EE201100054A - Meetod ja seade ssteemide ja substantside laiaribaliseks analsimiseks - Google Patents

Meetod ja seade ssteemide ja substantside laiaribaliseks analsimiseks

Info

Publication number
EE201100054A
EE201100054A EEP201100054A EEP201100054A EE201100054A EE 201100054 A EE201100054 A EE 201100054A EE P201100054 A EEP201100054 A EE P201100054A EE P201100054 A EEP201100054 A EE P201100054A EE 201100054 A EE201100054 A EE 201100054A
Authority
EE
Estonia
Prior art keywords
substances
systems
wide band
band analysis
analysis
Prior art date
Application number
EEP201100054A
Other languages
English (en)
Inventor
Land Raul
Annus Paul
Min Mart
M�rtens Olev
Ojarand Jaan
Original Assignee
Tallinna Tehnika�likool
O� ELIKO Tehnoloogia Arenduskeskus
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tallinna Tehnika�likool, O� ELIKO Tehnoloogia Arenduskeskus filed Critical Tallinna Tehnika�likool
Priority to EEP201100054A priority Critical patent/EE05668B1/et
Priority to EP12182280.3A priority patent/EP2565654B1/en
Priority to US13/598,955 priority patent/US10698023B2/en
Publication of EE201100054A publication Critical patent/EE201100054A/et
Publication of EE05668B1 publication Critical patent/EE05668B1/et

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G01R31/2841—Signal generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/02—Digital function generators
    • G06F1/03—Digital function generators working, at least partly, by table look-up

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Tests Of Electronic Circuits (AREA)
EEP201100054A 2011-08-30 2011-08-30 Meetod ja seade ssteemide ja substantside laiaribaliseks analsimiseks EE05668B1 (et)

Priority Applications (3)

Application Number Priority Date Filing Date Title
EEP201100054A EE05668B1 (et) 2011-08-30 2011-08-30 Meetod ja seade ssteemide ja substantside laiaribaliseks analsimiseks
EP12182280.3A EP2565654B1 (en) 2011-08-30 2012-08-29 Method and device for broadband analysis of systems and substances
US13/598,955 US10698023B2 (en) 2011-08-30 2012-08-30 Method and device for broadband analysis of systems and substances

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EEP201100054A EE05668B1 (et) 2011-08-30 2011-08-30 Meetod ja seade ssteemide ja substantside laiaribaliseks analsimiseks

Publications (2)

Publication Number Publication Date
EE201100054A true EE201100054A (et) 2013-04-15
EE05668B1 EE05668B1 (et) 2013-08-15

Family

ID=46727146

Family Applications (1)

Application Number Title Priority Date Filing Date
EEP201100054A EE05668B1 (et) 2011-08-30 2011-08-30 Meetod ja seade ssteemide ja substantside laiaribaliseks analsimiseks

Country Status (3)

Country Link
US (1) US10698023B2 (et)
EP (1) EP2565654B1 (et)
EE (1) EE05668B1 (et)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
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US9928213B2 (en) 2014-09-04 2018-03-27 Qualcomm Incorporated Event-driven spatio-temporal short-time fourier transform processing for asynchronous pulse-modulated sampled signals
EE05788B1 (et) * 2015-04-20 2017-02-15 Tallinna Tehnikaülikool Impedantsi binaarse ergutusega analüüsi meetod ja seade
FR3051915B1 (fr) * 2016-05-31 2020-06-12 Thales Procede de determination d'un coefficient de derive electrique d'un circuit electronique, produit programme d'ordinateur et dispositif electronique associes
US10469299B2 (en) * 2017-10-27 2019-11-05 Terawave, Llc Multi-carrier data communications system having high spectral efficiency
US11876659B2 (en) 2017-10-27 2024-01-16 Terawave, Llc Communication system using shape-shifted sinusoidal waveforms
CN108809750A (zh) * 2018-04-04 2018-11-13 北京天元创新科技有限公司 提升家客宽带装机测速准确性的方法及装置
CN112083237B (zh) * 2020-07-31 2021-06-29 西安交通大学 一种用于大尺度电气设备宽频特性时域测量方法及系统
US11619662B1 (en) * 2021-09-17 2023-04-04 Rohde & Schwarz Gmbh & Co. Kg Measurement system and method for a parallel measurement with multiple tones
CN113851151A (zh) * 2021-10-26 2021-12-28 北京融讯科创技术有限公司 掩蔽阈值估计方法、装置、电子设备和存储介质
CN117686889B (zh) * 2024-01-25 2024-05-14 杭州广立微电子股份有限公司 一种可寻址并行测试电路、方法、芯片和系统

Family Cites Families (22)

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US3764995A (en) * 1971-12-21 1973-10-09 Prd Electronics Inc Programmable test systems
US4067060A (en) * 1976-07-06 1978-01-03 Canadian Patents And Development Limited Transfer function measurement
US4093988A (en) 1976-11-08 1978-06-06 General Electric Company High speed frequency response measurement
US4187466A (en) * 1978-01-16 1980-02-05 Rolm Corporation Signal injection technique
JPS5955523A (ja) * 1982-09-24 1984-03-30 Advantest Corp デジタルスペクトルアナライザ用信号発生器
GB2145888B (en) * 1983-08-24 1986-06-18 Ferranti Plc Testing the transfer function linearity of analogue input circuits
US5051916A (en) 1990-01-12 1991-09-24 Tektronix, Inc. Stimulus signal generation method to maximize dynamic range in frequency response function calculations
DE69325224T2 (de) * 1992-09-24 1999-11-11 Canon Kk Verfahren zur Frequenzkammspreizspektrummodulation
DE19846870C1 (de) * 1998-10-12 2001-01-25 Peter Peyerl Verfahren zur Bestimmung der Impulsantwort eines breitbandigen linearen Systems und Meßanordnung zur Durchführung des Verfahrens
US6570394B1 (en) * 1999-01-22 2003-05-27 Thomas H. Williams Tests for non-linear distortion using digital signal processing
US7027940B2 (en) * 2002-08-13 2006-04-11 Iannuzzi John F Stepped sine wave frequency response measurement system
US7194317B2 (en) 2002-08-22 2007-03-20 Air Products And Chemicals, Inc. Fast plant test for model-based control
EE04767B1 (et) 2002-12-06 2007-02-15 Tallinna Tehnika�likool Meetod ja seade elektrilise bioimpedantsi mõõtmiseks
MXPA05009713A (es) * 2003-03-12 2005-11-04 Joule Microsystems Canada Inc Sistema procesador de senal y metodo.
WO2005122889A1 (en) 2004-06-18 2005-12-29 Tallinn University Of Technology Simultaneous discrete-time analysis of features of substances
WO2006017795A2 (en) * 2004-08-05 2006-02-16 University Of South Carolina Automatic signal collection and analysis for piezoelectric wafer active sensor
US7088109B2 (en) * 2004-09-30 2006-08-08 Agilent Technologies, Inc. Method and apparatus for measuring a digital device
GB0522888D0 (en) 2005-11-10 2005-12-21 Univ Southampton Measurement of the electrical impedance frequency spectrum
US8005633B2 (en) * 2006-02-06 2011-08-23 Verigy (Singapore) Pte. Ltd. Excitation signal generator for improved accuracy of model-based testing
EE05600B1 (et) * 2007-04-17 2012-12-17 Tallinna Tehnikaülikool Meetod vigade minimiseerimiseks ebahtlaselt diskreeditud signaalide t””tlemisel ja demoduleerimisel laiaribaliste mitmesageduslike m??tmiste jaoks
EP2313001B8 (en) 2008-05-12 2012-03-28 Tallinn University Of Technology Method and device using shortened square wave waveforms in synchronous signal processing
US9042721B2 (en) * 2012-07-25 2015-05-26 Alcatel Lucent Stochastic reflectometer

Also Published As

Publication number Publication date
US20130054178A1 (en) 2013-02-28
US10698023B2 (en) 2020-06-30
EP2565654A2 (en) 2013-03-06
EP2565654B1 (en) 2024-04-03
EP2565654A3 (en) 2017-05-17
EE05668B1 (et) 2013-08-15

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