EP1941543A4 - Sram cell with asymmetrical transistors for reduced leakage - Google Patents
Sram cell with asymmetrical transistors for reduced leakageInfo
- Publication number
- EP1941543A4 EP1941543A4 EP06804051A EP06804051A EP1941543A4 EP 1941543 A4 EP1941543 A4 EP 1941543A4 EP 06804051 A EP06804051 A EP 06804051A EP 06804051 A EP06804051 A EP 06804051A EP 1941543 A4 EP1941543 A4 EP 1941543A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- sram cell
- reduced leakage
- asymmetrical transistors
- asymmetrical
- transistors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/8238—Complementary field-effect transistors, e.g. CMOS
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
- H01L21/26586—Bombardment with radiation with high-energy radiation producing ion implantation characterised by the angle between the ion beam and the crystal planes or the main crystal surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/1025—Channel region of field-effect devices
- H01L29/1029—Channel region of field-effect devices of field-effect transistors
- H01L29/1033—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure
- H01L29/1041—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure with a non-uniform doping structure in the channel region surface
- H01L29/1045—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure with a non-uniform doping structure in the channel region surface the doping structure being parallel to the channel length, e.g. DMOS like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66568—Lateral single gate silicon transistors
- H01L29/66659—Lateral single gate silicon transistors with asymmetry in the channel direction, e.g. lateral high-voltage MISFETs with drain offset region, extended drain MISFETs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
- H10B10/12—Static random access memory [SRAM] devices comprising a MOSFET load element
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B99/00—Subject matter not provided for in other groups of this subclass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0207—Geometrical layout of the components, e.g. computer aided design; custom LSI, semi-custom LSI, standard cell technique
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- High Energy & Nuclear Physics (AREA)
- Ceramic Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Semiconductor Memories (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Thin Film Transistor (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/239,626 US7384839B2 (en) | 2005-09-29 | 2005-09-29 | SRAM cell with asymmetrical transistors for reduced leakage |
PCT/US2006/037021 WO2007041029A2 (en) | 2005-09-29 | 2006-09-22 | Sram cell with asymmetrical transistors for reduced leakage |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1941543A2 EP1941543A2 (en) | 2008-07-09 |
EP1941543A4 true EP1941543A4 (en) | 2011-03-09 |
Family
ID=37892804
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP06804051A Withdrawn EP1941543A4 (en) | 2005-09-29 | 2006-09-22 | Sram cell with asymmetrical transistors for reduced leakage |
Country Status (5)
Country | Link |
---|---|
US (2) | US7384839B2 (en) |
EP (1) | EP1941543A4 (en) |
KR (1) | KR100992203B1 (en) |
CN (1) | CN101529580A (en) |
WO (1) | WO2007041029A2 (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8216903B2 (en) * | 2005-09-29 | 2012-07-10 | Texas Instruments Incorporated | SRAM cell with asymmetrical pass gate |
US7414877B2 (en) * | 2006-01-23 | 2008-08-19 | Freescale Semiconductor, Inc. | Electronic device including a static-random-access memory cell and a process of forming the electronic device |
US7977178B2 (en) * | 2009-03-02 | 2011-07-12 | International Business Machines Corporation | Asymmetric source/drain junctions for low power silicon on insulator devices |
CN102479718B (en) * | 2010-11-29 | 2014-03-26 | 中芯国际集成电路制造(上海)有限公司 | Manufacturing method of metal-oxide-semiconductor field effect transistor (MOSFET) |
US9059032B2 (en) | 2011-04-29 | 2015-06-16 | Texas Instruments Incorporated | SRAM cell parameter optimization |
CN103703556B (en) * | 2011-07-29 | 2017-02-22 | 瑞萨电子株式会社 | Semiconductor device and method for producing same |
CN102610507A (en) * | 2012-03-23 | 2012-07-25 | 上海华力微电子有限公司 | Method for reducing gate-induced drain leakage of semiconductor device, and manufacturing method of MOS (metal oxide semiconductor) device |
CN102779837B (en) * | 2012-08-15 | 2015-04-08 | 中国科学院上海微系统与信息技术研究所 | Six-transistor static random access memory unit and manufacturing method thereof |
US8947122B2 (en) | 2013-01-14 | 2015-02-03 | Cypress Semiconductor Corporation | Non-volatile latch structures with small area for FPGA |
US8897067B2 (en) | 2013-01-18 | 2014-11-25 | Cypress Semiconductor Corporation | Nonvolatile memory cells and methods of making such cells |
US9589652B1 (en) * | 2015-09-24 | 2017-03-07 | Cypress Semiconductor Corporation | Asymmetric pass field-effect transistor for non-volatile memory |
US9496024B1 (en) * | 2015-12-18 | 2016-11-15 | Texas Instruments Incorporated | Automatic latch-up prevention in SRAM |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5886921A (en) * | 1996-12-09 | 1999-03-23 | Motorola, Inc. | Static random access memory cell having graded channel metal oxide semiconductor transistors and method of operation |
US6566204B1 (en) * | 2000-03-31 | 2003-05-20 | National Semiconductor Corporation | Use of mask shadowing and angled implantation in fabricating asymmetrical field-effect transistors |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06140631A (en) * | 1992-10-28 | 1994-05-20 | Ryoden Semiconductor Syst Eng Kk | Field-effect thin film transistor and manufacture thereof |
US6008080A (en) * | 1997-11-21 | 1999-12-28 | United Microelectronics Corp. | Method of making a low power SRAM |
US6667512B1 (en) * | 2000-01-28 | 2003-12-23 | Advanced Micro Devices, Inc. | Asymmetric retrograde halo metal-oxide-semiconductor field-effect transistor (MOSFET) |
US6466489B1 (en) * | 2001-05-18 | 2002-10-15 | International Business Machines Corporation | Use of source/drain asymmetry MOSFET devices in dynamic and analog circuits |
US6894356B2 (en) * | 2002-03-15 | 2005-05-17 | Integrated Device Technology, Inc. | SRAM system having very lightly doped SRAM load transistors for improving SRAM cell stability and method for making the same |
-
2005
- 2005-09-29 US US11/239,626 patent/US7384839B2/en active Active
-
2006
- 2006-09-22 KR KR1020087010391A patent/KR100992203B1/en active IP Right Grant
- 2006-09-22 EP EP06804051A patent/EP1941543A4/en not_active Withdrawn
- 2006-09-22 WO PCT/US2006/037021 patent/WO2007041029A2/en active Application Filing
- 2006-09-22 CN CNA2006800442015A patent/CN101529580A/en active Pending
-
2008
- 2008-05-01 US US12/113,770 patent/US20080237745A1/en not_active Abandoned
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5886921A (en) * | 1996-12-09 | 1999-03-23 | Motorola, Inc. | Static random access memory cell having graded channel metal oxide semiconductor transistors and method of operation |
US6566204B1 (en) * | 2000-03-31 | 2003-05-20 | National Semiconductor Corporation | Use of mask shadowing and angled implantation in fabricating asymmetrical field-effect transistors |
Also Published As
Publication number | Publication date |
---|---|
US20070069277A1 (en) | 2007-03-29 |
CN101529580A (en) | 2009-09-09 |
EP1941543A2 (en) | 2008-07-09 |
WO2007041029A2 (en) | 2007-04-12 |
US20080237745A1 (en) | 2008-10-02 |
KR20080058447A (en) | 2008-06-25 |
WO2007041029A3 (en) | 2009-04-16 |
US7384839B2 (en) | 2008-06-10 |
KR100992203B1 (en) | 2010-11-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR |
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AX | Request for extension of the european patent |
Extension state: AL BA HR MK RS |
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R17D | Deferred search report published (corrected) |
Effective date: 20090416 |
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17P | Request for examination filed |
Effective date: 20091016 |
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RBV | Designated contracting states (corrected) |
Designated state(s): DE FR GB NL |
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DAX | Request for extension of the european patent (deleted) | ||
RBV | Designated contracting states (corrected) |
Designated state(s): DE FR GB NL |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20110208 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: H01L 27/02 20060101ALN20110202BHEP Ipc: H01L 27/11 20060101ALI20110202BHEP Ipc: H01L 29/10 20060101ALI20110202BHEP Ipc: H01L 21/336 20060101ALI20110202BHEP Ipc: H01L 21/265 20060101ALI20110202BHEP Ipc: H01L 21/8244 20060101AFI20110202BHEP |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20110908 |