EP0998137A2 - Dispositif et procédé de détection des pixels défectueux - Google Patents

Dispositif et procédé de détection des pixels défectueux Download PDF

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Publication number
EP0998137A2
EP0998137A2 EP99308326A EP99308326A EP0998137A2 EP 0998137 A2 EP0998137 A2 EP 0998137A2 EP 99308326 A EP99308326 A EP 99308326A EP 99308326 A EP99308326 A EP 99308326A EP 0998137 A2 EP0998137 A2 EP 0998137A2
Authority
EP
European Patent Office
Prior art keywords
pixel
values
pixels
standard deviation
mean
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP99308326A
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German (de)
English (en)
Other versions
EP0998137A3 (fr
Inventor
Sussan Pourjavid
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
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Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of EP0998137A2 publication Critical patent/EP0998137A2/fr
Publication of EP0998137A3 publication Critical patent/EP0998137A3/fr
Withdrawn legal-status Critical Current

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays
EP99308326A 1998-10-30 1999-10-21 Dispositif et procédé de détection des pixels défectueux Withdrawn EP0998137A3 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US182910 1998-10-30
US09/182,910 US6381374B1 (en) 1998-10-30 1998-10-30 Histogram analysis method for defective pixel identification

Publications (2)

Publication Number Publication Date
EP0998137A2 true EP0998137A2 (fr) 2000-05-03
EP0998137A3 EP0998137A3 (fr) 2002-05-08

Family

ID=22670584

Family Applications (1)

Application Number Title Priority Date Filing Date
EP99308326A Withdrawn EP0998137A3 (fr) 1998-10-30 1999-10-21 Dispositif et procédé de détection des pixels défectueux

Country Status (3)

Country Link
US (2) US6381374B1 (fr)
EP (1) EP0998137A3 (fr)
JP (1) JP2000182062A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1271131A3 (fr) * 2001-06-29 2004-01-02 Agilent Technologies, Inc. Méthode et dispositif pour identifier la distribution non uniforme d'un signal de mesure

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3717725B2 (ja) * 1999-10-07 2005-11-16 三洋電機株式会社 画素欠陥検出方法及び画像処理装置
US6711302B1 (en) * 1999-10-20 2004-03-23 Eastman Kodak Company Method and system for altering defects in digital image
DE10019955A1 (de) * 2000-04-20 2001-10-25 Philips Corp Intellectual Pty Röntgenuntersuchungsgerät und Verfahren zur Erzeugung eines Röntgenbildes
JP2002043200A (ja) * 2000-07-24 2002-02-08 Mitsubishi Electric Corp 異常原因検出装置及び異常原因検出方法
US7035772B2 (en) * 2001-05-31 2006-04-25 International Business Machines Corporation Method and apparatus for calculating data integrity metrics for web server activity log analysis
US6623161B2 (en) * 2001-08-28 2003-09-23 Ge Medical Systems Global Technology Company, Llc Method and apparatus for identifying and correcting line artifacts in a solid state X-ray detector
US6663281B2 (en) * 2001-09-25 2003-12-16 Ge Medical Systems Global Technology Company, Llc X-ray detector monitoring
US7956889B2 (en) * 2003-06-04 2011-06-07 Model Software Corporation Video surveillance system
DE10343787B4 (de) * 2003-09-22 2006-03-16 Siemens Ag Verfahren zur Kalibrierung eines digitalen Röntgendetektors und zugehörige Röntgenvorrichtung
US20050089204A1 (en) * 2003-10-22 2005-04-28 Cross Match Technologies, Inc. Rolled print prism and system
DE102004003881B4 (de) * 2004-01-26 2013-06-06 Siemens Aktiengesellschaft Bildaufnahmevorrichtung
US7711203B2 (en) * 2004-06-09 2010-05-04 Broadcom Corporation Impulsive noise removal using maximum and minimum neighborhood values
US20060242198A1 (en) * 2005-04-22 2006-10-26 Microsoft Corporation Methods, computer-readable media, and data structures for building an authoritative database of digital audio identifier elements and identifying media items
US7647128B2 (en) * 2005-04-22 2010-01-12 Microsoft Corporation Methods, computer-readable media, and data structures for building an authoritative database of digital audio identifier elements and identifying media items
DE102005052979B4 (de) * 2005-11-07 2011-08-18 Siemens AG, 80333 Verfahren zur Gain-Kalibrierung eines Röntgenbildaufnahmesystems und Röntgenbildaufnahmesystem
US8063957B2 (en) * 2006-03-24 2011-11-22 Qualcomm Incorporated Method and apparatus for processing bad pixels
US7710472B2 (en) * 2006-05-01 2010-05-04 Warner Bros. Entertainment Inc. Detection and/or correction of suppressed signal defects in moving images
US8144997B1 (en) * 2006-12-21 2012-03-27 Marvell International Ltd. Method for enhanced image decoding
KR100859052B1 (ko) * 2007-02-06 2008-09-17 엘지이노텍 주식회사 픽셀 어레이의 보간 방법
US8121414B2 (en) * 2007-06-13 2012-02-21 Sharp Kabushiki Kaisha Image processing method, image processing apparatus, and image forming apparatus
TWI437878B (zh) * 2007-11-20 2014-05-11 Quanta Comp Inc 用以校正影像訊號中壞點之方法及電路
DE102010019735B4 (de) * 2010-05-07 2015-10-15 Siemens Aktiengesellschaft Verfahren zur automatischen Erkennung von Defektpixeln eines Detektors eines bildgebenden Durchleuchtungssystems sowie entsprechendes Durchleuchtungssystem
KR20120114021A (ko) 2011-04-06 2012-10-16 삼성디스플레이 주식회사 불량 픽셀 보정 방법
KR101996917B1 (ko) * 2012-07-20 2019-10-02 삼성디스플레이 주식회사 평판 검사 방법 및 장치
KR102483787B1 (ko) * 2016-02-25 2023-01-04 에스케이하이닉스 주식회사 반도체 장치의 결함 모델링 장치 및 방법, 이를 위한 컴퓨터 프로그램과, 이를 이용한 반도체 장치의 결함 검사 시스템
US10270995B1 (en) 2017-10-19 2019-04-23 Kromek Group, PLC Automated non-conforming pixel masking
JP7271209B2 (ja) * 2019-02-06 2023-05-11 キヤノン株式会社 放射線撮像装置、放射線撮像システムおよび放射線撮像装置の制御方法
CN110490864B (zh) * 2019-08-22 2021-09-21 易思维（杭州）科技有限公司 图像的自适应缺陷检测方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0357842A1 (fr) * 1988-09-07 1990-03-14 Agfa-Gevaert N.V. Traitement des images digitales tenant compte de l'écart-type
US5617461A (en) * 1995-07-25 1997-04-01 Siemens Aktiengesellschaft Method for the operation of a digital imaging system of an X-ray diagnostic apparatus

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4858013A (en) * 1987-03-19 1989-08-15 Mitsubishi Denki Kabushiki Kaisha Solid state imaging device with adaptive pixel correction
US5047863A (en) * 1990-05-24 1991-09-10 Polaroid Corporation Defect correction apparatus for solid state imaging devices including inoperative pixel detection
US5321497A (en) * 1992-03-09 1994-06-14 Wyko Corporation Interferometric integration technique and apparatus to confine 2π discontinuity
US5537669A (en) * 1993-09-30 1996-07-16 Kla Instruments Corporation Inspection method and apparatus for the inspection of either random or repeating patterns
US5917935A (en) * 1995-06-13 1999-06-29 Photon Dynamics, Inc. Mura detection apparatus and method
TW351898B (en) * 1995-12-05 1999-02-01 Advantest Corp Portrait processing method
US5877501A (en) 1996-11-26 1999-03-02 Picker International, Inc. Digital panel for x-ray image acquisition
JP3484042B2 (ja) * 1997-05-21 2004-01-06 株式会社日立製作所 パターン検査方法およびその装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0357842A1 (fr) * 1988-09-07 1990-03-14 Agfa-Gevaert N.V. Traitement des images digitales tenant compte de l'écart-type
US5617461A (en) * 1995-07-25 1997-04-01 Siemens Aktiengesellschaft Method for the operation of a digital imaging system of an X-ray diagnostic apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1271131A3 (fr) * 2001-06-29 2004-01-02 Agilent Technologies, Inc. Méthode et dispositif pour identifier la distribution non uniforme d'un signal de mesure
US6993172B2 (en) 2001-06-29 2006-01-31 Agilent Technologies, Inc. Method and system for automated outlying feature and outlying feature background detection during processing of data scanned from a molecular array

Also Published As

Publication number Publication date
US6381374B1 (en) 2002-04-30
JP2000182062A (ja) 2000-06-30
EP0998137A3 (fr) 2002-05-08
US6415063B1 (en) 2002-07-02

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