EP1966577B1 - Pressure-measuring cell - Google Patents

Pressure-measuring cell Download PDF

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Publication number
EP1966577B1
EP1966577B1 EP06841597A EP06841597A EP1966577B1 EP 1966577 B1 EP1966577 B1 EP 1966577B1 EP 06841597 A EP06841597 A EP 06841597A EP 06841597 A EP06841597 A EP 06841597A EP 1966577 B1 EP1966577 B1 EP 1966577B1
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Prior art keywords
resistance
pressure sensor
pressure
resistance element
layer
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German (de)
French (fr)
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EP1966577A1 (en
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Anh Tuan Tham
Dietfried Burczyk
Dieter Stolze
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Endress and Hauser SE and Co KG
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Endress and Hauser SE and Co KG
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/0041—Transmitting or indicating the displacement of flexible diaphragms
    • G01L9/0051—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance
    • G01L9/0052—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance of piezoresistive elements
    • G01L9/0055—Transmitting or indicating the displacement of flexible diaphragms using variations in ohmic resistance of piezoresistive elements bonded on a diaphragm

Definitions

  • the present invention relates to a pressure measuring cell, in particular a pressure measuring cell with at least one deformation-dependent resistance element.
  • Common pressure measuring cells have four deformation-dependent resistance elements in a full-bridge connection, two first resistance elements having a first deformation dependence and two second resistance elements having a second deformation dependence.
  • the resistance elements are arranged alternately in a closed bridge circuit, which is fed via a first diagonal, and whose Verfornungspares signal is tapped via the second diagonal of the bridge circuit.
  • Resistance elements include, for example piezoresistive semiconductor resistors, which are created by local doping in a base material, such as silicon. Insofar as dopants are associated with concentration gradients, such resistance elements or their dependency can tend to change, especially at high temperatures, since the concentration gradients are unstable due to diffusion phenomena.
  • the Al concentration between, for example, 0 and 0.35 is suitable as a parameter for varying the deformation dependence of an electrical resistance.
  • the international publication WO 2004 / 083110A discloses for this purpose a pressure sensor which has a sensor body, a measuring diaphragm and at least two resistance elements, wherein the measuring diaphragm, which is held by the sensor body, can be acted upon by a pressure and deformed in a pressure-dependent manner; wherein the resistance elements comprise an Al x Ga 1 -x N layer, wherein at least one first resistance element of the at least two resistance elements is arranged on the measuring membrane and has a deformation-dependent resistance value.
  • the pressure sensor according to the invention comprises
  • a measuring membrane which is held by the sensor body, can be acted upon by a pressure and deformed in a pressure-dependent manner;
  • At least two resistance elements which have an Al x Ga 1 -xN layer, wherein at least one first resistance element of the at least two resistance elements is arranged on the measuring membrane and has a deformation-dependent resistance value.
  • a measuring circuit for detecting a signal which depends on the resistance values of the at least two resistance elements in the plane of the Al x Ga 1-x N layer, wherein, according to the invention, the at least one first and the at least one second resistance element each have Al x Ga 1-x N layers with different Al contents.
  • At least one second resistance element of the at least two resistance elements is arranged on the sensor body or the edge region of the measuring membrane, so that this resistance element has a possibly negligible deformation dependence.
  • both the at least one first resistance element and the at least one second resistance element are arranged on the measuring membrane, wherein the resistance elements undergo different changes in the respective resistance value given a pressure-dependent deformation of the measuring membrane.
  • the at least one first and the at least one second resistance element may be arranged at such positions, which have different pressure-dependent deformations, for example, at different radii of a circular measuring diaphragm.
  • the at least one first resistive element and the at least one second resistance element Al, x Ga 1-x N layers with opposite polarities due to different termination to instruct the layers is, one resistance type has an N-terminated layer and the other resistance type has a Ga or Al-terminated layer.
  • the pressure sensor has four resistance elements which are connected in a full bridge, wherein two resistance elements of a first type, such as the previously described at least one first resistance element and two resistance elements of a second type, such as the above-described at least one second resistance element are provided.
  • the resistive elements may be contacted, for example, by metal traces whose resistance value is negligible compared to the resistance of the resistive elements.
  • the resistance elements may, for example, have a length of not more than 1 mm, preferably not more than 0.5 mm, more preferably not more than about 0.25 mm, and particularly preferably not more than about 0.125 mm.
  • the length here refers to the extent of the resistance elements in the direction of the current flow.
  • the width of the resistance element is a degree of freedom with which the value of the resistance can be determined for a given choice of material and length, wherein the resistance element is preferably contacted over its entire width by the metallic conductor. Suitable widths may, for example, in the range between 0.25 mm and 2 mm, preferably between 0.3 mm and 1 mm. lie.
  • the layer thickness of the Al x Ga 1-x N layer is, for example, not more than 0.2 ⁇ m, preferably not more than 0.1 ⁇ m, more preferably not more than 0.05 ⁇ m, and particularly preferably not more than about 0.03 microns.
  • the Al x Ga 1 -xN layer can be applied, for example, on a GaN layer of a few 100 nm, which in turn is arranged on the actual substrate material of the measuring membrane.
  • silicon, silicon nitride, corundum or sapphire can be used as the substrate material, it being possible for the thickness of the substrate material to be selected correspondingly to the measuring range of the pressure sensor.
  • silicon membranes having a thickness of 5 to 50 ⁇ m can be used.
  • Fig. 1 a schematic longitudinal section through a first embodiment a pressure sensor according to the invention
  • Fig. 2 a plan view of the measuring diaphragm of the first embodiment of a pressure sensor according to the invention.
  • Figure 3 A plan view of the measuring diaphragm of a second embodiment of a pressure sensor according to the invention.
  • the in FIGS. 1 and 2 shown pressure sensor 1 has a Si (111) basic body in which a recess 3 is etched through to prepare a measuring membrane 4 with a thickness of about 5 microns.
  • a layer of about 600 nm GaN 5 is applied, on which an Al x Ga 1-x N layer 6 is prepared in a thickness of about 30 nm with an Al: Ga ratio from about 1: 4.
  • This layer has a deformation-dependent resistance
  • the four resistance elements 11 and 12 of a full bridge are realized; by metallic conductor tracks thereon prepared 8, which have a higher conductivity than the Al x Ga 1-x N layer, and which have defined gaps in which the flow of current through the Al x Ga 1-x N-layer must be made.
  • the resistance elements 11 and 12 lie under these gaps Fig. 2 indicated, the resistance elements are arranged in pairs on different radii of the measuring diaphragm to achieve different pressure-dependent changes in resistance.
  • the full bridge is fed via contact point 9, and the pressure-dependent signal is tapped diagonally thereto at contact points 10.
  • the surface of the measuring membrane 4 with a passivation layer for example made of SiO 2 7 in a thickness of about 150 nm.
  • FIG. 3 shown second Ausurelungsbeispiel has a measuring membrane, which is given in principle the same layer structure, as in the first embodiment, however, the Al x Ga 1-x N layer on a lateral hetero-structure, so that the resistance elements 14 and 15 on the same Radial positions of the measuring diaphragm can be arranged and still have a different pressure-dependent change in resistance.
  • alternating strips 6a and 6b with different aluminum content can be prepared, or strips of N-terminated layers can be arranged next to strips of Ga-terminated layers.
  • the layer with the resistive elements Apart from the described type of contacting can be applied in all embodiments above the layer with the resistive elements, first an insulator layer, in which then contact windows are etched. The dimensioning or limitation of the resistors in the longitudinal direction, ie in the direction of the current flow takes place through the contact window. This is followed by vapor deposition with a metal, for example aluminum. The structuring of the metal layer is then carried out lithographically. The resistance elements or their contact zones are thus contacted in the region of the contact window by the metallic conductor tracks from above.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Fluid Pressure (AREA)
  • Pressure Sensors (AREA)

Abstract

A pressure sensor comprises a sensor body 1; a measuring diaphragm 4 which is held by the sensor body, can have a pressure applied to it and can be deformed on the basis of pressure; at least two resistance elements 11, 12 which have an AlxGa1-xN layer 6, wherein at least one first resistance element of the at least two resistance elements is arranged on the measuring diaphragm and has a resistance which depends on deformation. The pressure sensor can be operated using a measurement circuit for detecting a signal which depends on the resistances of the at least two resistance elements on the plane of the AlxGa1-xN layer. Four resistance elements (11, 12) are preferably provided in a full bridge.

Description

Die vorliegende Erfindung betrifft eine Druckmesszelle, insbesondere eine Druckmesszelle mit mindestens einem verformmgsabhängigen Widerstandselement. Gängige Druckmesszellen weisen vier verformungsabhängige Widerstandselemente in einer Vollbrückenachaltung auf, wobei zwei erste Widerstandselemente auf, die eine erste Verformungsabhängigkeit und zwei zweite Widerstandselemente eine zweite Verformungsabhängigkeit aufweisen. Die Widerstandselemente sind alternierend in einer geschlossenen Brückenschaltung angeordnet, welche über eine erste Diagonale gespeist wird, und deren verfornungsabhängiges Signal über die zweite Diagonale der Brückenschaltung abgegriffen wird.The present invention relates to a pressure measuring cell, in particular a pressure measuring cell with at least one deformation-dependent resistance element. Common pressure measuring cells have four deformation-dependent resistance elements in a full-bridge connection, two first resistance elements having a first deformation dependence and two second resistance elements having a second deformation dependence. The resistance elements are arranged alternately in a closed bridge circuit, which is fed via a first diagonal, and whose Verfornungsabhängiges signal is tapped via the second diagonal of the bridge circuit.

Widerstandselemente umfassen beispielsweise piezoresistive Halbleiterwiderstände, die durch lokale Dotierung in einem Basismaterial, beispielsweise Silizium erstellt sind. Insoweit als Dotierungen mit Konzentrationsgradienten einhergehen, können solche Widerstandselemente bzw. deren Verfomungsabhängigkeit insbesondere bei hohen Temperaturen zu Veränderungen neigen, da die Konzentrationsgradienten durch Diffusionsphänomene instabil sind.Resistance elements include, for example piezoresistive semiconductor resistors, which are created by local doping in a base material, such as silicon. Insofar as dopants are associated with concentration gradients, such resistance elements or their dependency can tend to change, especially at high temperatures, since the concentration gradients are unstable due to diffusion phenomena.

Es besteht daher grundsätzlich Bedarf an Drucksensoren mit anderen Materialien, die nicht die genannten dotierungsbedingten Probleme aufweisen.There is therefore a general need for pressure sensors with other materials that do not have the mentioned doping-related problems.

Eickhoff et al. haben im Journal of Applied Physics, Vol. 90, No. 7 die Piezoresistivität von AlxGa1-xN-Schichten mit Wurtzitstruktur und AlxGa1-xN /GaN-Heterostrukturen beschrieben. In der genannten Arbeit werden die experimentellen Ergebnisse zu verformungsabhängigen Widerständen tragfähig mit dem Modell eines mechanisch kontrollierten Gates eines Feldeffekt-Transistors interpretiert, dessen Widerstandswert von dem verformungsabhängigen piezoelektrischen Feld entlang der Achse senkrecht zur Ebene der Al xGa1-xN-Schichten abhängt. Eickhoff et al. have in the Journal of Applied Physics, Vol. 7 described the piezoresistivity of Al x Ga 1-x N layers with wurtzite structure and Al x Ga 1-x N / GaN heterostructures. In the mentioned work, the experimental results for deformation-dependent resistances are interpreted as being compatible with the model of a mechanically controlled gate of a field-effect transistor whose resistance value depends on the deformation-dependent piezoelectric field along the axis perpendicular to the plane of the Al x Ga 1-x N layers.

Der Arbeit ist weiterhin zu entnehmen, dass die Al-Konzentration zwischen beispielsweise 0 und 0,35 als ein Parameter zur Variation der Verformungsabhängigkeit eines elektrischen Widerstands geeignet ist.It can also be seen from the work that the Al concentration between, for example, 0 and 0.35 is suitable as a parameter for varying the deformation dependence of an electrical resistance.

Stutzmann et al. haben in phys. Stat. Sol. (b) 228, No. 2, 505-512 (2001 ) den Einfluss der Polarität von AlxGa1-xN-Schichten in Abhängigkeit von den Terminierungen mit N bzw. Ga oder Al auf die elektrischen Eigenschaften der Schichten beschrieben. Es erscheint insoweit interessant, die in den obigen Arbeiten beschriebenen Materialien zur Realisierung eines Drucksensors aufzugreifen. Stutzmann et al. have in phys. Stat. Sol. (b) 228, no. 2, 505-512 (2001 ) the influence of the polarity of Al x Ga 1-x N layers as a function of the terminations with N or Ga or Al on the electrical properties of Layers described. It seems to be interesting in this respect, to pick up the materials described in the above work for the realization of a pressure sensor.

Die internationale Veröffentlichung WO 2004/083110A offenbart hierzu einen Drucksensor, der einen Sensorkörper, eine Messmembran und mindestens zwei Widerstandselemente aufweist, wobei die Messmembran, die von dem Sensorkörper gehalten wird, mit einem Druck beaufschlagbar und druckabhängig verformbar ist; wobei die Widerstandselemente eine AlxGa1-xN-Schicht aufweisen, wobei mindestens ein erstes Widerstandselement der mindestens zwei Widerstandselemente auf der Messmembran angeordnet ist und einen verformungsabhängigen Widerstandswert aufweist.The international publication WO 2004 / 083110A discloses for this purpose a pressure sensor which has a sensor body, a measuring diaphragm and at least two resistance elements, wherein the measuring diaphragm, which is held by the sensor body, can be acted upon by a pressure and deformed in a pressure-dependent manner; wherein the resistance elements comprise an Al x Ga 1 -x N layer, wherein at least one first resistance element of the at least two resistance elements is arranged on the measuring membrane and has a deformation-dependent resistance value.

Der erfindungsgemäße Drucksensor umfasstThe pressure sensor according to the invention comprises

einen Sensorkörper;a sensor body;

eine Messmembran, die von dem Sensorkörper gehalten wird, mit einem Druck beaufschlagbar und druckabhängig verformbar ist; unda measuring membrane, which is held by the sensor body, can be acted upon by a pressure and deformed in a pressure-dependent manner; and

mindestens zwei Widerstandselemente die eine AlxGa1-xN-Schicht aufweisen, wobei mindestens ein erstes Widerstandselement der mindestens zwei Widerstandselemente auf der Messmembran angeordnet ist und einen verformingsabhängigen Widerstandswert aufweist.at least two resistance elements which have an Al x Ga 1 -xN layer, wherein at least one first resistance element of the at least two resistance elements is arranged on the measuring membrane and has a deformation-dependent resistance value.

Vorzugsweise ist eine Messschaltung vorgesehen zum Erfassen eines Signals, welches von den Widerstandswerten der mindestens zwei Widerstandselemente in Ebene der AlxGa1-xN-Schicht abhängt,
wobei erfingdungsgemäß das mindestens eine erste und das mindestens eine zweite Widerstandselement jeweils AlxGa1-xN-Schichten mit unterschiedlichen Al-Anteilen aufweisen.Preferably, a measuring circuit is provided for detecting a signal which depends on the resistance values of the at least two resistance elements in the plane of the Al x Ga 1-x N layer,
wherein, according to the invention, the at least one first and the at least one second resistance element each have Al x Ga 1-x N layers with different Al contents.

In einer Weiterbildung der Erfindung ist mindestens ein zweites Widerstandselement der mindestens zwei Widerstandselemente auf dem Sensorkörper bzw. dem Randbereich der Messmembran angeordnet, so dass dieses Widerstandselement eine allenfalls vernachlässigbare Verformungsabhängigkeit aufweist.In one development of the invention, at least one second resistance element of the at least two resistance elements is arranged on the sensor body or the edge region of the measuring membrane, so that this resistance element has a possibly negligible deformation dependence.

In einer Weiterbildung der Erfindung sind sowohl das mindestens eine erste Widerstandselement als auch das mindestens eine zweite Widerstandselement auf der Messmembran angeordnet, wobei, die Widerstandselemente bei einer druckabhängigen Verformung der Messmembran unterschiedliche Änderungen des jeweiligen Widerstandswertes erfahren.In one development of the invention, both the at least one first resistance element and the at least one second resistance element are arranged on the measuring membrane, wherein the resistance elements undergo different changes in the respective resistance value given a pressure-dependent deformation of the measuring membrane.

Hierau können beispielsweise das mindestens eine erste und das mindestens eine zweite Widerstandselement an solchen Positionen angeordnet sein, die unterschiedliche druckabhängige verformungen aufweisen, beispielsweise auf unterschiedlichen Radien einer kreisförmigen Messmembran.Hierau example, the at least one first and the at least one second resistance element may be arranged at such positions, which have different pressure-dependent deformations, for example, at different radii of a circular measuring diaphragm.

Als weitere Alternative zum Erzielen unterschiedlicher Widerstandsänderungen aufgrund der druckabbängigen Verformungen oder als Kombinationsmöglichkeit mit den zuvor genannten Maßnahmen zu diesem Zweck können das mindestens eine erste Widerstandselement und das mindestens eine zweite widerstandselement Al, xGa1-x N-Schichten mit entgegengesetzten Polaritäten aufgrund unterschiedlicher Terminierung der Schichten anweisen. D.h. der eine Widerstandstyp weist eine N-terminierte Schicht auf und der andere Widerstandstyp eine Ga- bzw. Al-terminierte Schicht.As a further alternative for achieving different resistance changes due to the druckabbängigen deformations or as a combination with the aforementioned measures for this purpose, the at least one first resistive element and the at least one second resistance element Al, x Ga 1-x N layers with opposite polarities due to different termination to instruct the layers. That is, one resistance type has an N-terminated layer and the other resistance type has a Ga or Al-terminated layer.

Derzeit ist es bevorzugt, wenn der Drucksensor vier Widerstandselemente aufweist die in einer Vollbrücke geschaltet sind, wobei zwei Widerstandselemente eines ersten Typs wie das zuvor beschriebene mindestens eine erste Widerstandselement und zwei Widerstandselemente eines zweiten Typs wie das zuvor beschriebene mindestens eine zweite Widerstandselement beschaffen sind. In einer vorteilhaften Ausgestalung der Vollbrücke weisen die Widerstandselemente bei der Gleichgewichtslage der Messmembran, also ohne druckabhängige Verformung, etwa den gleichen Widerstandswert auf.At present, it is preferred if the pressure sensor has four resistance elements which are connected in a full bridge, wherein two resistance elements of a first type, such as the previously described at least one first resistance element and two resistance elements of a second type, such as the above-described at least one second resistance element are provided. In an advantageous embodiment of the full bridge, the resistance elements in the equilibrium position of the measuring membrane, ie without pressure-dependent deformation, about the same resistance value.

Die Widerstandselemente können beispielsweisedurch metallische Leiterbahnen kontaktiert werden, deren Widerstandswert im Vergleich zum Widerstand der Widerstandselemente vernachlässigbar sind. Die Wiederstandselemente können beispielsweise eine Länge von nicht mehr als 1 mm vorzugsweise nicht mehr als 0,5 mm weiter bevorzugt nicht mehr als etwa 0,25 mm, und besonders bevorzugt nicht mehr als etwa 0.125 mm aufweisen. Die Länge bezieht sich hierbei auf die Ausdehnung der Widerstandselemente in Richtung des Stromflusses. Die Breite des Widerstandselementes ist ein Freiheitsgrad, mit dem bei gegebener Materialwahl und Länge der Wert des Widerstands festgelegt werden kann, wobei das Widerstandselement vorzugsweise über seine gesamte Breite von dem metallischen Leiter kontaktiert wird. Geeignete Breiten können beispielsweise im Bereich zwischen 0,25 mm und 2 mm, vorzugsweise zwischen 0,3 mm und 1 mm. liegen.The resistive elements may be contacted, for example, by metal traces whose resistance value is negligible compared to the resistance of the resistive elements. The resistance elements may, for example, have a length of not more than 1 mm, preferably not more than 0.5 mm, more preferably not more than about 0.25 mm, and particularly preferably not more than about 0.125 mm. The length here refers to the extent of the resistance elements in the direction of the current flow. The width of the resistance element is a degree of freedom with which the value of the resistance can be determined for a given choice of material and length, wherein the resistance element is preferably contacted over its entire width by the metallic conductor. Suitable widths may, for example, in the range between 0.25 mm and 2 mm, preferably between 0.3 mm and 1 mm. lie.

Die Schichtdicke der AlxGa1-xN-Schicht beträgt beispielsweise nicht mehr als 0,2 µm, vorzugsweise nicht mehr als 0,1 µm, weiter bevorzugt nicht mehr als 0,05 µm und besonders bevorzugt nicht mehr als etwa 0,03 µm.The layer thickness of the Al x Ga 1-x N layer is, for example, not more than 0.2 μm, preferably not more than 0.1 μm, more preferably not more than 0.05 μm, and particularly preferably not more than about 0.03 microns.

Die AlxGa1-xN-Schicht kann beispielsweise auf einer GaN-Schicht von einigen 100 nm aufgebracht sein, welche Ihrerseits auf dem eigentlichen Substratmaterial der Messmembran angeordnet ist. Als Substratmaterial können beispielsweise Silizium, Siliziumnitrid, Korund oder Saphir verwendet werden, wobei die Stärke des Substratmaterials dem Messbereich des Drucksensors entsprechend gewählt werden kann. Beispielsweise können Siliziummembranen mit einer Dicke von 5 bis 50 µm verwendet werden.The Al x Ga 1 -xN layer can be applied, for example, on a GaN layer of a few 100 nm, which in turn is arranged on the actual substrate material of the measuring membrane. For example, silicon, silicon nitride, corundum or sapphire can be used as the substrate material, it being possible for the thickness of the substrate material to be selected correspondingly to the measuring range of the pressure sensor. For example, silicon membranes having a thickness of 5 to 50 μm can be used.

Die Erfindung wird nun anhand der in den Zeichnungen dargestellten Ausführungsbeispiele erläutert. Es zeigt:The invention will now be explained with reference to the embodiments illustrated in the drawings. It shows:

Fig. 1: einen schematischen Längsschnitt durch ein erstes Ausführungsbeispiel eines erfindungsgemäßen Drucksensors; Fig. 1 : a schematic longitudinal section through a first embodiment a pressure sensor according to the invention;

Fig. 2: eine Aufsicht auf die Messmembran des ersten Ausführungsbeispiels eines erfindungsgemäßen Drucksensors; und Fig. 2 : a plan view of the measuring diaphragm of the first embodiment of a pressure sensor according to the invention; and

Fig.3: eine Aufsicht auf die Messmembran eines zweiten Ausführungsbeispiels eines erfindungsgemäßen Drucksensors. Figure 3 : A plan view of the measuring diaphragm of a second embodiment of a pressure sensor according to the invention.

Der in Fign. 1 und 2 gezeigte Drucksensor 1 weist einen Si (111)-Grundkörper auf, in dem eine Aussparung 3 durch geätzt ist, um eine Messmembran 4 mit einer Stärke von etwa 5 µm zu präparieren. Auf der der Aussparung 3 abgewandten Oberseite des Grundkörpers 2 ist eine Schicht von etwa 600 nm GaN 5 aufgebracht, auf der eine Al x Ga1-xN-Schicht 6 in einer Stärke von etwa 30 nm präpariert ist mit einem Al:Ga-Verhältnis von etwa 1:4. Diese Schicht weist einen verformungsabhängigen Widerstand auf, In dieser Schicht sind die vier Widerstandselemente 11 und 12 einer Vollbrücke realisiert; indem darauf metallische Leiterbahnen 8 präpariert sind, welche eine höhere Leitfähigkeit aufweisen als die AlxGa1-xN-Schicht, und welche definierte Lücken aufweisen, in denen der Stromfluss durch die Al xGa1-xN-Schicht zu erfolgen hat. Insoweit liegen unter diesen Lücken die Widerstandselemente 11 und 12. Wie in Fig. 2 angedeutet, sind die Widerstandselemente paarweise auf unterschiedlichen Radien der Messmembran angeordnet, um unterschiedliche Druckabhängige Widerstandsänderungen zu erzielen. Die Vollbrücke wird über Kontaktpunke 9 gespeist, und das druckabhängige Signal wird diagonal dazu an Kontaktpunkten 10 abgegriffen.The in FIGS. 1 and 2 shown pressure sensor 1 has a Si (111) basic body in which a recess 3 is etched through to prepare a measuring membrane 4 with a thickness of about 5 microns. On the side facing away from the recess 3 top of the base body 2, a layer of about 600 nm GaN 5 is applied, on which an Al x Ga 1-x N layer 6 is prepared in a thickness of about 30 nm with an Al: Ga ratio from about 1: 4. This layer has a deformation-dependent resistance, in this layer the four resistance elements 11 and 12 of a full bridge are realized; by metallic conductor tracks thereon prepared 8, which have a higher conductivity than the Al x Ga 1-x N layer, and which have defined gaps in which the flow of current through the Al x Ga 1-x N-layer must be made. Insofar, the resistance elements 11 and 12 lie under these gaps Fig. 2 indicated, the resistance elements are arranged in pairs on different radii of the measuring diaphragm to achieve different pressure-dependent changes in resistance. The full bridge is fed via contact point 9, and the pressure-dependent signal is tapped diagonally thereto at contact points 10.

Abgesehen von den Kontaktpunkten ist die Oberfläche der Messmembran 4 mit einer Passivierungsschicht, beispielsweise aus SiO2 7 in einer Stärke von etwa 150 nm.Apart from the contact points, the surface of the measuring membrane 4 with a passivation layer, for example made of SiO 2 7 in a thickness of about 150 nm.

Das in Fig. 3 gezeigte zweite Ausfühlungsbeispiel weist eine Messmembran auf, bei der prinzipiell der gleiche Schichtaufbau gegeben ist, wie beim ersten Ausführungsbeispiel, jedoch weist die Al xGa1-xN-Schicht eine laterale Hetero-Struktur auf, so dass die Widerstandselemente 14 und 15 an gleichen radialen Positionen der Messmembran angeordnet sein können und dennoch eine unterschiedliche druckabhängige Widerstandsänderung aufweisen.This in Fig. 3 shown second Ausfühlungsbeispiel has a measuring membrane, which is given in principle the same layer structure, as in the first embodiment, however, the Al x Ga 1-x N layer on a lateral hetero-structure, so that the resistance elements 14 and 15 on the same Radial positions of the measuring diaphragm can be arranged and still have a different pressure-dependent change in resistance.

Zur Erzielung der lateralen Heterostruktur können beispielsweise alternierende Streifen 6a und 6b mit unterschiedlichem Aluminiumgehalt präpariert werden, oder es können Streifen von N-terminierten Schichten neben Streifen von Ga-terminierten Schichten angeordnet sein.To obtain the lateral heterostructure, for example, alternating strips 6a and 6b with different aluminum content can be prepared, or strips of N-terminated layers can be arranged next to strips of Ga-terminated layers.

Zur Präparation der Schichtstrukturen werden die üblichen Methoden der Halbleiterprozesstechnik eingesetzt. Bezüglich weiterer Einzelheiten zur Präparation sei auf die in der Einleitung zitierte Literatur verwiesen.For the preparation of the layer structures, the usual methods of Semiconductor process technology used. For further details on the preparation, reference is made to the literature cited in the introduction.

Abgesehen von der beschriebenen Art der Kontaktierung kann bei allen Ausführungsbeispielen über der Schicht mit den Widerstandselementen zunächst eine Isolatorschicht aufgebracht werden, in welche dann Kontaktfenster hineingeätzt werden. Die Dimensionierung bzw. Begrenzung der Widerstände in Längsrichtung, also in Richtung des Stromflusses erfolgt durch die Kontaktfenster. Anschließend erfolgt eine Bedampfung mit einem Metall, beispielsweise Aluminium. Die Strukturierung der Metallschicht erfolgt anschließend lithographisch. Die Widerstandselemente bzw. deren Kontaktzonen werden also im Bereich der Kontaktfenster durch die metallischen Leiterbahnen von oben kontaktiert.Apart from the described type of contacting can be applied in all embodiments above the layer with the resistive elements, first an insulator layer, in which then contact windows are etched. The dimensioning or limitation of the resistors in the longitudinal direction, ie in the direction of the current flow takes place through the contact window. This is followed by vapor deposition with a metal, for example aluminum. The structuring of the metal layer is then carried out lithographically. The resistance elements or their contact zones are thus contacted in the region of the contact window by the metallic conductor tracks from above.

Claims (15)

  1. Pressure sensor (1), comprising:
    a sensor body (2);
    a measuring diaphragm (4), which is held by the sensor body, can be exposed to a pressure and can be deformed as a function of the pressure; and
    at least two resistance elements (11, 12) that have a AlxGa1-xN layer (6), wherein at least a first resistance element of the two resistance elements, at least, is arranged on the measuring diaphragm (4) and has a deformation-dependent resistance value,
    characterized in that
    the first resistance element at least and the second resistance element at least both have AlxGa1-xN layers with different Al proportions.
  2. Pressure sensor as claimed in Claim 1, wherein at least a second resistance element of the two resistance elements, at least, is arranged on the sensor body or the edge of the measuring diaphragm such that the second resistance element, at least, presents a deformation dependence which is negligible at best.
  3. Pressure sensor as claimed in Claim 1, wherein both the first resistance element, at least, and the second resistance element, at least, are arranged on the measuring diaphragm, and the resistance elements experience different changes in the individual resistance values in the event of pressure-dependent deformations of the measuring diaphragm.
  4. Pressure sensor as claimed in Claim 3, wherein the first resistance element, at least, and the second resistance element, at least, are arranged at such positions that present different pressure-dependent deformations.
  5. Pressure sensor as claimed in Claim 4, wherein the first resistance element, at least, and the second resistance element, at least, are arranged on different radii of a circular measuring diaphragm.
  6. Pressure sensor as claimed in one of the previous claims, wherein the first resistance element, at least, and the second resistance element, at least, have AlxGa1-xN layers with opposite polarities due to the different termination of the layers. This means that one resistor type has an N-terminated layer while the other resistor type has a Ga- or Al-terminated layer.
  7. Pressure sensor as claimed in one of the previous claims which has four resistance elements which are switched in a full bridge wherein two resistance elements are provided with a first pressure dependence of the resistance value and two resistance elements with a second pressure dependence of the second type of resistance value.
  8. Pressure sensor as claimed in Claim 7, wherein the resistance elements have more or less the same resistance value when the measuring diaphragm is in a state of equilibrium, i.e. not experiencing pressure-dependent deformation.
  9. Pressure sensor as claimed in one of the previous claims, wherein the resistance elements are connected by metal conducting paths.
  10. Pressure sensor as claimed in one of the previous claims, wherein the resistance elements are of a length of not more than 1 mm, preferably not more than 0.5 mm, more preferably of not more than 0.25 mm and most preferably not more than 0.125 mm.
  11. Pressure sensor as claimed in one of the previous claims, wherein the widths of the resistance elements are within the range between 0.25 mm and 2 mm, and preferably between 0.5 mm and 1 mm.
  12. Pressure sensor as claimed in one of the previous claims, wherein the layer thickness of the AlxGa1-xN layer is not more than 0.2 µm, preferably not more than 0.1 µm, more preferably not more than 0.05 µm and most preferably not more than 0.03 µm.
  13. Pressure sensor as claimed in one of the previous claims, wherein the AlxGa1-xN layer is applied on a GaN layer of some 100 nm, which itself is applied on the actual substrate material of the measuring diaphragm.
  14. Pressure sensor as claimed in one of the previous claims, wherein the measuring diaphragm comprises silicon, silicon nitride, corundum or sapphire.
  15. Pressure sensor as claimed in one of the previous claims, further comprising a measurement circuit to measure a signal which depends on the resistance values of the two resistance elements, at least, in the plane of the AlxGa1-xN layer.
EP06841597A 2005-12-31 2006-12-22 Pressure-measuring cell Not-in-force EP1966577B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102005063213 2005-12-31
PCT/EP2006/070169 WO2007077168A1 (en) 2005-12-31 2006-12-22 Pressure-measuring cell

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EP1966577B1 true EP1966577B1 (en) 2012-07-25

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DE102007031980A1 (en) * 2007-07-10 2009-01-15 Robert Bosch Gmbh Connection unit for a pressure measuring cell
US8468894B2 (en) * 2009-11-02 2013-06-25 Vega Grieshaber Kg Measuring cell and a method of use therefor
CN110799164B (en) 2017-12-13 2021-05-18 上海联影医疗科技股份有限公司 System and method for diagnosis and treatment
CN108375446B (en) * 2018-04-17 2023-04-28 南京信息工程大学 Sounding giant piezoresistive barometric sensor array device and measuring method
CN109211444A (en) * 2018-09-25 2019-01-15 中国电子科技集团公司第十三研究所 pressure sensor and preparation method thereof
CN109682510B (en) * 2018-12-07 2021-05-04 中国电子科技集团公司第十三研究所 GaN high-temperature pressure sensor
CN109668661B (en) * 2018-12-07 2021-05-04 中国电子科技集团公司第十三研究所 GaN high-temperature pressure sensor

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US6647796B2 (en) * 2000-08-11 2003-11-18 California Institue Of Technology Semiconductor nitride pressure microsensor and method of making and using the same
US7504658B2 (en) 2003-03-18 2009-03-17 Mike Kunze Sensor elements with cantilevered bar structures made of semiconductors based on group III-nitride

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US8033178B2 (en) 2011-10-11
EP1966577A1 (en) 2008-09-10
WO2007077168A1 (en) 2007-07-12
US20090293627A1 (en) 2009-12-03

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