EP1492994A4 - Method and apparatus for stage mirror mapping - Google Patents
Method and apparatus for stage mirror mappingInfo
- Publication number
- EP1492994A4 EP1492994A4 EP03714507A EP03714507A EP1492994A4 EP 1492994 A4 EP1492994 A4 EP 1492994A4 EP 03714507 A EP03714507 A EP 03714507A EP 03714507 A EP03714507 A EP 03714507A EP 1492994 A4 EP1492994 A4 EP 1492994A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- stage mirror
- mirror mapping
- mapping
- stage
- mirror
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02007—Two or more frequencies or sources used for interferometric measurement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
- G01B9/02019—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different points on same face of object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02027—Two or more interferometric channels or interferometers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/70591—Testing optical components
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US37117202P | 2002-04-09 | 2002-04-09 | |
US371172P | 2002-04-09 | ||
US10/217,531 US6700665B2 (en) | 2001-08-20 | 2002-08-13 | Interferometric apparatus for measuring the topography of mirrors in situ and providing error correction signals therefor |
US217531 | 2002-08-13 | ||
PCT/US2003/010212 WO2003087710A2 (en) | 2002-04-09 | 2003-04-04 | Method and apparatus for stage mirror mapping |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1492994A2 EP1492994A2 (en) | 2005-01-05 |
EP1492994A4 true EP1492994A4 (en) | 2010-07-28 |
Family
ID=29254154
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP03714507A Withdrawn EP1492994A4 (en) | 2002-04-09 | 2003-04-04 | Method and apparatus for stage mirror mapping |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1492994A4 (en) |
JP (1) | JP4458855B2 (en) |
WO (1) | WO2003087710A2 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007005314A2 (en) * | 2005-06-29 | 2007-01-11 | Zygo Corporation | Apparatus and methods for reducing non-cyclic non-linear errors in interferometry |
US7853067B2 (en) * | 2006-10-27 | 2010-12-14 | Asml Holding N.V. | Systems and methods for lithographic reticle inspection |
US8937707B2 (en) | 2011-08-23 | 2015-01-20 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method, and method of calibrating a displacement measuring system |
US11619886B2 (en) | 2018-03-29 | 2023-04-04 | Asml Netherlands B.V. | Position measurement system, interferometer system and lithographic apparatus |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5371588A (en) * | 1993-11-10 | 1994-12-06 | University Of Maryland, College Park | Surface profile and material mapper using a driver to displace the sample in X-Y-Z directions |
US5464715A (en) * | 1993-04-02 | 1995-11-07 | Nikon Corporation | Method of driving mask stage and method of mask alignment |
US20010035959A1 (en) * | 2000-05-19 | 2001-11-01 | Hill Henry Allen | In-situ mirror characterization |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3295846B2 (en) * | 1989-06-08 | 2002-06-24 | 株式会社ニコン | Position measuring method, position measuring device, positioning method, positioning device, and exposure device |
US5151749A (en) * | 1989-06-08 | 1992-09-29 | Nikon Corporation | Method of and apparatus for measuring coordinate position and positioning an object |
JPH04351905A (en) * | 1991-05-30 | 1992-12-07 | Fujitsu Ltd | Xy stage possessing laser length measuring device |
US5363196A (en) * | 1992-01-10 | 1994-11-08 | Ultratech Stepper, Inc. | Apparatus for measuring a departure from flatness or straightness of a nominally-plane mirror for a precision X-Y movable-stage |
JPH07253304A (en) * | 1994-03-15 | 1995-10-03 | Nikon Corp | Multi-axial positioning unit and length measuring method therefor |
JPH09162113A (en) * | 1995-12-04 | 1997-06-20 | Nikon Corp | Orthogonality measuring method, stage apparatus and aligner |
AU6122099A (en) * | 1998-10-14 | 2000-05-01 | Nikon Corporation | Shape measuring method and shape measuring device, position control method, stage device, exposure apparatus and method for producing exposure apparatus, and device and method for manufacturing device |
-
2003
- 2003-04-04 EP EP03714507A patent/EP1492994A4/en not_active Withdrawn
- 2003-04-04 JP JP2003584612A patent/JP4458855B2/en not_active Expired - Fee Related
- 2003-04-04 WO PCT/US2003/010212 patent/WO2003087710A2/en active Application Filing
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5464715A (en) * | 1993-04-02 | 1995-11-07 | Nikon Corporation | Method of driving mask stage and method of mask alignment |
US5371588A (en) * | 1993-11-10 | 1994-12-06 | University Of Maryland, College Park | Surface profile and material mapper using a driver to displace the sample in X-Y-Z directions |
US20010035959A1 (en) * | 2000-05-19 | 2001-11-01 | Hill Henry Allen | In-situ mirror characterization |
Non-Patent Citations (1)
Title |
---|
ZANONI C: "DIFFERENTIAL INTERFEROMETER ARRANGEMENTS FOR DISTANCE AND ANGLE MEASUREMENTS: PRINCIPLES, ADVANTAGES AND APPLICATIONS", VDI BERICHTE, DUESSELDORF, DE, no. 749, 1 January 1989 (1989-01-01), pages 93 - 106, XP001028012, ISSN: 0083-5560 * |
Also Published As
Publication number | Publication date |
---|---|
WO2003087710A3 (en) | 2003-12-18 |
JP2005522683A (en) | 2005-07-28 |
WO2003087710A2 (en) | 2003-10-23 |
EP1492994A2 (en) | 2005-01-05 |
JP4458855B2 (en) | 2010-04-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20041006 |
|
AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20100624 |
|
RIC1 | Information provided on ipc code assigned before grant |
Ipc: G01B 9/02 20060101AFI20031031BHEP Ipc: G01B 11/24 20060101ALI20100618BHEP |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20100924 |