EP1738144A1 - Spectrometre de fourier a miroir modulable integre sur un substrat et capteur a balayage d'ondes stationnaires et procede de fabrication associe - Google Patents

Spectrometre de fourier a miroir modulable integre sur un substrat et capteur a balayage d'ondes stationnaires et procede de fabrication associe

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Publication number
EP1738144A1
EP1738144A1 EP05744320A EP05744320A EP1738144A1 EP 1738144 A1 EP1738144 A1 EP 1738144A1 EP 05744320 A EP05744320 A EP 05744320A EP 05744320 A EP05744320 A EP 05744320A EP 1738144 A1 EP1738144 A1 EP 1738144A1
Authority
EP
European Patent Office
Prior art keywords
sensor
input signal
layer
mirror
transparent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP05744320A
Other languages
German (de)
English (en)
Inventor
Dietmar Knipp
Helmut Stiebig
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Forschungszentrum Juelich GmbH
Original Assignee
Forschungszentrum Juelich GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Forschungszentrum Juelich GmbH filed Critical Forschungszentrum Juelich GmbH
Publication of EP1738144A1 publication Critical patent/EP1738144A1/fr
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0204—Compact construction
    • G01J1/0209—Monolithic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0256—Compact construction

Definitions

  • the present invention relates to a Fourier spectrometer for determining spectral information of an incident optical input signal and a method for producing such a Fourier spectrometer.
  • Fourier spectrometers are of interest, for example, for applications in the fields of optical measurement technology, optical communication, object recognition, biophotonics and material characterization.
  • Fourier spectrometers are typically based on Michelson interferometers or modifications of Michelson interferometers.
  • the incident light beam is divided into a measuring beam and a reference beam on a beam splitter. After the reflection at the measuring and reference mirror, the beams are superimposed in the detector arm.
  • the superposition of the two waves with the same direction of propagation leads to the formation of a standing wave.
  • the standing wave is then detected by a semiconductor sensor.
  • the two optical beam paths (measuring beam and reference beam) are perpendicular to each other. Due to the structure, the implementation of 1 D and 2D spectrometer arrays is not possible.
  • MEMS Micro Electro Mechanical System
  • Michelson interferometers are known, which are manufactured using bulk silicon technology.
  • the optical axis of the spectrometer is parallel to the substrate. It is also not possible to implement the spectrometer as a 1 D or 2D array of spectrometers.
  • a standing wave can be generated by the superimposition of two oppositely spreading rays.
  • the incident light is reflected on a modular mirror.
  • a standing wave forms in front of the mirror.
  • the standing wave is scanned by a semi-transparent sensor that is inserted into the standing wave.
  • the sensor is sufficiently transparent so that enough light passes the sensor and a standing wave is generated in front of the modulatable mirror. At the same time, the transmission of the
  • the boundary condition described above only applies to the active area of the detector and not to the total layer thickness of the detector. Accordingly, the total layer thickness of the sensor can be greater, which significantly simplifies the manufacture of the detector.
  • the condition must also be met that the sensor has sufficient transmission so that a standing wave can form in front of the mirror.
  • These semi-transparent sensors can be used as components of an interferometer or spectrometer.
  • the requirements for the sensor structure as part of a spectrometer differ significantly from the requirements for a sensor as part of an interferometer.
  • the semi-transparent sensors differ in that the sensor of the interferometer can be optimized for a fixed wavelength. This can be used, for example, to reduce losses due to reflections at layer transitions.
  • the component In the case of a spectrometer, the component must be optimized for a spectral range. Accordingly, design compromises have to be made here, since the component cannot be optimized in the same way for all wavelengths.
  • the semi-transparent sensors differ in a second point.
  • the aim of the measurement with an interferometer is to determine the change in the position of the measuring mirror (relative distance measurement) or to determine the quantities derived therefrom.
  • a second semi-transparent sensor is required, which must also be introduced into the standing wave. There must be a phase difference of 90 ° between the signals from the two sensors.
  • the same boundary condition also applies to a Michelson interferometer.
  • Two detectors are also used here to determine the direction of movement of the measuring mirror. In the case of a standing wave interferometer, this can be achieved by inserting the two semi-transparent sensors into the standing wave at a distance of 90 °.
  • a single semi-transparent sensor is sufficient for use as a spectrometer.
  • the concept of scanning a standing wave by means of a semi-transparent sensor and its use as an interferometer is known.
  • the idea of scanning a standing wave by means of a semi-transparent sensor and its use as a Fourier spectrometer is known, for example from HL Kung et al., Standing-wave transform spectrometer based on integrated MEMS mirror and thin film detector, IEEE Selected Topics in Quantum Electronics, 8, 98 (2002).
  • the spectrometer described therein uses an amorphous / polycrystalline silicon detector, which is used as a semi-transparent sensor.
  • the sensor is based on a photoconductor arrangement.
  • the sensor is operated in combination with a separate MEMS-based mirror that can be electrostatically modulated.
  • the mirror was realized using bulk silicon technology.
  • the mirror can be deflected by 65 ⁇ m, whereby a relatively high voltage of> 100V must be applied to the electrodes in order to deflect the mirror.
  • the deflection of the mirror is essential for the resolution of the spectrometer. A large deflection range is desirable, as this can improve the spectral resolution of the spectrometer.
  • the spectrometer is limited by the time
  • Photoconductor response Furthermore, the optical design of the detector is not adapted to the incident light, so that the photocurrent response of the sensor is not linear.
  • Detector and the modular mirror must be aligned with each other.
  • the alignment of the mirror and the detector perpendicular to the optical axis and parallel to one another is very time-consuming, since even a slight tilting of the mirror and the detector to one another leads to falsification of the measurement result.
  • the present invention is based on the object of specifying a Fourier spectrometer which can be smaller, more compact and more precise and which in particular can also be produced as 1-D and 2-D spectrometer arrays.
  • a suitable method for producing such a Fourier spectrometer is to be specified.
  • a Fourier spectrometer with: - a carrier layer which is permeable to the optical input signal, - a sensor applied to the carrier layer and at least partially permeable to the optical input signal for generating an electrical output signal, - one on which Reflection layer arranged on the side of the sensor facing away from the carrier layer for reflecting the incident optical input signal and for forming an optically standing wave from the incident input signal and the reflected input signal, and - a cavity arranged between the sensor and the reflection layer to enable modulation of the distance between the Sensor and the reflection layer, wherein the sensor is designed to scan the intensity of the standing wave and to form an output signal containing the spectral information of the input signal, and wherein the carrier layer t, the sensor and the reflection layer are integrated together in a semiconductor component and are aligned essentially parallel to one another and perpendicular to the incident optical input signal for generating the optically standing wave.
  • the spectrometer according to the invention thus requires no beam splitter and no reference mirror.
  • the physical principle of the spectrometer is based on the scanning of an optically standing wave in front of a reflection layer, for example a measuring mirror.
  • the standing wave is generated exclusively by superimposing the back and forth wave in front of the reflective layer.
  • the standing wave is scanned by a semi-transparent sensor (detector) which is introduced into the beam path. This reduces the structure of the spectrometer to a minimum.
  • the spectrometer thus consists of a linear arrangement of a modulatable reflection layer and a semi-transparent sensor. Both components are integrated together. Due to the linear structure of the spectrometer, these can be implemented as 1 D and 2D spectrometer arrays. Spectrometer arrays are characterized by the fact that they can determine both the location information and the spectral information. The spectral information is obtained by the Fourier transformation of the measurement signal.
  • the spectrometer according to the invention thus requires no beam splitter and no reference mirror.
  • the physical principle of the spectrometer is based on the scanning of an optically standing wave in front of a reflection layer, whereby the distance between the reflection layer and the sensor can be modulated.
  • the structure proposed here differs fundamentally from known Fourier spectrometers.
  • the senor and the modulatable reflection layer can be integrated together, whereby integration here means the processing / production of a common component, which consists of a sensor and a reflection layer.
  • the spectrometer according to the invention is preferably a MEMS Fourier spectrometer. All components of the spectrometer are preferably manufactured using thin-film technology.
  • the spectrometer thus consists of a semi-transparent thin-film sensor in combination with a modulatable mirror, which is also produced using thin-film technology. Both components can therefore be easily integrated together.
  • the spectral information is obtained by the Fourier transformation of the sensor signal.
  • the sensor signal corresponds, for example, to a photocurrent.
  • the signal is generated by scanning the standing waves in front of the measuring mirror.
  • either the measuring mirror and / or the semi-transparent sensor can be modulated, with electrostatic modulation of the measuring mirror and / or the semi-transparent sensor being preferred.
  • the senor and the reflection layer are applied to the same carrier (substrate).
  • the optical axis of the spectrometer is arranged perpendicular to the substrate. This reduces the manufacturing costs because the spectrometer can already be tested during the manufacturing process.
  • 1 D and 2D spectrometer arrays can be produced on a carrier (substrate).
  • a MEMS spectrometer whose optical axis runs parallel to the substrate must first be diced (sawn) before the function of the spectrometer can be tested. This increases the manufacturing costs.
  • layer electrodes are provided for contacting the sensor and / or for applying an electrical voltage for electrostatic modulation of the distance between the sensor and the reflection layer, the layer electrodes being made of transparent conductive oxides, in particular SnO 2 , ZnO, ln 2 O 3 or
  • the semi-transparent sensor can be designed as a photoconductor, as a Schottky diode, as a pin, nip, pip, nin, npin, pnip, pinp, nipn structure or as a combination of such structures. It can also be provided that the semi-transparent sensor has at least one photoelectrically active semiconductor layer which is formed from an amorphous, microcrystalline, polycrystalline or crystalline material, in particular from the materials silicon, germanium, carbon, nitrogen, oxygen and / or alloys thereof Materials.
  • the spectrometer can be adapted to a corresponding spectral range. Carbon and oxygen and the alloys with silicon can be used in particular in the ultraviolet and in the visible range of the optical spectrum, silicon in particular in the visible range and germanium and alloys with silicon in particular in the visible and infrared spectral range.
  • optical adaptation layers are preferably provided for the optical adaptation of the Fourier spectrometer. Serve here these dielectric layers to optically adapt the sensor to the incident spectrum, so that the standing wave can pass through the semi-transparent sensor unhindered and the losses are minimized by means of reflection at the individual layers of the semi-transparent sensor.
  • the invention also relates to a Fourier spectrometer field with several Fourier spectrometers of the type described above integrated on a single, common carrier layer, arranged in a row or in an array. Only through the common integration of the sensors and the reflection layer / layers on a single carrier layer it is even possible to form such a Fourier spectrometer field on a carrier layer, with which one-dimensional or two-dimensional location information can then be detected in a simple manner in addition to the spectral information.
  • a method according to the invention for producing a Fourier spectrometer of the type according to the invention is specified in claim 10. This has the following steps: deposition of a sensor which is at least partially permeable to the optical input signal on a carrier layer which is permeable to the optical input signal for generating an electrical output signal, application of a sacrificial layer on the side of the sensor facing away from the carrier layer, application of a - Reflection layer on the side of the sacrificial layer facing away from the sensor for reflecting the incident optical input signal and for forming an optically standing wave from the incident input signal and the reflected input signal, - removing the sacrificial layer to form a cavity between the sensor and the reflective layer to enable a Modulation of the distance between the sensor and the reflection layer, the sensor being designed to scan the intensity of the standing wave and to form an output signal containing the spectral information of the input signal nals and where the carrier layer, the sensor and the reflection layer are integrated together in a semiconductor component and essentially parallel lel to each other
  • the sensor is preferably produced by means of a deposition process, in particular by means of a CVD process, sputtering process or epitaxial process. Thin-film technology and surface micromechanics are preferably used to produce the reflection layer.
  • FIG. 1 shows a first embodiment of a Fourier spectrometer according to the invention
  • FIG. 2 shows a schematic course of the optical generation rate (intensity) of the incident light for a transparent sensor as a function of the position of the modulatable mirror
  • FIG. 3 shows a second embodiment of a Fourier spectrometer according to the invention
  • FIG. 4 shows a side view of a third embodiment of a Fourier spectrometer according to the invention
  • FIG. 5 shows a top view of the third embodiment of the Fourier spectrometer according to the invention
  • FIG. 6 shows the individual process steps of the manufacturing method according to the invention for producing the Fourier spectrometer according to the invention.
  • FIG. 1 shows the schematic structure of an embodiment of the Fourier spectrometer 1 according to the invention.
  • a sensor 2 and a reflection layer 3, in particular a mirror, are applied as parallel layers on a substrate 4.
  • the semi-transparent sensor 2 is contacted by means of two transparent conductive electrodes 5 and 6.
  • a cavity 7 is formed between the sensor 2 and the mirror 3, which permits the modulation of the distance between the sensor 2 and the mirror 3, in particular the position of the mirror 3.
  • two insulation layers 8, 9 with an electrode 10 in between are arranged between the electrode 6 and the cavity 7.
  • the reflection layer 3 and the electrode 6 form a capacitor arrangement.
  • the insulation layer 8 fulfills the function of electrical insulation of the semitransparent sensor 2 and the modulatable mirror 3.
  • the insulation layer 9 prevents direct electrical contact between the electrode 10 and the reflection layer 3.
  • the light L incident perpendicular to the surface of the spectrometer 1 is partly (approximately 40-90%) transmitted by the sensor 2 and reflected on the modulatable mirror 3.
  • a standing wave is generated in front of the mirror 3.
  • the mirror 3 can be modulated electrostatically.
  • Wave can be modulated in front of the mirror 3 as a function of the applied voltage.
  • the sensor signal is modulated.
  • a structure can also be selected, with sensor 2 being modulated. In both cases there is no adjustment and precise alignment between the sensor 2 and the mirror 3, since the mirror 3 is produced together with the semi-transparent sensor 2.
  • Amorphous silicon comes into consideration as materials for the optical sensor 2.
  • Other inorganic and organic materials that are optoelectronically active can also be used as sensors.
  • the optical design of the semi-transparent sensor 2 must be adapted to the desired spectral range. Since the spectrometer 1 is intended to work over a wide spectral range, the sensor 2 can be provided with a special antireflection layer / reflecting layer (not shown). As for the sensor 2 itself, a pn or pin diode arrangement or a modified arrangement can be used for this. But it can also be one
  • the two transparent conductive electrodes 5 and 6 are preferably made of ITO (Indium Tin Oxide).
  • K1 represents the course of the optical generation without the mirror.
  • the curves K2 shown as solid lines correspond to the optical generation using the mirror.
  • the mirror has been shifted by 20nm in the calculations. It is clearly visible how the minima and maxima are pushed through the semi-transparent sensor.
  • the modulatable mirror 3 is preferably also produced using thin-film technology.
  • the cavity 7 is formed by removing a sacrificial layer, which consists, for example, of amorphous silicon or a metal.
  • the sacrificial layer is removed by wet chemical means or by means of a dry etching process.
  • the mirror was processed on the semi-transparent sensor 2.
  • the membrane of the mirror 3 can be modulated electrostatically.
  • the structured back electrode 6 of the sensor 2 can, however, also be used as a common electrode for the sensor 2 and the mirror 3.
  • the schematic structure of such an embodiment of the Fourier spectrometer according to the invention is shown in FIG.
  • the structure of this embodiment is simplified compared to the structure of the embodiment shown in FIG. 1.
  • a passivation layer / insulation layer 8 and a transparent conductive layer 6 have been dispensed with.
  • the membrane of the mirror 3 is identical in both cases. In both cases, a metal layer 3 with high reflection is applied to the passivation layer 9 (FIG. 1) and the sacrificial layer (not shown in FIG. 1 and FIG. 3 but already shown as a cavity 7). Materials such as silver, aluminum, chrome or gold are preferred for this.
  • Such a layer is typically tracked down to the existing layer sequence!
  • the roughness of the metal film is important.
  • the surface of the metal layer (border crossing cavity 7 and reflection layer 3 in FIG. 1 and FIG. 2) should be as smooth as possible.
  • An electroplating process is then typically used to apply a further metal layer. This is not shown in Figures 1 and 3.
  • the reflection layer 3 can consist of one or more layers.
  • the layers used can consist of one or more metals.
  • the reason for applying several layers is the mechanical requirements for the reflective layer. Since the reflection layer is designed as a self-supporting layer, a corresponding layer thickness is required. Layers that are thicker than 10 ⁇ m are typically used for this.
  • a first thin layer is sputtered on.
  • the rest of the layer is then applied in an electroplating process.
  • the electroplating process is characterized by the fact that significantly thicker layers can be applied in a shorter time.
  • the seal 3 can also be produced by means of an only partially transparent layer. In this case, it is necessary that a certain proportion of the light is reflected on this layer, so that a standing wave can form.
  • the advantage of such an arrangement is that the spectrometer can be operated in transmission mode. A Fourier spectrometer can thus be introduced into a beam path without, for example, having to use beam splitters which couple out part of the beam and direct it onto a spectrometer. This is of particular interest, particularly in the area of optical telecommunications.
  • Amorphous silicon can be used as a possible sacrificial layer.
  • the material can be deposited in a chemical vapor deposition (CVD) or sputtering process. After applying the reflective layer, holes are made in the reflection layer is introduced (removal of the metal layer at certain points), and the sacrificial layer is removed by wet chemical means or by means of a dry etching process, for example with xenon diflouride.
  • the mirror should preferably be able to be deflected over a wide range.
  • the deflection of the mirror is limited in addition to the design of the mirror by the thickness of the sacrificial layer.
  • other mirror designs can also be used.
  • the mechanical stress in metal films can be used for this.
  • FIG. 4 Such an embodiment is shown in FIG. 4 as a side view and in FIG. 5 as a top view.
  • Metal multi-layers are applied, which are strongly tensioned. After removing the sacrificial layer, the metal film gives way to the stress in the film.
  • the metal film has properties comparable to a spring.
  • the spring constant can be adjusted by the deposition conditions and the layer thicknesses of the metal films. This effect, which can be controlled very precisely, can be used to increase the distance between the mirror and the sensor. Studies on mirror arrays have shown this very impressively. The mirror is thus suspended from "springs".
  • FIG. 1 An embodiment of the manufacturing process for manufacturing an integrated Fourier spectrometer according to the invention, as shown in FIG. 1, is shown by way of example with reference to FIG. 6.
  • the individual manufacturing steps are briefly explained in detail below.
  • the sensor 2 can be made of a pn, np, pin, nip, pnip, pinp, nipn, npin diode, a combination of the arrangements, a Schottky diode arrangement or a photoconductor arrangement.
  • the passivation layer 8 can be a plasma-enhanced chemical vapor deposition (PECVD) silicon act layer that is transparent with its large optical band gap for the incident light.
  • PECVD plasma-enhanced chemical vapor deposition
  • Alternative materials such as silicon oxide or aluminum oxide can also be considered.
  • PECVD plasma-enhanced chemical vapor deposition
  • a solid transparent electrode 10 for the MEMS based modulatable mirror The material of the electrode 10 can consist of ITO.
  • structuring of the fixed electrode 10 of the mirror This reduces parasitic capacitances between the movable electrode 3 and the fixed electrode 10.
  • a passivation 9 between the fixed and the movable electrode 3 of the modulatable mirror h) applying a sacrificial layer 11, e.g. B. from amorphous silicon, i) structuring of the sacrificial layer 11.
  • Gold or silver are preferred as materials here.
  • the layer can be applied by means of thermal evaporation, electron beam evaporation or as a sputter layer. Application of another metal layer on the mirror surface.
  • the layer can be applied by means of electroplating. The aim here is to apply a layer of a few micrometers in order to achieve a mechanical rigidity of the mirror 3.
  • Opening holes in the reflective layer (membrane of the mirror).
  • xenon diflouirde it is a dry etching process.
  • wet chemical etching processes can also be used.
  • the manufacturing process was shown as an example. Both the manufacture of the semi-transparent sensor and the manufacture of the mirror can be modified. Furthermore, the manufacturing sequence of the component can still be modified. Possible alternative component designs are briefly described below.
  • the Fourier spectrometer is preferably produced on a substrate that is transparent to the incident light in the following steps: A.1 Manufacture of the semi-transparent sensor and the modulatable mirror on one side of the substrate.
  • A.1.1 The sensor is applied first and then the mirror.
  • the mirror is modulated. Light is radiated through the substrate.
  • A.1.2 The mirror is made first. The sensor is then applied. In this case, the mirror only acts as a reflector. The sensor is modulated. In this case, the light is not radiated through the substrate.
  • the sensor is first applied on one side and then the mirror on the other side.
  • the mirror is modulated. Light first falls through the semi-transparent sensor, then through the substrate and is then reflected on the mirror.
  • A.2.2 The mirror is first made on one side. The sensor is then applied to the other side. In this case, the seal only acts as a reflector. The sensor is modulated. Light first falls through the semi-transparent sensor, then through the substrate and is then reflected on the mirror.
  • the Fourier spectrometer is preferably produced on a substrate that is not transparent to the incident light, using the following steps: B.1 Production of the semi-transparent sensor and the modulatable mirror on one side of the substrate. B.1.1 The sensor is applied first and then the mirror. The mirror is modulated. Light is radiated through the substrate. B.1.2 The mirror is made first. The sensor is then applied. In this case, the seal only acts as a reflector. The sensor is modulated. In this case, the light is not radiated through the substrate.
  • the application of the sensor and the mirror on different sides of the substrate offers advantages with regard to the contacting of the components.
  • the beam widens as it passes through the substrate. This is not wanted.
  • the sensor is modulated instead of the mirror.
  • the mirror is fixed.
  • the advantage of this arrangement is that the incident beam does not have to pass through the substrate. Reflections at the transitions of the substrate to the air or to the layers of the semi-transparent sensor have a negative effect on the propagation of a standing wave in the sensor. In this case, however, the modulated sensor must be connected to the readout electronics. This is significantly more complex than using a modulated mirror.
  • the problems of the known MEMS Fourier spectrometers can thus be avoided according to the invention by integrating the semi-transparent sensor and the modulatable mirror together. This reduces the number of components and eliminates the need to align the sensor and mirror. Thin-film technology is the preferred technology. This enables the spectrometer to be implemented on a neutral substrate such as glass. The use of a neutral substrate lowers the manufacturing costs.
  • the use of thin-film technology can be used to produce a modulatable mirror that can be deflected over a wide range even at low operating voltages.

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

La présente invention concerne un spectromètre de Fourier (1), destiné à déterminer des informations spectrales d'un signal d'entrée optique incident (2), ainsi qu'un procédé de fabrication d'un spectromètre de Fourier de ce type. L'objectif de cette invention est de permettre de fabriquer avec précision un spectromètre de Fourier compact et de petite dimension, permettant en particulier la production d'ensembles de spectromètres 1D et 2D. A cet effet, un spectromètre de Fourier selon l'invention présente une couche support (4) laissant passer le signal d'entrée optique, un capteur (2) appliqué sur la couche support, laissant au moins partiellement passer le signal d'entrée optique et destiné à produire un signal de sortie électrique, une couche réflectrice (3) placée sur le côté du capteur opposé à la couche support, laquelle couche réflectrice est destinée à réfléchir le signal d'entrée optique incident (2) et à former une onde optiquement stationnaire à partir du signal d'entrée incident et du signal d'entrée réfléchi, ainsi qu'une cavité (7) située entre le capteur et la couche réflectrice et destinée à permettre une modulation de l'écartement entre le capteur et la couche réflectrice, ledit capteur étant conçu pour détecter l'intensité de l'onde stationnaire et produire un signal de sortie contenant les informations spectrales du signal d'entrée et ladite couche support, le capteur et la couche réflectrice étant intégrés conjointement dans un composant à semi-conducteurs (1) et orientés de façon sensiblement parallèle les uns par rapport aux autres et perpendiculairement au signal d'entrée optique incident pour la production de l'onde optiquement stationnaire.
EP05744320A 2004-04-22 2005-04-20 Spectrometre de fourier a miroir modulable integre sur un substrat et capteur a balayage d'ondes stationnaires et procede de fabrication associe Withdrawn EP1738144A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102004019570A DE102004019570B3 (de) 2004-04-22 2004-04-22 Fourier-Spektrometer und Verfahren zur Herstellung eines Fourier-Spektrometers
PCT/DE2005/000725 WO2005103635A1 (fr) 2004-04-22 2005-04-20 Spectrometre de fourier a miroir modulable integre sur un substrat et capteur a balayage d'ondes stationnaires et procede de fabrication associe

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WO (1) WO2005103635A1 (fr)

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WO2005103635A1 (fr) 2005-11-03
US20070165237A1 (en) 2007-07-19
DE102004019570B3 (de) 2005-10-13

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