EP1417453A1 - Dispositif et procede d'imagerie tridimensionnelle - Google Patents

Dispositif et procede d'imagerie tridimensionnelle

Info

Publication number
EP1417453A1
EP1417453A1 EP02740754A EP02740754A EP1417453A1 EP 1417453 A1 EP1417453 A1 EP 1417453A1 EP 02740754 A EP02740754 A EP 02740754A EP 02740754 A EP02740754 A EP 02740754A EP 1417453 A1 EP1417453 A1 EP 1417453A1
Authority
EP
European Patent Office
Prior art keywords
periodic pattern
pattern
image
imaging
grating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP02740754A
Other languages
German (de)
English (en)
Inventor
M.G. Unilever Research Port Sunlight REED
John E. Unilever Research Port Sunlight WILSON
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Unilever PLC
Unilever NV
Original Assignee
Unilever PLC
Unilever NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Unilever PLC, Unilever NV filed Critical Unilever PLC
Priority to EP02740754A priority Critical patent/EP1417453A1/fr
Publication of EP1417453A1 publication Critical patent/EP1417453A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded

Definitions

  • the present invention is in the field of 3D scanning and 3D image reconstruction using structured light.
  • Structured light methods have been used to perform depth measurements in microscope images and to obtain 3D mask images of the external surfaces of microscopic and macroscopic objects. These methods are broadly based on trigonometric considerations. Methods based on trigonometry, more specifically triangulation, involve the evaluation of patterned images which are obtained by projecting substantially periodic structures by means of a grating onto an object. By setting the viewing position at an angle to projection, the shape of the object introduces a distortion in the patterned image. The shape of the object is calculated from the extent of 'the distortion of the patterned image. Triangulation methods work best when the patterned image is in focus over the whole of the object.
  • US-A-4, 657, 394 discloses a technique for determining the three dimensional surface profile of an object.
  • An incident light beam is directed at the object, the beam having a sinusoidally varying intensity pattern.
  • the phase of the sinusoidal intensity pattern is modulated, such as by moving the grating used to obtain said pattern.
  • a deformed grating image of a line profile is detected, preferably at a linear detector; a detector having individual detector elements arranged in a line.
  • the distance of each such point from a reference line is then determined, each such distance determination including the step of combining intensity values of the received image at the different modulated phases to obtain an object phase for each point . In this manner the coordinate locations of the points on a line profile of the object can be determined.
  • the current invention provides an inexpensive, convenient and safe device and imaging method for reconstructing the 3D peripheral shape of an object using SMI. It has surprisingly been found that a device comprising a component suitable to create mask' type images by generating and recording at least two "periodic patterns" at altered spatial position and a component enabling the creation of masks of at least two different views of an object, enables the construction of a 3D image of an object in a simple and straightforward way.
  • a device according to the invention is cheap to build and easy, quick and convenient to operate whereby the 3D peripheral view of an object can be reconstructed in a single operational step.
  • the invention relates to a device for 3D imaging of the peripheral view of an object using structured modulation imaging said device comprising:
  • SI projecting system
  • L light source
  • FI focussing means
  • Ml patterning means
  • SI image recording system
  • F2 focussing means
  • M2 means of recording an image of the periodic pattern generated on the object
  • SI, S2 and the object are arranged relative to each other such that the periodic patterns can be generated and recorded for at least two different views of the object
  • said device further comprising means (M3) allowing Ml and the object to be moved relative to each other.
  • the invention in another aspect relates to a method for 3D imaging of the peripheral view of an object using structured modulation imaging comprising a) illuminating the object with a light source, b) projecting a first substantially periodic pattern on the object c) recording an image of the periodic pattern on the object, d) generating at least one more time the periodic pattern at an altered spatial phase of the first pattern, wherein steps a-d are carried out for at least two different views of the object and wherein the data obtained are analysed to reconstruct the 3D peripheral view of the object.
  • the invention relates to a kit of parts comprising the device and one or more software package for analysing the recorded information and/or reconstructing the 3D peripheral view of the object.
  • Figure 1 shows a representation of a 3D mask image (a) and a 3D peripheral view (b) .
  • FIG. 2 shows a schematic of the principle underlying SMI.
  • L is a light source
  • M l is a grating
  • FI is a lens
  • f is a focal position
  • d is the distance between focal position and FI.
  • the physical principle that allows the present invention to obtain 3D surface distances from structured illumination requires a light source (L) , a patterning means for generating a substantially periodic pattern of lighter and darker bands (Ml) and a focusing means (FI) .
  • the pattern will be seen with maximum contrast between the dark and light bands at a given focal position (f) .
  • the contrast of the pattern falls off with a known response as a function of distance, d, away from f and the banding of the pattern will eventually become indistinct.
  • the measured modulation depth of the pattern on the surface of the object gives a direct link to the distance that the surface patch is away from the focal position f .
  • FIG. 3 shows schematic representations of preferred embodiments of the projecting system (SI) . A detailed description of the figure is done in the section describing preferred embodiments of SI.
  • Figures 4-6 are schematic representations of preferred embodiments of the device. A detailed description of the figures is provided in the section describing preferred embodiments of the device .
  • object view is used to indicate views taken from an object from different points of observation. This is also referred to as different sides of an object.
  • the method according to the invention involves the evaluation of patterned images, which are obtained by projecting substantially periodic structures by means of a grating onto an object.
  • gratings are imaged in the object planes and displaced by integral fractions of the grating constant. An image is recorded for each position of the grating and the images are recombined.
  • SMI Structured Modulation Imaging
  • the claimed method which is based on the frequency transfer of a lens involves the evaluation of patterned images which are obtained by projecting substantially periodic structures by means of a grating onto an object. In this case the extent of defocus of the patterned image is recorded and the shape of the object is calculated. Frequency transfer methods differ from trigonometry methods of the prior art in 2 significant ways:
  • the patterned image must defocus over the depth of the object (in triangulation no defocus is preferred) .
  • the invention relies on structured modulation imaging (SMI) .
  • SMI structured modulation imaging
  • This technique relates the frequency pattern (modulation contrast) of a periodic pattern projected on the surface of an object to its surface structure.
  • This frequency pattern is also referred to as brightness pattern of grey scale pattern. If a periodic grid of given frequency is projected via a lens onto a screen the observed intensity pattern on the screen has a modulation contrast that is at a maximum at the focal position of the lens. When the screen is moved away from the focal plane the observed modulation contrast on the screen diminishes .
  • Figure 2 schematically showing the underlying principle. Figure 2 shows that the modulation contrast of the projected grating varies with distance from the focal plane.
  • modulation contrast and distance is a function of the lens properties, the spatial frequency of the periodic grid and wavelength of the light used. If an object is placed within the structured light field, surface features of that object that are in the focal plane show a high contrast of the projected grating while surface features away from the plane show a lower modulation contrast.
  • the relationship between the distance from focal plane and the observed modulation for a lens system is given in W098/45745, Jwfad 4* i-u iiicuipui ⁇ Led 'by r leirsftee.
  • WO-A-98/45745 relates to a microscopy imaging apparatus and associated imaging method and describes the use of structured light for generating an optically sectioned image of a specimen.
  • mask images are generated and only the in focus parts of the image generated on the object by the grating are used for the image reconstruction.
  • the device and method according to the invention allow the rapid 3D imaging of the peripheral shape of an object within one or more operational step.
  • An operational step is herewith defined as placing the object on/in the device, activate the device, obtain the 3D surface information (shape) of various different and/or all views of that object.
  • the information of the 3D peripheral view is obtained in a single operational step.
  • a user can place the object in the device, activates the device and obtains the information of the peripheral shape and/or colour of the object without having to carry out any intermediate steps.
  • the functioning of the device according to the invention relies on two principles.
  • the first principle (embodied in steps a-d of the method according to the invention) leads to the generation of a mask.
  • the second principle relies on masks being generated for at least two different views of the object. The information from the different masks is combined to reconstruct the peripheral view of the object.
  • the information is determined in terms of brightness values which are also referred to as different grey scales of the mask that is determined.
  • brightness values which are also referred to as different grey scales of the mask that is determined.
  • An object according to the invention can be any object of suitable size to be placed in the device.
  • the object is a macroscopic object, that means it can be seen with the naked-eye.
  • object as used herein also comprises a multiplicity of objects.
  • the device according to the invention comprises one or more projecting systems (SI) .
  • Each projecting system comprises one or more of the following: light source (L) , focussing means (FI) , patterning means (Ml) .
  • the object is illuminated by one or more light source (L) .
  • Any light source can be used, such as for example halogen lamps, electric light bulbs, light sources emitting coherent light, light sources emitting incoherent light, lasers or a collimated light source.
  • the light source is a fluorescent tube.
  • a substantially periodic pattern is generated by Ml and projected on the surface of the object by FI .
  • a substantially periodic pattern is one in which there is a clearly dominant frequency component.
  • the frequency components of a given spatial pattern can be estimated using standard computer means such as application of the Fast Fourier Transform algorithm.
  • the patterning means (Ml) can be for example a grating. Any grating known in the art can be used to work the invention.
  • the gratings may be linear, planar or spiral, one, two or three dimensional.
  • An electronic spatial light modulator, using transmitted or reflected attenuation schemes may also be used.
  • a periodic pattern may also be generated by interference of two or more suitably arranged coherent light beams, e.g. lasers.
  • Another way of generating a periodic pattern is by electronically modulating the intensity of the light source L, for example by using a collimated light source, in combination with a suitable focusing means (FI) , for example a suitable mirror and a lens.
  • a suitable focusing means for example a suitable mirror and a lens.
  • the periodic pattern generated by Ml can be one dimensional or two dimensional, stationary as well as movable.
  • Ml generates a periodic pattern having one dimensional local periodicity.
  • the position of Ml in relation to L, FI and the object can be anywhere as long as the periodic pattern can be projected on a surface of the object.
  • the focussing means can be any suitable focussing means known in the art, such as for examples lenses, mirrors, screens or a combination thereof.
  • the lens can for example be spherical or cylindrical.
  • the lens has a focal depth between 1 and 50 cm.
  • FI comprises a mirror
  • the mirror can for example be curved or parabolic.
  • the mirror has a focal depth of 1cm to 50 cm.
  • FI can be positioned anywhere in relation to L, Ml and the object suitably to project the generated periodic pattern on the object .
  • SI projects a one-dimensional (ID) periodic pattern on the object.
  • the visible face of the object is in front or behind the focal point of the focusing means. It is preferred that the visible face of the object is not in the focal point of the focusing means. Even more preferred the object is positioned at the place where the contrast is less than 90% of its maximum value, in a region where the defocus function is at its steepest.
  • the preferred embodiment of SI shown in figure 3a comprises a light source (L) illuminating a 2D grating (Ml) and subsequently the object via a focusing means (FI) .
  • the pattern shift means (M3) in this embodiment is a mechanically or electronically driven carriage for moving the grating in the plane of the grating and in a direction perpendicular to the ruled lines on the grating.
  • the preferred embodiment represented in figure 3b shows the light source ( ) illuminating the object via a 2D grating (Ml) and focusing means (FI) , and a screen D having a slit to produce a ID patterned line of illumination.
  • the angle of the grating with respect to the slit and/or the direction in which the grating is moved provide two means for altering the spatial frequency of the ID illumination pattern, thereby allowing altered modulation contrast characteristics for a fixed focusing means system.
  • the pattern shift means (M3) in this embodiment is a mechanically or electronically driven carriage for moving the grating in the plane of the grating and in a direction that is not parallel to the ruled lines on the grating.
  • Figure 3 (c) represents another preferred embodiment of SI comprising a spiral grating (Ml) , which is placed around a light source (L) , which preferably is a linear light source, most preferably a fluorescent tube.
  • the focussing means FI comprise a lens, preferably a cylindrical lens. Only a small portion parallel to the long axis of the grating is used for projection of the pattern, so that the spiral grating approximates to a grating of parallel lines. This can, for example, be achieved either by placing a suitable screen (D) between light source and lens, whereby the screen comprises a slit parallel to the long dimension of the grating. Another way to achieve the same is by incorporating the screen in the light source or by placing the screen between light source and grating.
  • Spatial movement of the pattern is obtained by rotation of Ml carried out by the spatial shift means M3.
  • the embodiment may optionally comprise one or more mirrors.
  • the preferred embodiment of SI represented by figure 3 (d) comprises a collimated light source (L) imaged via the focusing means (FI) comprising a scanning mirror assembly to produce a ID line of illumination on the object.
  • a collimated light source L
  • FI focusing means
  • the image of the periodic pattern, which is projected on the object, is recorded by one or more recording system S2.
  • S2 comprises at least one recording means M2 and at least one focussing means F2.
  • M2 can be any detector capable of receiving, digitising and storing the information obtained in the image of the projected pattern.
  • M2 can for example be a 1 or 2 D array of optoelectronically active picture elements such as are known in the imaging art, e.g. CCD, CMOS or CIS devices.
  • the image-recording system is suitable to receive and record also colour information. This allows not only to reconstruct the peripheral shape of the object but also its colour.
  • M2 is a CCD device.
  • the imaging device can be operated as a continuous acquisition of the patterns such that each image represents an integration of the image over a small time period as the pattern is being moved.
  • the images can be acquired after each movement .
  • F2 can be any focusing means known in the art as for example lenses, mirrors, screens or a combination thereof.
  • F2 is preferably a lens with a focal depth between 1 and 50 cm.
  • F2 may also be a mirror, preferably a parabolic mirror. Preferably the mirror has a focal depth between 1 and 50 cm.
  • F2 can for example be a lens of a CCD camera.
  • the spatial phase of the pattern is altered.
  • the device is provided with a spatial shift means M3 moving Ml relative to the object. Movement of Ml relative to the object can be carried out either by moving the object or by moving Ml.
  • M3 may be in the form of a mechanically or electronically driven carriage for moving the object relatively to Ml or vice versa. Movement can be carried out stepwise or continuously.
  • Movement serves to generate periodic patterns at altered spatial positions within the plane of periodicity of Ml on the object in order to enable removing of the projected pattern from the image and to construct a mask by using the algorithms described in DE 19930816 Al .
  • the quoted document refers to displacements by integral fractions of the grating constant. It has been found that in the device according to the invention, the displacements can be carried out at any fractions of the grating constant.
  • periodic patterns at altered spatial positions according to the above in principle only need to be generated twice. If used twice the reconstruction of the image is approximate. In order to obtain an exact reconstruction the patterns are generated at least 3 times .
  • the device may further comprise a turntable on which the object is placed.
  • the turntable may be moved electronically, mechanically, stepwise or continuously.
  • the turntable may be transparent allowing also the side on which the object rests to be scanned by the device .
  • the turntable may be rotated between 0 and 360 degrees within one or more planes.
  • SI and S2 are arranged relative to the object so that masks can be constructed of at least two different views of the object. This can be achieved in a number of ways.
  • the device may for example comprise a turntable on which the object is placed.
  • the turntable may be rotated stepwise or continuously, mechanically or electronically in relation to SI and S2.
  • the device preferably comprises only one SI and one S2, which are at fixed positions. By moving the turntable between 0 and 360 degrees (not including 360 degrees) the object can be imaged peripherally.
  • SI and S2 may be in a fixed position relative to each other but capable to be moved around and/or over an object either continuously or stepwise, mechanically or electronically.
  • the object is preferably at a fixed position, although it is also possible to include a turntable in this device.
  • the device comprises a plurality of projecting systems and recording systems at various positions, each combination of SI and S2 facing different sides of the object.
  • the systems may be at fixed positions or movable.
  • the device is configured as to comprise a combination of the above.
  • a transparent turntable is used or a second operational step is introduced wherein the object is turned such that it rests on a different side and the scanning process is repeated.
  • the device preferably comprises suitable software.
  • the device is also provided with suitable software to recombine the masks for reconstructing the peripheral shape of the object.
  • the device is optionally provided with means to display the generated peripheral view.
  • the device may also be used as computer peripheral and is then provided with a means to record and store the information such that the information and/or the peripheral view can be processed, generated and displayed on a separate computer.
  • the invention therefore also relates to a kit of parts comprising the device and a software package for analysing processing and displaying the surface information.
  • the invention provides a method of 3D imaging of the peripheral view of an object. Parts of the method have already been illustrated during the description of the device.
  • the method according to the invention comprises a) illuminating the object with a light source, b) projecting a first substantially periodic pattern on the object c) recording an image of the periodic pattern on the object, d) generating at least one more time the periodic pattern at an altered spatial phase of the first pattern, wherein steps a-d are carried out for at least two different views of the object and wherein the data obtained are analysed to reconstruct the 3D peripheral view of the object.
  • the generation of the patterns can be done in any order suitable for reconstructing the peripheral view of the object. This is further demonstrated by preferred embodiments, which are not to be understood as limiting.
  • steps a-d are carried out for one particular view of the object. Steps a-d are then repeated for other views of the object and the combined data is analysed for the reconstruction of the peripheral view.
  • a plurality of systems SI and S2 record images of periodic patterns that have been generated at different sides of the object. After these images have been recorded the systems are moved relative to the object and the periodic patterns are generated and recorded at an altered spatial phase of the first patterns .
  • the device Prior to use the device can be calibrated. Calibration can be carried out once and the device is set up or calibration can be carried prior to every single use .
  • Calibration of the device can for example be provided as follows. A calibration means of known dimension is inserted into the device and the 3D scanning process is carried out. The observed values of modulation ratio for each surface patch are then cross-correlated with the known distances that exist for each surface patch. The results of the correlation are stored in a look up table so that during normal operation an observed modulation ratio value is transformed into distance before further data processing. Alternatively all data processing can be carried out in modulation ratio values and after processing transformed into real distances.
  • a calibration figure is inserted on, above or below a turntable and fixed so that on rotation of the turntable the figure rotates .
  • the observed values of modulation ratio for each surface patch are then cross-correlated with the known distances that exist for each surface patch on the calibration figure.
  • the results of the correlation are stored in a look up table so that after a complete revolution of the turntable the observed modulation ratio values can be transformed into distances before further data processing.
  • FIG. 4 A schematic of a preferred embodiment of the device is shown in figure 4.
  • SI is described in figure 3c, i.e. comprising a fluorescent tube as a light source (L) , being surrounded by a spiral grating (Ml), a screen with a slit parallel to the long axis of the light source (D) and a cylindrical lens (FI) .
  • a spatial shift means (M3) is connected to the grating capable of rotating the grating.
  • the device comprises a turntable on which the object can be placed (indicated by bent arrow) .
  • S2 is a CCD camera.
  • a preferred way of operating this device is as follows: The object is illuminated and a periodic pattern is generated, projected on the object and recorded. The spiral grating is rotated. A periodic pattern of altered spatial phase is generated, projected and recorded. The spiral grating is rotated again leading to another periodic pattern being generated, projected and recorded. A mask of this view of the object is generated. The turntable is now moved by 90 degrees so that a different side of the objects faces SI and S2. A mask of this view is generated by repeating the procedures described above. The turntable is then turned again by 90 degrees and the procedures described above are repeated. The data of the different masks are combined for reconstruction of the peripheral view of the object.
  • Another preferred way of operating that device is by scanning a complete peripheral image of the object at one position of the spatial phase of the grating. Then the spatial phase of the grating is shifted by rotation and another peripheral image is scanned. This procedure is repeated once more and the obtained data are processed to reconstruct the peripheral view.
  • This embodiment is similar to embodiment I .
  • S2 a CCD camera, is attached to SI which is the preferred embodiment shown in figure 3c, and both SI and S2 are moved around and/or over the object thus obtaining surface information of several views of the object.
  • This embodiment is represented in figure 5.
  • This embodiment comprises three projecting and recording systems (SI and S2) arranged at different positions in the device so that each combination of projecting and recording system faces a different side of the object.
  • SI and S2 projecting and recording systems

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention concerne un procédé et un dispositif d'imagerie tridimensionnelle d'objets, dans lesquels un objet est éclairé par une source de lumière et un motif périodique est généré sur cet objet. Le même motif périodique est généré sur le même plan de l'objet mais en position modifiée. Les images sont enregistrées et analysées afin d'éliminer le motif spatial des images. Ceci est mis en oeuvre pour différentes vues de l'objet afin d'obtenir l'image tridimensionnelle de l'objet entière.
EP02740754A 2001-08-01 2002-06-26 Dispositif et procede d'imagerie tridimensionnelle Withdrawn EP1417453A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP02740754A EP1417453A1 (fr) 2001-08-01 2002-06-26 Dispositif et procede d'imagerie tridimensionnelle

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
EP01306605 2001-08-01
EP01306605 2001-08-01
EP02740754A EP1417453A1 (fr) 2001-08-01 2002-06-26 Dispositif et procede d'imagerie tridimensionnelle
PCT/EP2002/007065 WO2003014665A1 (fr) 2001-08-01 2002-06-26 Dispositif et procede d'imagerie tridimensionnelle

Publications (1)

Publication Number Publication Date
EP1417453A1 true EP1417453A1 (fr) 2004-05-12

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DE10359104B3 (de) * 2003-12-17 2005-10-13 Universität Karlsruhe Verfahren zur dynamischen, dreidimensionalen Erfassung und Darstellung einer Oberfläche
GB2413910A (en) * 2004-04-28 2005-11-09 Spiral Scratch Ltd Determining depth information from change in size of a projected pattern with varying depth
DE102006008840B4 (de) * 2006-02-25 2009-05-14 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Beleuchtungsvorrichtung für zylindrische Objekte, damit durchgeführtes Oberflächenuntersuchungsverfahren und Computerprogrammprodukt
GB2445961B (en) * 2006-10-31 2009-02-04 Prosurgics Ltd Fiducial marker placement
CN109831620A (zh) * 2018-12-29 2019-05-31 上海与德通讯技术有限公司 一种图片获取方法、装置、电子设备和存储介质

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US4657394A (en) * 1984-09-14 1987-04-14 New York Institute Of Technology Apparatus and method for obtaining three dimensional surface contours
US5085502A (en) * 1987-04-30 1992-02-04 Eastman Kodak Company Method and apparatus for digital morie profilometry calibrated for accurate conversion of phase information into distance measurements in a plurality of directions
JP2868985B2 (ja) * 1993-11-15 1999-03-10 マルコ株式会社 下着用３次元人体計測装置
DE4416108C2 (de) * 1994-05-06 2000-05-11 Fraunhofer Ges Forschung Vorrichtung zum berührungsfreien Vermessen einer Objektoberfläche
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