EA201890639A1 - Измерения смещения с использованием многорезонаторного датчика - Google Patents
Измерения смещения с использованием многорезонаторного датчикаInfo
- Publication number
- EA201890639A1 EA201890639A1 EA201890639A EA201890639A EA201890639A1 EA 201890639 A1 EA201890639 A1 EA 201890639A1 EA 201890639 A EA201890639 A EA 201890639A EA 201890639 A EA201890639 A EA 201890639A EA 201890639 A1 EA201890639 A1 EA 201890639A1
- Authority
- EA
- Eurasian Patent Office
- Prior art keywords
- reflector
- multipreamaging
- shifting
- measurements
- sensor
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title 1
- 230000003287 optical effect Effects 0.000 abstract 2
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/10—Detecting, e.g. by using light barriers
- G01V8/20—Detecting, e.g. by using light barriers using multiple transmitters or receivers
- G01V8/22—Detecting, e.g. by using light barriers using multiple transmitters or receivers using reflectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
- G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
- G01H9/004—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means using fibre optic sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
- G01J9/0246—Measuring optical wavelength
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/093—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by photoelectric pick-up
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V2210/00—Details of seismic processing or analysis
- G01V2210/10—Aspects of acoustic signal generation or detection
- G01V2210/14—Signal detection
- G01V2210/142—Receiver location
- G01V2210/1429—Subsurface, e.g. in borehole or below weathering layer or mud line
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/28—Interference filters
- G02B5/284—Interference filters of etalon type comprising a resonant cavity other than a thin solid film, e.g. gas, air, solid plates
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Вариант реализации изобретения представляет собой устройство для определения параметра, содержащее источник света, выполненный с возможностью излучения оптического сигнала, и интерферометр, содержащий первый узел отражателя, имеющий по меньшей мере одну отражающую поверхность, и второй узел отражателя, имеющий множество отдельных отражающих поверхностей, обращенных к указанной по меньшей мере одной отражающей поверхности. По меньшей мере один из первого узла отражателя и второго узла отражателя может перемещаться в ответ на воздействие, а отдельные отражающие поверхности указанного множества расположены в фиксированном положении друг относительно друга, и при этом каждая отдельная отражающая поверхность определяет свою, отличную от других длину оптического резонатора относительно первого узла отражателя.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/863,897 US9933546B2 (en) | 2015-09-24 | 2015-09-24 | Displacement measurements using a multi-cavity sensor |
PCT/US2016/053275 WO2017053679A1 (en) | 2015-09-24 | 2016-09-23 | Displacement measurements using a multi-cavity sensor |
Publications (1)
Publication Number | Publication Date |
---|---|
EA201890639A1 true EA201890639A1 (ru) | 2018-07-31 |
Family
ID=58387456
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EA201890639A EA201890639A1 (ru) | 2015-09-24 | 2016-09-23 | Измерения смещения с использованием многорезонаторного датчика |
Country Status (4)
Country | Link |
---|---|
US (1) | US9933546B2 (ru) |
EA (1) | EA201890639A1 (ru) |
NO (1) | NO20180451A1 (ru) |
WO (1) | WO2017053679A1 (ru) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NO343314B1 (no) * | 2015-11-29 | 2019-01-28 | Tunable As | Optisk trykksensor |
DE102019214940A1 (de) * | 2019-09-27 | 2021-04-01 | Helmut Fritz | Optomechanisches system, verwendung eines optomechanischen systems, strömungssensoranordnung und beschleunigungssensoranordnung |
CN113767309A (zh) * | 2020-05-28 | 2021-12-07 | 深圳市海谱纳米光学科技有限公司 | 一种可调光学滤波器件和光谱成像系统 |
WO2022147918A1 (zh) * | 2021-01-06 | 2022-07-14 | 苏州联讯仪器有限公司 | 高精度干涉波长测量仪 |
US12092652B2 (en) * | 2021-06-30 | 2024-09-17 | Government Of The United States Of America, As Represented By The Secretary Of Commerce | Optomechanical accelerometer and performing optomechanical accelerometry |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4822998A (en) * | 1986-05-15 | 1989-04-18 | Minolta Camera Kabushiki Kaisha | Spectral sensor with interference filter |
US5151585A (en) * | 1991-08-12 | 1992-09-29 | Hughes Danbury Optical Systems, Inc. | Coherent radiation detector |
JP3844886B2 (ja) * | 1998-07-28 | 2006-11-15 | 富士通株式会社 | 光フィルタの製造方法 |
US6738145B2 (en) * | 2000-04-14 | 2004-05-18 | Shipley Company, L.L.C. | Micromachined, etalon-based optical fiber pressure sensor |
US6924898B2 (en) | 2000-08-08 | 2005-08-02 | Zygo Corporation | Phase-shifting interferometry method and system |
US20030035120A1 (en) * | 2001-08-14 | 2003-02-20 | Myatt Christopher J. | Multiple-interferometer device for wavelength measuring and locking |
US6829092B2 (en) * | 2001-08-15 | 2004-12-07 | Silicon Light Machines, Inc. | Blazed grating light valve |
US7433552B2 (en) * | 2005-12-22 | 2008-10-07 | Palo Alto Research Center Incorporated | Obtaining analyte information |
US7355714B2 (en) * | 2005-12-29 | 2008-04-08 | Xerox Corporation | Reconfigurable MEMS fabry-perot tunable matrix filter systems and methods |
WO2008064470A1 (en) | 2006-11-27 | 2008-06-05 | Roctest Ltée | High selectivity band-pass interferometer with tuning capabilities |
US8154734B2 (en) | 2008-04-25 | 2012-04-10 | Symphony Acoustics, Inc. | Optical interferometric sensor |
US8793102B2 (en) | 2010-01-12 | 2014-07-29 | Baker Hughes Incorporated | Multi-gap interferometric sensors |
JP5663900B2 (ja) * | 2010-03-05 | 2015-02-04 | セイコーエプソン株式会社 | 分光センサー装置及び電子機器 |
US20120200852A1 (en) * | 2010-09-10 | 2012-08-09 | Aerospace Missions Corporation | Spectroscopy and spectral imaging methods and apparatus |
US9046427B2 (en) * | 2011-04-11 | 2015-06-02 | Massachusetts Institute Of Technology | System for dual pressure sensing |
CN102798917B (zh) * | 2011-05-25 | 2015-02-25 | 苏州大学 | 一种彩色图像制作方法及使用该方法制作的彩色滤光片 |
US9513166B2 (en) * | 2013-07-16 | 2016-12-06 | Utah State University Research Foundation | Split field spectral imager |
US9513145B2 (en) | 2013-10-29 | 2016-12-06 | Baker Hughes Incorporated | Apparatus to reduce pressure and thermal sensitivity of high precision optical displacement sensors |
US9677935B2 (en) * | 2014-11-03 | 2017-06-13 | Trutag Technologies, Inc. | Fabry-perot spectral image measurement |
-
2015
- 2015-09-24 US US14/863,897 patent/US9933546B2/en active Active
-
2016
- 2016-09-23 WO PCT/US2016/053275 patent/WO2017053679A1/en active Application Filing
- 2016-09-23 EA EA201890639A patent/EA201890639A1/ru unknown
-
2018
- 2018-04-04 NO NO20180451A patent/NO20180451A1/no not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
NO20180451A1 (en) | 2018-04-04 |
US20170090064A1 (en) | 2017-03-30 |
US9933546B2 (en) | 2018-04-03 |
WO2017053679A1 (en) | 2017-03-30 |
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