EP0633601A3 - Large aperture, low flight-time distortion detector for a time-of-flight mass spectrometer. - Google Patents

Large aperture, low flight-time distortion detector for a time-of-flight mass spectrometer. Download PDF

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Publication number
EP0633601A3
EP0633601A3 EP94110272A EP94110272A EP0633601A3 EP 0633601 A3 EP0633601 A3 EP 0633601A3 EP 94110272 A EP94110272 A EP 94110272A EP 94110272 A EP94110272 A EP 94110272A EP 0633601 A3 EP0633601 A3 EP 0633601A3
Authority
EP
European Patent Office
Prior art keywords
time
flight
mass spectrometer
large aperture
distortion detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP94110272A
Other languages
German (de)
French (fr)
Other versions
EP0633601A2 (en
EP0633601B1 (en
Inventor
Thorald Dr Bergmann
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
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Individual
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Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of EP0633601A2 publication Critical patent/EP0633601A2/en
Publication of EP0633601A3 publication Critical patent/EP0633601A3/en
Application granted granted Critical
Publication of EP0633601B1 publication Critical patent/EP0633601B1/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

If ions transverse inhomogenous fields in the detector of a time-of-flight mass spectrometer, the case can arise that different flight paths (11) require different times from the entry window up to the ion-electron conversion surface (3). These flight-time distortions can be reduced by suitable deformation of the conversion surface (3). <IMAGE>
EP94110272A 1993-07-02 1994-07-01 Large aperture, low flight-time distortion detector for a time-of-flight mass spectrometer Expired - Lifetime EP0633601B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4322104 1993-07-02
DE4322104A DE4322104A1 (en) 1993-07-02 1993-07-02 Detector for time-of-flight mass spectrometers with low time-of-flight errors and a large aperture at the same time

Publications (3)

Publication Number Publication Date
EP0633601A2 EP0633601A2 (en) 1995-01-11
EP0633601A3 true EP0633601A3 (en) 1995-11-22
EP0633601B1 EP0633601B1 (en) 1998-10-14

Family

ID=6491838

Family Applications (1)

Application Number Title Priority Date Filing Date
EP94110272A Expired - Lifetime EP0633601B1 (en) 1993-07-02 1994-07-01 Large aperture, low flight-time distortion detector for a time-of-flight mass spectrometer

Country Status (7)

Country Link
US (1) US5637869A (en)
EP (1) EP0633601B1 (en)
JP (1) JPH0831372A (en)
AT (1) ATE172323T1 (en)
AU (1) AU685114B2 (en)
CA (1) CA2127184A1 (en)
DE (2) DE4322104A1 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10188881A (en) * 1996-12-26 1998-07-21 Yokogawa Analytical Syst Kk Time of flight type mass spectrometry device and convergent lens for ion beam
US6013913A (en) * 1998-02-06 2000-01-11 The University Of Northern Iowa Multi-pass reflectron time-of-flight mass spectrometer
US20050099761A1 (en) * 2001-10-18 2005-05-12 Pst Associates, Llc Field converter for thrust generation
US6891712B2 (en) * 2001-10-18 2005-05-10 Pst Associates, Llc Field converter
DE202004002190U1 (en) * 2003-02-13 2004-07-15 Micromass Uk Ltd. ion detector
US7141785B2 (en) 2003-02-13 2006-11-28 Micromass Uk Limited Ion detector
CN103745908B (en) * 2014-01-10 2016-06-22 清华大学深圳研究生院 A kind of time bias ion detector and flexure type ionic migration spectrometer
WO2015179709A1 (en) * 2014-05-22 2015-11-26 Benner W Henry Instruments for measuring ion size distribution and concentration

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2534796A1 (en) * 1975-08-04 1977-02-10 Max Planck Gesellschaft ION-ELECTRON CONVERTER
SU1274547A2 (en) * 1984-08-10 1988-04-30 Институт Аналитического Приборостроения Научно-Технического Объединения Ан Ссср Device for mass spectrometric analysis
WO1992019367A1 (en) * 1991-04-25 1992-11-12 Applied Biosystems, Inc. Time-of-flight mass spectrometer with an aperture enabling tradeoff of transmission efficiency and resolution

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4472631A (en) * 1982-06-04 1984-09-18 Research Corporation Combination of time resolution and mass dispersive techniques in mass spectrometry
US5160840A (en) * 1991-10-25 1992-11-03 Vestal Marvin L Time-of-flight analyzer and method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2534796A1 (en) * 1975-08-04 1977-02-10 Max Planck Gesellschaft ION-ELECTRON CONVERTER
SU1274547A2 (en) * 1984-08-10 1988-04-30 Институт Аналитического Приборостроения Научно-Технического Объединения Ан Ссср Device for mass spectrometric analysis
WO1992019367A1 (en) * 1991-04-25 1992-11-12 Applied Biosystems, Inc. Time-of-flight mass spectrometer with an aperture enabling tradeoff of transmission efficiency and resolution

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
DATABASE WPI Section EI Week 8848, Derwent World Patents Index; Class S03, AN 88-344396 *

Also Published As

Publication number Publication date
DE4322104A1 (en) 1995-01-19
AU6615494A (en) 1995-01-12
JPH0831372A (en) 1996-02-02
ATE172323T1 (en) 1998-10-15
EP0633601A2 (en) 1995-01-11
US5637869A (en) 1997-06-10
EP0633601B1 (en) 1998-10-14
AU685114B2 (en) 1998-01-15
DE59407075D1 (en) 1998-11-19
CA2127184A1 (en) 1995-01-03

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