EP0294696A3 - Spring loaded contact pin - Google Patents

Spring loaded contact pin Download PDF

Info

Publication number
EP0294696A3
EP0294696A3 EP88108746A EP88108746A EP0294696A3 EP 0294696 A3 EP0294696 A3 EP 0294696A3 EP 88108746 A EP88108746 A EP 88108746A EP 88108746 A EP88108746 A EP 88108746A EP 0294696 A3 EP0294696 A3 EP 0294696A3
Authority
EP
European Patent Office
Prior art keywords
spring
contact pin
sleeve
spring loaded
loaded contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP88108746A
Other languages
German (de)
French (fr)
Other versions
EP0294696A2 (en
Inventor
Klaus Giringer
Jochen Laube
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Feinmetall GmbH
Original Assignee
Feinmetall GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Feinmetall GmbH filed Critical Feinmetall GmbH
Publication of EP0294696A2 publication Critical patent/EP0294696A2/en
Publication of EP0294696A3 publication Critical patent/EP0294696A3/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/18—End pieces terminating in a probe

Landscapes

  • Measuring Leads Or Probes (AREA)

Abstract

Federkontaktstift (10) zum Kontaktieren von elektrischen und elektronischen Prüflingen für Prüfzwecke. Er weist eine Hülse (11), einen in ihr geradegeführten Kontakt­ bolzen (15) und mindestens zwei Federn (12, 13) auf. Mindestens eine Feder (13) ist im Inneren der den Kon­ taktbolzen (15) geradeführenden Hülse angeordnet. Eine zusätzliche Schraubendruckfeder (12) ist auf dem über die Hülse (11) nach außen überstehenden Bereich einer Stange (20) des Kontaktbolzens (15) angeordnet, wo­ durch sich Verkürzung des Federkontaktstiftes und Ver­ kürzung der Federwege bei gegebener Federkraft und damit auch Kosteneinsparung erreichen lassen. Spring contact pin (10) for contacting electrical and electronic test objects for test purposes. He points a sleeve (11), a straight contact in it bolt (15) and at least two springs (12, 13). At least one spring (13) is inside the con clock bolt (15) arranged straight sleeve. A additional helical compression spring (12) is on the over the sleeve (11) projecting outward area of a Rod (20) of the contact pin (15) arranged where by shortening the spring contact pin and ver Shortening the spring travel for a given spring force and thus also achieve cost savings.

EP88108746A 1987-06-10 1988-06-01 Spring loaded contact pin Withdrawn EP0294696A3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3719309 1987-06-10
DE3719309 1987-06-10

Publications (2)

Publication Number Publication Date
EP0294696A2 EP0294696A2 (en) 1988-12-14
EP0294696A3 true EP0294696A3 (en) 1989-04-26

Family

ID=6329395

Family Applications (1)

Application Number Title Priority Date Filing Date
EP88108746A Withdrawn EP0294696A3 (en) 1987-06-10 1988-06-01 Spring loaded contact pin

Country Status (2)

Country Link
US (1) US4918384A (en)
EP (1) EP0294696A3 (en)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5084673A (en) * 1989-06-15 1992-01-28 Nhk Spring Co., Ltd. Electric contact probe
US5018988A (en) * 1989-10-10 1991-05-28 Sps Technologies, Inc. Electrical contact mechanism for ultrasonic transducers on fasteners
US5225773A (en) * 1992-02-26 1993-07-06 Interconnect Devices, Inc. Switch probe
US5557213A (en) * 1994-12-01 1996-09-17 Everett Charles Technologies, Inc. Spring-loaded electrical contact probe
KR200172044Y1 (en) * 1999-09-21 2000-03-15 석정곤 Cable contactor analyzer connector
US6844749B2 (en) * 2002-07-18 2005-01-18 Aries Electronics, Inc. Integrated circuit test probe
US6677772B1 (en) 2002-08-21 2004-01-13 Micron Technology, Inc. Contactor with isolated spring tips
JP3981042B2 (en) 2003-06-09 2007-09-26 アルプス電気株式会社 Contact probe, probe socket, electrical characteristic measuring apparatus, and contact probe pressing method
TWI258255B (en) * 2005-05-20 2006-07-11 Ramtek Technology Inc Method of testing ball grid array packed device in real system and test socket assembly therefor
JP4999079B2 (en) * 2007-04-10 2012-08-15 サンユー工業株式会社 probe
DE102008028831C5 (en) * 2008-06-19 2013-06-06 Dorma Gmbh + Co. Kg Drive system for driving and guiding a wall element for a room dividing wall system
US8988090B2 (en) 2009-04-21 2015-03-24 Johnstech International Corporation Electrically conductive kelvin contacts for microcircuit tester
US9329204B2 (en) 2009-04-21 2016-05-03 Johnstech International Corporation Electrically conductive Kelvin contacts for microcircuit tester
KR101149760B1 (en) * 2009-07-03 2012-06-01 리노공업주식회사 a probe
KR101247499B1 (en) * 2012-02-14 2013-04-03 주식회사 휴먼라이트 Probe pin and method of manufacturing the same background of the invention
CN102636669A (en) * 2012-04-24 2012-08-15 北京元六鸿远电子技术有限公司 Spring probe
US9887478B2 (en) * 2015-04-21 2018-02-06 Varian Semiconductor Equipment Associates, Inc. Thermally insulating electrical contact probe
US9899193B1 (en) 2016-11-02 2018-02-20 Varian Semiconductor Equipment Associates, Inc. RF ion source with dynamic volume control
HUP1700051A2 (en) * 2017-02-02 2018-08-28 Equip Test Kft Contact device and headunit, and method of contact device and headunit production
US10367279B2 (en) * 2017-10-26 2019-07-30 Xilinx, Inc. Pusher pin having a non-electrically conductive portion
CN108336521A (en) * 2018-04-11 2018-07-27 范长东 A kind of overhead transmission line emergency harness clip
DE102019220311A1 (en) * 2019-12-19 2021-06-24 Feinmetall Gesellschaft mit beschränkter Haftung Contact device
KR102216143B1 (en) * 2019-12-24 2021-02-16 주식회사 아이에스시 Contact device for electrical test

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0030407A1 (en) * 1979-12-10 1981-06-17 John Fluke Mfg. Co., Inc. Electrical test probe for use in testing circuits on printed circuit boards and the like
EP0237732A1 (en) * 1986-02-27 1987-09-23 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Spring-loaded contact pin for a testing apparatus

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE257904C (en) *
US4189203A (en) * 1978-07-24 1980-02-19 The United States Of America As Represented By The Secretary Of The Air Force Circular connector
US4528500A (en) * 1980-11-25 1985-07-09 Lightbody James D Apparatus and method for testing circuit boards
US4504780A (en) * 1982-08-25 1985-03-12 Marsella John R Test probe
JPS59195164A (en) * 1983-04-20 1984-11-06 Terukazu Yamanishi Probe contact for detecting circuit
JPS60140160A (en) * 1983-12-27 1985-07-25 Sumitomo Wiring Syst Ltd Terminal inspection instrument of connector
DE3706652A1 (en) * 1986-03-26 1987-10-01 Feinmetall Gmbh Test adaptor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0030407A1 (en) * 1979-12-10 1981-06-17 John Fluke Mfg. Co., Inc. Electrical test probe for use in testing circuits on printed circuit boards and the like
EP0237732A1 (en) * 1986-02-27 1987-09-23 Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung Spring-loaded contact pin for a testing apparatus

Also Published As

Publication number Publication date
US4918384A (en) 1990-04-17
EP0294696A2 (en) 1988-12-14

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