EP1772874A3 - Diaphragme orienté vers le foyer - Google Patents

Diaphragme orienté vers le foyer Download PDF

Info

Publication number
EP1772874A3
EP1772874A3 EP06121864A EP06121864A EP1772874A3 EP 1772874 A3 EP1772874 A3 EP 1772874A3 EP 06121864 A EP06121864 A EP 06121864A EP 06121864 A EP06121864 A EP 06121864A EP 1772874 A3 EP1772874 A3 EP 1772874A3
Authority
EP
European Patent Office
Prior art keywords
aperture
focal point
absorption cylinder
cylinder
point oriented
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP06121864A
Other languages
German (de)
English (en)
Other versions
EP1772874B1 (fr
EP1772874A2 (fr
Inventor
Dr. Rer. Nat. Kurt Osterloh
Prof. Dr. Uwe Ewert
Heinz-Jürgen KNISCHEK
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bundesanstalt fuer Materialforschung und Pruefung BAM
Original Assignee
Bundesanstalt fuer Materialforschung und Pruefung BAM
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bundesanstalt fuer Materialforschung und Pruefung BAM filed Critical Bundesanstalt fuer Materialforschung und Pruefung BAM
Publication of EP1772874A2 publication Critical patent/EP1772874A2/fr
Publication of EP1772874A3 publication Critical patent/EP1772874A3/fr
Application granted granted Critical
Publication of EP1772874B1 publication Critical patent/EP1772874B1/fr
Not-in-force legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Beam Exposure (AREA)
  • Powder Metallurgy (AREA)
  • Gas Separation By Absorption (AREA)
  • Surgical Instruments (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
EP06121864A 2005-10-06 2006-10-06 Diaphragme orienté vers le foyer Not-in-force EP1772874B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102005048519A DE102005048519A1 (de) 2005-10-06 2005-10-06 Brennpunktorientierte Blende

Publications (3)

Publication Number Publication Date
EP1772874A2 EP1772874A2 (fr) 2007-04-11
EP1772874A3 true EP1772874A3 (fr) 2007-08-22
EP1772874B1 EP1772874B1 (fr) 2009-01-14

Family

ID=37769388

Family Applications (1)

Application Number Title Priority Date Filing Date
EP06121864A Not-in-force EP1772874B1 (fr) 2005-10-06 2006-10-06 Diaphragme orienté vers le foyer

Country Status (3)

Country Link
EP (1) EP1772874B1 (fr)
AT (1) ATE421151T1 (fr)
DE (2) DE102005048519A1 (fr)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007057261B3 (de) * 2007-11-26 2009-08-06 BAM Bundesanstalt für Materialforschung und -prüfung Vorrichtung und Verfahren zur Herstellung von Schlitzblenden
DE102009021750B4 (de) * 2009-05-12 2013-01-17 BAM Bundesanstalt für Materialforschung und -prüfung Schwenkbar bewegliche Schlitzblendenvorrichtung
EP2333786B1 (fr) 2009-12-08 2012-02-15 BAM Bundesanstalt für Materialforschung und -prüfung Diaphragme à fente asymétrique ainsi que dispositif et procédé de sa fabrication
BR112012023116A2 (pt) * 2010-03-14 2016-05-24 Rapiscan Systems Inc sistema de exame de pessoal
JP2013522622A (ja) 2010-03-14 2013-06-13 ラピスカン システムズ、インコーポレイテッド ビーム形成装置
CN102565110B (zh) * 2010-12-31 2015-04-01 同方威视技术股份有限公司 一种背散射成像用射线束的扫描装置和方法
CN103728326A (zh) * 2010-12-31 2014-04-16 同方威视技术股份有限公司 一种背散射成像用射线束的扫描装置和方法
CN103776847B (zh) * 2012-10-24 2016-04-27 清华大学 射线发射装置和成像系统
US11280898B2 (en) 2014-03-07 2022-03-22 Rapiscan Systems, Inc. Radar-based baggage and parcel inspection systems
KR20170109533A (ko) 2014-11-25 2017-09-29 라피스캔 시스템스, 인코포레이티드 지능형 보안관리시스템
DE102015008272A1 (de) 2015-06-18 2016-12-22 Kurt Osterloh Schlitzblendensystem für bildgebende Verfahren mit harter Strahlung
US10082473B2 (en) 2015-07-07 2018-09-25 General Electric Company X-ray filtration
DE102016004624A1 (de) 2016-04-13 2017-10-19 Kurt Osterloh Das Gammaauge: Ein Gerät zur Abbildung hochenergetisch strahlender Objekte
CN105810281A (zh) * 2016-05-03 2016-07-27 北京华力兴科技发展有限责任公司 斩波器和背散射成像装置
US10720300B2 (en) 2016-09-30 2020-07-21 American Science And Engineering, Inc. X-ray source for 2D scanning beam imaging
DE102017005302A1 (de) 2017-05-30 2018-12-06 Kurt Osterloh Gestaltung einer Gammakamera mit einem rotierenden Kollimator zur Darstellung strahlender Objekte
CN113936838B (zh) * 2021-10-11 2023-09-26 散裂中子源科学中心 一种两级定位中子光阑切换机构

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4031401A (en) * 1975-03-14 1977-06-21 American Science & Engineering, Inc. Radiant energy imaging scanning
JPS5293384A (en) * 1976-01-31 1977-08-05 Shimadzu Corp Radiation collimeter for segmental scanning
EP0074021A1 (fr) * 1981-09-07 1983-03-16 Siemens Aktiengesellschaft Appareil d'examen radiologique
EP0311177A2 (fr) * 1987-10-05 1989-04-12 Philips Patentverwaltung GmbH Système pour examiner un corps avec une source de rayonnement
EP0357146A2 (fr) * 1988-09-01 1990-03-07 Philips Patentverwaltung GmbH Dispositif pour générer un faisceau de rayons X ou gamma de petite section transversale et de direction variable
EP0389033A2 (fr) * 1989-03-18 1990-09-26 Philips Patentverwaltung GmbH Dispositif pour la génération d'une radiation X ou gamma à faible section et position variable
FR2790100A1 (fr) * 1999-02-24 2000-08-25 Commissariat Energie Atomique Detecteur bidimensionnel de rayonnements ionisants et procede de fabrication de ce detecteur
WO2002082065A2 (fr) * 2001-04-03 2002-10-17 Koninklijke Philips Electronics N.V. Appareil de tomographie assistee par ordinateur permettant de determiner le spectre de transfert d'impulsion

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4031401A (en) * 1975-03-14 1977-06-21 American Science & Engineering, Inc. Radiant energy imaging scanning
JPS5293384A (en) * 1976-01-31 1977-08-05 Shimadzu Corp Radiation collimeter for segmental scanning
EP0074021A1 (fr) * 1981-09-07 1983-03-16 Siemens Aktiengesellschaft Appareil d'examen radiologique
EP0311177A2 (fr) * 1987-10-05 1989-04-12 Philips Patentverwaltung GmbH Système pour examiner un corps avec une source de rayonnement
EP0357146A2 (fr) * 1988-09-01 1990-03-07 Philips Patentverwaltung GmbH Dispositif pour générer un faisceau de rayons X ou gamma de petite section transversale et de direction variable
EP0389033A2 (fr) * 1989-03-18 1990-09-26 Philips Patentverwaltung GmbH Dispositif pour la génération d'une radiation X ou gamma à faible section et position variable
FR2790100A1 (fr) * 1999-02-24 2000-08-25 Commissariat Energie Atomique Detecteur bidimensionnel de rayonnements ionisants et procede de fabrication de ce detecteur
US20050092928A1 (en) * 1999-02-24 2005-05-05 Commissariat A L'energie Atomique Bidimensional detector of ionizing radiation and manufacturing process for this detector
WO2002082065A2 (fr) * 2001-04-03 2002-10-17 Koninklijke Philips Electronics N.V. Appareil de tomographie assistee par ordinateur permettant de determiner le spectre de transfert d'impulsion

Also Published As

Publication number Publication date
EP1772874B1 (fr) 2009-01-14
EP1772874A2 (fr) 2007-04-11
DE502006002637D1 (de) 2009-03-05
ATE421151T1 (de) 2009-01-15
DE102005048519A1 (de) 2007-04-19

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