141B4 (de) | Ausgleich nachlassender Funktionsfähigkeit | |
DE102007006307A1 (de) | Verfahren zum Betreiben eines nichtflüchtigen Speicherelements, Aufzeichnungsmedium und nichtflüchtigen Speicherelement | |
DE102005034611A1 (de) | Speichersystem und zugehörige Betriebs- und Blockverwaltungsverfahren | |
EP1008993A2 (fr) | Mémoire avec dispositif de auto-test et sa mèthode | |
DE3602112A1 (de) | System zur speicherung von informationen | |
DE102006009214B4 (de) | Verfahren und Vorrichtung zum Schreiben in eine Zielspeicherseite eines Speichers | |
DE60317801T2 (de) | Verfahren und vorrichtung zur erkennung von fehlern während des schreibens in einen nichtflüchtigen speicher | |
DE102012101405B4 (de) | Steuervorrichtung zum Steuern eines Datenlesens und - schreibens von und zu einem Flash-Speicher | |
EP2005440A1 (fr) | Procédé pour faire fonctionner un dispositif de mémoire | |
DE102005016801B4 (de) | Verfahren und Rechnereinheit zur Fehlererkennung und Fehlerprotokollierung in einem Speicher | |
DE3210616A1 (de) | Rechner | |
EP1204917B1 (fr) | Pile d'operandes et procede de mise en oeuvre d'une pile d'operande | |
DE10134654A1 (de) | Verfahren zur Fehleranalyse von Speichermodulen | |
DE19959779A1 (de) | Vorrichtung zum Erhalten von Fehlverhaltensinformationen sowie diese verwendende Halbleiterspeicher-Prüfvorrichtung | |
EP2002446B1 (fr) | Procédé pour faire fonctionner un dispositif de mémoire comprenant le marquage de blocs de mémoire identifiées comme défectueux | |
DE2750126B2 (fr) | ||
WO2004105042A1 (fr) | Dispositif et procede pour traiter un etat d'une memoire | |
DE112015002881B4 (de) | Speichervorrichtung, Flash-Speicher-Steuervorrichtung und Programm | |
DE102017119426A1 (de) | Verfahren und vorrichtung zum test von speicherzellen | |
DE19701323C2 (de) | Verfahren und Vorrichtung zur Aktualisierung der Betriebssoftware | |
WO2009103728A1 (fr) | Procédé et dispositif de stockage de données d’information | |
DE102006013762A1 (de) | Verfahren zum Betreiben einer Speichereinrichtung | |
DE102005013896B4 (de) | Verfahren zur Datenverwaltung und Datenzugriffssystem zum Speichern von allen Verwaltungsdaten in einer Verwaltungsbank eines nicht-flüchtigen Speichers | |
DE2710502A1 (de) | Anordnung zur kohaerenten leitung einer speicherhierarchie | |
DE102008002494A1 (de) | Verfahren zum Aktualisieren eines Speichersegments, Datenverarbeitungsschaltung und Speichersegment |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20081024 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): DE ES FR GB IT |
|
17Q | First examination report despatched |
Effective date: 20090203 |
|
DAX | Request for extension of the european patent (deleted) | ||
RBV | Designated contracting states (corrected) |
Designated state(s): DE ES FR GB IT |
|
REG | Reference to a national code |
Ref country code: DE Ref legal event code: R003 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION HAS BEEN REFUSED |
|
18R | Application refused |
Effective date: 20130805 |