EE201500014A - Impedantsi binaarse ergutusega analüüsi meetod ja seade - Google Patents

Impedantsi binaarse ergutusega analüüsi meetod ja seade

Info

Publication number
EE201500014A
EE201500014A EEP201500014A EEP201500014A EE201500014A EE 201500014 A EE201500014 A EE 201500014A EE P201500014 A EEP201500014 A EE P201500014A EE P201500014 A EEP201500014 A EE P201500014A EE 201500014 A EE201500014 A EE 201500014A
Authority
EE
Estonia
Prior art keywords
analysis
response signal
model
preliminary
equivalent circuit
Prior art date
Application number
EEP201500014A
Other languages
English (en)
Inventor
Olev Märtens
Raul Land
Mart Min
Paul Annus
Marko Reidla
Original Assignee
Tallinna Tehnikaülikool
Eliko Tehnoloogia Arenduskeskus Oü
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tallinna Tehnikaülikool, Eliko Tehnoloogia Arenduskeskus Oü filed Critical Tallinna Tehnikaülikool
Priority to EEP201500014A priority Critical patent/EE05788B1/et
Priority to US15/132,381 priority patent/US10156600B2/en
Publication of EE201500014A publication Critical patent/EE201500014A/et
Publication of EE05788B1 publication Critical patent/EE05788B1/et

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

Binaarse ergutusega impedantsi analüüsi meetod ja seade, kus analüüsitäpsuse oluline paranemine saavutatakse ergutussignaali vastussignaali võendamisel ja esmatöötlusel tekkivate ebatäpsuste (k.a. tingituna signaali nn aliaskomponentidest) arvessevõtmisega, kasutades kogu süsteemi mudelit. Viimane sisaldab mõõdetava objekti aseskeemi (või selle variante) ning vastussignaali esialgse analüüsi mudelit koos mitteideaalsuste arvestamisega. Impedantsianalüüsi vahe- või lõpptulemuseks on aseskeem koos aseskeemi komponentide parameetritega, mis parimal viisil sobitab süsteemi analüüsi kogumudeli tulemuse ja vastussignaali esialgse analüüsi tulemuse. Edasiseks tulemuseks võib olla ka antud aseskeemist arvutatud impedantsi sageduskäik või määratud objekti klassifikaator.
EEP201500014A 2015-04-20 2015-04-20 Impedantsi binaarse ergutusega analüüsi meetod ja seade EE05788B1 (et)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EEP201500014A EE05788B1 (et) 2015-04-20 2015-04-20 Impedantsi binaarse ergutusega analüüsi meetod ja seade
US15/132,381 US10156600B2 (en) 2015-04-20 2016-04-19 Method and device for impedance analyzer with binary excitation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EEP201500014A EE05788B1 (et) 2015-04-20 2015-04-20 Impedantsi binaarse ergutusega analüüsi meetod ja seade

Publications (2)

Publication Number Publication Date
EE201500014A true EE201500014A (et) 2016-11-15
EE05788B1 EE05788B1 (et) 2017-02-15

Family

ID=57241196

Family Applications (1)

Application Number Title Priority Date Filing Date
EEP201500014A EE05788B1 (et) 2015-04-20 2015-04-20 Impedantsi binaarse ergutusega analüüsi meetod ja seade

Country Status (2)

Country Link
US (1) US10156600B2 (et)
EE (1) EE05788B1 (et)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107451361B (zh) * 2017-07-31 2020-05-05 青岛理工大学 一种电路id生成方法
US11269415B2 (en) 2018-08-14 2022-03-08 Cirrus Logic, Inc. Haptic output systems
GB201817495D0 (en) 2018-10-26 2018-12-12 Cirrus Logic Int Semiconductor Ltd A force sensing system and method
CN110967618A (zh) * 2019-03-21 2020-04-07 宁德时代新能源科技股份有限公司 电路参数的检测方法及检测装置
US10955955B2 (en) 2019-03-29 2021-03-23 Cirrus Logic, Inc. Controller for use in a device comprising force sensors
US10828672B2 (en) 2019-03-29 2020-11-10 Cirrus Logic, Inc. Driver circuitry
US11509292B2 (en) 2019-03-29 2022-11-22 Cirrus Logic, Inc. Identifying mechanical impedance of an electromagnetic load using least-mean-squares filter
US10976825B2 (en) 2019-06-07 2021-04-13 Cirrus Logic, Inc. Methods and apparatuses for controlling operation of a vibrational output system and/or operation of an input sensor system
US11380175B2 (en) 2019-10-24 2022-07-05 Cirrus Logic, Inc. Reproducibility of haptic waveform
US20210174777A1 (en) * 2019-12-05 2021-06-10 Cirrus Logic International Semiconductor Ltd. Methods and systems for estimating coil impedance of an electromagnetic transducer
CN111539182B (zh) * 2020-07-08 2020-10-09 成都奥卡思微电科技有限公司 一种对组合逻辑电路等价验证的分级方法
US11933822B2 (en) 2021-06-16 2024-03-19 Cirrus Logic Inc. Methods and systems for in-system estimation of actuator parameters
US11908310B2 (en) 2021-06-22 2024-02-20 Cirrus Logic Inc. Methods and systems for detecting and managing unexpected spectral content in an amplifier system
US11765499B2 (en) 2021-06-22 2023-09-19 Cirrus Logic Inc. Methods and systems for managing mixed mode electromechanical actuator drive
JP2023025353A (ja) * 2021-08-10 2023-02-22 株式会社アドバンテスト 測定装置、測定方法およびプログラム

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10214407C1 (de) * 2002-03-30 2003-06-18 Klippel Gmbh Anordnung und Verfahren zur Messung, Bewertung und Störungserkennung von Systemen
EE04767B1 (et) * 2002-12-06 2007-02-15 Tallinna Tehnika�likool Meetod ja seade elektrilise bioimpedantsi mõõtmiseks
EP2314217B1 (en) * 2009-10-23 2013-03-13 Tallinn University of Technology Method and device for fast measurement of frequency response with scalable short chirp signals
US9341687B2 (en) * 2011-02-22 2016-05-17 The Mitre Corporation Classifying and identifying materials based on permittivity features
US9470729B2 (en) * 2011-04-08 2016-10-18 Telefonaktiebolaget L M Ericsson Transmission line parameter determination
EE05668B1 (et) * 2011-08-30 2013-08-15 Tallinna Tehnika�likool Meetod ja seade ssteemide ja substantside laiaribaliseks analsimiseks

Also Published As

Publication number Publication date
US10156600B2 (en) 2018-12-18
EE05788B1 (et) 2017-02-15
US20160305996A1 (en) 2016-10-20

Similar Documents

Publication Publication Date Title
EE201500014A (et) Impedantsi binaarse ergutusega analüüsi meetod ja seade
WO2015128272A3 (en) Photo-selective method for biological sample analysis field
TW201611775A (en) Electronic device and method for measuring vital signal by the electronic device
MY189945A (en) Statistical analytic method for the determination of the risk posed by file based content
MX2015010391A (es) Dispositivo de muestreo y registro de almacenamiento para analisis de gas de respiracion.
EP3696577A4 (en) METHOD AND DEVICE FOR ACQUIRING POINT CLOUD DATA IN THE ABSENCE OF GNSS SIGNAL
SG10201808165YA (en) Sample analysis for mass cytometry
EP3525371A4 (en) SIGNAL SCANING AND RESTORATION METHOD AND DEVICE FOR OVXDM SYSTEM AND OVXDM SYSTEM
HUE063109T2 (hu) Impulzusjel-mintavételi módszer és eszköz, valamint számítógépes programhordozó
EP3495812A4 (en) METHOD FOR PROCESSING ANALYSIS DATA AND DEVICE FOR PROCESSING ANALYSIS DATA
EP3662816A4 (en) DEVICE FOR MEASURING BIOMETRIC SIGNALS WITH TRAP UNIT FOR MEASURING THE BIOMETRIC SIGNAL OF A MICRO ANIMAL AND METHOD OF MEASURING THE BIOMETRIC SIGNAL OF A MICRO ANIMAL THEREOF
TW201613811A (en) Method and apparatus for aligning electronic components
GB2523973A (en) Audio analysis system and method using audio segment characterisation
EP3257444A4 (en) Method for data analysis and processing of elasticity detection device, and elasticity detection device
SG11201700694PA (en) Processor, method and computer program for processing an audio signal using truncated analysis or synthesis window overlap portions
SG10201901587VA (en) Application testing
MX2019001193A (es) Metodo para procesar señal de voz/audio y aparato.
GB2548042A (en) Real-time performance analyzer for drilling operations
MX2016010252A (es) Control de calidad y acondicionamiento previo de datos sismicos.
WO2019066572A3 (en) Method and device for analyzing target analyte in sample
MX2016002961A (es) Aparato y metodo para procesar datos de induccion multicomponentes.
MX2016016222A (es) Sistemas y metodos para detectar y demostrar daño por radiacion ultravioleta al cabello mediante la evaluacion de fragmentos de proteina.
ZA202007161B (en) Systems, devices, and methods for analysis of geological samples
EP2763368A3 (en) Undersampled receiver characterization
MX2018002495A (es) Inversiones enfocadas con datos.