EP1103985A3 - Optisches Fokussierelement und Messsystem - Google Patents
Optisches Fokussierelement und Messsystem Download PDFInfo
- Publication number
- EP1103985A3 EP1103985A3 EP00125565A EP00125565A EP1103985A3 EP 1103985 A3 EP1103985 A3 EP 1103985A3 EP 00125565 A EP00125565 A EP 00125565A EP 00125565 A EP00125565 A EP 00125565A EP 1103985 A3 EP1103985 A3 EP 1103985A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- rays
- measuring system
- optical element
- sample
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19956782 | 1999-11-25 | ||
DE1999156782 DE19956782C2 (de) | 1999-11-25 | 1999-11-25 | Optisches Fokussierelement, Meßsystem und Apparatur mit einem solchen optischen Element und Verwendung desselben |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1103985A2 EP1103985A2 (de) | 2001-05-30 |
EP1103985A3 true EP1103985A3 (de) | 2003-04-09 |
Family
ID=7930314
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00125565A Withdrawn EP1103985A3 (de) | 1999-11-25 | 2000-11-22 | Optisches Fokussierelement und Messsystem |
Country Status (2)
Country | Link |
---|---|
EP (1) | EP1103985A3 (de) |
DE (1) | DE19956782C2 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10125870B4 (de) * | 2001-05-26 | 2006-09-14 | Lutz Dr. Kipp | Optisches Element zur Abbildung von Objekten und/oder zur Fokussierung von elektromagnetischen Strahlen oder Strahlen von Elementarteilchen und dessen Verwendung |
DE10242431A1 (de) * | 2002-09-11 | 2004-03-25 | Lutz Dr. Kipp | Element zur Fokussierung von elektromagnetischen Strahlen oder Strahlen von Elementarteilchen |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3867637A (en) * | 1973-09-04 | 1975-02-18 | Raytheon Co | Extended monochromatic x-ray source |
GB2252843A (en) * | 1991-01-17 | 1992-08-19 | Atomic Energy Authority Uk | Diffractive focussing means |
JPH09251100A (ja) * | 1996-03-15 | 1997-09-22 | Olympus Optical Co Ltd | 軟x線顕微鏡 |
US5715219A (en) * | 1991-11-29 | 1998-02-03 | Nippon Steel Corporation | Displacement detecting device for optical head |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2921038B2 (ja) * | 1990-06-01 | 1999-07-19 | キヤノン株式会社 | X線を用いた観察装置 |
DE4027285A1 (de) * | 1990-08-29 | 1992-03-05 | Zeiss Carl Fa | Roentgenmikroskop |
DE19540195C2 (de) * | 1995-10-30 | 2000-01-20 | Fraunhofer Ges Forschung | Verfahren der Röntgenfluoreszenzmikroskopie |
-
1999
- 1999-11-25 DE DE1999156782 patent/DE19956782C2/de not_active Expired - Fee Related
-
2000
- 2000-11-22 EP EP00125565A patent/EP1103985A3/de not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3867637A (en) * | 1973-09-04 | 1975-02-18 | Raytheon Co | Extended monochromatic x-ray source |
GB2252843A (en) * | 1991-01-17 | 1992-08-19 | Atomic Energy Authority Uk | Diffractive focussing means |
US5715219A (en) * | 1991-11-29 | 1998-02-03 | Nippon Steel Corporation | Displacement detecting device for optical head |
JPH09251100A (ja) * | 1996-03-15 | 1997-09-22 | Olympus Optical Co Ltd | 軟x線顕微鏡 |
Non-Patent Citations (3)
Title |
---|
BETT T H ET AL: "A binary phase zone plate array for laser beam spatial intensity distribution conversion", FOURTH INTERNATIONAL CONFERENCE ON HOLOGRAPHIC SYSTEMS, COMPONENTS AND APPLICATIONS (CONF. PUBL. NO.379), NEUCHATEL, SWITZERLAND, 13-15 SEPT. 1993, 1993, London, UK, IEE, UK, pages 249 - 254, XP008013081, ISBN: 0-85296-578-8 * |
CANNON T M ET AL: "Coded aperture imaging: many holes make light work", OPTICAL ENGINEERING, MAY-JUNE 1980, USA, vol. 19, no. 3, pages 283 - 289, XP001092857, ISSN: 0091-3286 * |
PATENT ABSTRACTS OF JAPAN vol. 1998, no. 01 30 January 1998 (1998-01-30) * |
Also Published As
Publication number | Publication date |
---|---|
DE19956782A1 (de) | 2001-06-28 |
DE19956782C2 (de) | 2001-11-15 |
EP1103985A2 (de) | 2001-05-30 |
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Legal Events
Date | Code | Title | Description |
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PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
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RIC1 | Information provided on ipc code assigned before grant |
Ipc: 7G 21K 1/02 B Ipc: 7G 21K 1/06 A |
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STAA | Information on the status of an ep patent application or granted ep patent |
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18D | Application deemed to be withdrawn |
Effective date: 20031010 |