EP0167601A1 - Spectrometre interferometre a reseaux de diodes - Google Patents

Spectrometre interferometre a reseaux de diodes

Info

Publication number
EP0167601A1
EP0167601A1 EP85900572A EP85900572A EP0167601A1 EP 0167601 A1 EP0167601 A1 EP 0167601A1 EP 85900572 A EP85900572 A EP 85900572A EP 85900572 A EP85900572 A EP 85900572A EP 0167601 A1 EP0167601 A1 EP 0167601A1
Authority
EP
European Patent Office
Prior art keywords
radiation
interference pattern
mirror
spectrometer
forming
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP85900572A
Other languages
German (de)
English (en)
Inventor
Ronald R. Williams
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ohio University
Ohio State University
Original Assignee
Ohio University
Ohio State University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ohio University, Ohio State University filed Critical Ohio University
Publication of EP0167601A1 publication Critical patent/EP0167601A1/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4531—Devices without moving parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods

Definitions

  • Interferometers take a variety of forms. They all depend upon the production of an interference pattern which is detected by a single element detector. In the case of a Michaelson interferometer, which can be used to measure visible spectra, ultra-violet, and infrared, the interference pattern is produced by varying the dis ⁇ tance that a portion of a split beam of light travels. In this type of interferometer, two plane mirrors are set perpendicular to each other with a beamsplitter positioned at 45 degrees between them. The beamsplitter is fabricated so that one-half of the light striking it is transmitted and one-half is reflected.
  • Light to be analyzed enters the interferometer perpendicular to one of the mirrors.
  • the beamsplitter transmits 50 percent of this light to one mirror and reflects 50 percent to the other mirror.
  • the two light beams are reflected back to the beamsplitter by the mirrors, where the beams are recombined, and then exit perpendicular to their axis of entrance.
  • Interference is produced by modifying the path lengths travelled by one of the two beams by moving one of the mirrors toward or away from the beamsplitter.
  • the detector monitors the exiting radiation from such an interference pattern and the signal is recorded as a function of distance travelled by the moving mirror.
  • the moving mirror must be kept exactly perpendicular to the fixed mirror throughout the scan. Usually special air bearings are required to accomplish this,
  • Applicant's invention combines any one of a variety of means of creating a static interference pattern 15 with an array detector which can instantaneously measure an interference pattern over an area of two dimensions.
  • Another object of this invention is to provide such an interferometer which may be used with a variety of devices to create an interference pattern.
  • a source of radiation 10 is provided. Obviously, the radiation emanating from this source must be a type which is reflectable by mirrors so it would include the visible spectra, ultraviolet, and infrared. For purposes of illustration, three different rays of radiation from this source labeled 11, 12 and 13 are shown.
  • Tilted mirror 17 is shown tilted but perpendicular to the same plane of the drawing as is the fixed mirror 16. It must be recognized that tilted mirror 17 may also be additionally tilted so that it is not perpendicular to the plane of the drawing and thus will produce a two-dimensional inter ⁇ ference pattern which may be read on a two-dimensional photodiode array detector.
  • the photodiode array detector shown in this drawing is essentially in the single dimension of the plane of the drawing.
  • ray 18 will have travelled a shorter distance than the other half of its ray 11 and when recombined rays 11 and 18 will create a signal of some intermediate intensity since these two rays will be out of phase.
  • the thus recombined rays are transmitted through a focuss- ing lens 21 and displayed on the photodiode array detector
  • photodiode array detectors having as many as 4,000 or more different detectors are used so that a great amount of different information can be obtained rapidly and much more inexpensively than would be obtained if the normal mirror of a Mi ⁇ haelson inferometer were moved backwards and forwards. If tilted mirror 17 is not positioned at right angles to the plane of the drawing and a two-dimensional photodiode array detector having a large area is employed, even more information may be obtained. Two-dimensional detectors are currently commercially available having 256 2 elements.
  • the interference pattern generator described above may be replaced by a Young's double slit apparatus, a Lloyd's mirror, a Fresnel's biprism, and a Billet's split lens, all of which are described in The Theory of Light, by Thomas Preston, and published by MacMillan & Company, London, 1924, and all of which can generate interference patterns by suitable detection.
  • the spectral range studied by the spectrometer can easily be altered by changing detector arrays provided a suitable interference pattern can be
  • diode arrays sensitive to x-rays, are readily- available and an x-ray spectrometer of this invention would utilize Young's double slit apparatus with these x-ray detectors.

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)

Abstract

Spectromètre interféromètre utilisant un détecteur à réseaux multiples (22). Lorsque le spectromètre utilise la lumière visible, un détecteur à réseaux de photodiodes (22) est utilisé, ainsi qu'un miroir incliné fixe (17) et un miroir vertical fixe (16) en combinaison avec un diviseur optique de faisceaux (15), pour produire un interféromètre de Michaelson sans parties mobiles.
EP85900572A 1984-01-16 1984-12-27 Spectrometre interferometre a reseaux de diodes Withdrawn EP0167601A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US57117584A 1984-01-16 1984-01-16
US571175 1984-01-16

Publications (1)

Publication Number Publication Date
EP0167601A1 true EP0167601A1 (fr) 1986-01-15

Family

ID=24282615

Family Applications (1)

Application Number Title Priority Date Filing Date
EP85900572A Withdrawn EP0167601A1 (fr) 1984-01-16 1984-12-27 Spectrometre interferometre a reseaux de diodes

Country Status (3)

Country Link
EP (1) EP0167601A1 (fr)
JP (1) JPS61500929A (fr)
WO (1) WO1985003122A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5495334A (en) * 1990-07-26 1996-02-27 Research Development Corporation Of Japan Fourier transform spectroscope with quadrangular common path interferometer
JP3292935B2 (ja) * 1993-05-18 2002-06-17 富士写真フイルム株式会社 蛍光分光画像計測装置
DE4431412C1 (de) * 1994-08-24 1996-03-14 William Newton Vorrichtung zur Durchführung spektroskopischer Messungen
AU2507797A (en) * 1996-03-30 1997-10-22 Michael Overhamm Fourier spectrometer
DE19916072A1 (de) * 1999-04-09 2000-10-26 Campus Technologies Ag Zug Vorrichtung und Verfahren zur optischen Spektroskopie
DE10118760A1 (de) * 2001-04-17 2002-10-31 Med Laserzentrum Luebeck Gmbh Verfahren zur Ermittlung der Laufzeitverteilung und Anordnung
JP5317298B2 (ja) * 2010-09-08 2013-10-16 国立大学法人 香川大学 分光計測装置及び分光計測方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1602535A (fr) * 1968-10-09 1970-12-21
US4173442A (en) * 1977-05-27 1979-11-06 The United States Of America As Represented By The Secretary Of Commerce Apparatus and method for determination of wavelength

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See references of WO8503122A1 *

Also Published As

Publication number Publication date
WO1985003122A1 (fr) 1985-07-18
JPS61500929A (ja) 1986-05-08

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Legal Events

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Effective date: 19860321

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Inventor name: WILLIAMS, RONALD, R.