EP1756329A1 - Plasma enhanced chemical vapor deposition of metal oxide - Google Patents
Plasma enhanced chemical vapor deposition of metal oxideInfo
- Publication number
- EP1756329A1 EP1756329A1 EP05747858A EP05747858A EP1756329A1 EP 1756329 A1 EP1756329 A1 EP 1756329A1 EP 05747858 A EP05747858 A EP 05747858A EP 05747858 A EP05747858 A EP 05747858A EP 1756329 A1 EP1756329 A1 EP 1756329A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- oxide
- precursor
- metal
- metal oxide
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 229910044991 metal oxide Inorganic materials 0.000 title claims abstract description 29
- 150000004706 metal oxides Chemical group 0.000 title claims abstract description 29
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 title claims description 9
- 239000000758 substrate Substances 0.000 claims abstract description 50
- 238000000576 coating method Methods 0.000 claims abstract description 20
- 239000011248 coating agent Substances 0.000 claims abstract description 17
- 239000007800 oxidant agent Substances 0.000 claims abstract description 15
- 230000004888 barrier function Effects 0.000 claims abstract description 10
- 239000012702 metal oxide precursor Substances 0.000 claims abstract description 9
- 239000002243 precursor Substances 0.000 claims description 29
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 24
- 238000000034 method Methods 0.000 claims description 22
- 238000000151 deposition Methods 0.000 claims description 21
- 239000003570 air Substances 0.000 claims description 13
- 229920003023 plastic Polymers 0.000 claims description 12
- 239000004033 plastic Substances 0.000 claims description 12
- 239000011787 zinc oxide Substances 0.000 claims description 12
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 6
- HQWPLXHWEZZGKY-UHFFFAOYSA-N diethylzinc Chemical group CC[Zn]CC HQWPLXHWEZZGKY-UHFFFAOYSA-N 0.000 claims description 6
- 125000005375 organosiloxane group Chemical group 0.000 claims description 5
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims description 5
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 claims description 4
- SDTDHTCWRNVNAJ-UHFFFAOYSA-L dimethyltin(2+);diacetate Chemical compound CC(=O)O[Sn](C)(C)OC(C)=O SDTDHTCWRNVNAJ-UHFFFAOYSA-L 0.000 claims description 4
- 229910001887 tin oxide Inorganic materials 0.000 claims description 4
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 claims description 4
- 229910052726 zirconium Inorganic materials 0.000 claims description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 3
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims description 3
- OTRPZROOJRIMKW-UHFFFAOYSA-N triethylindigane Chemical compound CC[In](CC)CC OTRPZROOJRIMKW-UHFFFAOYSA-N 0.000 claims description 3
- IBEFSUTVZWZJEL-UHFFFAOYSA-N trimethylindium Chemical compound C[In](C)C IBEFSUTVZWZJEL-UHFFFAOYSA-N 0.000 claims description 3
- ZOIORXHNWRGPMV-UHFFFAOYSA-N acetic acid;zinc Chemical compound [Zn].CC(O)=O.CC(O)=O ZOIORXHNWRGPMV-UHFFFAOYSA-N 0.000 claims description 2
- 239000012080 ambient air Substances 0.000 claims description 2
- AXAZMDOAUQTMOW-UHFFFAOYSA-N dimethylzinc Chemical compound C[Zn]C AXAZMDOAUQTMOW-UHFFFAOYSA-N 0.000 claims description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical group [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims description 2
- 239000004246 zinc acetate Substances 0.000 claims description 2
- NRINZBKAERVHFW-UHFFFAOYSA-L zinc;dicarbamate Chemical compound [Zn+2].NC([O-])=O.NC([O-])=O NRINZBKAERVHFW-UHFFFAOYSA-L 0.000 claims description 2
- NHXVNEDMKGDNPR-UHFFFAOYSA-N zinc;pentane-2,4-dione Chemical compound [Zn+2].CC(=O)[CH-]C(C)=O.CC(=O)[CH-]C(C)=O NHXVNEDMKGDNPR-UHFFFAOYSA-N 0.000 claims description 2
- 229910000420 cerium oxide Inorganic materials 0.000 claims 1
- ITZXULOAYIAYNU-UHFFFAOYSA-N cerium(4+) Chemical compound [Ce+4] ITZXULOAYIAYNU-UHFFFAOYSA-N 0.000 claims 1
- 239000011261 inert gas Substances 0.000 claims 1
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 claims 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 claims 1
- 229910001928 zirconium oxide Inorganic materials 0.000 claims 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 19
- 239000004417 polycarbonate Substances 0.000 description 15
- 229920000515 polycarbonate Polymers 0.000 description 15
- 239000007789 gas Substances 0.000 description 13
- 230000008021 deposition Effects 0.000 description 11
- 239000000203 mixture Substances 0.000 description 11
- 239000011521 glass Substances 0.000 description 8
- 229910052757 nitrogen Inorganic materials 0.000 description 7
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 6
- 229910001873 dinitrogen Inorganic materials 0.000 description 5
- 238000004626 scanning electron microscopy Methods 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 229910052684 Cerium Inorganic materials 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 3
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- -1 polypropylenes Polymers 0.000 description 3
- 239000011135 tin Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 239000012159 carrier gas Substances 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 229910052718 tin Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- 229920000089 Cyclic olefin copolymer Polymers 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229940123973 Oxygen scavenger Drugs 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Natural products C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 1
- 239000004433 Thermoplastic polyurethane Substances 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical group [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 229910002091 carbon monoxide Inorganic materials 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000009477 glass transition Effects 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 229920001903 high density polyethylene Polymers 0.000 description 1
- 239000004700 high-density polyethylene Substances 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 229920001684 low density polyethylene Polymers 0.000 description 1
- 239000000395 magnesium oxide Substances 0.000 description 1
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 1
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 239000010955 niobium Substances 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 229920002285 poly(styrene-co-acrylonitrile) Polymers 0.000 description 1
- 229920001707 polybutylene terephthalate Polymers 0.000 description 1
- 229920006289 polycarbonate film Polymers 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 1
- UHUUYVZLXJHWDV-UHFFFAOYSA-N trimethyl(methylsilyloxy)silane Chemical compound C[SiH2]O[Si](C)(C)C UHUUYVZLXJHWDV-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- 239000004711 α-olefin Substances 0.000 description 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/407—Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/405—Oxides of refractory metals or yttrium
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
Definitions
- the present invention relates to plasma enhanced chemical vapor deposition of a metal oxide onto a substrate, particularly a plastic substrate.
- Metal oxide films are deposited onto glass substrates for a variety of applications.
- Shiozaki et al. describes a method for depositing a transparent electroconductive zinc oxide film onto the rear surface of a photoelectric converter using magnetron sputtering under high vacuum (2.2 mtorr).
- Siddle et al. describes a process for producing an electrically conductive low emissivity coating on a glass substrate comprising 1) depositing a reflective metal layer onto the substrate, then 2) reactive sputter depositing a metal oxide layer over the reflective metal layer in the presence of an oxygen scavenger, then 3) heat treating the substrate to 400° C to 720° C.
- the metal oxide is described as being an oxide of tin, zinc, tungsten, nickel, molybdenum, manganese, zirconium, vanadium, niobium, tantalum, cerium, or titanium or mixtures thereof.
- Woo in U.S. 6,603,033, describes the preparation of organotitanium precursors that can be used for metal-organic chemical vapor deposition (MOCND).
- MOCND metal-organic chemical vapor deposition
- the thin film of titanium oxide was described as being formed on a glass substrate that was heated to 375°C to 475° C.
- Hitchman et al. in WO 00/47797, describes the deposition of thin films of rutile titanium dioxide onto a variety of substrates including glass, sapphire, steel, aluminum, and magnesium oxide, at temperatures as low as 268° C, but at reduced pressures (1 torr).
- deposition of metal oxides onto temperature-resistant substrates such as glass can be carried out at relatively high temperatures without degrading the glass.
- significantly lower temperatures would be required to deposit a metal oxide onto a plastic substrate.
- the present invention addresses a need in the art by providing a method comprising the steps of 1) carrying a metal-oxide precursor through a corona discharge or a dielectric barrier discharge in the presence of an oxidizing agent to convert the precursor to a metal oxide by plasma enhanced chemical vapor deposition (PECND), and 2) depositing the metal oxide onto a substrate.
- a method comprising the steps of 1) carrying a metal-oxide precursor through a corona discharge or a dielectric barrier discharge in the presence of an oxidizing agent to convert the precursor to a metal oxide by plasma enhanced chemical vapor deposition (PECND), and 2) depositing the metal oxide onto a substrate.
- PECND plasma enhanced chemical vapor deposition
- organosiloxane and SiOx coating may be sequentially deposited or codeposited with metal oxides providing multilayer and/or composite compositions on the substrate.
- Fig. 1 illustrates a corona discharge method of generating and depositing a metal oxide on a substrate.
- Fig. 2 illustrates a dielectric barrier discharge device.
- the present invention is a method for depositing a metal oxide onto a substrate using plasma enhanced chemical vapor deposition.
- a metal-organic precursor is carried through a corona discharge or a dielectric barrier discharge in the presence of an oxidizing agent and preferably a carrier gas.
- the discharge converts the precursor to a metal oxide, which is deposited on a substrate.
- metal-oxide precursor refers to a material capable of forming a metal oxide when subjected to plasma enhanced chemical vapor deposition (PECND).
- metal-oxide precursors examples include diethyl zinc, dimethyl zinc, zinc acetate, titanium tetrachloride, dimethyltin diacetate, zinc acetylacetonate, zirconium hexafluoroacetylacetonate, zinc carbamate, trimethyl indium, triethyl indium, cerium (IN) (2,2,6,6-tetramethyl-3,5-heptanedionate), and mixtures thereof.
- metal oxides include oxides of zinc, tin, titanium, indium, cerium, and zirconium, and mixtures thereof.
- An example of a particularly useful mixed oxide is indium-tin-oxide (ITO), which can be used as a transparent conductive oxide for electronic applications.
- ITO indium-tin-oxide
- the method of the present invention can be advantageously carried out using well known corona discharge technology as illustrated in Fig. la.
- the headspace from precursor (10), a carrier for the precursor, and the oxidizing agent is flowed into the jet (20) through a first gas intake (30) and corona discharge (40) - which breaks down gas between two electrodes 50(a) and 50(b) - to form the metal oxide, which is deposited on the substrate (60), preferably a plastic substrate that is heated to impart order thereto.
- the plastic is advantageously maintained at a temperature near its T g , preferably not exceeding 50 C° higher than its T g , prior to and during the deposition of the metal oxide.
- the method is preferably carried out at or near atmospheric pressure, typically in the range of 700 - 800 torr.
- the carrier for the precursor is typically nitrogen, helium, or argon, with nitrogen being preferred;
- the oxidizing agent is an oxygen containing gas such as O 2 , ⁇ 2 O, air, O 3 , CO , NO, or N O , with air being preferred. If the precursor is highly reactive with the oxidizing agent - for example, if the precursor is pyrophoric - it is preferred to separate the oxidizing agent from the precursor, as depicted in Fig. lb.
- carrier and precursor are flowed through a second gas intake (70) situated just above the corona discharge (40) and the oxidizing agent is flowed through the first intake (30).
- a second carrier may be used to further dilute the concentration of the precursor prior to introduction into the jet (20).
- the oxidizing agent may not need to be affirmatively provided to the corona discharge or dielectric barrier discharge region if it is available to the region through the ambient air.
- the corona discharge (40) is preferably maintained at a voltage in the range of about 2 - 20 kN.
- the distance between the corona discharge (40) and the substrate (60) typically varies from about 1mm to 50 mm.
- the precursor can be delivered to the jet by partially filling a container with precursor to leave a headspace and sweeping the headspace with the carrier into the jet (10).
- the container can be heated, if necessary, to generate the desirable vapor pressure for the precursor.
- the precursor is moisture- or air-sensitive or both, it is preferable to hold the precursor in a substantially moisture-free and oxygen-free container.
- Dielectric barrier discharge also known as “silent” and “atmospheric-pressure- glow” discharges, can also be used to carry out the process of the present invention.
- Fig. 2 illustrates a schematic of a dielectric barrier discharge device (100), which comprises two metal electrodes (110 and 120) in which at least one is coated with a dielectric layer (130) superposed by a substrate (150).
- the gap between the electrodes (110 and 120) typically ranges from 1 to 100 mm and the applied voltage is on the order of 10-50 kN.
- the plasma (140) is generated through a series of micro-arcs that last for about 10-100 ns and that are randomly distributed in space and time.
- the concentration of the precursor in the total gas mixture (the precursor, the oxidizing agent, and the carrier gas) is preferably in the range of 10 ppm to 1% v/v.
- the flow rate of the precursor is preferably in the range of 0.1-10 seem and the flow rate of the oxidizing agent is preferably in the range of 10-100 scfin (2.7 x 10 5 to 2.7 x 10 6 seem).
- the thickness of the coating on the substrate is application dependent but is typically in the range! of 10 nm to 1 ⁇ m.
- the substrate is not limited but is preferably a plastic, examples of which include polycarbonates, polyurethanes, thermoplastic polyurethanes, poly(methylmefhacrylates), polypropylenes, low density polyethylenes, high density polyethylene, ethylene-alpha- olefin copolymers, styrene (co)polymers, styrene-acrylonitrile copolymers, polyethylene terephthalates, and polybutylene terephthalates.
- the method of the present invention can provide UN blocking coatings for plastic substrates at low temperature and at or near atmospheric pressure. The following examples are for illustrative purposes only and not intended to limit the scope of the invention.
- Dimethyltin diacetate was placed in a closed precursor reservoir and heated to 62° C. Nitrogen gas was passed through the reservoir at 3000 seem and combined with a stream of air passed at 15 scfin (420,000 seem). The outcoming gas line of the reservoir was heated to 70° C. The total gas mixture was passed tlirough a PLASM A- JET® corona discharge (available from Corotec Corp., Farmington, CT., electrode spacing of 1 cm) directed at a polycarbonate substrate. After 10 min., a clear monolithic coating of tin oxide was formed as evidenced by scanning electron microscopy and x-ray photoelectron spectroscopy (XPS).
- XPS x-ray photoelectron spectroscopy
- Titanium tetrachloride was placed in a closed precursor reservoir and cooled to 0° C. Nitrogen gas was flowed through the reservoir at 600 seem and combined with a stream of dry (TOC grade) air passed at 20 scfin (570,000 seem). The total gas mixture was passed through the plasma jet device directed at a polycarbonate substrate. After 8 min., a clear monolithic coating of titanium oxide was formed as evidenced by scanning electron microscopy and XPS.
- Example 3 Deposition of Zinc Oxide on a Polycarbonate Substrate
- Diethyl zinc was placed in a closed precursor reservoir. Nitrogen gas was passed through the reservoir at 150 seem and combined with another stream of nitrogen passed at 3500 seem. This gas mixture was introduced into a stream of air plasma generated by the plasma jet device and directed onto the polycarbonate substrate. The flow rate of the air (TOC grade) was 20 scfin (570,000 seem). After 10 min., a clear coating of zinc oxide was formed as evidenced by scanning electron microscopy and XPS.
- Example 4 Deposition of a UN absorbing Zinc Oxide on a Polycarbonate Substrate Diethyl zinc was placed in a closed precursor reservoir. Nitrogen gas was passed through the reservoir at lOOsccm and combined with another stream of nitrogen passed at 3800 seem. This gas mixture was introduced into a stream of air plasma generated by the plasma jet device and directed onto the polycarbonate substrate. The flow rate of the air (low humidity conditioned air) was 15 scfin (570,000sccm). The applied power to the electrodes was 720 W and the distance from jet to substrate was 20 mm. After 15 min, a clear coating of zinc oxide about 0.6 ⁇ m thick was formed on a polycarbonate sheet as evidenced by scanning electron microscopy and XPS.
- Nitrogen gas was passed through the reservoir at lOOsccm and combined with another stream of nitrogen passed at 3800 seem. This gas mixture was introduced into a stream of air plasma generated by the plasma jet device and directed onto the polycarbonate substrate. The flow rate of the air (low humidity conditioned
- the polycarbonate sheet (T g - 150° C) was heated to a temperature of 180° C to induce crystallinity in the coating, as evidenced by XRD analysis.
- Zinc oxide coatings were in tact after 1000 hours of QUV-B weathering tests according to ASTM G53-96. Coatings exhibited yellow Index ⁇ 5 and ⁇ 18% Delta Haze, 85% light transmission and a UN absorption cutoff of about 360 nm.
- Example 5 Deposition of Zinc Oxide Using a Dielectric Barrier Discharge on a Polycarbonate Substrate
- Diethylzinc was placed in a closed reservoir. Nitrogen gas was passed through the reservoir at 150sccm and combined with another stream of nitrogen at 60scfm. This gas mixture was introduced downstream and mixed with air prior to exiting the electrode into the discharge zone, which contacts the polycarbonate substrate. The flow rate of air was 11357sccm. The applied power to the electrodes was 1 ,000W and a distance from electrode to substrate was about 4mm. After lOmin, a clear coating of zinc oxide was formed on a polycarbonate film as evidenced by scanning electron microscopy and XPS.
- An organosiloxane coating similar to NPP according to patent US 5,718.967. was deposited onto a polycarbonate substrate.
- the precursor tetramethyldisiloxane flowing at 6000sccm is mixed with ⁇ 2O at a flowrate of lOOOsccm.
- This gas mixture was introduced into a stream of nitrogen plasma generated by the plasma jet device and directed onto the polycarbonate substrate.
- a balance gas of nitrogen is passed at a flowrate of 25 scfin.
- the applied power to the electrodes was 78W and the distance from jet to substrate was 5 mm.
- a Zinc Oxide coating was deposited on top of the organosiloxane coating according to Example 4.
- another organosiloxane layer was deposited on top of the Zinc Oxide layer.
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Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US57281304P | 2004-05-20 | 2004-05-20 | |
| PCT/US2005/017747 WO2005113856A1 (en) | 2004-05-20 | 2005-05-20 | Plasma enhanced chemical vapor deposition of metal oxide |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP1756329A1 true EP1756329A1 (en) | 2007-02-28 |
Family
ID=34970263
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP05747858A Withdrawn EP1756329A1 (en) | 2004-05-20 | 2005-05-20 | Plasma enhanced chemical vapor deposition of metal oxide |
Country Status (10)
| Country | Link |
|---|---|
| EP (1) | EP1756329A1 (en) |
| JP (1) | JP2007538159A (en) |
| KR (1) | KR20070012718A (en) |
| CN (1) | CN1957109A (en) |
| BR (1) | BRPI0510823A (en) |
| CA (1) | CA2562914A1 (en) |
| MX (1) | MXPA06013380A (en) |
| RU (1) | RU2006145309A (en) |
| SG (1) | SG151324A1 (en) |
| WO (1) | WO2005113856A1 (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7736698B2 (en) * | 2006-05-05 | 2010-06-15 | Pilkington Group Limited | Method of depositing zinc oxide coatings on a substrate |
| WO2008137588A1 (en) * | 2007-05-01 | 2008-11-13 | Exatec, Llc | Edge healing and field repair of plasma coating |
| DE102007025151A1 (en) * | 2007-05-29 | 2008-09-04 | Innovent E.V. | Coating method comprises producing plasma jet from process gas and introducing precursor material into it, coating being deposited from jet on to substrate or existing coating on it and substrate being heated |
| EP2145978A1 (en) | 2008-07-16 | 2010-01-20 | AGC Flat Glass Europe SA | Method and installation for depositing layers on a substrate |
| EP2145979A1 (en) | 2008-07-16 | 2010-01-20 | AGC Flat Glass Europe SA | Method and installation for depositing layers on both sides of a substrate simultaneously |
| ES2335638B1 (en) * | 2008-08-01 | 2011-02-09 | Cosentino, S.A. | ARTICLE IN THE FORM OF A TABLE OR Slab MANUFACTURED OF PETREO AGLOMERATE COATED WITH TRANSPARENT THIN SHEETS OF TIO2 OR ZNO THROUGH DRY DEPOSITION TECHNIQUES WITH HIGH RESISTANCE AGAINST SOLAR DEGRADATION. |
| JP2010250088A (en) * | 2009-04-16 | 2010-11-04 | Konica Minolta Business Technologies Inc | Intermediate transfer member, method for manufacturing intermediate transfer member, and image forming apparatus |
| KR101133250B1 (en) * | 2009-09-29 | 2012-04-05 | 부산대학교 산학협력단 | manufacturing mathod of transparency electrode using polymer substrate atmosphere plasma treated |
| DE102012003943B4 (en) * | 2012-02-24 | 2017-09-14 | Innovent E.V. Technologieentwicklung | Process for the preparation of antibacterial nanosheets on threads or textile materials in the form of woven, knitted or nonwoven fabric, product produced by this process and its use |
| DE102014118487A1 (en) * | 2014-12-12 | 2016-06-16 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Method for depositing a transparent multi-layer system with scratch-resistant properties |
| KR20250122490A (en) | 2022-12-14 | 2025-08-13 | 바스프 코팅스 게엠베하 | Multilayer barrier film coated polymer substrate, its preparation and use in electronic devices |
| WO2026027436A1 (en) | 2024-07-30 | 2026-02-05 | Basf Coatings Gmbh | Use of lithium containing compounds in vapor deposition and precursors for vapor deposition |
| EP4687175A1 (en) | 2024-07-30 | 2026-02-04 | BASF Coatings GmbH | Multilayer film coated lithium substrate, its manufacture and use in secondary batteries |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6457767A (en) * | 1987-08-28 | 1989-03-06 | Seiko Epson Corp | Josephson effect element |
| JPH07506850A (en) * | 1991-12-23 | 1995-07-27 | アクゾ ノーベル ナムローゼ フェンノートシャップ | Blend of polyethylene terephthalate matrix and thermotropic liquid crystal block copolymer |
| JP4024546B2 (en) * | 2002-01-25 | 2007-12-19 | 住友ベークライト株式会社 | Method for producing film with inorganic thin film |
| GB0217553D0 (en) * | 2002-07-30 | 2002-09-11 | Sheel David W | Titania coatings by CVD at atmospheric pressure |
-
2005
- 2005-05-20 KR KR1020067024137A patent/KR20070012718A/en not_active Withdrawn
- 2005-05-20 WO PCT/US2005/017747 patent/WO2005113856A1/en not_active Ceased
- 2005-05-20 SG SG200902158-5A patent/SG151324A1/en unknown
- 2005-05-20 RU RU2006145309/02A patent/RU2006145309A/en unknown
- 2005-05-20 EP EP05747858A patent/EP1756329A1/en not_active Withdrawn
- 2005-05-20 BR BRPI0510823-3A patent/BRPI0510823A/en not_active Application Discontinuation
- 2005-05-20 MX MXPA06013380A patent/MXPA06013380A/en unknown
- 2005-05-20 JP JP2007527479A patent/JP2007538159A/en not_active Withdrawn
- 2005-05-20 CA CA002562914A patent/CA2562914A1/en not_active Abandoned
- 2005-05-20 CN CNA2005800162132A patent/CN1957109A/en active Pending
Non-Patent Citations (1)
| Title |
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| See references of WO2005113856A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CA2562914A1 (en) | 2005-12-01 |
| MXPA06013380A (en) | 2007-01-23 |
| KR20070012718A (en) | 2007-01-26 |
| WO2005113856A1 (en) | 2005-12-01 |
| JP2007538159A (en) | 2007-12-27 |
| SG151324A1 (en) | 2009-04-30 |
| CN1957109A (en) | 2007-05-02 |
| BRPI0510823A (en) | 2007-12-26 |
| RU2006145309A (en) | 2008-06-27 |
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