EP1047128A3 - Warped semiconductor device and method of manufacturing the same - Google Patents
Warped semiconductor device and method of manufacturing the same Download PDFInfo
- Publication number
- EP1047128A3 EP1047128A3 EP00303379A EP00303379A EP1047128A3 EP 1047128 A3 EP1047128 A3 EP 1047128A3 EP 00303379 A EP00303379 A EP 00303379A EP 00303379 A EP00303379 A EP 00303379A EP 1047128 A3 EP1047128 A3 EP 1047128A3
- Authority
- EP
- European Patent Office
- Prior art keywords
- semiconductor element
- element chip
- semiconductor device
- manufacturing
- same
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title abstract 8
- 238000004519 manufacturing process Methods 0.000 title 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/57—Protection from inspection, reverse engineering or tampering
- H01L23/573—Protection from inspection, reverse engineering or tampering using passive means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
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- H—ELECTRICITY
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49503—Lead-frames or other flat leads characterised by the die pad
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/3205—Shape
- H01L2224/32057—Shape in side view
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
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- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/48463—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
- H01L2224/48465—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8338—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/83385—Shape, e.g. interlocking features
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- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0657—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape of the body
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- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H01L2924/10155—Shape being other than a cuboid
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- H01L2924/14—Integrated circuits
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Lead Frames For Integrated Circuits (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Pressure Sensors (AREA)
- Die Bonding (AREA)
Abstract
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11710899A JP3515012B2 (en) | 1999-04-23 | 1999-04-23 | Semiconductor device and manufacturing method thereof |
JP11710899 | 1999-04-23 |
Publications (3)
Publication Number | Publication Date |
---|---|
EP1047128A2 EP1047128A2 (en) | 2000-10-25 |
EP1047128A3 true EP1047128A3 (en) | 2001-05-16 |
EP1047128B1 EP1047128B1 (en) | 2006-11-22 |
Family
ID=14703618
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP00303379A Expired - Lifetime EP1047128B1 (en) | 1999-04-23 | 2000-04-20 | Warped semiconductor device and method of manufacturing the same |
Country Status (5)
Country | Link |
---|---|
US (1) | US6472730B1 (en) |
EP (1) | EP1047128B1 (en) |
JP (1) | JP3515012B2 (en) |
KR (1) | KR100366932B1 (en) |
DE (1) | DE60031908T2 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10106836B4 (en) | 2001-02-14 | 2009-01-22 | Infineon Technologies Ag | Integrated circuit arrangement of a flat substrate |
US20060072302A1 (en) * | 2004-10-01 | 2006-04-06 | Chien Tseng L | Electro-luminescent (EL) illuminated wall plate device with push-tighten frame means |
DE102004007690B3 (en) * | 2004-02-16 | 2005-10-13 | Infineon Technologies Ag | Integrated circuit arrangement |
DE102004021633B4 (en) * | 2004-05-03 | 2006-04-06 | Infineon Technologies Ag | Method for connecting a semiconductor chip to a chip carrier and arrangement with a semiconductor chip and a chip carrier |
US11277010B2 (en) | 2004-10-01 | 2022-03-15 | Tseng-Lu Chien | LED night light with edge-lit light guide |
US9235747B2 (en) * | 2008-11-27 | 2016-01-12 | Apple Inc. | Integrated leadframe and bezel structure and device formed from same |
CN116779496B (en) * | 2023-08-21 | 2023-12-26 | 成都汉芯国科集成技术有限公司 | 3D packaging system and packaging method suitable for heterogeneous integrated multiple chips |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63237144A (en) * | 1987-03-25 | 1988-10-03 | Sega Enterp:Kk | Semiconductor device with imitation preventing function |
EP0509567A2 (en) * | 1991-03-28 | 1992-10-21 | Koninklijke Philips Electronics N.V. | Device with protection against access to secure information |
EP0510434A2 (en) * | 1991-04-26 | 1992-10-28 | Hughes Aircraft Company | Apparatus and method for inhibiting analysis of a secure circuit |
WO1997036326A1 (en) * | 1996-03-28 | 1997-10-02 | Symbios,Inc. | Integrated circuit protection device and method |
EP0860882A2 (en) * | 1997-02-24 | 1998-08-26 | General Instrument Corporation | Anti-tamper bond wire shield for an integrated circuit |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60747A (en) * | 1983-06-17 | 1985-01-05 | Hitachi Ltd | Resin molded ic package |
SE8605266L (en) * | 1986-12-09 | 1988-06-10 | Ragnar Jonsson | SWITCH CONNECTION |
JPS6415957A (en) | 1987-07-10 | 1989-01-19 | Hitachi Ltd | Package |
US5031821A (en) * | 1988-08-19 | 1991-07-16 | Hitachi, Ltd. | Semiconductor integrated circuit device, method for producing or assembling same, and producing or assembling apparatus for use in the method |
US5319151A (en) * | 1988-12-29 | 1994-06-07 | Casio Computer Co., Ltd. | Data processing apparatus outputting waveform data in a certain interval |
JPH05211262A (en) | 1992-01-08 | 1993-08-20 | Nec Corp | Resin sealed semiconductor device |
DE4337461A1 (en) * | 1993-11-03 | 1995-05-04 | Braun Ag | Switching power supply |
JPH0951058A (en) * | 1995-08-07 | 1997-02-18 | Mitsubishi Electric Corp | Semiconductor device, and method and apparatus for manufacturing semiconductor device |
JPH1056180A (en) * | 1995-09-29 | 1998-02-24 | Canon Inc | Manufacture of semiconductor device |
JPH11345823A (en) * | 1998-05-29 | 1999-12-14 | Sony Corp | Method of mounting flip chip of semiconductor chip, and mounting jig thereof |
-
1999
- 1999-04-23 JP JP11710899A patent/JP3515012B2/en not_active Expired - Lifetime
-
2000
- 2000-04-18 US US09/551,741 patent/US6472730B1/en not_active Expired - Lifetime
- 2000-04-20 DE DE60031908T patent/DE60031908T2/en not_active Expired - Lifetime
- 2000-04-20 EP EP00303379A patent/EP1047128B1/en not_active Expired - Lifetime
- 2000-04-22 KR KR10-2000-0021457A patent/KR100366932B1/en not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63237144A (en) * | 1987-03-25 | 1988-10-03 | Sega Enterp:Kk | Semiconductor device with imitation preventing function |
EP0509567A2 (en) * | 1991-03-28 | 1992-10-21 | Koninklijke Philips Electronics N.V. | Device with protection against access to secure information |
EP0510434A2 (en) * | 1991-04-26 | 1992-10-28 | Hughes Aircraft Company | Apparatus and method for inhibiting analysis of a secure circuit |
WO1997036326A1 (en) * | 1996-03-28 | 1997-10-02 | Symbios,Inc. | Integrated circuit protection device and method |
EP0860882A2 (en) * | 1997-02-24 | 1998-08-26 | General Instrument Corporation | Anti-tamper bond wire shield for an integrated circuit |
Non-Patent Citations (2)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 013, no. 040 (P - 820) 30 January 1989 (1989-01-30) * |
PATENT ABSTRACTS OF JAPAN vol. 013, no. 195 (E - 754) 10 May 1989 (1989-05-10) * |
Also Published As
Publication number | Publication date |
---|---|
DE60031908T2 (en) | 2007-09-20 |
EP1047128A2 (en) | 2000-10-25 |
DE60031908D1 (en) | 2007-01-04 |
EP1047128B1 (en) | 2006-11-22 |
KR100366932B1 (en) | 2003-01-09 |
KR20010014803A (en) | 2001-02-26 |
US6472730B1 (en) | 2002-10-29 |
JP2000307050A (en) | 2000-11-02 |
JP3515012B2 (en) | 2004-04-05 |
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