EP1103985A3 - Optical focusing device and measuring system - Google Patents
Optical focusing device and measuring system Download PDFInfo
- Publication number
- EP1103985A3 EP1103985A3 EP00125565A EP00125565A EP1103985A3 EP 1103985 A3 EP1103985 A3 EP 1103985A3 EP 00125565 A EP00125565 A EP 00125565A EP 00125565 A EP00125565 A EP 00125565A EP 1103985 A3 EP1103985 A3 EP 1103985A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- rays
- measuring system
- optical element
- sample
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Die Erfindung betrifft ein optisches Element zur Fokussierung von elektromagnetischen Strahlen (20, 21) oder Strahlen von Elementarteilchen, insbesondere von Röntgenstrahlen, umfassend eine Fresnelsche Zonenplatte (30) mit Ringzonen, die durchlässig für die Strahlen (20, 21) sind und Ringzonen, die für die Strahlen (20, 21) un-durchlässig sind und ferner ein Meßsystem, insbesondere zum Vermessen von inneren Bereichen dreidimensionaler Proben mit hoher Ortsauflösung und einer Apparatur zur Veränderung der physikalischen, chemischen und/oder biologischen Eigenschaften eines Bereichs einer Probe, insbesondere eines Innenbereichs einer Probe. Die Erfindung zeichnet sich dadurch aus, daß das optische Element dadurch weitergebildet ist, daß die für die Strahlen (20, 21) durchlässigen Ringzonen der Fresnelschen Zonenplatte (30) teilweise für die Strahlen (20, 21) undurchlässig sind. Die Erfindung zeichnet sich ferner dadurch aus. daß das Meßsystem und die Apparatur zur Veränderung der Eigenschaften eines Bereichs einer Probe wenigstens ein entsprechendes optisches Element umfassen. The invention relates to an optical element for focusing electromagnetic rays (20, 21) or rays from elementary particles, in particular X-rays, comprising a Fresnel zone plate (30) with ring zones that are transparent to the rays (20, 21) and ring zones that are impermeable to the rays (20, 21) and also a measuring system, in particular for measuring internal areas of three-dimensional samples with high spatial resolution and an apparatus for changing the physical, chemical and / or biological properties of an area of a sample, in particular an internal area a sample. The invention is characterized in that the optical element is further developed in that the ring zones of the Fresnel zone plate (30) which are permeable to the rays (20, 21) are partially impermeable to the rays (20, 21). The invention is further characterized by this. that the measuring system and the apparatus for changing the properties of an area of a sample comprise at least one corresponding optical element.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE1999156782 DE19956782C2 (en) | 1999-11-25 | 1999-11-25 | Optical focusing element, measuring system and apparatus with such an optical element and use of the same |
DE19956782 | 1999-11-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1103985A2 EP1103985A2 (en) | 2001-05-30 |
EP1103985A3 true EP1103985A3 (en) | 2003-04-09 |
Family
ID=7930314
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00125565A Withdrawn EP1103985A3 (en) | 1999-11-25 | 2000-11-22 | Optical focusing device and measuring system |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP1103985A3 (en) |
DE (1) | DE19956782C2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10125870B4 (en) * | 2001-05-26 | 2006-09-14 | Lutz Dr. Kipp | Optical element for imaging objects and / or for focusing electromagnetic radiation or rays of elementary particles and its use |
DE10242431A1 (en) * | 2002-09-11 | 2004-03-25 | Lutz Dr. Kipp | Electromagnetic radiation or x-ray focussing element, for processing cells or tissues, has structural elements of size that is not much smaller or larger than resolution to be achieved |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3867637A (en) * | 1973-09-04 | 1975-02-18 | Raytheon Co | Extended monochromatic x-ray source |
GB2252843A (en) * | 1991-01-17 | 1992-08-19 | Atomic Energy Authority Uk | Diffractive focussing means |
JPH09251100A (en) * | 1996-03-15 | 1997-09-22 | Olympus Optical Co Ltd | Soft x-ray microscope |
US5715219A (en) * | 1991-11-29 | 1998-02-03 | Nippon Steel Corporation | Displacement detecting device for optical head |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2921038B2 (en) * | 1990-06-01 | 1999-07-19 | キヤノン株式会社 | Observation device using X-ray |
DE4027285A1 (en) * | 1990-08-29 | 1992-03-05 | Zeiss Carl Fa | X-RAY MICROSCOPE |
DE19540195C2 (en) * | 1995-10-30 | 2000-01-20 | Fraunhofer Ges Forschung | X-ray fluorescence microscopy |
-
1999
- 1999-11-25 DE DE1999156782 patent/DE19956782C2/en not_active Expired - Fee Related
-
2000
- 2000-11-22 EP EP00125565A patent/EP1103985A3/en not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3867637A (en) * | 1973-09-04 | 1975-02-18 | Raytheon Co | Extended monochromatic x-ray source |
GB2252843A (en) * | 1991-01-17 | 1992-08-19 | Atomic Energy Authority Uk | Diffractive focussing means |
US5715219A (en) * | 1991-11-29 | 1998-02-03 | Nippon Steel Corporation | Displacement detecting device for optical head |
JPH09251100A (en) * | 1996-03-15 | 1997-09-22 | Olympus Optical Co Ltd | Soft x-ray microscope |
Non-Patent Citations (3)
Title |
---|
BETT T H ET AL: "A binary phase zone plate array for laser beam spatial intensity distribution conversion", FOURTH INTERNATIONAL CONFERENCE ON HOLOGRAPHIC SYSTEMS, COMPONENTS AND APPLICATIONS (CONF. PUBL. NO.379), NEUCHATEL, SWITZERLAND, 13-15 SEPT. 1993, 1993, London, UK, IEE, UK, pages 249 - 254, XP008013081, ISBN: 0-85296-578-8 * |
CANNON T M ET AL: "Coded aperture imaging: many holes make light work", OPTICAL ENGINEERING, MAY-JUNE 1980, USA, vol. 19, no. 3, pages 283 - 289, XP001092857, ISSN: 0091-3286 * |
PATENT ABSTRACTS OF JAPAN vol. 1998, no. 01 30 January 1998 (1998-01-30) * |
Also Published As
Publication number | Publication date |
---|---|
DE19956782C2 (en) | 2001-11-15 |
EP1103985A2 (en) | 2001-05-30 |
DE19956782A1 (en) | 2001-06-28 |
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