EP1774301A2 - Tomographe a rayons x assiste par ordinateur ainsi que procede pour examiner une piece a controler a l'aide d'un tomographe a rayons x assiste par ordinateur - Google Patents
Tomographe a rayons x assiste par ordinateur ainsi que procede pour examiner une piece a controler a l'aide d'un tomographe a rayons x assiste par ordinateurInfo
- Publication number
- EP1774301A2 EP1774301A2 EP05773890A EP05773890A EP1774301A2 EP 1774301 A2 EP1774301 A2 EP 1774301A2 EP 05773890 A EP05773890 A EP 05773890A EP 05773890 A EP05773890 A EP 05773890A EP 1774301 A2 EP1774301 A2 EP 1774301A2
- Authority
- EP
- European Patent Office
- Prior art keywords
- detector
- ray
- computer tomograph
- detector array
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/20—Sources of radiation
- G01N2223/201—Sources of radiation betatron
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Definitions
- the invention relates to an X-ray computer tomograph having an X-ray source which generates a fan beam and a 2-dimensional energy-resolving detector array, which are arranged on a gantry.
- the invention relates to a method for examining a test piece with an X-ray computer tomograph.
- DE 100 09 285 A1 discloses a computer tomograph for determining the pulse transmission spectrum in a test area.
- an X-ray source with a primary collimator is arranged on a gantry rotatable about an axis, with which a fan beam is generated.
- a detector array Opposite the x-ray source lies a detector array, likewise attached to the gantry, for detecting the x-rays passing through an examination area.
- a secondary collimator is arranged, which transmits only X-ray radiation from a specific scatter voxel from the examination area into an assigned column of the detector array.
- the object of the invention is therefore to overcome the aforementioned disadvantages.
- the omission of the secondary collimator increases the leakage flux, so that a lower tube power is required or a shorter test time is required for a test part
- there is no undesirable background to scattered radiation originating from lamellae of the secondary collimator moderate X-ray computer tomograph too cheaper than its predecessor with secondary collimator, because on the one hand material costs are saved and on the other hand, the gantry has to move much less mass in its rotation, which leads to cheaper drives and bearings.
- the pulse transmission spectrum lies between 0.2 and 2 n ⁇ f 1 .
- the molecular structure functions of the materials that are of interest in the security field - for example, in the security control of baggage at airports - are of interest. Above this range, the peak information and the intensity of molecular structure functions are negligible for these materials.
- a further advantageous embodiment of the invention provides that the energy of the X-radiation is between 100 and 500 keV. With such a high-energy X-ray radiation, the examination area is increased both in the security control and in the non-destructive analysis. In addition, this energy also has a positive effect on the required size of the individual detector elements of the detector array.
- a further advantageous development of the invention provides that the detector array is arranged on a cylinder jacket surface about a central axis running perpendicular to the fan beam through the X-ray source. This makes it possible to use known arrangements of detector arrays arranged on a gantry. Thus, not all parts of the known X-ray computer tomograph need to be completely redesigned.
- h ⁇ 0.2 * aresine (g max * ⁇ ) * Z P.
- the detector resolution thus achieved achieves an acceptable detector element height at very high x-ray energies and a conventional distance of the measuring point from the detector. It is advantageous if a pixellated detector array is used as detector array with a number of 5 to 50 detector elements in the direction of the Y-axis, preferably of 15 detector elements.
- a further advantageous development of the invention provides that the gantry for receiving the scattering data is rotated about an axis which is perpendicular to the plane of the fan beam. If scattering radiation from other scatter voxels should also fall in a detector element during a recording without rotation of the gantry, this is compensated by the rotation, since by the scatter voxel. always another Partial beam passes. The scattered radiation emanating from the scatter voxel thus changes constantly, so that an additional calculation is possible on account of the multiplicity of data obtained during the rotation of the gantry.
- Fig. 1 is a perspective, schematic view of an X-ray computed tomography according to the invention.
- FIG. 2 shows a view perpendicular to the plane of the fan beam of the X-ray computer tomograph from FIG. 1.
- Fig. 1 the schematic structure of an X-ray computed tomography according to the invention is shown in a greatly simplified manner.
- computer tomography by means of coherently scattered X-ray guides, spatially resolved diffraction patterns can be reconstructed on the basis of the scattered and detected X-ray radiation.
- a fan beam 2 is used, which is produced by an X-ray source 1.
- the fan beam 2 is generated regularly by a slit diaphragm as a primary collimator (not shown). It completely penetrates the test piece 4 over its entire width.
- the conventional and known examination method is between the test part 4 and a detector array 5 a sec.
- the detector array 5 has a series of elements in a 2-dimensional structure. It is made from a material which has the capability of energy-resolving detection, for example from CdZnTe.
- the detector elements of the detector array 5 are arranged on a cylinder jacket surface.
- the axis of the cylinder jacket passes through the X-ray source 1 and runs parallel to the Y-axis, ie perpendicular to the fan beam 2.
- the dashed line indicates the Z-axis, in the illustrated case the line of sight 3 between the detector element, in the coordinate origin is arranged, and the X-ray source 1 corresponds.
- the detector array 5 has lines that extend parallel to the X-axis and columns that extend parallel to the Y-axis.
- the primary radiation elements 6 are arranged on the X-axis. With these, the X-ray radiation passing directly through the X-ray source 1 through the test piece 4, which was thus not scattered, is detected.
- the scattering radiation elements 7 only X-ray radiation is detected which has undergone coherent scattering within the scattering voxel S.
- the width B of a "strip" of an object radiating coherent scattered radiation into a certain detector column is ⁇ Z p * ⁇
- the entire detector array 5 extends, in the X direction, so far that the entire fan beam 2 passing through the test piece 4 is detected.
- 50 detector elements regularly extend, since the coherent scattered radiation decreases in its intensity towards larger scattering angles.
- the coherently scattered X-ray radiation from a scatter voxel S around a certain observation point P results, on the basis of the specified scattering angle-dependent intensity of the coherently scattered X-ray images, that significant scattering radiation is detected only in the given scattering angle range to ⁇ . From the observation point P, a cone thus results, in the region of which in the detector array 5 coherently scattered X-ray quanta from the scatter voxel S are detected.
- the radius R of this region is for small angles proportional to the product ⁇ * Z p due to the proximity at small angles, where Z p represents the coordinate of the observation point P with respect to the origin of the coordinate system.
- this distance Z p is approximately 2 m, so that the radius R is approximately 1 cm.
- the detector resolution depends on this radius R. It is the finer, the more detector elements in a column of the detector array 5 within this radius R are arranged.
- FIG. 2 shows schematically how the X-ray source 1 and the detector array 5 are fastened to a gantry (not shown) which can be rotated around the test part 4.
- a gantry (not shown) which can be rotated around the test part 4.
- the gantry is rotated about an imaging angle ⁇ about an axis parallel to the Y axis
- Detector array 5 is read out for each value of the imaging angle ⁇ , so that a 4-dimensional data set results for each imaging angle ⁇ .
- This data set S raw ( ⁇ , E, x, y) next to Angle of projection ⁇ also depends on the energy E of the X-ray quantum detected in the energy-detecting detector element and on the X and Y coordinates of the detecting detector element.
- the second step requires an estimate of the multiple scattering component. This can be obtained from measurements or photon transport simulations with typical test piece geometries. It is also possible to include this second step in the iterative construction under an estimate of the multiple-scattering component, which is based on the current object distribution.
- forward projection data stemming from an assumed material distribution whose molecular structure function is known are compared with the measured scatter data. The deviations between these two data sets are iteratively subjected to backprojections into the object space.
- An object matrix ⁇ mol is written with data of the backprojection of the data S ( ⁇ lf E 1 , X 1 , y ⁇ from the first projection into the object space taking into account the geometrical assumptions from X-ray source 1 and detector array 5, with the angular steps which were carried out in the measurement. leads by using the values of the object matrix ⁇ mol of flexibils ⁇ step.
- the difference between the forward projection data and the measured data is used in a difference matrix which is subsequently used for a back projection. Repeated iterative forward and backward projections are performed until all the image data has been used once. This procedure is repeated several times, the weighting being reduced each time until the mean square error sum of the difference matrix is no longer reduced in the next iteration step.
Landscapes
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Abstract
L'invention concerne un tomographe à rayons X assisté par ordinateur, comprenant une source de rayons X (1) qui génère un faisceau de rayons X en éventail, ainsi qu'un réseau de détecteurs bidimensionnel (5) à résolution en énergie, ces dispositifs étant placés de part et d'autre d'un support mobile de sorte que le rayonnement laser traverse intégralement une zone d'exploration et qu'une rangée d'éléments de détection (6) se situe dans le plan du faisceau en éventail (2), plusieurs autres rangées d'éléments de détection (7) se raccordant à cette première rangée dans au moins une direction perpendiculairement au faisceau en éventail (2). Pendant la mesure, aucun collimateur secondaire n'est placé entre la zone d'exploration et le réseau de détecteurs (5) et on a la relation suivante pour la largeur (B) des éléments de détection : B = ZP * arcsin (qmax * ?), qmax représentant la transmission d'impulsion, ? la longueur d'onde du rayonnement laser et ZP la distance du point de mesure au détecteur.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102004035943A DE102004035943B4 (de) | 2004-07-23 | 2004-07-23 | Röntgencomputertomograph sowie Verfahren zur Untersuchung eines Prüfteils mit einem Röntgencomputertomographen |
PCT/EP2005/008082 WO2006010588A2 (fr) | 2004-07-23 | 2005-07-25 | Tomographe a rayons x assiste par ordinateur ainsi que procede pour examiner une piece a controler a l'aide d'un tomographe a rayons x assiste par ordinateur |
Publications (1)
Publication Number | Publication Date |
---|---|
EP1774301A2 true EP1774301A2 (fr) | 2007-04-18 |
Family
ID=35509657
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP05773890A Withdrawn EP1774301A2 (fr) | 2004-07-23 | 2005-07-25 | Tomographe a rayons x assiste par ordinateur ainsi que procede pour examiner une piece a controler a l'aide d'un tomographe a rayons x assiste par ordinateur |
Country Status (5)
Country | Link |
---|---|
US (1) | US7583783B2 (fr) |
EP (1) | EP1774301A2 (fr) |
CN (1) | CN101088007A (fr) |
DE (1) | DE102004035943B4 (fr) |
WO (1) | WO2006010588A2 (fr) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8000435B2 (en) * | 2006-06-22 | 2011-08-16 | Koninklijke Philips Electronics N.V. | Method and system for error compensation |
DE102009036579A1 (de) * | 2009-08-07 | 2011-02-17 | Wenzel Volumetrik Gmbh | Röntgendetektorvorrichtung |
WO2013103408A1 (fr) | 2011-10-07 | 2013-07-11 | Duke University | Appareil d'imagerie par diffusion de rayons x à ouverture codée et procédé s'y rapportant |
US10004464B2 (en) | 2013-01-31 | 2018-06-26 | Duke University | System for improved compressive tomography and method therefor |
WO2015012850A1 (fr) * | 2013-07-25 | 2015-01-29 | Analogic Corporation | Génération de signature de diffraction d'un élément à l'intérieur d'un objet |
WO2015023741A1 (fr) | 2013-08-13 | 2015-02-19 | Duke University | Éclairage structuré pour imagerie moléculaire volumétrique |
EP3102109B1 (fr) * | 2014-06-16 | 2017-11-08 | Koninklijke Philips N.V. | Acquisition de données hybride de tomodensitométrie (tdm) |
US10987071B2 (en) * | 2017-06-29 | 2021-04-27 | University Of Delaware | Pixelated K-edge coded aperture system for compressive spectral X-ray imaging |
US10789738B2 (en) * | 2017-11-03 | 2020-09-29 | The University Of Chicago | Method and apparatus to reduce artifacts in a computed-tomography (CT) image by iterative reconstruction (IR) using a cost function with a de-emphasis operator |
WO2020028412A1 (fr) * | 2018-07-31 | 2020-02-06 | Lam Research Corporation | Détermination d'un angle d'inclinaison dans des réseaux à motifs de structures à rapport d'aspect élevé |
CN113552640A (zh) * | 2020-04-02 | 2021-10-26 | 同方威视技术股份有限公司 | 射线检查系统及散射校正方法 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3608965A1 (de) * | 1986-03-18 | 1987-10-01 | Philips Patentverwaltung | Verfahren zur bestimmung der raeumlichen struktur in einer schicht eines untersuchungsbereiches |
US5319547A (en) * | 1990-08-10 | 1994-06-07 | Vivid Technologies, Inc. | Device and method for inspection of baggage and other objects |
DE4101544A1 (de) * | 1991-01-19 | 1992-07-23 | Philips Patentverwaltung | Roentgengeraet |
US5414623A (en) * | 1992-05-08 | 1995-05-09 | Iowa State University Research Foundation | Optoelectronic system for implementation of iterative computer tomography algorithms |
DE4441843A1 (de) * | 1994-11-24 | 1996-05-30 | Philips Patentverwaltung | Anordnung zum Messen des Impulsübertragungsspektrums von elastisch gestreuten Röntgenquanten |
GB2297835A (en) * | 1995-02-08 | 1996-08-14 | Secr Defence | Three dimensional detection of contraband using x rays |
US5717733A (en) * | 1995-05-31 | 1998-02-10 | Quanta Vision, Inc. | X-ray and neutron diffractometric imaging of the internal structure of objects |
RU2145485C1 (ru) * | 1998-03-12 | 2000-02-20 | Кванта Вижн, Инк. | Ультрамалоугловая рентгеновская томография |
DE19947537A1 (de) * | 1999-10-02 | 2001-04-05 | Philips Corp Intellectual Pty | Gitter zur Absorption von Röntgenstrahlung |
DE10009285A1 (de) * | 2000-02-28 | 2001-08-30 | Philips Corp Intellectual Pty | Computertomograph zur Ermittlung des Impulsübertrags-Spektrums in einem Untersuchungsbereich |
US6535571B2 (en) * | 2000-03-27 | 2003-03-18 | Siemens Aktiengesellschaft | Detector for an X-ray computed tomography apparatus |
DE10055739B4 (de) * | 2000-11-10 | 2006-04-27 | Siemens Ag | Streustrahlungskorrekturverfahren für eine Röntgen-Computertomographieeinrichtung |
DE50100675D1 (de) * | 2001-03-14 | 2003-10-30 | Yxlon Int X Ray Gmbh | Anordnung zum Messen des Impulsübertragungsspektrums von in einem Untersuchungsbereich für Behältnisse elastisch gestreuten Röntgenquanten |
JP4216078B2 (ja) * | 2001-04-03 | 2009-01-28 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | パルス運動量移動スペクトルを決定するコンピュータ断層撮影装置 |
US6751288B1 (en) * | 2002-10-02 | 2004-06-15 | The United States Of America As Represented By The United States Department Of Energy | Small angle x-ray scattering detector |
DE10252662A1 (de) * | 2002-11-11 | 2004-05-27 | Philips Intellectual Property & Standards Gmbh | Computertomographie-Verfahren mit kohärenten Streustrahlen und Computertomograph |
WO2004105610A1 (fr) * | 2003-05-28 | 2004-12-09 | Philips Intellectual Property & Standards Gmbh | Tomodensitometrie par diffusion coherente d'un faisceau en eventail |
US20070019782A1 (en) * | 2003-10-14 | 2007-01-25 | Udo Van Stevendaal | Fan-beam coherent-scatter computed tomography |
-
2004
- 2004-07-23 DE DE102004035943A patent/DE102004035943B4/de not_active Expired - Fee Related
-
2005
- 2005-07-25 WO PCT/EP2005/008082 patent/WO2006010588A2/fr active Application Filing
- 2005-07-25 EP EP05773890A patent/EP1774301A2/fr not_active Withdrawn
- 2005-07-25 CN CNA2005800322606A patent/CN101088007A/zh active Pending
-
2007
- 2007-01-22 US US11/625,429 patent/US7583783B2/en not_active Expired - Fee Related
Non-Patent Citations (1)
Title |
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See references of WO2006010588A2 * |
Also Published As
Publication number | Publication date |
---|---|
DE102004035943B4 (de) | 2007-11-08 |
CN101088007A (zh) | 2007-12-12 |
US7583783B2 (en) | 2009-09-01 |
WO2006010588A2 (fr) | 2006-02-02 |
US20070153970A1 (en) | 2007-07-05 |
WO2006010588A3 (fr) | 2006-03-30 |
DE102004035943A1 (de) | 2006-02-16 |
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